A Low-Cost FPGA-Based Test and Diagnosis Architecture for SRAMs

The continues improvement of manufacturing technologies allows the realization of integrated circuits containing an ever increasing number of transistors. A major part of these devices is devoted to realize SRAM blocks. Test and diagnosis of SRAM circuits are therefore an important challenge for improving quality of next generation integrated circuits. This paper proposes a flexible platform for testing and diagnosis of SRAM circuits. The architecture is based on the use of a low cost FPGA based board allowing high diagnosability while keeping costs at a very low leve

Explanation-based learning for diagnosis

Diagnostic expert systems constructed using traditional knowledge-engineering techniques identify malfunctioning components using rules that associate symptoms with diagnoses. Model-based diagnosis (MBD) systems use models of devices to find faults given observations of abnormal behavior. These approaches to diagnosis are complementary. We consider hybrid diagnosis systems that include both associational and model-based diagnostic components. We present results on explanation-based learning (EBL) methods aimed at improving the performance of hybrid diagnostic problem solvers. We describe two architectures called EBL_IA and EBL(p). EBL_IA is a form fo "learning in advance" that pre-compiles models into associations. At run-time the diagnostic system is purely associational. In EBL(p), the run-time diagnosis system contains associational, MBD, and EBL components. Learned associational rules are preferred but when they are incomplete they may produce too many incorrect diagnoses. When errors cause performance to dip below a give threshold p, EBL(p) activates MBD and explanation-based "learning while doing". We present results of empirical studies comparing MBD without learning versus EBL_IA and EBL(p). The main conclusions are as follows. EBL_IA is superior when it is feasible but it is not feasible for large devices. EBL(p) can speed-up MBD and scale-up to larger devices in situations where perfect accuracy is not required

Improving performance through concept formation and conceptual clustering

Research from June 1989 through October 1992 focussed on concept formation, clustering, and supervised learning for purposes of improving the efficiency of problem-solving, planning, and diagnosis. These projects resulted in two dissertations on clustering, explanation-based learning, and means-ends planning, and publications in conferences and workshops, several book chapters, and journals; a complete Bibliography of NASA Ames supported publications is included. The following topics are studied: clustering of explanations and problem-solving experiences; clustering and means-end planning; and diagnosis of space shuttle and space station operating modes

Test Case Purification for Improving Fault Localization

Finding and fixing bugs are time-consuming activities in software development. Spectrum-based fault localization aims to identify the faulty position in source code based on the execution trace of test cases. Failing test cases and their assertions form test oracles for the failing behavior of the system under analysis. In this paper, we propose a novel concept of spectrum driven test case purification for improving fault localization. The goal of test case purification is to separate existing test cases into small fractions (called purified test cases) and to enhance the test oracles to further localize faults. Combining with an original fault localization technique (e.g., Tarantula), test case purification results in better ranking the program statements. Our experiments on 1800 faults in six open-source Java programs show that test case purification can effectively improve existing fault localization techniques

Developing a distributed electronic health-record store for India

The DIGHT project is addressing the problem of building a scalable and highly available information store for the Electronic Health Records (EHRs) of the over one billion citizens of India

Surface Defect Classification for Hot-Rolled Steel Strips by Selectively Dominant Local Binary Patterns

Developments in defect descriptors and computer vision-based algorithms for automatic optical inspection (AOI) allows for further development in image-based measurements. Defect classification is a vital part of an optical-imaging-based surface quality measuring instrument. The high-speed production rhythm of hot continuous rolling requires an ultra-rapid response to every component as well as algorithms in AOI instrument. In this paper, a simple, fast, yet robust texture descriptor, namely selectively dominant local binary patterns (SDLBPs), is proposed for defect classification. First, an intelligent searching algorithm with a quantitative thresholding mechanism is built to excavate the dominant non-uniform patterns (DNUPs). Second, two convertible schemes of pattern code mapping are developed for binary encoding of all uniform patterns and DNUPs. Third, feature extraction is carried out under SDLBP framework. Finally, an adaptive region weighting method is built for further strengthening the original nearest neighbor classifier in the feature matching stage. The extensive experiments carried out on an open texture database (Outex) and an actual surface defect database (Dragon) indicates that our proposed SDLBP yields promising performance on both classification accuracy and time efficiencyPeer reviewe