Conception et test des circuits et systèmes numériques à haute fiabilité et sécurité

Research activities I carried on after my nomination as Chargé de Recherche deal with the definition of methodologies and tools for the design, the test and the reliability of secure digital circuits and trustworthy manufacturing. More recently, we have started a new research activity on the test of 3D stacked Integrated CIrcuits, based on the use of Through Silicon Vias. Moreover, thanks to the relationships I have maintained after my post-doc in Italy, I have kept on cooperating with Politecnico di Torino on the topics related to test and reliability of memories and microprocessors.Secure and Trusted DevicesSecurity is a critical part of information and communication technologies and it is the necessary basis for obtaining confidentiality, authentication, and integrity of data. The importance of security is confirmed by the extremely high growth of the smart-card market in the last 20 years. It is reported in "Le monde Informatique" in the article "Computer Crime and Security Survey" in 2007 that financial losses due to attacks on "secure objects" in the digital world are greater than $11 Billions. Since the race among developers of these secure devices and attackers accelerates, also due to the heterogeneity of new systems and their number, the improvement of the resistance of such components becomes today’s major challenge.Concerning all the possible security threats, the vulnerability of electronic devices that implement cryptography functions (including smart cards, electronic passports) has become the Achille’s heel in the last decade. Indeed, even though recent crypto-algorithms have been proven resistant to cryptanalysis, certain fraudulent manipulations on the hardware implementing such algorithms can allow extracting confidential information. So-called Side-Channel Attacks have been the first type of attacks that target the physical device. They are based on information gathered from the physical implementation of a cryptosystem. For instance, by correlating the power consumed and the data manipulated by the device, it is possible to discover the secret encryption key. Nevertheless, this point is widely addressed and integrated circuit (IC) manufacturers have already developed different kinds of countermeasures.More recently, new threats have menaced secure devices and the security of the manufacturing process. A first issue is the trustworthiness of the manufacturing process. From one side, secure devices must assure a very high production quality in order not to leak confidential information due to a malfunctioning of the device. Therefore, possible defects due to manufacturing imperfections must be detected. This requires high-quality test procedures that rely on the use of test features that increases the controllability and the observability of inner points of the circuit. Unfortunately, this is harmful from a security point of view, and therefore the access to these test features must be protected from unauthorized users. Another harm is related to the possibility for an untrusted manufacturer to do malicious alterations to the design (for instance to bypass or to disable the security fence of the system). Nowadays, many steps of the production cycle of a circuit are outsourced. For economic reasons, the manufacturing process is often carried out by foundries located in foreign countries. The threat brought by so-called Hardware Trojan Horses, which was long considered theoretical, begins to materialize.A second issue is the hazard of faults that can appear during the circuit’s lifetime and that may affect the circuit behavior by way of soft errors or deliberate manipulations, called Fault Attacks. They can be based on the intentional modification of the circuit’s environment (e.g., applying extreme temperature, exposing the IC to radiation, X-rays, ultra-violet or visible light, or tampering with clock frequency) in such a way that the function implemented by the device generates an erroneous result. The attacker can discover secret information by comparing the erroneous result with the correct one. In-the-field detection of any failing behavior is therefore of prime interest for taking further action, such as discontinuing operation or triggering an alarm. In addition, today’s smart cards use 90nm technology and according to the various suppliers of chip, 65nm technology will be effective on the horizon 2013-2014. Since the energy required to force a transistor to switch is reduced for these new technologies, next-generation secure systems will become even more sensitive to various classes of fault attacks.Based on these considerations, within the group I work with, we have proposed new methods, architectures and tools to solve the following problems:• Test of secure devices: unfortunately, classical techniques for digital circuit testing cannot be easily used in this context. Indeed, classical testing solutions are based on the use of Design-For-Testability techniques that add hardware components to the circuit, aiming to provide full controllability and observability of internal states. Because crypto‐ processors and others cores in a secure system must pass through high‐quality test procedures to ensure that data are correctly processed, testing of crypto chips faces a dilemma. In fact design‐for‐testability schemes want to provide high controllability and observability of the device while security wants minimal controllability and observability in order to hide the secret. We have therefore proposed, form one side, the use of enhanced scan-based test techniques that exploit compaction schemes to reduce the observability of internal information while preserving the high level of testability. From the other side, we have proposed the use of Built-In Self-Test for such devices in order to avoid scan chain based test.