PVT-Robust CMOS Programmable Chaotic Oscillator: Synchronization of Two 7-Scroll Attractors

Designing chaotic oscillators using complementary metal-oxide-semiconductor (CMOS) integrated circuit technology for generating multi-scroll attractors has been a challenge. That way, we introduce a current-mode piecewise-linear (PWL) function based on CMOS cells that allow programmable generation of 2–7-scroll chaotic attractors. The mathematical model of the chaotic oscillator designed herein has four coefficients and a PWL function, which can be varied to provide a high value of the maximum Lyapunov exponent. The coefficients are implemented electronically by designing operational transconductance amplifiers that allow programmability of their transconductances. Design simulations of the chaotic oscillator are provided for the 0.35μ m CMOS technology. Post-layout and process–voltage–temperature (PVT) variation simulations demonstrate robustness of the multi-scroll chaotic attractors. Finally, we highlight the synchronization of two seven-scroll attractors in a master–slave topology by generalized Hamiltonian forms and observer approach. Simulation results show that the synchronized CMOS chaotic oscillators are robust to PVT variations and are suitable for chaotic secure communication applications.Universidad Autónoma de Tlaxcala CACyPI-UATx-2017Program to Strengthen Quality in Educational Institutions C/PFCE-2016-29MSU0013Y-07-23National Council for Science and Technology 237991 22284

A fully CMOS true random number generator based on hidden attractor hyperchaotic system

Low-power devices used in Internet-of-things networks have been short of security due to the high power consumption of random number generators. This paper presents a low-power hyperchaos-based true random number generator, which is highly recommended for secure communications. The proposed system, which is based on a four-dimensional chaotic system with hidden attractors and oscillators, exhibits rich dynamics. Numerical analysis is provided to verify the dynamic characteristics of the proposed system. A fully customized circuit is deployed using 130 nm CMOS technology to enable integration into low-power devices. Four output signals are used to seed a SHIFT-XOR-based chaotic data post-processing to generate random bit output. The chip prototype was simulated and tested at 100 MHz sampling frequency. The hyperchaotic circuit consumes a maximum of 980 μ W in generating chaotic signals while dissipates a static current of 623 μ A. Moreover, the proposed system provides ready-to-use binary random bit sequences which have passed the well-known statistical randomness test suite NIST SP800-22. The proposed novel system design and its circuit implementation provide a best energy efficiency of 4.37 pJ/b at a maximum sampling frequency of 100 MHz

Design and implementation of a multi-modal sensor with on-chip security

With the advancement of technology, wearable devices for fitness tracking, patient monitoring, diagnosis, and disease prevention are finding ways to be woven into modern world reality. CMOS sensors are known to be compact, with low power consumption, making them an inseparable part of wireless medical applications and Internet of Things (IoT). Digital/semi-digital output, by the translation of transmitting data into the frequency domain, takes advantages of both the analog and digital world. However, one of the most critical measures of communication, security, is ignored and not considered for fabrication of an integrated chip. With the advancement of Moore\u27s law and the possibility of having a higher number of transistors and more complex circuits, the feasibility of having on-chip security measures is drawing more attention. One of the fundamental means of secure communication is real-time encryption. Encryption/ciphering occurs when we encode a signal or data, and prevents unauthorized parties from reading or understanding this information. Encryption is the process of transmitting sensitive data securely and with privacy. This measure of security is essential since in biomedical devices, the attacker/hacker can endanger users of IoT or wearable sensors (e.g. attacks at implanted biosensors can cause fatal harm to the user). This work develops 1) A low power and compact multi-modal sensor that can measure temperature and impedance with a quasi-digital output and 2) a low power on-chip signal cipher for real-time data transfer

A fully CMOS true random number generator based on hidden attractor hyperchaotic system

