Online self-repair of FIR filters

Chip-level failure detection has been a target of research for some time, but today's very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today's chips. This article introduces a self-repair-solution for the digital FIR filter, one of the key blocks used in DSPs

An On-line BIST RAM Architecture with Self Repair Capabilities

The emerging field of self-repair computing is expected to have a major impact on deployable systems for space missions and defense applications, where high reliability, availability, and serviceability are needed. In this context, RAM (random access memories) are among the most critical components. This paper proposes a built-in self-repair (BISR) approach for RAM cores. The proposed design, introducing minimal and technology-dependent overheads, can detect and repair a wide range of memory faults including: stuck-at, coupling, and address faults. The test and repair capabilities are used on-line, and are completely transparent to the external user, who can use the memory without any change in the memory-access protocol. Using a fault-injection environment that can emulate the occurrence of faults inside the module, the effectiveness of the proposed architecture in terms of both fault detection and repairing capability was verified. Memories of various sizes have been considered to evaluate the area-overhead introduced by this proposed architectur

Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs

SRAM-based FPGAs are increasingly relevant in a growing number of safety-critical application fields, ranging from automotive to aerospace. These application fields are characterized by a harsh radiation environment that can cause the occurrence of Single Event Upsets (SEUs) in digital devices. These faults have particularly adverse effects on SRAM-based FPGA systems because not only can they temporarily affect the behaviour of the system by changing the contents of flip-flops or memories, but they can also permanently change the functionality implemented by the system itself, by changing the content of the configuration memory. Designing safety-critical applications requires accurate methodologies to evaluate the system’s sensitivity to SEUs as early as possible during the design process. Moreover it is necessary to detect the occurrence of SEUs during the system life-time. To this purpose test patterns should be generated during the design process, and then applied to the inputs of the system during its operation. In this thesis we propose a set of software tools that could be used by designers of SRAM-based FPGA safety-critical applications to assess the sensitivity to SEUs of the system and to generate test patterns for in-service testing. The main feature of these tools is that they implement a model of SEUs affecting the configuration bits controlling the logic and routing resources of an FPGA device that has been demonstrated to be much more accurate than the classical stuck-at and open/short models, that are commonly used in the analysis of faults in digital devices. By keeping this accurate fault model into account, the proposed tools are more accurate than similar academic and commercial tools today available for the analysis of faults in digital circuits, that do not take into account the features of the FPGA technology.. In particular three tools have been designed and developed: (i) ASSESS: Accurate Simulator of SEuS affecting the configuration memory of SRAM-based FPGAs, a simulator of SEUs affecting the configuration memory of an SRAM-based FPGA system for the early assessment of the sensitivity to SEUs; (ii) UA2TPG: Untestability Analyzer and Automatic Test Pattern Generator for SEUs Affecting the Configuration Memory of SRAM-based FPGAs, a static analysis tool for the identification of the untestable SEUs and for the automatic generation of test patterns for in-service testing of the 100% of the testable SEUs; and (iii) GABES: Genetic Algorithm Based Environment for SEU Testing in SRAM-FPGAs, a Genetic Algorithm-based Environment for the generation of an optimized set of test patterns for in-service testing of SEUs. The proposed tools have been applied to some circuits from the ITC’99 benchmark. The results obtained from these experiments have been compared with results obtained by similar experiments in which we considered the stuck-at fault model, instead of the more accurate model for SEUs. From the comparison of these experiments we have been able to verify that the proposed software tools are actually more accurate than similar tools today available. In particular the comparison between results obtained using ASSESS with those obtained by fault injection has shown that the proposed fault simulator has an average error of 0:1% and a maximum error of 0:5%, while using a stuck-at fault simulator the average error with respect of the fault injection experiment has been 15:1% with a maximum error of 56:2%. Similarly the comparison between the results obtained using UA2TPG for the accurate SEU model, with the results obtained for stuck-at faults has shown an average difference of untestability of 7:9% with a maximum of 37:4%. Finally the comparison between fault coverages obtained by test patterns generated for the accurate model of SEUs and the fault coverages obtained by test pattern designed for stuck-at faults, shows that the former detect the 100% of the testable faults, while the latter reach an average fault coverage of 78:9%, with a minimum of 54% and a maximum of 93:16%

DFT and BIST of a multichip module for high-energy physics experiments

Engineers at Politecnico di Torino designed a multichip module for high-energy physics experiments conducted on the Large Hadron Collider. An array of these MCMs handles multichannel data acquisition and signal processing. Testing the MCM from board to die level required a combination of DFT strategie

Identifying worst case test vectors for FPGA exposed to total ionization dose using design for testability techniques