• Reliability of secure devices: we proposed an on-line self-test architecture for hardware implementation of the Advanced Encryption Standard (AES). The solution exploits the inherent spatial replications of a parallel architecture for implementing functional redundancy at low cost.• Fault Attacks: one of the most powerful types of attack for secure devices is based on the intentional injection of faults (for instance by using a laser beam) into the system while an encryption occurs. By comparing the outputs of the circuits with and without the injection of the fault, it is possible to identify the secret key. To face this problem we have analyzed how to use error detection and correction codes as counter measure against this type of attack, and we have proposed a new code-based architecture. Moreover, we have proposed a bulk built-in current-sensor that allows detecting the presence of undesired current in the substrate of the CMOS device.• Fault simulation: to evaluate the effectiveness of countermeasures against fault attacks, we developed an open source fault simulator able to perform fault simulation for the most classical fault models as well as user-defined electrical level fault models, to accurately model the effect of laser injections on CMOS circuits.• Side-Channel attacks: they exploit physical data-related information leaking from the device (e.g. current consumption or electro-magnetic emission). One of the most intensively studied attacks is the Differential Power Analysis (DPA) that relies on the observation of the chip power fluctuations during data processing. I studied this type of attack in order to evaluate the influence of the countermeasures against fault attack on the power consumption of the device. Indeed, the introduction of countermeasures for one type of attack could lead to the insertion of some circuitry whose power consumption is related to the secret key, thus allowing another type of attack more easily. We have developed a flexible integrated simulation-based environment that allows validating a digital circuit when the device is attacked by means of this attack. All architectures we designed have been validated through this tool. Moreover, we developed a methodology that allows to drastically reduce the time required to validate countermeasures against this type of attack.TSV- based 3D Stacked Integrated Circuits TestThe stacking process of integrated circuits using TSVs (Through Silicon Via) is a promising technology that keeps the development of the integration more than Moore’s law, where TSVs enable to tightly integrate various dies in a 3D fashion. Nevertheless, 3D integrated circuits present many test challenges including the test at different levels of the 3D fabrication process: pre-, mid-, and post- bond tests. Pre-bond test targets the individual dies at wafer level, by testing not only classical logic (digital logic, IOs, RAM, etc) but also unbounded TSVs. Mid-bond test targets the test of partially assembled 3D stacks, whereas finally post-bond test targets the final circuit.The activities carried out within this topic cover 2 main issues:• Pre-bond test of TSVs: the electrical model of a TSV buried within the substrate of a CMOS circuit is a capacitance connected to ground (when the substrate is connected to ground). The main assumption is that a defect may affect the value of that capacitance. By measuring the variation of the capacitance’s value it is possible to check whether the TSV is correctly fabricated or not. We have proposed a method to measure the value of the capacitance based on the charge/ discharge delay of the RC network containing the TSV.• Test infrastructures for 3D stacked Integrated Circuits: testing a die before stacking to another die introduces the problem of a dynamic test infrastructure, where test data must be routed to a specific die based on the reached fabrication step. New solutions are proposed in literature that allow reconfiguring the test paths within the circuit, based on on-the-fly requirements. We have started working on an extension of the IEEE P1687 test standard that makes use of an automatic die-detection based on pull-up resistors.Memory and Microprocessor Test and ReliabilityThanks to device shrinking and miniaturization of fabrication technology, performances of microprocessors and of memories have grown of more than 5 magnitude order in the last 30 years. With this technology trend, it is necessary to face new problems and challenges, such as reliability, transient errors, variability and aging.In the last five years I’ve worked in cooperation with the Testgroup of Politecnico di Torino (Italy) to propose a new method to on-line validate the correctness of the program execution of a microprocessor. The main idea is to monitor a small set of control signals of the processors in order to identify incorrect activation sequences. This approach can detect both permanent and transient errors of the internal logic of the processor.Concerning the test of memories, we have proposed a new approach to automatically generate test programs starting from a functional description of the possible faults in the memory.Moreover, we proposed a new methodology, based on microprocessor error probability profiling, that aims at estimating fault injection results without the need of a typical fault injection setup. The proposed methodology is based on two main ideas: a one-time fault-injection analysis of the microprocessor architecture to characterize the probability of successful execution of each of its instructions in presence of a soft-error, and a static and very fast analysis of the control and data flow of the target software application to compute its probability of success

