Reliability in Power Electronics and Power Systems

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Modeling Emerging Semiconductor Devices for Circuit Simulation

Circuit simulation is an indispensable part of modern IC design. The significant cost of fabrication has driven researchers to verify the chip functionality through simulation before submitting the design for final fabrication. With the impending end of Moore’s Law, researchers all over the world are looking for new devices with enhanced functionality. A plethora of promising emerging devices has been proposed in recent years. In order to leverage the full potential of such devices, circuit designers need fast, reliable models for SPICE simulation to explore different applications. Most of these new devices have complex underlying physical mechanism rendering the model development an extremely challenging task. For the models to be of practical use, they have to enable fast and accurate simulation that rules out the possibility of numerically solving a system of partial differential equations to arrive at a solution. In this chapter, we show how different modeling approaches can be used to simulate three emerging semiconductor devices namely, silicon- on- insulator four gate transistor(G4FET), perimeter gated single photon avalanche diode (PG-SPAD) and insulator-metal transistor (IMT) device with volatile memristance. All the models have been verified against experimental /TCAD data and implemented in commercial circuit simulator

Techniques for low power analog, digital and mixed signal CMOS integrated circuit design

With the continuously expanding of market for portable devices such as wireless communication devices, portable computers, consumer electronics and implantable medical devices, low power is becoming increasingly important in integrated circuits. The low power design can increase operation time and/or utilize a smaller size and lighter-weight battery. In this dissertation, several low power complementary metal-oxide-semiconductor (CMOS) integrated circuit design techniques are investigated. A metal-oxide-semiconductor field effect transistor (MOSFET) can be operated at a lower voltage by forward-biasing the source-substrate junction. This approach has been investigated in detail and used to designing an ultra-low power CMOS operational amplifier for operation at ± 0.4 V. The issue of CMOS latchup and noise has been investigated in detail because of the forward biasing of the substrates of MOSFETs in CMOS. With increasing forward body-bias, the leakage current increases significantly. Dynamic threshold MOSFET (DTMOS) technique is proposed to overcome the drawback which is inherent in a forward-biased MOSFET. By using the DTMOS method with the forward source-body biased MOSFET, two low-power low-voltage CMOS VLSI circuits that of a CMOS analog multiplexer and a Schmitt trigger circuits are designed. In this dissertation, an adaptive body-bias technique is proposed. Adaptive body-bias voltage is generated for several operational frequencies. Another issue, which the chip design community is facing, is the development of portable, cost effective and low power supply voltage. This dissertation proposes a new cost-effective DC/DC converter design in standard 1.5 um n-well CMOS, which adopts a delay-line controller for voltage regulation

Testing microelectronic biofluidic systems

According to the 2005 International Technology Roadmap for Semiconductors, the integration of emerging nondigital CMOS technologies will require radically different test methods, posing a major challenge for designers and test engineers. One such technology is microelectronic fluidic (MEF) arrays, which have rapidly gained importance in many biological, pharmaceutical, and industrial applications. The advantages of these systems, such as operation speed, use of very small amounts of liquid, on-board droplet detection, signal conditioning, and vast digital signal processing, make them very promising. However, testable design of these devices in a mass-production environment is still in its infancy, hampering their low-cost introduction to the market. This article describes analog and digital MEF design and testing method