A survey of outlier detection methodologies

Outlier detection has been used for centuries to detect and, where appropriate, remove anomalous observations from data. Outliers arise due to mechanical faults, changes in system behaviour, fraudulent behaviour, human error, instrument error or simply through natural deviations in populations. Their detection can identify system faults and fraud before they escalate with potentially catastrophic consequences. It can identify errors and remove their contaminating effect on the data set and as such to purify the data for processing. The original outlier detection methods were arbitrary but now, principled and systematic techniques are used, drawn from the full gamut of Computer Science and Statistics. In this paper, we introduce a survey of contemporary techniques for outlier detection. We identify their respective motivations and distinguish their advantages and disadvantages in a comparative review

Regularizing Face Verification Nets For Pain Intensity Regression

Limited labeled data are available for the research of estimating facial expression intensities. For instance, the ability to train deep networks for automated pain assessment is limited by small datasets with labels of patient-reported pain intensities. Fortunately, fine-tuning from a data-extensive pre-trained domain, such as face verification, can alleviate this problem. In this paper, we propose a network that fine-tunes a state-of-the-art face verification network using a regularized regression loss and additional data with expression labels. In this way, the expression intensity regression task can benefit from the rich feature representations trained on a huge amount of data for face verification. The proposed regularized deep regressor is applied to estimate the pain expression intensity and verified on the widely-used UNBC-McMaster Shoulder-Pain dataset, achieving the state-of-the-art performance. A weighted evaluation metric is also proposed to address the imbalance issue of different pain intensities.Comment: 5 pages, 3 figure; Camera-ready version to appear at IEEE ICIP 201