VLSI Design

This book provides some recent advances in design nanometer VLSI chips. The selected topics try to present some open problems and challenges with important topics ranging from design tools, new post-silicon devices, GPU-based parallel computing, emerging 3D integration, and antenna design. The book consists of two parts, with chapters such as: VLSI design for multi-sensor smart systems on a chip, Three-dimensional integrated circuits design for thousand-core processors, Parallel symbolic analysis of large analog circuits on GPU platforms, Algorithms for CAD tools VLSI design, A multilevel memetic algorithm for large SAT-encoded problems, etc

Architectural Techniques to Enable Reliable and Scalable Memory Systems

High capacity and scalable memory systems play a vital role in enabling our desktops, smartphones, and pervasive technologies like Internet of Things (IoT). Unfortunately, memory systems are becoming increasingly prone to faults. This is because we rely on technology scaling to improve memory density, and at small feature sizes, memory cells tend to break easily. Today, memory reliability is seen as the key impediment towards using high-density devices, adopting new technologies, and even building the next Exascale supercomputer. To ensure even a bare-minimum level of reliability, present-day solutions tend to have high performance, power and area overheads. Ideally, we would like memory systems to remain robust, scalable, and implementable while keeping the overheads to a minimum. This dissertation describes how simple cross-layer architectural techniques can provide orders of magnitude higher reliability and enable seamless scalability for memory systems while incurring negligible overheads.Comment: PhD thesis, Georgia Institute of Technology (May 2017

Network-on-Chip

Addresses the Challenges Associated with System-on-Chip Integration Network-on-Chip: The Next Generation of System-on-Chip Integration examines the current issues restricting chip-on-chip communication efficiency, and explores Network-on-chip (NoC), a promising alternative that equips designers with the capability to produce a scalable, reusable, and high-performance communication backbone by allowing for the integration of a large number of cores on a single system-on-chip (SoC). This book provides a basic overview of topics associated with NoC-based design: communication infrastructure design, communication methodology, evaluation framework, and mapping of applications onto NoC. It details the design and evaluation of different proposed NoC structures, low-power techniques, signal integrity and reliability issues, application mapping, testing, and future trends. Utilizing examples of chips that have been implemented in industry and academia, this text presents the full architectural design of components verified through implementation in industrial CAD tools. It describes NoC research and developments, incorporates theoretical proofs strengthening the analysis procedures, and includes algorithms used in NoC design and synthesis. In addition, it considers other upcoming NoC issues, such as low-power NoC design, signal integrity issues, NoC testing, reconfiguration, synthesis, and 3-D NoC design. This text comprises 12 chapters and covers: The evolution of NoC from SoC—its research and developmental challenges NoC protocols, elaborating flow control, available network topologies, routing mechanisms, fault tolerance, quality-of-service support, and the design of network interfaces The router design strategies followed in NoCs The evaluation mechanism of NoC architectures The application mapping strategies followed in NoCs Low-power design techniques specifically followed in NoCs The signal integrity and reliability issues of NoC The details of NoC testing strategies reported so far The problem of synthesizing application-specific NoCs Reconfigurable NoC design issues Direction of future research and development in the field of NoC Network-on-Chip: The Next Generation of System-on-Chip Integration covers the basic topics, technology, and future trends relevant to NoC-based design, and can be used by engineers, students, and researchers and other industry professionals interested in computer architecture, embedded systems, and parallel/distributed systems

Design of an Efficient Design for Test (DFT) Architecture and it\u27s Verification Using Universal Verification Methodology

The complexity of the circuit design has been significantly increased from 1980’s till date, and until 80’s, due to less complexity and technology node being down to 180nm, the need for Design for Test (DFT) equipment was not as important. The few System on Chips (SoC) were tested using test patterns sent from the external test equipment. As the technology node shrunk further, the devices became faster and the complexity of S0C’s increased as the chip could accommodate more transistors. The SoC’s have become more vulnerable to physical defects. Quality factor became a major issue, which pushed the industry standard of the test coverage very high i.e. between 98% to 100%. To achieve such a high test coverage, testing the SoC’s by external test equipment demands high test time and test cost. Due to this reason, the DFT architectures within the chip have become popular demand in the industry. With the DFT architectures like Memory-Built In Self Test (MBIST) and Logic- Built In Self Test (LBIST), the memories and core logic embedded in the chip will undergo self test at the speed of functional clock and hence saving test time and test cost. Introducing DFT into the chip implies increase in area due to overhead and increase in power consumption due to additional pins. So, the DFT architectures need to be efficient. This project paper discusses about designing an efficient DFT architecture on SoC by integrating MBIST and LBIST with Joint Test Action Group-Test Access Port (JTAG-TAP) Controller and verifying using SysteVerilog (SV) and Universal Verification Methodologies (UVM) libraries. Detailed discussion of the design architecture and verification plan is included in the upcoming sections