AbstractLow-power devices used in Internet-of-things networks have been short of security due to the high power consumption of random number generators. This paper presents a low-power hyperchaos-based true random number generator, which is highly recommended for secure communications. The proposed system, which is based on a four-dimensional chaotic system with hidden attractors and oscillators, exhibits rich dynamics. Numerical analysis is provided to verify the dynamic characteristics of the proposed system. A fully customized circuit is deployed using 130 nm CMOS technology to enable integration into low-power devices. Four output signals are used to seed a SHIFT-XOR-based chaotic data post-processing to generate random bit output. The chip prototype was simulated and tested at 100 MHz sampling frequency. The hyperchaotic circuit consumes a maximum of 980 \upmu μ W in generating chaotic signals while dissipates a static current of 623 \upmu μ A. Moreover, the proposed system provides ready-to-use binary random bit sequences which have passed the well-known statistical randomness test suite NIST SP800-22. The proposed novel system design and its circuit implementation provide a best energy efficiency of 4.37 pJ/b at a maximum sampling frequency of 100 MHz

Design, simulation and fabrication of 4H-SiC Power MOSFETs

For a 4H-SiC MOSFET to compete with Si counterparts, especially at lower voltages (1.2kV), the channel resistance contributes to a significant part in the total on-state resistance which must be addressed. Since most of the commercially available SiC wafer materials are grown on the {0001} crystal plane, a trench-gate MOSFET is necessary to take the advantage of the higher reported channel mobility on the {112 ̅ 0} crystal plane. 1.2kV trench MOSFET design and fabrication is the main focus in this work. The micro-trench free dry etching process has first been developed with a systematic study on the dry etching parameters. Trench corner rounding has also been investigated since a rounded corner is normally preferred to avoid an electric field hot spot. Two generations of trench MOSFETs have been designed and fabricated. The 1st generation devices have been used to validate the fabrication process. A maximum breakdown voltage of 1600V has been achieved for the 1st generation devices. The p+ trench bottom shielding region provides the protection for the trench gate oxide since it shifts the peak electric field from the oxide/semiconductor interface to a semiconductor p-n junction; however, it also introduces a parasitic JFET region into the trench MOSFET structure which severely degraded the on-state performance of the 1st generation devices. The 2nd generation devices were designed to eliminate the effect of the parasitic JFET region and improve the on-state performance. The optimised device structure with a current spreading layer (CSL) and p+ implantation clearance in the 2nd generation design has successfully eliminated the effect of the parasitic JFET region. Further design and process optimisation is necessary to increase the current density of the device which was as low as 3A/cm2. A fabrication trial has been carried out on the MOSFETs with integrated Schottky contacts at the termination region and therefore, external Schottky diodes are not necessary for many applications. A 10kV DMOSFET has also been designed and fabricated with maximum breakdown voltage at 13.6kV. The high voltage termination design options have been discussed among the floating field ring (FFR) termination and the junction termination extensions (JTEs). The on-state performance is poor due to a photo mask error on the JFET length which needs to be optimised for the next generation devices. Novel device structures have been studied with simulation. These include trench MOSFET with integrated Schottky diode and 3.3kV superjunction trench MOSFET. The MOSFET with integrated Schottky diode not only reduces the chip area consumption, but also reduces the chip count in the system level. In the proposed design, the Schottky contact is placed at the bottom of the trench structure for the first time. The superjunction structure has a great potential for SiC devices rated at above 3.3kV. The proposed design uses implanted p-pillar with a trench gate structure which combines the benefits of low channel resistance and low drift region resistance

Development of an Encrypted Wireless System for Body Sensor Network Applications

Wireless body area networks (WBAN), also called wireless body sensor networks (WBSN), consist of a collection of wireless sensor nodes used to monitor and assess various human physiological conditions, which can then be used by healthcare professionals to help them make important healthcare decisions. They can be used to prevent disease, help diagnosis a disease, or manage the symptoms of a disease. An extremely important aspect of WBAN is security to protect a patient\u27s healthcare information, as a hacker could potentially cause fatal harm. Current security measures are implemented in software at the MAC layer and higher, not in the physical layer. Previous research demonstrated a chaotic encryption cipher to add a layer of security in the physical layer. This cipher exploits different properties of the Lorenz chaotic system to encrypt and decrypt digital data. Decryption involved synchronizing two chaotic signals to recover original data by sharing a state between the transmitter and receiver. In this thesis, we further develop the encryption system by implementing wireless capabilities. We use two approaches: the first by using commercially available wireless microcontrollers that communicate using Bluetooth Low Energy, and the second by the design and fabrication of a dual-band low noise amplifier (LNA) that can be used in a receiver for WBANs collecting data from implantable and on-the-body sensors. For the first approach, a custom Bluetooth Low Energy profile was created for streaming the analog encrypted signal, and signal processing was done at the receiver side. For the second approach, the LNA operates at the Medical Implant Communication System (MICS) band and the 915 MHz Industrial, Scientific, and Medical (ISM) band simultaneously through dual-band input and output matching networks

