270 research outputs found
Review of the mathematical foundations of data fusion techniques in surface metrology
The recent proliferation of engineered surfaces, including freeform and structured surfaces, is challenging current metrology techniques. Measurement using multiple sensors has been proposed to achieve enhanced benefits, mainly in terms of spatial frequency bandwidth, which a single sensor cannot provide. When using data from different sensors, a process of data fusion is required and there is much active research in this area. In this paper, current data fusion methods and applications are reviewed, with a focus on the mathematical foundations of the subject. Common research questions in the fusion of surface metrology data are raised and potential fusion algorithms are discussed
Reconstruction Algorithms in Undersampled AFM Imaging
This software was used for producing the simulation results for the paper "Reconstruction Algorithms in Undersampled AFM
Imaging", published in IEEE Journal of Selected Topics in Signal Processing: http://dx.doi.org/10.1109/JSTSP.2015.2500363.
This deposition consists of a number of Python scripts, some of which were used for producing the results in the accompanying data set available at http://dx.doi.org/10.5281/zenodo.32958 and some of which can be used to extract data and images from said data set. The deposition further contains a README file explaining the purpose and use of the individual files as well as MD5 and SHA checksums of the files for validating the integrity of the files after download.
The scripts are licensed under the BSD 2-Clause license (http://opensource.org/licenses/BSD-2-Clause).
The scripts perform and analyse results from simulations using images, and reconstructed versions of these, originally published in the data set available at http://dx.doi.org/10.5281/zenodo.17573
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Single atom imaging with time-resolved electron microscopy
Developments in scanning transmission electron microscopy (STEM) have opened
up new possibilities for time-resolved imaging at the atomic scale. However, rapid
imaging of single atom dynamics brings with it a new set of challenges, particularly
regarding noise and the interaction between the electron beam and the specimen. This
thesis develops a set of analytical tools for capturing atomic motion and analyzing the
dynamic behaviour of materials at the atomic scale.
Machine learning is increasingly playing an important role in the analysis of electron
microscopy data. In this light, new unsupervised learning tools are developed here for
noise removal under low-dose imaging conditions and for identifying the motion of
surface atoms. The scope for real-time processing and analysis is also explored, which is
of rising importance as electron microscopy datasets grow in size and complexity.
These advances in image processing and analysis are combined with computational
modelling to uncover new chemical and physical insights into the motion of atoms
adsorbed onto surfaces. Of particular interest are systems for heterogeneous catalysis,
where the catalytic activity can depend intimately on the atomic environment. The
study of Cu atoms on a graphene oxide support reveals that the atoms undergo
anomalous diffusion as a result of spatial and energetic disorder present in the substrate.
The investigation is extended to examine the structure and stability of small Cu clusters
on graphene oxide, with atomistic modelling used to understand the significant role
played by the substrate. Finally, the analytical methods are used to study the surface
reconstruction of silicon alongside the electron beam-induced motion of adatoms on
the surface.
Taken together, these studies demonstrate the materials insights that can be obtained
with time-resolved STEM imaging, and highlight the importance of combining state-ofthe-
art imaging with computational analysis and atomistic modelling to quantitatively
characterize the behaviour of materials with atomic resolution.The research leading to these results has received funding from the European Research Council under the European Union's Seventh Framework Programme (FP7/2007â2013)/ERC grant agreement 291522â3DIMAGE, as well as from the European Union Seventh Framework Programme under Grant Agreement 312483-ESTEEM2 (Integrated Infrastructure Initiative -I3)
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Mathematical Challenges in Electron Microscopy
Development of electron microscopes first started nearly 100 years ago and they are now a mature imaging modality with many applications and vast potential for the future. The principal feature of electron microscopes is their resolution; they can be up to 1000 times more powerful than a visible light microscope and resolve even the smallest atoms. Furthermore, electron microscopes are also sensitive to many material properties due to the very rich interactions between electrons and other matter. Because of these capabilities, electron microscopy is used in applications as diverse as drug discovery, computer chip manufacture, and the development of solar cells.
