Algorithms for Power Aware Testing of Nanometer Digital ICs

At-speed testing of deep-submicron digital very large scale integrated (VLSI) circuits has become mandatory to catch small delay defects. Now, due to continuous shrinking of complementary metal oxide semiconductor (CMOS) transistor feature size, power density grows geometrically with technology scaling. Additionally, power dissipation inside a digital circuit during the testing phase (for test vectors under all fault models (Potluri, 2015)) is several times higher than its power dissipation during the normal functional phase of operation. Due to this, the currents that flow in the power grid during the testing phase, are much higher than what the power grid is designed for (the functional phase of operation). As a result, during at-speed testing, the supply grid experiences unacceptable supply IR-drop, ultimately leading to delay failures during at-speed testing. Since these failures are specific to testing and do not occur during functional phase of operation of the chip, these failures are usually referred to false failures, and they reduce the yield of the chip, which is undesirable. In nanometer regime, process parameter variations has become a major problem. Due to the variation in signalling delays caused by these variations, it is important to perform at-speed testing even for stuck faults, to reduce the test escapes (McCluskey and Tseng, 2000; Vorisek et al., 2004). In this context, the problem of excessive peak power dissipation causing false failures, that was addressed previously in the context of at-speed transition fault testing (Saxena et al., 2003; Devanathan et al., 2007a,b,c), also becomes prominent in the context of at-speed testing of stuck faults (Maxwell et al., 1996; McCluskey and Tseng, 2000; Vorisek et al., 2004; Prabhu and Abraham, 2012; Potluri, 2015; Potluri et al., 2015). It is well known that excessive supply IR-drop during at-speed testing can be kept under control by minimizing switching activity during testing (Saxena et al., 2003). There is a rich collection of techniques proposed in the past for reduction of peak switching activity during at-speed testing of transition/delay faults ii in both combinational and sequential circuits. As far as at-speed testing of stuck faults are concerned, while there were some techniques proposed in the past for combinational circuits (Girard et al., 1998; Dabholkar et al., 1998), there are no techniques concerning the same for sequential circuits. This thesis addresses this open problem. We propose algorithms for minimization of peak switching activity during at-speed testing of stuck faults in sequential digital circuits under the combinational state preservation scan (CSP-scan) architecture (Potluri, 2015; Potluri et al., 2015). First, we show that, under this CSP-scan architecture, when the test set is completely specified, the peak switching activity during testing can be minimized by solving the Bottleneck Traveling Salesman Problem (BTSP). This mapping of peak test switching activity minimization problem to BTSP is novel, and proposed for the first time in the literature. Usually, as circuit size increases, the percentage of don’t cares in the test set increases. As a result, test vector ordering for any arbitrary filling of don’t care bits is insufficient for producing effective reduction in switching activity during testing of large circuits. Since don’t cares dominate the test sets for larger circuits, don’t care filling plays a crucial role in reducing switching activity during testing. Taking this into consideration, we propose an algorithm, XStat, which is capable of performing test vector ordering while preserving don’t care bits in the test vectors, following which, the don’t cares are filled in an intelligent fashion for minimizing input switching activity, which effectively minimizes switching activity inside the circuit (Girard et al., 1998). Through empirical validation on benchmark circuits, we show that XStat minimizes peak switching activity significantly, during testing. Although XStat is a very powerful heuristic for minimizing peak input-switchingactivity, it will not guarantee optimality. To address this issue, we propose an algorithm that uses Dynamic Programming to calculate the lower bound for a given sequence of test vectors, and subsequently uses a greedy strategy for filling don’t cares in this sequence to achieve this lower bound, thereby guaranteeing optimality. This algorithm, which we refer to as DP-fill in this thesis, provides the globally optimal solution for minimizing peak input-switching-activity and also is the best known in the literature for minimizing peak input-switching-activity during testing. The proof of optimality of DP-fill in minimizing peak input-switching-activity is also provided in this thesis