Intégration 3D de dispositifs SET dans le Back-End-Of-Line en technologies CMOS 28 nm pour le développement de capteurs ultra basse consommation

La forte demande et le besoin d’intégration hétérogène de nouvelles fonctionnalités dans les systèmes mobiles et autonomes, tels que les mémoires, capteurs, et interfaces de communication doit prendre en compte les problématiques d’hétérogénéité, de consommation d’énergie et de dissipation de chaleur. Les systèmes mobiles intelligents sont déjà dotés de plusieurs composants de type capteur comme les accéléromètres, les thermomètres et les détecteurs infrarouge. Cependant, jusqu’à aujourd’hui l’intégration de capteurs chimiques dans des systèmes compacts sur puce reste limitée pour des raisons de consommation d’énergie et dissipation de chaleur principalement. La technologie actuelle et fiable des capteurs de gaz, les résistors à base d’oxyde métallique et les MOSFETs (Metal Oxide Semiconductor- Field Effect Transistors) catalytiques sont opérés à de hautes températures de 200–500 °C et 140–200 °C, respectivement. Les transistors à effet de champ à grille suspendu (SG-FETs pour Suspended Gate-Field Effect Transistors) offrent l’avantage d’être sensibles aux molécules gazeuses adsorbées aussi bien par chemisorption que par physisorption, et sont opérés à température ambiante ou légèrement au-dessus. Cependant l’intégration de ce type de composant est problématique due au besoin d’implémenter une grille suspendue et l’élargissement de la largeur du canal pour compenser la détérioration de la transconductance due à la faible capacité à travers le gap d’air. Les transistors à double grilles sont d’un grand intérêt pour les applications de détection de gaz, car une des deux grilles est fonctionnalisée et permet de coupler capacitivement au canal les charges induites par l’adsorption des molécules gazeuses cibles, et l’autre grille est utilisée pour le contrôle du point d’opération du transistor sans avoir besoin d’une structure suspendue. Les transistors monoélectroniques (les SETs pour Single Electron Transistors) présentent une solution très prometteuse grâce à leur faible puissance liée à leur principe de fonctionnement basé sur le transport d’un nombre réduit d’électrons et leur faible niveau de courant. Le travail présenté dans cette thèse fut donc concentré sur la démonstration de l’intégration 3D monolithique de SETs sur un substrat de technologie CMOS (Complementary Metal Oxide Semiconductor) pour la réalisation de la fonction capteurs de gaz très sensible et ultra basse consommation d’énergie. L’approche proposée consiste à l’intégration de SETs métalliques à double grilles dans l’unité de fabrication finale BEOL (Back-End-Of-Line) d’une technologie CMOS à l’aide du procédé nanodamascene. Le système sur puce profitera de la très élevée sensibilité à la charge électrique du transistor monoélectronique, ainsi que le traitement de signal et des données à haute vitesse en utilisant une technologie de pointe CMOS disponible. Les MOSFETs issus de la technologie FD-SOI (Fully Depleted-Silicon On Insulator) sont une solution très attractive à cause de leur pouvoir d’amplification du signal quand ils sont opérés dans le régime sous-le-seuil. Ces dispositifs permettent une très haute densité d’intégration due à leurs dimensions nanométriques et sont une technologie bien mature et modélisée. Ce travail se concentre sur le développement d’un procédé de fonctionnalisation d’un MOSFET FD-SOI comme démonstration du concept du capteur de gaz à base de transistor à double grilles. La sonde Kelvin a été la technique privilégiée pour la caractérisation des matériaux sensibles par le biais de mesure de la variation du travail de sortie induite par l’adsorption de molécules de gaz. Dans ce travail, une technique de caractérisation des matériaux sensibles alternative basée sur la mesure de la charge de surface est discutée. Pour augmenter la surface spécifique de l’électrode sensible, un nouveau concept de texturation de surface est présenté. Le procédé est basé sur le dépôt de réseaux de nanotubes de carbone multi-parois par pulvérisation d’une suspension de ces nanotubes. Les réseaux déposés servent de «squelettes» pour le matériau sensible. L’objectif principal de cette thèse de doctorat peut être divisé en 4 parties : (1) la modélisation et simulation de la réponse d’un capteur de gaz à base de SET à double grilles ou d’un MOSFET FD-SOI, et l’estimation de la sensibilité ainsi que la puissance consommée; (2) la caractérisation de la sensibilité du Pt comme couche sensible pour la détection du H[indice inférieur 2] par la technique de mesure de charge de surface, et le développement du procédé de texturation de surface de la grille fonctionnalisée avec les réseaux de nanotubes de carbone; (3) le