In parallel to this, the mathematical field of inverse problems has also evolved dramatically. Many new methods have been introduced to improve the recovery of unknown structures from indirect data, typically an ill-posed problem. In particular, sparsity promoting functionals such as the total variation and its extensions have been shown to be very powerful for recovering accurate physical quantities from very little and/or poor quality data. While sparsity-promoting reconstruction methods are powerful, they can also be slow, especially in a big-data setting. This trade-off forms an eternal cycle as new numerical tools are found and more powerful models are developed.
The work presented in this thesis aims to marry the tools of inverse problems with the problems of electron microscopy: bringing state-of-the-art image processing techniques to bear on challenges specific to electron microscopy, developing new optimisation methods for these problems, and modelling new inverse problems to extend the capabilities of existing microscopes. One focus is the application of a directional total variation to overcome the limited angle problem in electron tomography, another is the proposal of a new inverse problem for the reconstruction of 3D strain tensor fields from electron microscopy diffraction data. The remaining contributions target numerical aspects of inverse problems, from new algorithms for non-convex problems to convex optimisation with adaptive meshes.Cantab Capital Institute for Mathematics of Informatio
3D exemplar-based image inpainting in electron microscopy
In electron microscopy (EM) a common problem is the non-availability of data, which causes artefacts in reconstructions. In this thesis the goal is to generate artificial data where missing in EM by using exemplar-based inpainting (EBI). We implement an accelerated 3D version tailored to applications in EM, which reduces reconstruction times from days to minutes. We develop intelligent sampling strategies to find optimal data as input for reconstruction methods. Further, we investigate approaches to reduce electron dose and acquisition time. Sparse sampling followed by inpainting is the most promising approach. As common evaluation measures may lead to misinterpretation of results in EM and falsify a subsequent analysis, we propose to use application driven metrics and demonstrate this in a segmentation task. A further application of our technique is the artificial generation of projections in tiltbased EM. EBI is used to generate missing projections, such that the full angular range is covered. Subsequent reconstructions are significantly enhanced in terms of resolution, which facilitates further analysis of samples. In conclusion, EBI proves promising when used as an additional data generation step to tackle the non-availability of data in EM, which is evaluated in selected applications. Enhancing adaptive sampling methods and refining EBI, especially considering the mutual influence, promotes higher throughput in EM using less electron dose while not lessening quality.Ein hĂ€ufig vorkommendes Problem in der Elektronenmikroskopie (EM) ist die NichtverfĂŒgbarkeit von Daten, was zu Artefakten in Rekonstruktionen fĂŒhrt. In dieser Arbeit ist es das Ziel fehlende Daten in der EM kĂŒnstlich zu erzeugen, was durch Exemplar-basiertes Inpainting (EBI) realisiert wird. Wir implementieren eine auf EM zugeschnittene beschleunigte 3D Version, welche es ermöglicht, Rekonstruktionszeiten von Tagen auf Minuten zu reduzieren. Wir entwickeln intelligente Abtaststrategien, um optimale Datenpunkte fĂŒr die Rekonstruktion zu erhalten. AnsĂ€tze zur Reduzierung von Elektronendosis und Aufnahmezeit werden untersucht. Unterabtastung gefolgt von Inpainting fĂŒhrt zu den besten Resultaten. EvaluationsmaĂe zur Beurteilung der RekonstruktionsqualitĂ€t helfen in der EM oft nicht und können zu falschen SchlĂŒssen fĂŒhren, weswegen anwendungsbasierte Metriken die bessere Wahl darstellen. Dies demonstrieren wir anhand eines Beispiels. Die kĂŒnstliche Erzeugung von Projektionen in der neigungsbasierten Elektronentomographie ist eine weitere Anwendung. EBI wird verwendet um fehlende Projektionen zu generieren. Daraus resultierende Rekonstruktionen weisen eine deutlich erhöhte Auflösung auf. EBI ist ein vielversprechender Ansatz, um nicht verfĂŒgbare Daten in der EM zu generieren. Dies wird auf Basis verschiedener Anwendungen gezeigt und evaluiert. Adaptive Aufnahmestrategien und EBI können also zu einem höheren Durchsatz in der EM fĂŒhren, ohne die BildqualitĂ€t merklich zu verschlechtern
Topics on Multiresolution Signal Processing and Bayesian Modeling with Applications in Bioinformatics
Analysis of multi-resolution signals and time-series data has wide applications in biology, medicine, engineering, etc. In many cases, the large-scale (low-frequency) features of a signal including basic descriptive statistics, trends, smoothed functional estimates, do not carry useful information about the phenomenon of interest. On the other hand, the study of small-scale (high-frequency) features that look like noise may be more informative even though extracting such informative features are not always straightforward. In this dissertation we try to address some of the issues pertaining to high-frequency features extraction and denoising of noisy signals. Another topic studied in this dissertation is focused on the integration of genome data with transatlantic voyage data of enslaved people from Africa to determine the ancestry origin of Afro-Americans.
