Generation of technology-portable flexible analog blocks

This paper introduces a complete methodology for retargeting of analog blocks to different sets of specifications, even to different technology processes. By careful integration of the tuning process of design parameters with layout generation, fully functional designs are generated in a few minutes of CPU time.Ministerio de Ciencia y Tecnología TIC 2001-092

Algorithms and methodologies for interconnect reliability analysis of integrated circuits

The phenomenal progress of computing devices has been largely made possible by the sustained efforts of semiconductor industry in innovating techniques for extremely large-scale integration. Indeed, gigantically integrated circuits today contain multi-billion interconnects which enable the transistors to talk to each other -all in a space of few mm2. Such aggressively downscaled components (transistors and interconnects) silently suffer from increasing electric fields and impurities/defects during manufacturing. Compounded by the Gigahertz switching, the challenges of reliability and design integrity remains very much alive for chip designers, with Electro migration (EM) being the foremost interconnect reliability challenge. Traditionally, EM containment revolves around EM guidelines, generated at single-component level, whose non-compliance means that the component fails. Failure usually refers to deformation due to EM -manifested in form of resistance increase, which is unacceptable from circuit performance point of view. Subsequent aspects deal with correct-by-construct design of the chip followed by the signoff-verification of EM reliability. Interestingly, chip designs today have reached a dilemma point of reduced margin between the actual and reliably allowed current densities, versus, comparatively scarce system-failures. Consequently, this research is focused on improved algorithms and methodologies for interconnect reliability analysis enabling accurate and design-specific interpretation of EM events. In the first part, we present a new methodology for logic-IP (cell) internal EM verification: an inadequately attended area in the literature. Our SPICE-correlated model helps in evaluating the cell lifetime under any arbitrary reliability speciation, without generating additional data - unlike the traditional approaches. The model is apt for today's fab less eco-system, where there is a) increasing reuse of standard cells optimized for one market condition to another (e.g., wireless to automotive), as well as b) increasing 3rd party content on the chip requiring a rigorous sign-off. We present results from a 28nm production setup, demonstrating significant violations relaxation and flexibility to allow runtime level reliability retargeting. Subsequently, we focus on an important aspect of connecting the individual component-level failures to that of the system failure. We note that existing EM methodologies are based on serial reliability assumption, which deems the entire system to fail as soon as the first component in the system fails. With a highly redundant circuit topology, that of a clock grid, in perspective, we present algorithms for EM assessment, which allow us to incorporate and quantify the benefit from system redundancies. With the skew metric of clock-grid as a failure criterion, we demonstrate that unless such incorporations are done, chip lifetimes are underestimated by over 2x. This component-to-system reliability bridge is further extended through an extreme order statistics based approach, wherein, we demonstrate that system failures can be approximated by an asymptotic kth-component failure model, otherwise requiring costly Monte Carlo simulations. Using such approach, we can efficiently predict a system-criterion based time to failure within existing EDA frameworks. The last part of the research is related to incorporating the impact of global/local process variation on current densities as well as fundamental physical factors on EM. Through Hermite polynomial chaos based approach, we arrive at novel variations-aware current density models, which demonstrate significant margins (> 30 %) in EM lifetime when compared with the traditional worst case approach. The above research problems have been motivated by the decade-long work experience of the author dealing with reliability issues in industrial SoCs, first at Texas Instruments and later at Qualcomm.L'espectacular progrés dels dispositius de càlcul ha estat possible en gran part als esforços de la indústria dels semiconductors en proposar tècniques innovadores per circuits d'una alta escala d'integració. Els circuits integrats contenen milers de milions d'interconnexions que permeten connectar transistors dins d'un espai de pocs mm2. Tots aquests components estan afectats per camps elèctrics, impureses i defectes durant la seva fabricació. Degut a l’activitat a nivell de Gigahertzs, la fiabilitat i integritat són reptes importants pels dissenyadors de xips, on la Electromigració (EM) és un dels problemes més importants. Tradicionalment, el control de la EM ha girat entorn a directrius a nivell de component. L'incompliment d’alguna de les directrius implica un alt risc de falla. Per falla s'entén la degradació deguda a la EM, que es manifesta en forma d'augment de la resistència, la qual cosa és inacceptable des del punt de vista del rendiment del circuit. Altres aspectes tenen a veure amb la correcta construcció del xip i la verificació de fiabilitat abans d’enviar el xip a fabricar. Avui en dia, el disseny s’enfronta a dilemes importants a l’hora de definir els marges de fiabilitat dels xips. És un compromís entre eficiència i fiabilitat. La recerca en aquesta tesi se centra en la proposta d’algorismes i metodologies per a l'anàlisi de la fiabilitat d'interconnexió que permeten una interpretació precisa i específica d'esdeveniments d'EM. A la primera part de la tesi es presenta una nova metodologia pel disseny correcte-per-construcció i verificació d’EM a l’interior de les cel·les lògiques. Es presenta un model SPICE correlat que ajuda a avaluar el temps de vida de les cel·les segons qualsevol especificació arbitrària de fiabilitat i sense generar cap dada addicional, al contrari del que fan altres tècniques. El model és apte per l'ecosistema d'empreses de disseny quan hi ha a) una reutilització creixent de cel·les estàndard optimitzades per unes condicions de mercat i utilitzades en un altre (p.ex. de wireless a automoció), o b) la utilització de components del xip provinents de terceres parts i que necessiten una verificació rigorosa. Es presenten resultats en una tecnologia de 28nm, demostrant relaxacions significatives de les regles de fiabilitat i flexibilitat per permetre la reavaluació de la fiabilitat en temps d'execució. A continuació, el treball tracta un aspecte important sobre la relació entre les falles dels components i les falles del sistema. S'observa que les tècniques existents es basen en la suposició de fiabilitat en sèrie, que porta el sistema a fallar tant aviat hi ha un component que falla. Pensant en topologies redundants, com la de les graelles de rellotge, es proposen algorismes per l'anàlisi d'EM que permeten quantificar els beneficis de la redundància en el sistema. Utilitzant com a mètrica l’esbiaixi del senyal de rellotge, es demostra que la vida dels xips pot arribar a ser infravalorada per un factor de 2x. Aquest pont de fiabilitat entre component i sistema es perfecciona a través d'una tècnica basada en estadístics d'ordre extrem on es demostra que les falles poden ser aproximades amb un model asimptòtic de fallada de l'ièssim component, evitant així simulacions de Monte Carlo costoses. Amb aquesta tècnica, es pot predir eficientment el temps de fallada a nivell de sistema utilitzant eines industrials. La darrera part de la recerca està relacionada amb avaluar l'impacte de les variacions de procés en les densitats de corrent i factors físics de la EM. Mitjançant una tècnica basada en polinomis d'Hermite s'han obtingut uns nous models de densitat de corrent que mostren millores importants (>30%) en l'estimació de la vida del sistema comprades amb les tècniques basades en el cas pitjor. La recerca d'aquesta tesi ha estat motivada pel treball de l'autor durant més d'una dècada tractant temes de fiabilitat en sistemes, primer a Texas Instruments i després a Qualcomm.Postprint (published version

