Automated nonlinear Macromodelling of output buffers for high-speed digital applications

We present applications of a recently developed automated nonlin-ear macromodelling approach to the important problem of macro-modelling high-speed output buffers/drivers. Good nonlinear macro-models of such drivers are essential for fast signal-integrity and timing analysis in high-speed digital design. Unlike traditional black-box modelling techniques, our approach extracts nonlinear macromodels of digital drivers automatically from SPICE-level de-scriptions. Thus it can naturally capture transistor-level nonlinear-ities in the macromodels, resulting in far more accurate signal in-tegrity analysis, while retaining significant speedups. We demon-strate the technique by automatically extracting macromodels for two typical digital drivers. Using the macromodel, we obtain about 8 × speedup in average with excellent accuracy in capturing differ-ent loading effects, crosstalk, simultaneous switching noise (SSN), etc.

Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

Since the last century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The ISO 26262 standard for functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardization of defect modeling and injection mainly focused on digital circuits and, in a minor part, on analog ones. An initial attempt is being made with the IEEE P2427 draft standard that started to give a structured and formal organization to the analog testing field. Various methods have been proposed in the literature to speed up the fault simulation of the defect universe for an analog circuit. A more limited number of papers seek to reduce the overall simulation time by reducing the number of defects to be simulated. This literature survey describes the state-of-the-art of analog defect injection and fault simulation methods. The survey is based on the Preferred Reporting Items for Systematic Reviews and Meta-Analyses (PRISMA) methodological flow, allowing for a systematic and complete literature survey. Each selected paper has been categorized and presented to provide an overview of all the available approaches. In addition, the limitations of the various approaches are discussed by showing possible future directions

Qucs workbook

This document is intended to be a work book for RF and microwave designers.Our intention is not to provide an RF course, but some touchy RF topics. The goal is to insist on design rules and work flow for RF design using CAD programs. This work flow will be handled through different subjects

Parameterized model order reduction for nonlinear dynamical systems

Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2006.Includes bibliographical references (p. 67-70).The presence of several nonlinear analog circuits and Micro-Electro-Mechanical (MEM) components in modern mixed signal System-on-Chips (SoC) makes the fully automatic synthesis and optimization of such systems an extremely challenging task. The research presented in this thesis concerns the development of techniques for generating Parameterized Reduced Order Models (PROMs) of nonlinear dynamical systems. Such reduced order models could serve as a first step towards the automatic and accurate characterization of geometrically complex components and subcircuits, eventually enabling their synthesis and optimization. This work combines elements from a non-parameterized trajectory piecewise linear method for nonlinear systems with a moment matching paramneterized technique for linear systems. Exploiting these two methods one can create four different algorithms or generating PROMs of nonlinear systems. The algorithms were tested on three different systems: a MEM switch and two nonlinear analog circuits. All three examples contain distributed strong nonlinearities and possess dependence on several geometric parameters.(cont.) Using the proposed algorithms, the local and global parameter-space accuracy of the reduced order models can be adjusted as desired. Models call be created which are extremely accurate over a narrow range of parameter values. as well as models which are less accurate locally but still provide adequate accuracy over a much wider range of parameter values.by Bradley N. Bond.S.M

Modeling and simulation of VLSI interconnections with moments

Also issued as Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1989.Includes bibliographical references.Supported in part by the Joint Services Electronics Program. DAAL03-86-K-0002Steven Paul McCormick