Chapter 2. Assessment of Scaling by Auto-Correlation Shells. In this chapter, we utilize the Auto-Correlation (AC) Shell to propose a feature extraction method that can effectively capture small-scale information of a signal. The AC Shell is a redundant shift-invariant and symmetric representation of the signal that is obtained by using
Auto-Correlation function of compactly supported wavelets. The small-scale features are extracted by computing the energy of AC Shell coefficients at different levels of decomposition as well as the slope of the line fitted to these energy values using AC Shell spectra. We discuss the theoretical properties and verify them using extensive simulations. We compare the extracted features from AC Shell with those of Wavelets in terms of bias, variance, and mean square error (MSE). The results indicate that the AC Shell features tend to have smaller variance, hence more reliable. Moreover, to show its effectiveness, we validate our feature extraction method in the context of classification to identify patients with ovarian cancer through the analysis of their blood mass spectrum. For this study, we use the features extracted by AC Shell spectra along with a support vector machine classifier to distinguish control from cancer cases.
Chapter 3. Bayesian Binary Regressions in Wavelet-based Function Estimation. Wavelet shrinkage has been widely used in nonparametric statistics and signal processing for a variety of purposes including denoising noisy signals and images, dimension reduction, and variable/feature selection. Although the traditional wavelet shrinkage methods are effective and popular, they have one major drawback. In these methods the shrinkage process only relies on the information of the coefficient being thresholded and the information contained in the neighboring coefficients is ignored. Similarly, the standard AC Shell denoising methods shrink the empirical coefficients independently, by comparing their magnitudes with a threshold value. The information of other coefficients has no influence on behavior of a particular coefficients. However, due to redundant representation of signals and coefficients obtained by AC Shells, the dependency of neighboring coefficients and the amount of shared information between them increases. Therefore, it would be vital to propose a new thresholding approach for AC Shells coefficients that considers the information of neighboring coefficients. In this chapter, we develop a new Bayesian denoising for AC Shell coefficients approach that integrates logistic regression, universal thresholding and Bayesian inference. We validate the proposed method using extensive simulations with various types of smooth and non-smooth signals. The results indicate that for all signal types including the neighbor coefficients would improve the denoising process, resulting in lower MSEs. Moreover, we applied our proposed methodology to a case study of denoising Atomic Force Microscopy (AFM) signals measuring the adhesion strength between two materials at the nano-newton scale to correctly identify the cantilever detachment point.
Chapter 4. Bayesian Method in Combining Genetic and Historical Records of Transatlantic Slave Trade in the Americas. In the era between 1515 and 1865, more than 12 million people were enslaved and forced to move from Africa to North and Latin America. The shipping documents have recorded the origin and disembarkation of enslaved people. Traditionally, genealogy study has been done via the exploration of historical records, family tress and birth certificates. Due to recent advancements in the field of genetics, genealogy has been revolutionized and become more accurate. Although these methods can provide continental differentiation, they have poor spatial resolution that makes it hard to localize ancestry assignment as these markers are distributed across different sub-continental regions. To overcome the foregoing drawbacks, in this chapter, we propose a hybrid approach that combines the genetic markers results with the historical records of transatlantic voyage of enslaved people. Addition of the journey data can provide with substantially increased resolution in ancestry assignment, using a Bayesian modeling framework. The proposed Bayesian framework uses the voyage data from historical records available in the transatlantic slave trade database as prior probabilities and combine them with genetic markers of Afro-Americans, considered as the likelihood information to estimate the posterior (updated) probabilities of their ancestry assignments to geographical regions in Africa. We applied the proposed methodology to 60 Afro-American individuals and show that the prior information has increased the assignment probabilities obtained by the posterior distributions for some of the regions.Ph.D
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