377 research outputs found

    Phase Locked Loop Test Methodology

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    Phase locked loops are incorporated into almost every large-scale mixed signal and digital system on chip (SOC). Various types of PLL architectures exist including fully analogue, fully digital, semi-digital, and software based. Currently the most commonly used PLL architecture for SOC environments and chipset applications is the Charge-Pump (CP) semi-digital type. This architecture is commonly used for clock synthesis applications, such as the supply of a high frequency on-chip clock, which is derived from a low frequency board level clock. In addition, CP-PLL architectures are now frequently used for demanding RF (Radio Frequency) synthesis, and data synchronization applications. On chip system blocks that rely on correct PLL operation may include third party IP cores, ADCs, DACs and user defined logic (UDL). Basically, any on-chip function that requires a stable clock will be reliant on correct PLL operation. As a direct consequence it is essential that the PLL function is reliably verified during both the design and debug phase and through production testing. This chapter focuses on test approaches related to embedded CP-PLLs used for the purpose of clock generation for SOC. However, methods discussed will generally apply to CP-PLLs used for other applications

    A built-in self-test technique for high speed analog-to-digital converters

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    Fundação para a Ciência e a Tecnologia (FCT) - PhD grant (SFRH/BD/62568/2009

    Study of Single-Event Transient Effects on Analog Circuits

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    Radiation in space is potentially hazardous to microelectronic circuits and systems such as spacecraft electronics. Transient effects on circuits and systems from high energetic particles can interrupt electronics operation or crash the systems. This phenomenon is particularly serious in complementary metal-oxide-semiconductor (CMOS) integrated circuits (ICs) since most of modern ICs are implemented with CMOS technologies. The problem is getting worse with the technology scaling down. Radiation-hardening-by-design (RHBD) is a popular method to build CMOS devices and systems meeting performance criteria in radiation environment. Single-event transient (SET) effects in digital circuits have been studied extensively in the radiation effect community. In recent years analog RHBD has been received increasing attention since analog circuits start showing the vulnerability to the SETs due to the dramatic process scaling. Analog RHBD is still in the research stage. This study is to further study the effects of SET on analog CMOS circuits and introduces cost-effective RHBD approaches to mitigate these effects. The analog circuits concerned in this study include operational amplifiers (op amps), comparators, voltage-controlled oscillators (VCOs), and phase-locked loops (PLLs). Op amp is used to study SET effects on signal amplitude while the comparator, the VCO, and the PLL are used to study SET effects on signal state during transition time. In this work, approaches based on multi-level from transistor, circuit, to system are presented to mitigate the SET effects on the aforementioned circuits. Specifically, RHBD approach based on the circuit level, such as the op amp, adapts the auto-zeroing cancellation technique. The RHBD comparator implemented with dual-well and triple-well is studied and compared at the transistor level. SET effects are mitigated in a LC-tank oscillator by inserting a decoupling resistor. The RHBD PLL is implemented on the system level using triple modular redundancy (TMR) approach. It demonstrates that RHBD at multi-level can be cost-effective to mitigate the SEEs in analog circuits. In addition, SETs detection approaches are provided in this dissertation so that various mitigation approaches can be implemented more effectively. Performances and effectiveness of the proposed RHBD are validated through SPICE simulations on the schematic and pulsed-laser experiments on the fabricated circuits. The proposed and tested RHBD techniques can be applied to other relevant analog circuits in the industry to achieve radiation-tolerance

    Low jitter phase-locked loop clock synthesis with wide locking range

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    The fast growing demand of wireless and high speed data communications has driven efforts to increase the levels of integration in many communications applications. Phase noise and timing jitter are important design considerations for these communications applications. The desire for highly complex levels of integration using low cost CMOS technologies works against the minimization of timing jitter and phase noise for communications systems which employ a phase-locked loop for frequency and clock synthesis with on-chip VCO. This dictates an integrated CMOS implementation of the VCO with very low phase noise performance. The ring oscillator VCOs based on differential delay cell chains have been used successfully in communications applications, but thermal noise induced phase noise have to be minimized in order not to limit their applicability to some applications which impose stringent timing jitter and phase noise requirements on the PLL clock synthesizer. Obtaining lower timing jitter and phase noise at the PLL output also requires the minimization of noise in critical circuit design blocks as well as the optimization of the loop bandwidth of the PLL. In this dissertation the fundamental performance limits of CMOS PLL clock synthesizers based on ring oscillator VCOs are investigated. The effect of flicker and thermal noise in MOS transistors on timing jitter and phase noise are explored, with particular emphasis on source coupled NMOS differential delay cells with symmetric load elements. Several new circuit architectures are employed for the charge pump circuit and phase-frequency detector (PFD) to minimize the timing jitter due to the finite dead zone in the PFD and the current mismatch in the charge pump circuit. The selection of the optimum PLL loop bandwidth is critical in determining the phase noise performance at the PLL output. The optimum loop bandwidth and the phase noise performance of the PLL is determined using behavioral simulations. These results are compared with transistor level simulated results and experimental results for the PLL clock synthesizer fabricated in a 0.35 µm CMOS technology with good agreement. To demonstrate the proposed concept, a fully integrated CMOS PLL clock synthesizer utilizing integer-N frequency multiplier technique to synthesize several clock signals in the range of 20-400 MHz with low phase noise was designed. Implemented in a standard 0.35-µm N-well CMOS process technology, the PLL achieves a period jitter of 6.5-ps (rms) and 38-ps (peak-to-peak) at 216 MHz with a phase noise of -120 dBc/Hz at frequency offsets above 10 KHz. The specific research contributions of this work include (1) proposing, designing, and implementing a new charge pump circuit architecture that matches current levels and therefore minimizes one source of phase noise due to fluctuations in the control voltage of the VCO, (2) an improved phase-frequency detector architecture which has improved characteristics in lock condition, (3) an improved ring oscillator VCO with excellent thermal noise induced phase noise characteristics, (4) the application of selfbiased techniques together with fixed bias to CMOS low phase noise PLL clock synthesizer for digital video communications ,and (5) an analytical model that describes the phase noise performance of the proposed VCO and PLL clock synthesizer

