Self-Learning Hot Data Prediction: Where Echo State Network Meets NAND Flash Memories

© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Well understanding the access behavior of hot data is significant for NAND flash memory due to its crucial impact on the efficiency of garbage collection (GC) and wear leveling (WL), which respectively dominate the performance and life span of SSD. Generally, both GC and WL rely greatly on the recognition accuracy of hot data identification (HDI). However, in this paper, the first time we propose a novel concept of hot data prediction (HDP), where the conventional HDI becomes unnecessary. First, we develop a hybrid optimized echo state network (HOESN), where sufficiently unbiased and continuously shrunk output weights are learnt by a sparse regression based on L2 and L1/2 regularization. Second, quantum-behaved particle swarm optimization (QPSO) is employed to compute reservoir parameters (i.e., global scaling factor, reservoir size, scaling coefficient and sparsity degree) for further improving prediction accuracy and reliability. Third, in the test on a chaotic benchmark (Rossler), the HOESN performs better than those of six recent state-of-the-art methods. Finally, simulation results about six typical metrics tested on five real disk workloads and on-chip experiment outcomes verified from an actual SSD prototype indicate that our HOESN-based HDP can reliably promote the access performance and endurance of NAND flash memories.Peer reviewe

Spatial support vector regression to detect silent errors in the exascale era

As the exascale era approaches, the increasing capacity of high-performance computing (HPC) systems with targeted power and energy budget goals introduces significant challenges in reliability. Silent data corruptions (SDCs) or silent errors are one of the major sources that corrupt the executionresults of HPC applications without being detected. In this work, we explore a low-memory-overhead SDC detector, by leveraging epsilon-insensitive support vector machine regression, to detect SDCs that occur in HPC applications that can be characterized by an impact error bound. The key contributions are three fold. (1) Our design takes spatialfeatures (i.e., neighbouring data values for each data point in a snapshot) into training data, such that little memory overhead (less than 1%) is introduced. (2) We provide an in-depth study on the detection ability and performance with different parameters, and we optimize the detection range carefully. (3) Experiments with eight real-world HPC applications show thatour detector can achieve the detection sensitivity (i.e., recall) up to 99% yet suffer a less than 1% of false positive rate for most cases. Our detector incurs low performance overhead, 5% on average, for all benchmarks studied in the paper. Compared with other state-of-the-art techniques, our detector exhibits the best tradeoff considering the detection ability and overheads.This work was supported by the U.S. Department of Energy, Office of Science, Advanced Scientific Computing Research Program, under Contract DE-AC02-06CH11357, by FI-DGR 2013 scholarship, by HiPEAC PhD Collaboration Grant, the European Community’s Seventh Framework Programme [FP7/2007-2013] under the Mont-blanc 2 Project (www.montblanc-project.eu), grant agreement no. 610402, and TIN2015-65316-P.Peer ReviewedPostprint (author's final draft

Versatile stochastic dot product circuits based on nonvolatile memories for high performance neurocomputing and neurooptimization.

The key operation in stochastic neural networks, which have become the state-of-the-art approach for solving problems in machine learning, information theory, and statistics, is a stochastic dot-product. While there have been many demonstrations of dot-product circuits and, separately, of stochastic neurons, the efficient hardware implementation combining both functionalities is still missing. Here we report compact, fast, energy-efficient, and scalable stochastic dot-product circuits based on either passively integrated metal-oxide memristors or embedded floating-gate memories. The circuit's high performance is due to mixed-signal implementation, while the efficient stochastic operation is achieved by utilizing circuit's noise, intrinsic and/or extrinsic to the memory cell array. The dynamic scaling of weights, enabled by analog memory devices, allows for efficient realization of different annealing approaches to improve functionality. The proposed approach is experimentally verified for two representative applications, namely by implementing neural network for solving a four-node graph-partitioning problem, and a Boltzmann machine with 10-input and 8-hidden neurons

An Experimental Study of Reduced-Voltage Operation in Modern FPGAs for Neural Network Acceleration

We empirically evaluate an undervolting technique, i.e., underscaling the circuit supply voltage below the nominal level, to improve the power-efficiency of Convolutional Neural Network (CNN) accelerators mapped to Field Programmable Gate Arrays (FPGAs). Undervolting below a safe voltage level can lead to timing faults due to excessive circuit latency increase. We evaluate the reliability-power trade-off for such accelerators. Specifically, we experimentally study the reduced-voltage operation of multiple components of real FPGAs, characterize the corresponding reliability behavior of CNN accelerators, propose techniques to minimize the drawbacks of reduced-voltage operation, and combine undervolting with architectural CNN optimization techniques, i.e., quantization and pruning. We investigate the effect of environmental temperature on the reliability-power trade-off of such accelerators. We perform experiments on three identical samples of modern Xilinx ZCU102 FPGA platforms with five state-of-the-art image classification CNN benchmarks. This approach allows us to study the effects of our undervolting technique for both software and hardware variability. We achieve more than 3X power-efficiency (GOPs/W) gain via undervolting. 2.6X of this gain is the result of eliminating the voltage guardband region, i.e., the safe voltage region below the nominal level that is set by FPGA vendor to ensure correct functionality in worst-case environmental and circuit conditions. 43% of the power-efficiency gain is due to further undervolting below the guardband, which comes at the cost of accuracy loss in the CNN accelerator. We evaluate an effective frequency underscaling technique that prevents this accuracy loss, and find that it reduces the power-efficiency gain from 43% to 25%.Comment: To appear at the DSN 2020 conferenc

