4,391 research outputs found

    High-Level Synthesis for Embedded Systems

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    Hardware/Software Codesign

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    The current state of the art technology in integrated circuits allows the incorporation of multiple processor cores and memory arrays, in addition to application specific hardware, on a single substrate. As silicon technology has become more advanced, allowing the implementation of more complex designs, systems have begun to incorporate considerable amounts of embedded software [3]. Thus it becomes increasingly necessary for the system designers to have knowledge on both hardware and software to make efficient design tradeoffs. This is where hardware/software codesign comes into existence

    Custom Integrated Circuits

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    Contains reports on ten research projects.Analog Devices, Inc.IBM CorporationNational Science Foundation/Defense Advanced Research Projects Agency Grant MIP 88-14612Analog Devices Career Development Assistant ProfessorshipU.S. Navy - Office of Naval Research Contract N0014-87-K-0825AT&TDigital Equipment CorporationNational Science Foundation Grant MIP 88-5876

    Plug & Test at System Level via Testable TLM Primitives

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    With the evolution of Electronic System Level (ESL) design methodologies, we are experiencing an extensive use of Transaction-Level Modeling (TLM). TLM is a high-level approach to modeling digital systems where details of the communication among modules are separated from the those of the implementation of functional units. This paper represents a first step toward the automatic insertion of testing capabilities at the transaction level by definition of testable TLM primitives. The use of testable TLM primitives should help designers to easily get testable transaction level descriptions implementing what we call a "Plug & Test" design methodology. The proposed approach is intended to work both with hardware and software implementations. In particular, in this paper we will focus on the design of a testable FIFO communication channel to show how designers are given the freedom of trading-off complexity, testability levels, and cos
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