Test and Diagnosis of Integrated Circuits

The ever-increasing growth of the semiconductor market results in an increasing complexity of digital circuits. Smaller, faster, cheaper and low-power consumption are the main challenges in semiconductor industry. The reduction of transistor size and the latest packaging technology (i.e., System-On-a-Chip, System-In-Package, Trough Silicon Via 3D Integrated Circuits) allows the semiconductor industry to satisfy the latest challenges. Although producing such advanced circuits can benefit users, the manufacturing process is becoming finer and denser, making chips more prone to defects.The work presented in the HDR manuscript addresses the challenges of test and diagnosis of integrated circuits. It covers:- Power aware test;- Test of Low Power Devices;- Fault Diagnosis of digital circuits

The Customizable Virtual FPGA: Generation, System Integration and Configuration of Application-Specific Heterogeneous FPGA Architectures

In den vergangenen drei Jahrzehnten wurde die Entwicklung von Field Programmable Gate Arrays (FPGAs) stark von Moore’s Gesetz, Prozesstechnologie (Skalierung) und kommerziellen Märkten beeinflusst. State-of-the-Art FPGAs bewegen sich einerseits dem Allzweck näher, aber andererseits, da FPGAs immer mehr traditionelle Domänen der Anwendungsspezifischen integrierten Schaltungen (ASICs) ersetzt haben, steigen die Effizienzerwartungen. Mit dem Ende der Dennard-Skalierung können Effizienzsteigerungen nicht mehr auf Technologie-Skalierung allein zurückgreifen. Diese Facetten und Trends in Richtung rekonfigurierbarer System-on-Chips (SoCs) und neuen Low-Power-Anwendungen wie Cyber Physical Systems und Internet of Things erfordern eine bessere Anpassung der Ziel-FPGAs. Neben den Trends für den Mainstream-Einsatz von FPGAs in Produkten des täglichen Bedarfs und Services wird es vor allem bei den jüngsten Entwicklungen, FPGAs in Rechenzentren und Cloud-Services einzusetzen, notwendig sein, eine sofortige Portabilität von Applikationen über aktuelle und zukünftige FPGA-Geräte hinweg zu gewährleisten. In diesem Zusammenhang kann die Hardware-Virtualisierung ein nahtloses Mittel für Plattformunabhängigkeit und Portabilität sein. Ehrlich gesagt stehen die Zwecke der Anpassung und der Virtualisierung eigentlich in einem Konfliktfeld, da die Anpassung für die Effizienzsteigerung vorgesehen ist, während jedoch die Virtualisierung zusätzlichen Flächenaufwand hinzufügt. Die Virtualisierung profitiert aber nicht nur von der Anpassung, sondern fügt auch mehr Flexibilität hinzu, da die Architektur jederzeit verändert werden kann. Diese Besonderheit kann für adaptive Systeme ausgenutzt werden. Sowohl die Anpassung als auch die Virtualisierung von FPGA-Architekturen wurden in der Industrie bisher kaum adressiert. Trotz einiger existierenden akademischen Werke können diese Techniken noch als unerforscht betrachtet werden und sind aufstrebende Forschungsgebiete. Das Hauptziel dieser Arbeit ist die Generierung von FPGA-Architekturen, die auf eine effiziente Anpassung an die Applikation zugeschnitten sind. Im Gegensatz zum üblichen Ansatz mit kommerziellen FPGAs, bei denen die FPGA-Architektur als gegeben betrachtet wird und die Applikation auf die vorhandenen Ressourcen abgebildet wird, folgt diese Arbeit einem neuen Paradigma, in dem die Applikation oder Applikationsklasse fest steht und die Zielarchitektur auf die effiziente Anpassung an die Applikation zugeschnitten ist. Dies resultiert in angepassten anwendungsspezifischen FPGAs. Die drei Säulen dieser Arbeit sind die Aspekte der Virtualisierung, der Anpassung und des Frameworks. Das zentrale Element ist eine weitgehend parametrierbare virtuelle FPGA-Architektur, die V-FPGA genannt wird, wobei sie als primäres Ziel auf