Synthesis and Optimization of Reversible Circuits - A Survey

Reversible logic circuits have been historically motivated by theoretical research in low-power electronics as well as practical improvement of bit-manipulation transforms in cryptography and computer graphics. Recently, reversible circuits have attracted interest as components of quantum algorithms, as well as in photonic and nano-computing technologies where some switching devices offer no signal gain. Research in generating reversible logic distinguishes between circuit synthesis, post-synthesis optimization, and technology mapping. In this survey, we review algorithmic paradigms --- search-based, cycle-based, transformation-based, and BDD-based --- as well as specific algorithms for reversible synthesis, both exact and heuristic. We conclude the survey by outlining key open challenges in synthesis of reversible and quantum logic, as well as most common misconceptions.Comment: 34 pages, 15 figures, 2 table

Advanced Timing and Synchronization Methodologies for Digital VLSI Integrated Circuits

This dissertation addresses timing and synchronization methodologies that are critical to the design, analysis and optimization of high-performance, integrated digital VLSI systems. As process sizes shrink and design complexities increase, achieving timing closure for digital VLSI circuits becomes a significant bottleneck in the integrated circuit design flow. Circuit designers are motivated to investigate and employ alternative methods to satisfy the timing and physical design performance targets. Such novel methods for the timing and synchronization of complex circuitry are developed in this dissertation and analyzed for performance and applicability.Mainstream integrated circuit design flow is normally tuned for zero clock skew, edge-triggered circuit design. Non-zero clock skew or multi-phase clock synchronization is seldom used because the lack of design automation tools increases the length and cost of the design cycle. For similar reasons, level-sensitive registers have not become an industry standard despite their superior size, speed and power consumption characteristics compared to conventional edge-triggered flip-flops.In this dissertation, novel design and analysis techniques that fully automate the design and analysis of non-zero clock skew circuits are presented. Clock skew scheduling of both edge-triggered and level-sensitive circuits are investigated in order to exploit maximum circuit performances. The effects of multi-phase clocking on non-zero clock skew, level-sensitive circuits are investigated leading to advanced synchronization methodologies. Improvements in the scalability of the computational timing analysis process with clock skew scheduling are explored through partitioning and parallelization.The integration of the proposed design and analysis methods to the physical design flow of integrated circuits synchronized with a next-generation clocking technology-resonant rotary clocking technology-is also presented. Based on the design and analysis methods presented in this dissertation, a computer-aided design tool for the design of rotary clock synchronized integrated circuits is developed

Design Space Re-Engineering for Power Minimization in Modern Embedded Systems

Power minimization is a critical challenge for modern embedded system design. Recently, due to the rapid increase of system's complexity and the power density, there is a growing need for power control techniques at various design levels. Meanwhile, due to technology scaling, leakage power has become a significant part of power dissipation in the CMOS circuits and new techniques are needed to reduce leakage power. As a result, many new power minimization techniques have been proposed such as voltage island, gate sizing, multiple supply and threshold voltage, power gating and input vector control, etc. These design options further enlarge the design space and make it prohibitively expensive to explore for the most energy efficient design solution. Consequently, heuristic algorithms and randomized algorithms are frequently used to explore the design space, seeking sub-optimal solutions to meet the time-to-market requirements. These algorithms are based on the idea of truncating the design space and restricting the search in a subset of the original design space. While this approach can effectively reduce the runtime of searching, it may also exclude high-quality design solutions and cause design quality degradation. When the solution to one problem is used as the base for another problem, such solution quality degradation will accumulate. In modern electronics system design, when several such algorithms are used in series to solve problems in different design levels, the final solution can be far off the optimal one. In my Ph.D. work, I develop a {\em re-engineering} methodology to facilitate exploring the design space of power efficient embedded systems design. The direct goal is to enhance the performance of existing low power techniques. The methodology is based on the idea that design quality can be improved via iterative ``re-shaping'' the design space based on the ``bad'' structure in the obtained design solutions; the searching run-time can be reduced by the guidance from previous exploration. This approach can be described in three phases: (1) apply the existing techniques to obtain a sub-optimal solution; (2) analyze the solution and expand the design space accordingly; and (3) re-apply the technique to re-explore the enlarged design space. We apply this methodology at different levels of embedded system design to minimize power: (i) switching power reduction in sequential logic synthesis; (ii) gate-level static leakage current reduction; (iii) dual threshold voltage CMOS circuits design; and (iv) system-level energy-efficient detection scheme for wireless sensor networks. An extensive amount of experiments have been conducted and the results have shown that this methodology can effectively enhance the power efficiency of the existing embedded system design flows with very little overhead