Layoutautomatisierung im analogen IC-Entwurf mit formalisiertem und nicht-formalisiertem Expertenwissen

After more than three decades of electronic design automation, most layouts for analog integrated circuits are still handcrafted in a laborious manual fashion today. Obverse to the highly automated synthesis tools in the digital domain (coping with the quantitative difficulty of packing more and more components onto a single chip – a desire well known as More Moore), analog layout automation struggles with the many diverse and heavily correlated functional requirements that turn the analog design problem into a More than Moore challenge. Facing this qualitative complexity, seasoned layout engineers rely on their comprehensive expert knowledge to consider all design constraints that uncompromisingly need to be satisfied. This usually involves both formally specified and nonformally communicated pieces of expert knowledge, which entails an explicit and implicit consideration of design constraints, respectively. Existing automation approaches can be basically divided into optimization algorithms (where constraint consideration occurs explicitly) and procedural generators (where constraints can only be taken into account implicitly). As investigated in this thesis, these two automation strategies follow two fundamentally different paradigms denoted as top-down automation and bottom-up automation. The major trait of top-down automation is that it requires a thorough formalization of the problem to enable a self-intelligent solution finding, whereas a bottom-up automatism –controlled by parameters– merely reproduces solutions that have been preconceived by a layout expert in advance. Since the strengths of one paradigm may compensate the weaknesses of the other, it is assumed that a combination of both paradigms –called bottom-up meets top-down– has much more potential to tackle the analog design problem in its entirety than either optimization-based or generator-based approaches alone. Against this background, the thesis at hand presents Self-organized Wiring and Arrangement of Responsive Modules (SWARM), an interdisciplinary methodology addressing the design problem with a decentralized multi-agent system. Its basic principle, similar to the roundup of a sheep herd, is to let responsive mobile layout modules (implemented as context-aware procedural generators) interact with each other inside a user-defined layout zone. Each module is allowed to autonomously move, rotate and deform itself, while a supervising control organ successively tightens the layout zone to steer the interaction towards increasingly compact (and constraint compliant) layout arrangements. Considering various principles of self-organization and incorporating ideas from existing decentralized systems, SWARM is able to evoke the phenomenon of emergence: although each module only has a limited viewpoint and selfishly pursues its personal objectives, remarkable overall solutions can emerge on the global scale. Several examples exhibit this emergent behavior in SWARM, and it is particularly interesting that even optimal solutions can arise from the module interaction. Further examples demonstrate SWARM’s suitability for floorplanning purposes and its application to practical place-and-route problems. The latter illustrates how the interacting modules take care of their respective design requirements implicitly (i.e., bottom-up) while simultaneously paying respect to high level constraints (such as the layout outline imposed top-down by the supervising control organ). Experimental results show that SWARM can outperform optimization algorithms and procedural generators both in terms of layout quality and design productivity. From an academic point of view, SWARM’s grand achievement is to tap fertile virgin soil for future works on novel bottom-up meets top-down automatisms. These may one day be the key to close the automation gap in analog layout design.Nach mehr als drei Jahrzehnten Entwurfsautomatisierung werden die meisten Layouts für analoge integrierte Schaltkreise heute immer noch in aufwändiger Handarbeit entworfen. Gegenüber den hochautomatisierten Synthesewerkzeugen im Digitalbereich (die sich mit dem quantitativen Problem