Electronic devices often operate in harsh environments which contain a variation of radiation sources. Radiation may cause different kinds of damage to proper operation of the devices. Their sources can be found in terrestrial environments, or in extra-terrestrial environments like in space, or in man-made radiation sources like nuclear reactors, biomedical devices and high energy particles physics experiments equipment. Depending on the operation environment of the device, the radiation resultant effect manifests in several forms like total ionizing dose effect (TID), or single event effects (SEEs) such as single event upset (SEU), single event gate rupture (SEGR), and single event latch up (SEL). TID effect causes an increase in the delay and the leakage current of CMOS circuits which may damage the proper operation of the integrated circuit. To ensure proper operation of these devices under radiation, thorough testing must be made especially in critical applications like space and military applications. Although the standard which describes the procedure for testing electronic devices under radiation emphasizes the use of worst case test vectors (WCTVs), they are never used in radiation testing due to the difficulty of generating these vectors for circuits under test. For decades, design for testability (DFT) has been the best choice for test engineers to test digital circuits in industry. It has become a very mature technology that can be relied on. DFT is usually used with automatic test patterns generation (ATPG) software to generate test vectors to test application specific integrated circuits (ASICs), especially with sequential circuits, against faults like stuck at faults and path delay faults. Surprisingly, however, radiation testing has not yet made use of this reliable technology. In this thesis, a novel methodology is proposed to extend the usage of DFT to generate WCTVs for delay failure in Flash based field programmable gate arrays (FPGAs) exposed to total ionizing dose (TID). The methodology is validated using MicroSemi ProASIC3 FPGA and cobalt 60 facility

A comprehensive comparison between design for testability techniques for total dose testing of flash-based FPGAs

Radiation sources exist in different kinds of environments where electronic devices often operate. Correct device operation is usually affected negatively by radiation. The radiation resultant effect manifests in several forms depending on the operating environment of the device like total ionizing dose effect (TID), or single event effects (SEEs) such as single event upset (SEU), single event gate rupture (SEGR), and single event latch up (SEL). CMOS circuits and Floating gate MOS circuits suffer from an increase in the delay and the leakage current due to TID effect. This may damage the proper operation of the integrated circuit. Exhaustive testing is needed for devices operating in harsh conditions like space and military applications to ensure correct operations in the worst circumstances. The use of worst case test vectors (WCTVs) for testing is strongly recommended by MIL-STD-883, method 1019, which is the standard describing the procedure for testing electronic devices under radiation. However, the difficulty of generating these test vectors hinders their use in radiation testing. Testing digital circuits in the industry is usually done nowadays using design for testability (DFT) techniques as they are very mature and can be relied on. DFT techniques include, but not limited to, ad-hoc technique, built-in self test (BIST), muxed D scan, clocked scan and enhanced scan. DFT is usually used with automatic test patterns generation (ATPG) software to generate test vectors to test application specific integrated circuits (ASICs), especially with sequential circuits, against faults like stuck at faults and path delay faults. Despite all these recommendations for DFT, radiation testing has not benefited from this reliable technology yet. Also, with the big variation in the DFT techniques, choosing the right technique is the bottleneck to achieve the best results for TID testing. In this thesis, a comprehensive comparison between different DFT techniques for TID testing of flash-based FPGAs is made to help designers choose the best suitable DFT technique depending on their application. The comparison includes muxed D scan technique, clocked scan technique and enhanced scan technique. The comparison is done using ISCAS-89 benchmarks circuits. Points of comparisons include FPGA resources utilization, difficulty of designs bring-up, added delay by DFT logic and robust testable paths in each technique