Reliable chip design from low powered unreliable components

The pace of technological improvement of the semiconductor market is driven by Moore’s Law, enabling chip transistor density to double every two years. The transistors would continue to decline in cost and size but increase in power. The continuous transistor scaling and extremely lower power constraints in modern Very Large Scale Integrated(VLSI) chips can potentially supersede the benefits of the technology shrinking due to reliability issues. As VLSI technology scales into nanoscale regime, fundamental physical limits are approached, and higher levels of variability, performance degradation, and higher rates of manufacturing defects are experienced. Soft errors, which traditionally affected only the memories, are now also resulting in logic circuit reliability degradation. A solution to these limitations is to integrate reliability assessment techniques into the Integrated Circuit(IC) design flow. This thesis investigates four aspects of reliability driven circuit design: a)Reliability estimation; b) Reliability optimization; c) Fault-tolerant techniques, and d) Delay degradation analysis. To guide the reliability driven synthesis and optimization of combinational circuits, highly accurate probability based reliability estimation methodology christened Conditional Probabilistic Error Propagation(CPEP) algorithm is developed to compute the impact of gate failures on the circuit output. CPEP guides the proposed rewriting based logic optimization algorithm employing local transformations. The main idea behind this methodology is to replace parts of the circuit with functionally equivalent but more reliable counterparts chosen from a precomputed subset of Negation-Permutation-Negation(NPN) classes of 4-variable functions. Cut enumeration and Boolean matching driven by reliability-aware optimization algorithm are used to identify the best possible replacement candidates. Experiments on a set of MCNC benchmark circuits and 8051 functional microcontroller units indicate that the proposed framework can achieve up to 75% reduction of output error probability. On average, about 14% SER reduction is obtained at the expense of very low area overhead of 6.57% that results in 13.52% higher power consumption. The next contribution of the research describes a novel methodology to design fault tolerant circuitry by employing the error correction codes known as Codeword Prediction Encoder(CPE). Traditional fault tolerant techniques analyze the circuit reliability issue from a static point of view neglecting the dynamic errors. In the context of communication and storage, the study of novel methods for reliable data transmission under unreliable hardware is an increasing priority. The idea of CPE is adapted from the field of forward error correction for telecommunications focusing on both encoding aspects and error correction capabilities. The proposed Augmented Encoding solution consists of computing an augmented codeword that contains both the codeword to be transmitted on the channel and extra parity bits. A Computer Aided Development(CAD) framework known as CPE simulator is developed providing a unified platform that comprises a novel encoder and fault tolerant LDPC decoders. Experiments on a set of encoders with different coding rates and different decoders indicate that the proposed framework can correct all errors under specific scenarios. On average, about 1000 times improvement in Soft Error Rate(SER) reduction is achieved. Last part of the research is the Inverse Gaussian Distribution(IGD) based delay model applicable to both combinational and sequential elements for sub-powered circuits. The Probability Density Function(PDF) based delay model accurately captures the delay behavior of all the basic gates in the library database. The IGD model employs these necessary parameters, and the delay estimation accuracy is demonstrated by evaluating multiple circuits. Experiments results indicate that the IGD based approach provides a high matching against HSPICE Monte Carlo simulation results, with an average error less than 1.9% and 1.2% for the 8-bit Ripple Carry Adder(RCA), and 8-bit De-Multiplexer(DEMUX) and Multiplexer(MUX) respectively

Efficient Evaluation of Probability and Reliability with Digital Integrated Circuits