jeden kommerziellen FPGA abgebildet werden kann, während Anwendungen auf der virtuellen Schicht ausgeführt werden. Dies sorgt für Portabilität und Migration auch auf Bitstream-Ebene, da die Spezifikation der virtuellen Schicht bestehen bleibt, während die physische Plattform ausgetauscht werden kann. Darüber hinaus wird diese Technik genutzt, um eine dynamische und partielle Rekonfiguration auf Plattformen zu ermöglichen, die sie nicht nativ unterstützen. Neben der Virtualisierung soll die V-FPGA-Architektur auch als eingebettetes FPGA in ein ASIC integriert werden, das effiziente und dennoch flexible System-on-Chip-Lösungen bietet. Daher werden Zieltechnologie-Abbildungs-Methoden sowohl für Virtualisierung als auch für die physikalische Umsetzung adressiert und ein Beispiel für die physikalische Umsetzung in einem 45 nm Standardzellen Ansatz aufgezeigt. Die hochflexible V-FPGA-Architektur kann mit mehr als 20 Parametern angepasst werden, darunter LUT-Grösse, Clustering, 3D-Stacking, Routing-Struktur und vieles mehr. Die Auswirkungen der Parameter auf Fläche und Leistung der Architektur werden untersucht und eine umfangreiche Analyse von über 1400 Benchmarkläufen zeigt eine hohe Parameterempfindlichkeit bei Abweichungen bis zu ±95, 9% in der Fläche und ±78, 1% in der Leistung, was die hohe Bedeutung von Anpassung für Effizienz aufzeigt. Um die Parameter systematisch an die Bedürfnisse der Applikation anzupassen, wird eine parametrische Entwurfsraum-Explorationsmethode auf der Basis geeigneter Flächen- und Zeitmodellen vorgeschlagen. Eine Herausforderung von angepassten Architekturen ist der Entwurfsaufwand und die Notwendigkeit für angepasste Werkzeuge. Daher umfasst diese Arbeit ein Framework für die Architekturgenerierung, die Entwurfsraumexploration, die Anwendungsabbildung und die Evaluation. Vor allem ist der V-FPGA in einem vollständig synthetisierbaren generischen Very High Speed Integrated Circuit Hardware Description Language (VHDL) Code konzipiert, der sehr flexibel ist und die Notwendigkeit für externe Codegeneratoren eliminiert. Systementwickler können von verschiedenen Arten von generischen SoC-Architekturvorlagen profitieren, um die Entwicklungszeit zu reduzieren. Alle notwendigen Konstruktionsschritte für die Applikationsentwicklung und -abbildung auf den V-FPGA werden durch einen Tool-Flow für Entwurfsautomatisierung unterstützt, der eine Sammlung von vorhandenen kommerziellen und akademischen Werkzeugen ausnutzt, die durch geeignete Modelle angepasst und durch ein neues Werkzeug namens V-FPGA-Explorer ergänzt werden. Dieses neue Tool fungiert nicht nur als Back-End-Tool für die Anwendungsabbildung auf dem V-FPGA sondern ist auch ein grafischer Konfigurations- und Layout-Editor, ein Bitstream-Generator, ein Architekturdatei-Generator für die Place & Route Tools, ein Script-Generator und ein Testbenchgenerator. Eine Besonderheit ist die Unterstützung der Just-in-Time-Kompilierung mit schnellen Algorithmen für die In-System Anwendungsabbildung. Die Arbeit schliesst mit einigen Anwendungsfällen aus den Bereichen industrielle Prozessautomatisierung, medizinische Bildgebung, adaptive Systeme und Lehre ab, in denen der V-FPGA eingesetzt wird

A Scalable and Adaptive Network on Chip for Many-Core Architectures

In this work, a scalable network on chip (NoC) for future many-core architectures is proposed and investigated. It supports different QoS mechanisms to ensure predictable communication. Self-optimization is introduced to adapt the energy footprint and the performance of the network to the communication requirements. A fault tolerance concept allows to deal with permanent errors. Moreover, a template-based automated evaluation and design methodology and a synthesis flow for NoCs is introduced