Software fault characteristics: A synthesis of the literature

Faults continue to be a significant problem in software. Understanding the nature of these faults is important for practitioners and researchers. There are many published fault characteristics schemes but no one scheme dominates. Consequently it is difficult for practitioners to effectively evaluate the nature of faults in their software systems, and it is difficult for researchers to compare the types of faults found by different fault detection techniques. In this paper we synthesise previous fault characteristics schemes into one comprehensive scheme. Our scheme provides a richer view of faults than the previous schemes published and presents a comprehensive, unified approach which accommodates the many previous schemes. A characteristics-based view of faults should be considered by future researchers in the analysis of software faults and in the design and evaluation of new fault detection tools. We recommend that our fault characteristics scheme be used as a benchmark scheme

Software defect prediction: do different classifiers find the same defects?

Open Access: This article is distributed under the terms of the Creative Commons Attribution 4.0 International License CC BY 4.0 (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.During the last 10 years, hundreds of different defect prediction models have been published. The performance of the classifiers used in these models is reported to be similar with models rarely performing above the predictive performance ceiling of about 80% recall. We investigate the individual defects that four classifiers predict and analyse the level of prediction uncertainty produced by these classifiers. We perform a sensitivity analysis to compare the performance of Random Forest, Naïve Bayes, RPart and SVM classifiers when predicting defects in NASA, open source and commercial datasets. The defect predictions that each classifier makes is captured in a confusion matrix and the prediction uncertainty of each classifier is compared. Despite similar predictive performance values for these four classifiers, each detects different sets of defects. Some classifiers are more consistent in predicting defects than others. Our results confirm that a unique subset of defects can be detected by specific classifiers. However, while some classifiers are consistent in the predictions they make, other classifiers vary in their predictions. Given our results, we conclude that classifier ensembles with decision-making strategies not based on majority voting are likely to perform best in defect prediction.Peer reviewedFinal Published versio

Monitoring and debugging using an SDK for NFV-powered telecom applications

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