As complementary metal–oxide–semiconductor (CMOS) devices shrink to nanoscale, digital integrated circuits (ICs) are more susceptible to various environmental parameters, such as temperature, supply voltage, wiring, noise, and fabrication process variations. This would reduce the circuit operation reliability (i.e., the probability that a circuit or component is performing its intended logic function). Signal probability (the probability that a digital signal is producing logic 1) is another factor that measures circuit’s dynamic behavior and power dissipation. Research shows that signal probability and reliability within ICs may interact with each other in a complicated way. Generally speaking, as signal probability changes due to input probability variations, so does the signal reliability, and vice versa. This motivates simultaneous evaluation of both for digital ICs towards their performance improvement. However, this evaluation could be a challenge especially for large-scale circuits, due to signal correlations caused by reconvergent fanouts within circuits. Out of two existing evaluation methods, i.e., numerical and analytical methods, the former can give high accuracy level at the cost of expensive computation, while the latter does exactly the opposite. This thesis provides a hybrid solution by taking advantage of both numerical and analytical methods to achieve fast and accurate evaluation for signal probability and reliability for ICs (including both combinational and sequential circuits). First, we develop a categorization-based analytical model for combinational circuits to deal with a variety of signal correlations. For strongly correlated or independent cases, analytical solutions are applied for accurate results. For cases with moderate correlation strength, we use local bitstream simulations for fast estimation. Our simulation results show that the proposed method is hundreds of times faster than Monte-Carlo (MC) simulation, while keeping almost same level of accuracy. We then extend the above method to sequential circuits (with finite-state-machine model) for probability and reliability evaluation. Since sequential circuits can be viewed as an unfolded network of combinational logic, our focus is on how both probability and reliability converge to a final stable state over a certain number of cycles/iterations. To improve the efficiency of this convergence process, we propose a two-step-convergence (TSC) model instead of using traditional step-size based convergence. Simulation results show that the proposed method speeds up the process by around 30% on average compared to traditional method while maintaining a high level of accuracy. Finally, we study the impact of device aging on circuit reliability. After years of operation, CMOS (especially PMOS) devices would experience an increase in their threshold voltage, a phenomenon called Negative Bias Temperature Instability (NBTI). This aging effect leads to the increased gate delay with late arrival time of signals, making circuits temporally unreliable. Threshold voltage changes may also negatively affect the probability that transistors perform intended logical operations, causing them spatially more unreliable. Our investigation focuses on evaluation of the overall reliability at circuit-level by considering both spatial (solely considering the correctness of signal logic values) and temporal (considering the signal arrival time to catch up sampling action) aspects of it. This would help circuit designers predict the circuit lifetime. Simulations on benchmark circuits show that the reliability degradation rate due to aging effect ranges from 1.5% to 8.2% over one-year period, depending on specific circuits

Multi-objective digital circuit block optimisation based on cell mapping in an industrial electronic design automation flow

Abstract Modern electronic design automation (EDA) tools can handle the complexity of state‐of‐the‐art electronic systems by decomposing them into smaller blocks or cells, introducing different levels of abstraction and staged design flows. However, throughout each independently optimised design step, overheads and inefficiencies can accumulate in the resulting overall design. Performing design‐specific optimisation from a more global viewpoint requires more time due to the larger search space but has the potential to provide solutions with improved performanc. In this work, a fully‐automated, multi‐objective (MO) EDA flow is introduced to address this issue. It specifically tunes drive strength mapping, prior to physical implementation, through MO population‐based search algorithms. Designs are evaluated with respect to their power, performance and area (PPA). The proposed approach is aimed at digital circuit optimisation at the block level, where it is capable of expanding the design space and offers a set of trade‐off solutions for different case‐specific utilisation. We have applied the proposed multi‐objective electronic design automation flow (MOEDA) framework to ISCAS‐85 and EPFL benchmark circuits by using a commercial 65 nm standard cell library. The experimental results demonstrate how the MOEDA flow enhances the solutions initially generated by the standard digital flow and how simultaneously a significant improvement in PPA metrics is achieved

Testability and redundancy techniques for improved yield and reliability of CMOS VLSI circuits