développement et l’optimisation du procédé de fabrication des SETs à double grilles dans l’entité BEOL d’un substrat CMOS; et (4) la fonctionnalisation d’un MOSFET FD-SOI avec du Pt pour réaliser la fonction de capteur de H[indice inférieur 2].Abstract : The need of integration of new functionalities on mobile and autonomous electronic systems has to take into account all the problematic of heterogeneity together with energy consumption and thermal dissipation. In this context, all the sensing or memory components added to the CMOS (Complementary Metal Oxide Semiconductor) processing units have to respect drastic supply energy requirements. Smart mobile systems already incorporate a large number of embedded sensing components such as accelerometers, temperature sensors and infrared detectors. However, up to now, chemical sensors have not been fully integrated in compact systems on chips. Integration of gas sensors is limited since most used and reliable gas sensors, semiconducting metal oxide resistors and catalytic metal oxide semiconductor- field effect transistors (MOSFETs), are generally operated at high temperatures, 200–500 °C and 140–200° C, respectively. The suspended gate-field effect transistor (SG-FET)-based gas sensors offer advantages of detecting chemisorbed, as well as physisorbed gas molecules and to operate at room temperature or slightly above it. However they present integration limitations due to the implementation of a suspended gate electrode and augmented channel width in order to overcome poor transconductance due to the very low capacitance across the airgap. Double gate-transistors are of great interest for FET-based gas sensing since one functionalized gate would be dedicated for capacitively coupling of gas induced charges and the other one is used to bias the transistor, without need of airgap structure. This work discusses the integration of double gate-transistors with CMOS devices for highly sensitive and ultra-low power gas sensing applications. The use of single electron transistors (SETs) is of great interest for gas sensing applications because of their key properties, which are its ultra-high charge sensitivity and the ultra-low power consumption and dissipation, inherent to the fundamental of their operation based on the transport of a reduced number of charges. Therefore, the work presented in this thesis is focused on the proof of concept of 3D monolithic integration of SETs on CMOS technology for high sensitivity and ultra-low power gas sensing functionality. The proposed approach is to integrate metallic double gate-single electron transistors (DG-SETs) in the Back-End-Of-Line (BEOL) of CMOS circuits (within the CMOS interconnect layers) using the nanodamascene process. We take advantage of the hyper sensitivity of the SET to electric charges as well from CMOS circuits for high-speed signal processing. Fully depleted-silicon on insulator (FD-SOI) MOSFETs are very attractive devices for gas sensing due to their amplification capability when operated in the sub-threshold regime which is the strongest asset of these devices with respect to the FET-based gas sensor technology. In addition these devices are of a high interest in terms of integration density due to their small size. Moreover FD-SOI FETs is a mature and well-modelled technology. We focus on the functionalization of the front gate of a FD-SOI MOSFET as a demonstration of the DGtransistor- based gas sensor. Kelvin probe has been the privileged technique for the investigation of FET-based gas sensors’ sensitive material via measuring the work function variation induced by gas species adsorption. In this work an alternative technique to investigate gas sensitivity of materials suitable for implementation in DG-FET-based gas sensors, based on measurement of the surface charge induced by gas species adsorption is discussed. In order to increase the specific surface of the sensing electrode, a novel concept of functionalized gate surface texturing suitable for FET-based gas sensors are presented. It is based on the spray coating of a multi-walled-carbon nanotubes (MW-CNTs) suspension to deposit a MW-CNT porous network as a conducting frame for the sensing material. The main objective of this Ph.D. thesis can be divided into 4 parts: (1) modelling and simulation of a DG-SET and a FD-SOI MOSFET-based gas sensor response, and estimation of the sensitivity as well as the power consumption; (2) investigation of Pt sensitivity to hydrogen by surface charge measurement technique and development of the sensing electrode surface texturing process with CNT networks; (3) development and optimization of the DG-SET integration process in the BEOL of a CMOS substrate, and (4) FD-SOI MOSFET functionalization with Pt for H[subscript 2] sensing

