A Panorama on Multiscale Geometric Representations, Intertwining Spatial, Directional and Frequency Selectivity

The richness of natural images makes the quest for optimal representations in image processing and computer vision challenging. The latter observation has not prevented the design of image representations, which trade off between efficiency and complexity, while achieving accurate rendering of smooth regions as well as reproducing faithful contours and textures. The most recent ones, proposed in the past decade, share an hybrid heritage highlighting the multiscale and oriented nature of edges and patterns in images. This paper presents a panorama of the aforementioned literature on decompositions in multiscale, multi-orientation bases or dictionaries. They typically exhibit redundancy to improve sparsity in the transformed domain and sometimes its invariance with respect to simple geometric deformations (translation, rotation). Oriented multiscale dictionaries extend traditional wavelet processing and may offer rotation invariance. Highly redundant dictionaries require specific algorithms to simplify the search for an efficient (sparse) representation. We also discuss the extension of multiscale geometric decompositions to non-Euclidean domains such as the sphere or arbitrary meshed surfaces. The etymology of panorama suggests an overview, based on a choice of partially overlapping "pictures". We hope that this paper will contribute to the appreciation and apprehension of a stream of current research directions in image understanding.Comment: 65 pages, 33 figures, 303 reference

State of the art in 2D content representation and compression

Livrable D1.3 du projet ANR PERSEECe rapport a été réalisé dans le cadre du projet ANR PERSEE (n° ANR-09-BLAN-0170). Exactement il correspond au livrable D3.1 du projet

Advances in Industrial Crystallization

This Special Issue is result of a call for papers of the Section Industrial Crystallization of MDPI’s scientific journal Crystals. It addresses scientists and engineers active in research and process & product development in life-science industries (e.g. pharmaceuticals, fine chemicals and biotechnology products) and bulk chemical applications (e.g. desalination) as well. The contributions comprise several fundamental and application-oriented facets of crystallization providing an overview of industrially relevant subjects in the field. Main issues cover phase equilibria and solid-state behavior of crystalline compounds, crystal shape and size and related measurement techniques. Melt and solution crystallization are considered specifically addressing contemporary aspects of continuous crystallization and process intensification

Fabrication and nanoroughness characterization of specific nanostructures and nanodevice

Nanoroughness is becoming a very important specification for many nanostructures and nanodevices, and its metrology impacts not only the nanodevice properties of interest, but also its material selection and process development. This Ph.D. thesis presents an investigation into fabrication and nanoroughness characterization of nanoscale specimens and MIS (metal-insulator-semiconductor) capacitors with 2 HfO as a high k dielectric. Self-affine curves and Gaussian, non-Gaussian, self-affine as well as complicated rough surfaces were characterized and simulated. The effects of characteristic parameters on the CD (critical dimension) variation and the properties of these rough surfaces were visualized. Compared with experimental investigations, these simulations are flexible, low cost and highly efficient. Relevant conclusions were frequently employed in subsequent investigations. A proposal regarding the thicknesses of the deposited films represented by nominal linewidths and pitch was put forward. The MBE (Molecular Beam Epitaxy) process was introduced and AlGaAs and GaAs were selected to fabricate nanolinewidth and nanopitch specimens on GaAs substrate with nominal linewidths of 2nm, 4nm, 6nm and 8nm, and a nominal pitch of 5nm. HRTEM (High Resolution Transmission Electron Microscopy) image-based characterization of LER/LWR (Line Edge Roughness/Line Width Roughness) in real space and frequency domains demonstrated that the MBE-based process was capable of fabricating the desired nanolinewidth and nanopitch specimens and could be regulated accordingly. MIS capacitors with 2 HfO film as high k dielectric were fabricated, and SEM (Scanning Electron Microscope) image-based nanoroughness characterization, along with measurement of the MIS capacitor electrical properties were performed. It was concluded that the annealing temperature of the deposited 2 HfO film was an important process parameter and 700℃ was an optimal temperature to improve the properties of the MIS capacitor. Also, by quantitative characterization of the relevant nanoroughness, the fabrication process can be further regulated. The uncertainty propagation model of SEM based nanoroughness measurement was presented according to specific requirements of the relevant standards, ISO GPS (Geometric Product Specifications and Verification) and GUM (Guide to the Expression of Uncertainty in Measurement), and the method for implementating uncertainties was evaluated. The case study demonstrated that the total standard uncertainty of the nanoroughness measurement was 0.13nm, while its expanded uncertainty with the coverage factor k as 3 was 0.39nm. They are indispensable parts of LER/LWR measurement results

Very High Resolution (VHR) Satellite Imagery: Processing and Applications

Recently, growing interest in the use of remote sensing imagery has appeared to provide synoptic maps of water quality parameters in coastal and inner water ecosystems;, monitoring of complex land ecosystems for biodiversity conservation; precision agriculture for the management of soils, crops, and pests; urban planning; disaster monitoring, etc. However, for these maps to achieve their full potential, it is important to engage in periodic monitoring and analysis of multi-temporal changes. In this context, very high resolution (VHR) satellite-based optical, infrared, and radar imaging instruments provide reliable information to implement spatially-based conservation actions. Moreover, they enable observations of parameters of our environment at greater broader spatial and finer temporal scales than those allowed through field observation alone. In this sense, recent very high resolution satellite technologies and image processing algorithms present the opportunity to develop quantitative techniques that have the potential to improve upon traditional techniques in terms of cost, mapping fidelity, and objectivity. Typical applications include multi-temporal classification, recognition and tracking of specific patterns, multisensor data fusion, analysis of land/marine ecosystem processes and environment monitoring, etc. This book aims to collect new developments, methodologies, and applications of very high resolution satellite data for remote sensing. The works selected provide to the research community the most recent advances on all aspects of VHR satellite remote sensing