The research presented in this thesis is concerned with the design of fault-tolerant integrated circuits as a contribution to the design of fault-tolerant systems. The economical manufacture of very large area ICs will necessitate the incorporation of fault-tolerance features which are routinely employed in current high density dynamic random access memories. Furthermore, the growing use of ICs in safety-critical applications and/or hostile environments in addition to the prospect of single-chip systems will mandate the use of fault-tolerance for improved reliability. A fault-tolerant IC must be able to detect and correct all possible faults that may affect its operation. The ability of a chip to detect its own faults is not only necessary for fault-tolerance, but it is also regarded as the ultimate solution to the problem of testing. Off-line periodic testing is selected for this research because it achieves better coverage of physical faults and it requires less extra hardware than on-line error detection techniques. Tests for CMOS stuck-open faults are shown to detect all other faults. Simple test sequence generation procedures for the detection of all faults are derived. The test sequences generated by these procedures produce a trivial output, thereby, greatly simplifying the task of test response analysis. A further advantage of the proposed test generation procedures is that they do not require the enumeration of faults. The implementation of built-in self-test is considered and it is shown that the hardware overhead is comparable to that associated with pseudo-random and pseudo-exhaustive techniques while achieving a much higher fault coverage through-the use of the proposed test generation procedures. The consideration of the problem of testing the test circuitry led to the conclusion that complete test coverage may be achieved if separate chips cooperate in testing each other's untested parts. An alternative approach towards complete test coverage would be to design the test circuitry so that it is as distributed as possible and so that it is tested as it performs its function. Fault correction relies on the provision of spare units and a means of reconfiguring the circuit so that the faulty units are discarded. This raises the question of what is the optimum size of a unit? A mathematical model, linking yield and reliability is therefore developed to answer such a question and also to study the effects of such parameters as the amount of redundancy, the size of the additional circuitry required for testing and reconfiguration, and the effect of periodic testing on reliability. The stringent requirement on the size of the reconfiguration logic is illustrated by the application of the model to a typical example. Another important result concerns the effect of periodic testing on reliability. It is shown that periodic off-line testing can achieve approximately the same level of reliability as on-line testing, even when the time between tests is many hundreds of hours

Cross-Layer Resiliency Modeling and Optimization: A Device to Circuit Approach

The never ending demand for higher performance and lower power consumption pushes the VLSI industry to further scale the technology down. However, further downscaling of technology at nano-scale leads to major challenges. Reduced reliability is one of them, arising from multiple sources e.g. runtime variations, process variation, and transient errors. The objective of this thesis is to tackle unreliability with a cross layer approach from device up to circuit level

Broadening the Scope of Multi-Objective Optimizations in Physical Synthesis of Integrated Circuits.

In modern VLSI design, physical synthesis tools are primarily responsible for satisfying chip-performance constraints by invoking a broad range of circuit optimizations, such as buffer insertion, logic restructuring, gate sizing and relocation. This process is known as timing closure. Our research seeks more powerful and efficient optimizations to improve the state of the art in modern chip design. In particular, we integrate timing-driven relocation, retiming, logic cloning, buffer insertion and gate sizing in novel ways to create powerful circuit transformations that help satisfy setup-time constraints. State-of-the-art physical synthesis optimizations are typically applied at two scales: i) global algorithms that affect the entire netlist and ii) local transformations that focus on a handful of gates or interconnections. The scale of modern chip designs dictates that only near-linear-time optimization algorithms can be applied at the global scope — typically limited to wirelength-driven placement and legalization. Localized transformations can rely on more time-consuming optimizations with accurate delay models. Few techniques bridge the gap between fully-global and localized optimizations. This dissertation broadens the scope of physical synthesis optimization to include accurate transformations operating between the global and local scales. In particular, we integrate groups of related transformations to break circular dependencies and increase the number of circuit elements that can be jointly optimized to escape local minima. Integrated transformations in this dissertation are developed by identifying and removing obstacles to successful optimizations. Integration is achieved through mapping multiple operations to rigorous mathematical optimization problems that can be solved simultaneously. We achieve computational scalability in our techniques by leveraging analytical delay models and focusing optimization efforts on carefully selected regions of the chip. In this regard, we make extensive use of a linear interconnect-delay model that accounts for the impact of subsequent repeated insertion. Our integrated transformations are evaluated on high-performance circuits with over 100,000 gates. Integrated optimization techniques described in this dissertation ensure graceful timing-closure process and impact nearly every aspect of a typical physical synthesis flow. They have been validated in EDA tools used at IBM for physical synthesis of high-performance CPU and ASIC designs, where they significantly improved chip performance.Ph.D.Computer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/78744/1/iamyou_1.pd