GridSLAM on the RAPTOR autonomous vehicle

This thesis develops and applies GridSLAM on a small autonomous car-like vehicle for indoor environments. GridSLAM uses a particle filter to generate a discretized 2D occupancy map. This GridSLAM implementation uses sparse, shared, and lazy data structures to reduce memory usage and computation requirements

Development of a fault tolerant MOS field effect power semiconductor switching transistor

This work describes the development of a semiconductor switch to replace an electromechanical contactor as used within the electrical power distribution system of the More Electric Aircraft (MEA; a project begun in the 1990‟s by the United States Air Force). The MEA is safety critical and therefore requires highest reliability components and systems, but subsequent to a short circuit load fault the electro-mechanical contactor switch often welds shut. This risk is increased when using high discharge energy lithium ion dc batteries. Predominately the semiconductor switch controls inductive loads and is required to safely turn off current of up to 10 times the nominal level during sporadic load fault events. The switch requires the lowest static loss (lowest on state resistance), but also the lowest dynamic loss (losses due to the switching event). Presently, unipolar devices provide the lowest dynamic loss, but bipolar devices provide the lowest static loss. One possible solution is use of a Metal Oxide Semiconductor Field Effect Transistor (MOSFET), the area of which is sized to suit the fault current, but at relatively high cost in terms of silicon area. The resultant area is typically achieved by several die connected in parallel, unfortunately, such a solution suffers from current share imbalance and the potential of cascade die failure. The use of a parallel combination of unipolar and bipolar device types (MOSFET and Insulated Gate Bipolar Transistors, IGBTs) to form a hybrid appears to offer the potential to reduce the silicon area, and static loss, whilst reducing the impact of the increased dynamic losses of the IGBT. Unfortunately, this goal requires optimised gate timing of the resultant hybrid which proves challenging if the load current is to be shared appropriately during fault switching in order to prevent failure. Some form of single MOS (Metal Oxide Semiconductor) gated integrated hybrid device with self biased bipolar injection is therefore required to ensure highest reliability through a non latching design which offers lowest losses under all conditions and achieves an even temperature distribution. In this work the novel concept of the integrated hybrid device has been investigated at a low Blocking Voltage (BV) rating of 100 V, using computer simulation. The three terminal hybrid silicon DMOS (Double diffused Metal Oxide Semiconductor) device utilises a novel merged Schottky p-type injector to provide self biased entry into a reduced static loss bipolar state in the event of high fault current. The device achieves a specific on state resistance, R(ON,SP) = 1.16 mΩcm2 in bipolar mode (with BV=84 V), that is below the silicon limit line and requires half the area of a traditional unipolar MOSFET to conduct fault current. During comparative standard unclamped inductive switching trials, the hybrid device provides a self clamping action which enables increased inductive energy switching (higher inductance and/or higher load current), relative to that achieved by either the MOSFET or IGBT. The hybrid conducting in bipolar mode switches an inductive load off much faster than that typically achieved by an IGBT (toff =20 ns, in comparison to typically >10 μs for an IGBT). This results in a low turn off energy for the hybrid (1.26*10-4 J/cm2) as compared to that of the IGBT (8.72*10-3 J/cm2). The hybrid dynamic performance is enhanced by the action of the merged Schottky contact which, unlike the IGBT, acts to limit the emitter base voltage (VEB) of the internal PNP Bipolar Junction Transistor, BJT (the integral PNP BJT is otherwise a shared feature with the IGBT). The self biased bipolar activation is achieved at a forward bias (VAK) =1.3 V at temperature (T)= 300 K. The device is latch up free across the operational temperature range of T=233 K to 400 K. A viable charge balanced structure to increase the BV rating to approximately 600 V is also proposed. The resulting performance of the single gated, self biased, hybrid, utilising a novel merged Schottky/P type injector, could lead to a new class of rugged MOS gated power switching devices in silicon and potentially silicon carbide