    A study of Radiation-Tolerant Voltage-Controlled Oscillators designs in 65 nm bulk and 28 nm FDSOI CMOS technologies

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    Phase-locked loop (PLL) systems are widely employed in integrated circuits for space analog devices and communications systems that operate in radiation environments, where significant perturbations, especially in terms of phase noise, can be generated due to radiation particles. Among all the blocks that form a PLL system, previous research suggests the voltage-controlled oscillator (VCO) is one of the most critical components in terms of radiation tolerance and electric performance. Ring oscillators (ROs) and LC-tank VCOs have been commonly employed in high-performance PLLs. Nevertheless, both structures have drawbacks including a limited tuning range, high sensitivity to phase noise, limited radiation tolerance, and large design areas. In order to fulfill these high-performance requirements, a current-model logic (CML) based RO-VCO is presented as a possible solution capable of reducing the limitations of the commonly used structures and exploiting their advantages. The proposed hybrid VCO model includes passive components in its design which are the key parameters that define oscillation frequency of this structure. This tunable oscillator has been designed and tested in 65nm Bulk and 28 nm Fully depleted silicon-on-insulator (FDSOI) CMOS technologies The 65nm testchip was designed to compare the behavior of the proposed CML VCO with a current-starved RO and a radiation hardened by design (RHBD) LC-tank VCO in terms of tuning range, phase noise, Single event effect (SEE) sensitivity and design area. Simulations were carried out by applying a double exponential current pulse into different sensitive nodes of the three VCOs. In addition, SEE tests were conducted using pulsed laser experiments. Simulation and test results show that a CML VCO can effectively overcome the limitations presented by a RO-VCO and LC-tank VCO, achieving a wide range of tuning, and low sensitivity to noise and SEEs without the need for a large cross-section. Further studies of the proposed CML VCO were done on 28nm FDSOI in order to reduce the leakage current and increase the switching speed. the same current-starved VCO and CML VCO were implemented on this testchip, and simulations were performed by injecting a double exponential current pulse energy into the previously defined sensitive nodes. The results show SEE sensitivity improvement without narrowing the tuning range or affecting the phase noise response

    An arm length stabilization system for KAGRA and future gravitational-wave detectors

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    Modern ground-based gravitational wave (GW) detectors require a complex interferometer configuration with multiple coupled optical cavities. Since achieving the resonances of the arm cavities is the most challenging among the lock acquisition processes, the scheme called arm length stabilization (ALS) had been employed for lock acquisition of the arm cavities. We designed a new type of the ALS, which is compatible with the interferometers having long arms like the next generation GW detectors. The features of the new ALS are that the control configuration is simpler than those of previous ones and that it is not necessary to lay optical fibers for the ALS along the kilometer-long arms of the detector. Along with simulations of its noise performance, an experimental test of the new ALS was performed utilizing a single arm cavity of KAGRA. This paper presents the first results of the test where we demonstrated that lock acquisition of the arm cavity was achieved using the new ALS. We also demonstrated that the root mean square of residual noise was measured to be 8.2 Hz in units of frequency, which is smaller than the linewidth of the arm cavity and thus low enough to lock the full interferometer of KAGRA in a repeatable and reliable manner

    Analysis and equalization of data-dependent jitter

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    Data-dependent jitter limits the bit-error rate (BER) performance of broadband communication systems and aggravates synchronization in phase- and delay-locked loops used for data recovery. A method for calculating the data-dependent jitter in broadband systems from the pulse response is discussed. The impact of jitter on conventional clock and data recovery circuits is studied in the time and frequency domain. The deterministic nature of data-dependent jitter suggests equalization techniques suitable for high-speed circuits. Two equalizer circuit implementations are presented. The first is a SiGe clock and data recovery circuit modified to incorporate a deterministic jitter equalizer. This circuit demonstrates the reduction of jitter in the recovered clock. The second circuit is a MOS implementation of a jitter equalizer with independent control of the rising and falling edge timing. This equalizer demonstrates improvement of the timing margins that achieve 10/sup -12/ BER from 30 to 52 ps at 10 Gb/s

    Formal Verification and In-Situ Test of Analog and Mixed-Signal Circuits

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    As CMOS technologies continuously scale down, designing robust analog and mixed-signal (AMS) circuits becomes increasingly difficult. Consequently, there are pressing needs for AMS design checking techniques, more specifically design verification and design for testability (DfT). The purpose of verification is to ensure that the performance of an AMS design meets its specification under process, voltage and temperature (PVT) variations and different working conditions, while DfT techniques aim at embedding testability into the design, by adding auxiliary circuitries for testing purpose. This dissertation focuses on improving the robustness of AMS designs in highly scaled technologies, by developing novel formal verification and in-situ test techniques. Compared with conventional AMS verification that relies more on heuristically chosen simulations, formal verification provides a mathematically rigorous way of checking the target design property. A formal verification framework is proposed that incorporates nonlinear SMT solving techniques and simulation exploration to efficiently verify the dynamic properties of AMS designs. A powerful Bayesian inference based technique is applied to dynamically tradeoff between the costs of simulation and nonlinear SMT. The feasibility and efficacy of the proposed methodology are demonstrated on the verification of lock time specification of a charge-pump PLL. The powerful and low-cost digital processing capabilities of today?s CMOS technologies are enabling many new in-situ test schemes in a mixed-signal environment. First, a novel two-level structure of GRO-PVDL is proposed for on-chip jitter testing of high-speed high-resolution applications with a gated ring oscillator (GRO) at the first level to provide a coarse measurement and a Vernier-style structure at the second level to further measure the residue from the first level with a fine resolution. With the feature of quantization noise shaping, an effective resolution of 0.8ps can be achieved using a 90nm CMOS technology. Second, the reconfigurability of recent all-digital PLL designs is exploited to provide in-situ output jitter test and diagnosis abilities under multiple parametric variations of key analog building blocks. As an extension, an in-situ test scheme is proposed to provide online testing for all-digital PLL based polar transmitters

    Process and Temperature Compensated Wideband Injection Locked Frequency Dividers and their Application to Low-Power 2.4-GHz Frequency Synthesizers

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    There has been a dramatic increase in wireless awareness among the user community in the past five years. The 2.4-GHz Industrial, Scientific and Medical (ISM) band is being used for a diverse range of applications due to the following reasons. It is the only unlicensed band approved worldwide and it offers more bandwidth and supports higher data rates compared to the 915-MHz ISM band. The power consumption of devices utilizing the 2.4-GHz band is much lower compared to the 5.2-GHz ISM band. Protocols like Bluetooth and Zigbee that utilize the 2.4-GHz ISM band are becoming extremely popular. Bluetooth is an economic wireless solution for short range connectivity between PC, cell phones, PDAs, Laptops etc. The Zigbee protocol is a wireless technology that was developed as an open global standard to address the unique needs of low-cost, lowpower, wireless sensor networks. Wireless sensor networks are becoming ubiquitous, especially after the recent terrorist activities. Sensors are employed in strategic locations for real-time environmental monitoring, where they collect and transmit data frequently to a nearby terminal. The devices operating in this band are usually compact and battery powered. To enhance battery life and avoid the cumbersome task of battery replacement, the devices used should consume extremely low power. Also, to meet the growing demands cost and sized has to be kept low which mandates fully monolithic implementation using low cost process. CMOS process is extremely attractive for such applications because of its low cost and the possibility to integrate baseband and high frequency circuits on the same chip. A fully integrated solution is attractive for low power consumption as it avoids the need for power hungry drivers for driving off-chip components. The transceiver is often the most power hungry block in a wireless communication system. The frequency divider (prescaler) and the voltage controlled oscillator in the transmitter’s frequency synthesizer are among the major sources of power consumption. There have been a number of publications in the past few decades on low-power high-performance VCOs. Therefore this work focuses on prescalers. A class of analog frequency dividers called as Injection-Locked Frequency Dividers (ILFD) was introduced in the recent past as low power frequency division. ILFDs can consume an order of magnitude lower power when compared to conventional flip-flop based dividers. However the range of operation frequency also knows as the locking range is limited. ILFDs can be classified as LC based and Ring based. Though LC based are insensitive to process and temperature variation, they cannot be used for the 2.4-GHz ISM band because of the large size of on-chip inductors at these frequencies. This causes a lot of valuable chip area to be wasted. Ring based ILFDs are compact and provide a low power solution but are extremely sensitive to process and temperature variations. Process and temperature variation can cause ring based ILFD to loose lock in the desired operating band. The goal of this work is to make the ring based ILFDs useful for practical applications. Techniques to extend the locking range of the ILFDs are discussed. A novel and simple compensation technique is devised to compensate the ILFD and keep the locking range tight with process and temperature variations. The proposed ILFD is used in a 2.4-GHz frequency synthesizer that is optimized for fractional-N synthesis. Measurement results supporting the theory are provided
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