372,012 research outputs found

    Stitching IC Images

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    Image stitching software is used in many areas such as photogrammetry, biomedical imaging, and even amateur digital photography. However, these algorithms require relatively large image overlap, and for this reason they cannot be used to stitch the integrated circuit (IC) images, whose overlap is typically less than 60 pixels for a 4096 by 4096 pixel image. In this paper, we begin by using algorithmic graph theory to study optimal patterns for adding IC images one at a time to a grid. In the remaining sections we study ways of stitching all the images simultaneously using different optimisation approaches: least squares methods, simulated annealing, and nonlinear programming

    On applying the set covering model to reseeding

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    The Functional BIST approach is a rather new BIST technique based on exploiting embedded system functionality to generate deterministic test patterns during BIST. The approach takes advantages of two well-known testing techniques, the arithmetic BIST approach and the reseeding method. The main contribution of the present paper consists in formulating the problem of an optimal reseeding computation as an instance of the set covering problem. The proposed approach guarantees high flexibility, is applicable to different functional modules, and, in general, provides a more efficient test set encoding then previous techniques. In addition, the approach shorts the computation time and allows to better exploiting the tradeoff between area overhead and global test length as well as to deal with larger circuits

    Hashing with binary autoencoders

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    An attractive approach for fast search in image databases is binary hashing, where each high-dimensional, real-valued image is mapped onto a low-dimensional, binary vector and the search is done in this binary space. Finding the optimal hash function is difficult because it involves binary constraints, and most approaches approximate the optimization by relaxing the constraints and then binarizing the result. Here, we focus on the binary autoencoder model, which seeks to reconstruct an image from the binary code produced by the hash function. We show that the optimization can be simplified with the method of auxiliary coordinates. This reformulates the optimization as alternating two easier steps: one that learns the encoder and decoder separately, and one that optimizes the code for each image. Image retrieval experiments, using precision/recall and a measure of code utilization, show the resulting hash function outperforms or is competitive with state-of-the-art methods for binary hashing.Comment: 22 pages, 11 figure

    Bin Packing and Related Problems: General Arc-flow Formulation with Graph Compression

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    We present an exact method, based on an arc-flow formulation with side constraints, for solving bin packing and cutting stock problems --- including multi-constraint variants --- by simply representing all the patterns in a very compact graph. Our method includes a graph compression algorithm that usually reduces the size of the underlying graph substantially without weakening the model. As opposed to our method, which provides strong models, conventional models are usually highly symmetric and provide very weak lower bounds. Our formulation is equivalent to Gilmore and Gomory's, thus providing a very strong linear relaxation. However, instead of using column-generation in an iterative process, the method constructs a graph, where paths from the source to the target node represent every valid packing pattern. The same method, without any problem-specific parameterization, was used to solve a large variety of instances from several different cutting and packing problems. In this paper, we deal with vector packing, graph coloring, bin packing, cutting stock, cardinality constrained bin packing, cutting stock with cutting knife limitation, cutting stock with binary patterns, bin packing with conflicts, and cutting stock with binary patterns and forbidden pairs. We report computational results obtained with many benchmark test data sets, all of them showing a large advantage of this formulation with respect to the traditional ones
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