CAMP: A technique to estimate per-structure power at run-time using a few simple parameters

Microprocessor power has become a first-order constraint at run-time. Designers must employ aggressive power-management techniques at run-time to keep a processor’s ballooning power requirements under control. Effective power management benefits from knowledge of run-time microprocessor power consumption in both the core and individual microarchitectural structures, such as caches, queues, and execution units. Increasingly feasible per-structure power-control techniques, such as fine-grain clock gat-ing, power gating, and dynamic voltage/frequency scaling (DVFS), become more effective from run-time estimates of per-structure power. However, run-time computation of per-structure power esti-mates based on utilization requires daunting numbers of input sta-tistics, which makes per-structure monitoring of run-time power a challenging problem

The Fifth NASA Symposium on VLSI Design

The fifth annual NASA Symposium on VLSI Design had 13 sessions including Radiation Effects, Architectures, Mixed Signal, Design Techniques, Fault Testing, Synthesis, Signal Processing, and other Featured Presentations. The symposium provides insights into developments in VLSI and digital systems which can be used to increase data systems performance. The presentations share insights into next generation advances that will serve as a basis for future VLSI design

Intelligent Circuits and Systems

ICICS-2020 is the third conference initiated by the School of Electronics and Electrical Engineering at Lovely Professional University that explored recent innovations of researchers working for the development of smart and green technologies in the fields of Energy, Electronics, Communications, Computers, and Control. ICICS provides innovators to identify new opportunities for the social and economic benefits of society.　 This conference bridges the gap between academics and R&D institutions, social visionaries, and experts from all strata of society to present their ongoing research activities and foster research relations between them. It provides opportunities for the exchange of new ideas, applications, and experiences in the field of smart technologies and finding global partners for future collaboration. The ICICS-2020 was conducted in two broad categories, Intelligent Circuits & Intelligent Systems and Emerging Technologies in Electrical Engineering

An indirect current sensing technique for IDDQ and IDDT tests

An indirect current sensing technique for IDDQ and I DDT tests is proposed in this paper. This is accomplished by utilizing the pervasive on-chip voltage regulators and thus have little or no impact on CUT\u27s design and its performance. We demonstrate that the proposed technique can be applied to both IDDQ and IDDT tests. Experiments were successfully conducted in SPICE simulations assuming the TSMC 0.18μm CMOS technology. Copyright 2006 ACM