High-level synthesis of triple modular redundant FPGA circuits with energy efficient error recovery mechanisms

There is a growing interest in deploying commercial SRAM-based Field Programmable Gate Array (FPGA) circuits in space due to their low cost, reconfigurability, high logic capacity and rich I/O interfaces. However, their configuration memory (CM) is vulnerable to ionising radiation which raises the need for effective fault-tolerant design techniques. This thesis provides the following contributions to mitigate the negative effects of soft errors in SRAM FPGA circuits. Triple Modular Redundancy (TMR) with periodic CM scrubbing or Module-based CM error recovery (MER) are popular techniques for mitigating soft errors in FPGA circuits. However, this thesis shows that MER does not recover CM soft errors in logic instantiated outside the reconfigurable regions of TMR modules. To address this limitation, a hybrid error recovery mechanism, namely FMER, is proposed. FMER uses selective periodic scrubbing and MER to recover CM soft errors inside and outside the reconfigurable regions of TMR modules, respectively. Experimental results indicate that TMR circuits with FMER achieve higher dependability with less energy consumption than those using periodic scrubbing or MER alone. An imperative component of MER and FMER is the reconfiguration control network (RCN) that transfers the minority reports of TMR components, i.e., which, if any, TMR module needs recovery, to the FPGA's reconfiguration controller (RC). Although several reliable RCs have been proposed, a study of reliable RCNs has not been previously reported. This thesis fills this research gap, by proposing a technique that transfers the circuit's minority reports to the RC via the configuration-layer of the FPGA. This reduces the resource utilisation of the RCN and therefore its failure rate. Results show that the proposed RCN achieves higher reliability than alternative RCN architectures reported in the literature. The last contribution of this thesis is a high-level synthesis (HLS) tool, namely TLegUp, developed within the LegUp HLS framework. TLegUp triplicates Xilinx 7-series FPGA circuits during HLS rather than during the register-transfer level pre- or post-synthesis flow stage, as existing computer-aided design tools do. Results show that TLegUp can generate non-partitioned TMR circuits with 500x less soft error sensitivity than non-triplicated functional equivalent baseline circuits, while utilising 3-4x more resources and having 11% lower frequency

Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices

This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results