Run-time reconfigurable, fault-tolerant FPGA systems for space applications

Cozzi D. Run-time reconfigurable, fault-tolerant FPGA systems for space applications. Bielefeld: Universität Bielefeld; 2016.The aim of this thesis is to investigate the use of Dynamic Partial Reconfiguration (DPR) on Commercial Off-the-Shelf (COTS) FPGAs in space applications. Reconfigurable systems gained interest in a wide range of application fields, including aerospace, where electronic devices are exposed to a harsh working environment. COTS SRAM-based FPGA devices represent an interesting hardware platform for this kind of systems since they combine low cost with the possibility to utilize state-of-the-art processing power as well as the flexibility of reconfigurable hardware. FPGA architectures have high computational power and thanks to their ability to be reconfigured at run-time, they became interesting candidates for payload processing in space applications. The presented Dynamic Reconfigurable Processing Module (DRPM) has been developed to investigate the use of the DPR approach for satellite payload processing. This scalable platform combines dynamically reconfigurable FPGAs with the required avionic interfaces (e.g., SpaceWire, MIL-STD-1553B, and SpaceFibre). In particular, a novel communication interface has been developed, the Heterogeneous Multi Processor Communication Interface (HMPCI), which allows inter-process communication with small latency and low memory footprint. Current synthesis tools do not support fully the DPR capabilities of FPGAs. Therefore, this thesis introduces INDRA 2.0: an INtegrated Design flow for Reconfigurable Architectures. The key part of INDRA 2.0 is DHHarMa: a Design flow for Homogeneous Hard Macros, which generates homogeneous hard macros for Xilinx FPGAs starting from a high-level description (e.g., VHDL). In particular, the homogeneous DHHarMa router is explained in detail, providing novel terminologies and algorithms, which have enabled the generation of homogeneous routed designs. Results have been shown that Design flow for Homogeneous Hard Macros (DHHarMa) can route homogeneously a communication infrastructure utilizing just between 1% and 31% more resources than the Xilinx router, which cannot provide a homogeneous solution. Furthermore, the permanent faults that can occur on FPGAs have been investigated. This thesis presents OLT(RE)2: an on-line on-demand approach to testing permanent faults induced by radiation in reconfigurable systems used in space missions. The proposed approach relies on a test circuit and custom placer and router. OLT(RE)2 exploits DPR to place the test circuits at run-time. Its goal is to test unprogrammed areas of the FPGA before using them. Experimental results of OLT(RE)2 have shown that is possible to generate, place, and route the test circuits needed to detect on average more than 99 % of the physical wires and on average about 97 % of the programmable interconnection points of a large arbitrary region of the FPGA in a reasonable time. Moreover, the test can be run on the target device without interfering the functional behavior of the system

ANALYZING THE PERFORMANCE OF CARRY TREE ADDERS BASED ON FPGA’S

In this paper carry tree adders are known to have the best performance in VLSI designs. However, this performance advantage does not translate directly into FPGA implementations due to constraints on logic block configurations and routing overhead. This paper investigates three types of carry-tree adders (the Kogge-Stone, sparse Kogge-Stone, and spanning tree adder) and compares them to the simple Ripple Carry Adder (RCA) and Carry Skip Adder (CSA). These designs of varied bit-widths were implemented on a Xilinx Spartan 3E FPGA and delay measurements were made with a high-performance logic analyzer. Due to the presence of a fast carry-chain, the RCA designs exhibit better delay performance up to 128 bits. The carry-tree adders are expected to have a speed advantage over the RCA as bit widths approach 256

Pipelining Of Double Precision Floating Point Division And Square Root Operations On Field-programmable Gate Arrays

Many space applications, such as vision-based systems, synthetic aperture radar, and radar altimetry rely increasingly on high data rate DSP algorithms. These algorithms use double precision floating point arithmetic operations. While most DSP applications can be executed on DSP processors, the DSP numerical requirements of these new space applications surpass by far the numerical capabilities of many current DSP processors. Since the tradition in DSP processing has been to use fixed point number representation, only recently have DSP processors begun to incorporate floating point arithmetic units, even though most of these units handle only single precision floating point addition/subtraction, multiplication, and occasionally division. While DSP processors are slowly evolving to meet the numerical requirements of newer space applications, FPGA densities have rapidly increased to parallel and surpass even the gate densities of many DSP processors and commodity CPUs. This makes them attractive platforms to implement compute-intensive DSP computations. Even in the presence of this clear advantage on the side of FPGAs, few attempts have been made to examine how wide precision floating point arithmetic, particularly division and square root operations, can perform on FPGAs to support these compute-intensive DSP applications. In this context, this thesis presents the sequential and pipelined designs of IEEE-754 compliant double floating point division and square root operations based on low radix digit recurrence algorithms. FPGA implementations of these algorithms have the advantage of being easily testable. In particular, the pipelined designs are synthesized based on careful partial and full unrolling of the iterations in the digit recurrence algorithms. In the overall, the implementations of the sequential and pipelined designs are common-denominator implementations which do not use any performance-enhancing embedded components such as multipliers and block memory. As these implementations exploit exclusively the fine-grain reconfigurable resources of Virtex FPGAs, they are easily portable to other FPGAs with similar reconfigurable fabrics without any major modifications. The pipelined designs of these two operations are evaluated in terms of area, throughput, and dynamic power consumption as a function of pipeline depth. Pipelining experiments reveal that the area overhead tends to remain constant regardless of the degree of pipelining to which the design is submitted, while the throughput increases with pipeline depth. In addition, these experiments reveal that pipelining reduces power considerably in shallow pipelines. Pipelining further these designs does not necessarily lead to significant power reduction. By partitioning these designs into deeper pipelines, these designs can reach throughputs close to the 100 MFLOPS mark by consuming a modest 1% to 8% of the reconfigurable fabric within a Virtex-II XC2VX000 (e.g., XC2V1000 or XC2V6000) FPGA