Cost-Driven Hardware-Software Co-Optimization of Machine Learning Pipelines

Researchers have long touted a vision of the future enabled by a proliferation of internet-of-things devices, including smart sensors, homes, and cities. Increasingly, embedding intelligence in such devices involves the use of deep neural networks. However, their storage and processing requirements make them prohibitive for cheap, off-the-shelf platforms. Overcoming those requirements is necessary for enabling widely-applicable smart devices. While many ways of making models smaller and more efficient have been developed, there is a lack of understanding of which ones are best suited for particular scenarios. More importantly for edge platforms, those choices cannot be analyzed in isolation from cost and user experience. In this work, we holistically explore how quantization, model scaling, and multi-modality interact with system components such as memory, sensors, and processors. We perform this hardware/software co-design from the cost, latency, and user-experience perspective, and develop a set of guidelines for optimal system design and model deployment for the most cost-constrained platforms. We demonstrate our approach using an end-to-end, on-device, biometric user authentication system using a $20 ESP-EYE board

Flash Memory Devices

Flash memory devices have represented a breakthrough in storage since their inception in the mid-1980s, and innovation is still ongoing. The peculiarity of such technology is an inherent flexibility in terms of performance and integration density according to the architecture devised for integration. The NOR Flash technology is still the workhorse of many code storage applications in the embedded world, ranging from microcontrollers for automotive environment to IoT smart devices. Their usage is also forecasted to be fundamental in emerging AI edge scenario. On the contrary, when massive data storage is required, NAND Flash memories are necessary to have in a system. You can find NAND Flash in USB sticks, cards, but most of all in Solid-State Drives (SSDs). Since SSDs are extremely demanding in terms of storage capacity, they fueled a new wave of innovation, namely the 3D architecture. Today “3D” means that multiple layers of memory cells are manufactured within the same piece of silicon, easily reaching a terabit capacity. So far, Flash architectures have always been based on "floating gate," where the information is stored by injecting electrons in a piece of polysilicon surrounded by oxide. On the contrary, emerging concepts are based on "charge trap" cells. In summary, flash memory devices represent the largest landscape of storage devices, and we expect more advancements in the coming years. This will require a lot of innovation in process technology, materials, circuit design, flash management algorithms, Error Correction Code and, finally, system co-design for new applications such as AI and security enforcement

Machine Learning for Microcontroller-Class Hardware -- A Review

The advancements in machine learning opened a new opportunity to bring intelligence to the low-end Internet-of-Things nodes such as microcontrollers. Conventional machine learning deployment has high memory and compute footprint hindering their direct deployment on ultra resource-constrained microcontrollers. This paper highlights the unique requirements of enabling onboard machine learning for microcontroller class devices. Researchers use a specialized model development workflow for resource-limited applications to ensure the compute and latency budget is within the device limits while still maintaining the desired performance. We characterize a closed-loop widely applicable workflow of machine learning model development for microcontroller class devices and show that several classes of applications adopt a specific instance of it. We present both qualitative and numerical insights into different stages of model development by showcasing several use cases. Finally, we identify the open research challenges and unsolved questions demanding careful considerations moving forward.Comment: Accepted for publication at IEEE Sensors Journa

Tiny Machine Learning Environment: Enabling Intelligence on Constrained Devices

Running machine learning algorithms (ML) on constrained devices at the extreme edge of the network is problematic due to the computational overhead of ML algorithms, available resources on the embedded platform, and application budget (i.e., real-time requirements, power constraints, etc.). This required the development of specific solutions and development tools for what is now referred to as TinyML. In this dissertation, we focus on improving the deployment and performance of TinyML applications, taking into consideration the aforementioned challenges, especially memory requirements. This dissertation contributed to the construction of the Edge Learning Machine environment (ELM), a platform-independent open-source framework that provides three main TinyML services, namely shallow ML, self-supervised ML, and binary deep learning on constrained devices. In this context, this work includes the following steps, which are reflected in the thesis structure. First, we present the performance analysis of state-of-the-art shallow ML algorithms including dense neural networks, implemented on mainstream microcontrollers. The comprehensive analysis in terms of algorithms, hardware platforms, datasets, preprocessing techniques, and configurations shows similar performance results compared to a desktop machine and highlights the impact of these factors on overall performance. Second, despite the assumption that TinyML only permits models inference provided by the scarcity of resources, we have gone a step further and enabled self-supervised on-device training on microcontrollers and tiny IoT devices by developing the Autonomous Edge Pipeline (AEP) system. AEP achieves comparable accuracy compared to the typical TinyML paradigm, i.e., models trained on resource-abundant devices and then deployed on microcontrollers. Next, we present the development of a memory allocation strategy for convolutional neural networks (CNNs) layers, that optimizes memory requirements. This approach reduces the memory footprint without affecting accuracy nor latency. Moreover, e-skin systems share the main requirements of the TinyML fields: enabling intelligence with low memory, low power consumption, and low latency. Therefore, we designed an efficient Tiny CNN architecture for e-skin applications. The architecture leverages the memory allocation strategy presented earlier and provides better performance than existing solutions. A major contribution of the thesis is given by CBin-NN, a library of functions for implementing extremely efficient binary neural networks on constrained devices. The library outperforms state of the art NN deployment solutions by drastically reducing memory footprint and inference latency. All the solutions proposed in this thesis have been implemented on representative devices and tested in relevant applications, of which results are reported and discussed. The ELM framework is open source, and this work is clearly becoming a useful, versatile toolkit for the IoT and TinyML research and development community