auseinandersetzen, mehr und mehr Komponenten auf einem einzelnen Chip unterzubringen – bestens bekannt als More Moore) kämpft die analoge Layoutautomatisierung mit den vielen verschiedenen und stark korrelierten funktionalen Anforderungen, die das analoge Entwurfsproblem zu einer More than Moore Herausforderung machen. Angesichts dieser qualitativen Komplexität bedarf es des umfassenden Expertenwissens erfahrener Layouter um sämtliche Entwurfsconstraints, die zwingend eingehalten werden müssen, zu berücksichtigen. Meist beinhaltet dies formal spezifiziertes als auch nicht-formal übermitteltes Expertenwissen, was eine explizite bzw. implizite Constraint Berücksichtigung nach sich zieht. Existierende Automatisierungsansätze können grundsätzlich unterteilt werden in Optimierungsalgorithmen (wo die Constraint Berücksichtigung explizit erfolgt) und prozedurale Generatoren (die Constraints nur implizit berücksichtigen können). Wie in dieser Arbeit eruiert wird, folgen diese beiden Automatisierungsstrategien zwei grundlegend unterschiedlichen Paradigmen, bezeichnet als top-down Automatisierung und bottom-up Automatisierung. Wesentliches Merkmal der top-down Automatisierung ist die Notwendigkeit einer umfassenden Problemformalisierung um eine eigenintelligente Lösungsfindung zu ermöglichen, während ein bottom-up Automatismus –parametergesteuert– lediglich Lösungen reproduziert, die vorab von einem Layoutexperten vorgedacht wurden. Da die Stärken des einen Paradigmas die Schwächen des anderen ausgleichen können, ist anzunehmen, dass eine Kombination beider Paradigmen –genannt bottom-up meets top down– weitaus mehr Potenzial hat, das analoge Entwurfsproblem in seiner Gesamtheit zu lösen als optimierungsbasierte oder generatorbasierte Ansätze für sich allein. Vor diesem Hintergrund stellt die vorliegende Arbeit Self-organized Wiring and Arrangement of Responsive Modules (SWARM) vor, eine interdisziplinäre Methodik, die das Entwurfsproblem mit einem dezentralisierten Multi-Agenten-System angeht. Das Grundprinzip besteht darin, ähnlich dem Zusammentreiben einer Schafherde, reaktionsfähige mobile Layoutmodule (realisiert als kontextbewusste prozedurale Generatoren) in einer benutzerdefinierten Layoutzone interagieren zu lassen. Jedes Modul darf sich selbständig bewegen, drehen und verformen, wobei ein übergeordnetes Kontrollorgan die Zone schrittweise verkleinert, um die Interaktion auf zunehmend kompakte (und constraintkonforme) Layoutanordnungen hinzulenken. Durch die Berücksichtigung diverser Selbstorganisationsgrundsätze und die Einarbeitung von Ideen bestehender dezentralisierter Systeme ist SWARM in der Lage, das Phänomen der Emergenz hervorzurufen: obwohl jedes Modul nur eine begrenzte Sichtweise hat und egoistisch seine eigenen Ziele verfolgt, können sich auf globaler Ebene bemerkenswerte Gesamtlösungen herausbilden. Mehrere Beispiele veranschaulichen dieses emergente Verhalten in SWARM, wobei besonders interessant ist, dass sogar optimale Lösungen aus der Modulinteraktion entstehen können. Weitere Beispiele demonstrieren SWARMs Eignung zwecks Floorplanning sowie die Anwendung auf praktische Place-and-Route Probleme. Letzteres verdeutlicht, wie die interagierenden Module ihre jeweiligen Entwurfsanforderungen implizit (also: bottom-up) beachten, während sie gleichzeitig High-Level-Constraints berücksichtigen (z.B. die Layoutkontur, die top-down vom übergeordneten Kontrollorgan auferlegt wird). Experimentelle Ergebnisse zeigen, dass Optimierungsalgorithmen und prozedurale Generatoren von SWARM sowohl bezüglich Layoutqualität als auch Entwurfsproduktivität übertroffen werden können. Aus akademischer Sicht besteht SWARMs große Errungenschaft in der Erschließung fruchtbaren Neulands für zukünftige Arbeiten an neuartigen bottom-up meets top-down Automatismen. Diese könnten eines Tages der Schlüssel sein, um die Automatisierungslücke im analogen Layoutentwurf zu schließen

Meeting U.S. defense needs in the information age : an evaluation of selected comlex electronic system development methodologies

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Aeronautics and Astronautics, 1995.Includes bibliographical references (p. 159-167).by Alexander C. Hou.M.S

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks