Ultra-Low-Power Superconductor Logic

We have developed a new superconducting digital technology, Reciprocal Quantum Logic, that uses AC power carried on a transmission line, which also serves as a clock. Using simple experiments we have demonstrated zero static power dissipation, thermally limited dynamic power dissipation, high clock stability, high operating margins and low BER. These features indicate that the technology is scalable to far more complex circuits at a significant level of integration. On the system level, Reciprocal Quantum Logic combines the high speed and low-power signal levels of Single-Flux- Quantum signals with the design methodology of CMOS, including low static power dissipation, low latency combinational logic, and efficient device count.Comment: 7 pages, 5 figure

Testing of leakage current failure in ASIC devices exposed to total ionizing dose environment using design for testability techniques

Due to the advancements in technology, electronic devices have been relied upon to operate under harsh conditions. Radiation is one of the main causes of different failures of the electronics devices. According to the operation environment, the sources of the radiation can be terrestrial or extra-terrestrial. For terrestrial the devices can be used in nuclear reactors or biomedical devices where the radiation is man-made. While for the extra- terrestrial, the devices can be used in satellites, the international space station or spaceships, where the radiation comes from various sources like the Sun. According to the operation environment the effects of radiation differ. These effects falls under two categories, total ionizing dose effect (TID) and single event effects (SEEs). TID effects can be affect the delay and leakage current of CMOS circuits negatively. The affects can therefore hinder the integrated circuits\u27 operation. Before the circuits are used, particularly in critical radiation heavy applications like military and space, testing under radiation must be done to avoid any failures during operation. The standard in testing electronic devices is generating worst case test vectors (WCTVs) and under radiation using these vectors the circuits are tested. However, the generation of these WCTVs have been very challenging so this approach is rarely used for TIDs effects. Design for testability (DFT) have been widely used in the industry for digital circuits testing applications. DFT is usually used with automatic test patterns generation software to generate test vectors against fault models of manufacturer defects for application specific integrated circuit (ASIC.) However, it was never used to generate test vectors for leakage current testing induced in ASICs exposed to TID radiation environment. The purpose of the thesis is to use DFT to identify WCTVs for leakage current failures in sequential circuits for ASIC devices exposed to TID. A novel methodology was devised to identify these test vectors. The methodology is validated and compared to previous non DFT methods. The methodology is proven to overcome the limitation of previous methodologies

IDPAL – A Partially-Adiabatic Energy-Efficient Logic Family: Theory and Applications to Secure Computing

Low-power circuits and issues associated with them have gained a significant amount of attention in recent years due to the boom in portable electronic devices. Historically, low-power operation relied heavily on technology scaling and reduced operating voltage, however this trend has been slowing down recently due to the increased power density on chips. This dissertation introduces a new very-low power partially-adiabatic logic family called Input-Decoupled Partially-Adiabatic Logic (IDPAL) with applications in low-power circuits. Experimental results show that IDPAL reduces energy usage by 79% compared to equivalent CMOS implementations and by 25% when compared to the best adiabatic implementation. Experiments ranging from a simple buffer/inverter up to a 32-bit multiplier are explored and result in consistent energy savings, showing that IDPAL could be a viable candidate for a low-power circuit implementation. This work also shows an application of IDPAL to secure low-power circuits against power analysis attacks. It is often assumed that encryption algorithms are perfectly secure against attacks, however, most times attacks using side channels on the hardware implementation of an encryption operation are not investigated. Power analysis attacks are a subset of side channel attacks and can be implemented by measuring the power used by a circuit during an encryption operation in order to obtain secret information from the circuit under attack. Most of the previously proposed solutions for power analysis attacks use a large amount of power and are unsuitable for a low-power application. The almost-equal energy consumption for any given input in an IDPAL circuit suggests that this logic family is a good candidate for securing low-power circuits again power analysis attacks. Experimental results ranging from small circuits to large multipliers are performed and the power-analysis attack resistance of IDPAL is investigated. Results show that IDPAL circuits are not only low-power but also the most secure against power analysis attacks when compared to other adiabatic low-power circuits. Finally, a hybrid adiabatic-CMOS microprocessor design is presented. The proposed microprocessor uses IDPAL for the implementation of circuits with high switching activity (e.g. ALU) and CMOS logic for other circuits (e.g. memory, controller). An adiabatic-CMOS interface for transforming adiabatic signals to square-wave signals is presented and issues associated with a hybrid implementation and their solutions are also discussed

Cross-Layer Resiliency Modeling and Optimization: A Device to Circuit Approach

The never ending demand for higher performance and lower power consumption pushes the VLSI industry to further scale the technology down. However, further downscaling of technology at nano-scale leads to major challenges. Reduced reliability is one of them, arising from multiple sources e.g. runtime variations, process variation, and transient errors. The objective of this thesis is to tackle unreliability with a cross layer approach from device up to circuit level

An advanced Framework for efficient IC optimization based on analytical models engine

En base als reptes sorgits a conseqüència de l'escalat de la tecnologia, la present tesis desenvolupa i analitza un conjunt d'eines orientades a avaluar la sensibilitat a la propagació d'esdeveniments SET en circuits microelectrònics. S'han proposant varies mètriques de propagació de SETs considerant l'impacto dels emmascaraments lògic, elèctric i combinat lògic-elèctric. Aquestes mètriques proporcionen una via d'anàlisi per quantificar tant les regions més susceptibles a propagar SETs com les sortides més susceptibles de rebre'ls. S'ha desenvolupat un conjunt d'algorismes de cerca de camins sensibilitzables altament adaptables a múltiples aplicacions, un sistema lògic especific i diverses tècniques de simplificació de circuits. S'ha demostrat que el retard d'un camí donat depèn dels vectors de sensibilització aplicats a les portes que formen part del mateix, essent aquesta variació de retard comparable a la atribuïble a les variacions paramètriques del proces.En base a los desafíos surgidos a consecuencia del escalado de la tecnología, la presente tesis desarrolla y analiza un conjunto de herramientas orientadas a evaluar la sensibilidad a la propagación de eventos SET en circuitos microelectrónicos. Se han propuesto varias métricas de propagación de SETs considerando el impacto de los enmascaramientos lógico, eléctrico y combinado lógico-eléctrico. Estas métricas proporcionan una vía de análisis para cuantificar tanto las regiones más susceptibles a propagar eventos SET como las salidas más susceptibles a recibirlos. Ha sido desarrollado un conjunto de algoritmos de búsqueda de caminos sensibilizables altamente adaptables a múltiples aplicaciones, un sistema lógico especifico y diversas técnicas de simplificación de circuitos. Se ha demostrado que el retardo de un camino dado depende de los vectores de sensibilización aplicados a las puertas que forman parte del mismo, siendo esta variación de retardo comparable a la atribuible a las variaciones paramétricas del proceso.Based on the challenges arising as a result of technology scaling, this thesis develops and evaluates a complete framework for SET propagation sensitivity. The framework comprises a number of processing tools capable of handling circuits with high complexity in an efficient way. Various SET propagation metrics have been proposed considering the impact of logic, electric and combined logic-electric masking. Such metrics provide a valuable vehicle to grade either in-circuit regions being more susceptible of propagating SETs toward the circuit outputs or circuit outputs more susceptible to produce SET. A quite efficient and customizable true path finding algorithm with a specific logic system has been constructed and its efficacy demonstrated on large benchmark circuits. It has been shown that the delay of a path depends on the sensitization vectors applied to the gates within the path. In some cases, this variation is comparable to the one caused by process parameters variation