Measurements, Models, Systems and Design

531 s.

Petri net approaches for modeling, controlling, and validating flexible manufacturing systems

In this dissertation, we introduce the fundamental ideas and constructs of Petri net models such as ordinary, timed, colored, stochastic, control, and neural, and present some studies that emphasize Petri nets theories and applications as extended research fields that provide suitable platforms in modeling, controlling, validating, and evaluating concurrent systems, information systems, and a versatile dynamic system and manufacturing systems;We then suggest some of extensions that help make Petri nets useful for modeling and analyzing discrete event systems and manufacturing systems models based on the context of a versatile manufacturing system, and applies extended Petri nets models to several manufacturing systems such as an assembly cell, an Automated Palletized Conveyor System, and a tooling machine to show increased modeling power and efficient analysis methods;Finally, Validation methods are presented for these models and results of a performance analysis from a deterministic and stochastic model are used to reorganize and re-evaluate a manufacturing system in order to increase its flexibility

Tools and Algorithms for the Construction and Analysis of Systems

This book is Open Access under a CC BY licence. The LNCS 11427 and 11428 proceedings set constitutes the proceedings of the 25th International Conference on Tools and Algorithms for the Construction and Analysis of Systems, TACAS 2019, which took place in Prague, Czech Republic, in April 2019, held as part of the European Joint Conferences on Theory and Practice of Software, ETAPS 2019. The total of 42 full and 8 short tool demo papers presented in these volumes was carefully reviewed and selected from 164 submissions. The papers are organized in topical sections as follows: Part I: SAT and SMT, SAT solving and theorem proving; verification and analysis; model checking; tool demo; and machine learning. Part II: concurrent and distributed systems; monitoring and runtime verification; hybrid and stochastic systems; synthesis; symbolic verification; and safety and fault-tolerant systems

Coding approaches to fault tolerance in dynamic systems

Also issued as Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1999.Includes bibliographical references (p. 189-196).Sponsored through a contract with Sanders, A Lockheed Martin Company.Christoforos N. Hadjicostis

A petri-net based methodology for modeling, simulation, and control of flexible manufacturing systems

Global competition has made it necessary for manufacturers to introduce such advanced technologies as flexible and agile manufacturing, intelligent automation, and computer-integrated manufacturing. However, the application extent of these technologies varies from industry to industry and has met various degrees of success. One critical barrier leading to successful implementation of advanced manufacturing systems is the ever-increasing complexity in their modeling, analysis, simulation, and control. The purpose of this work is to introduce a set of Petri net-based tools and methods to address a variety of problems associated with the design and implementation of flexible manufacturing systems (FMSs). More specifically, this work proposes Petri nets as an integrated tool for modeling, simulation, and control of flexible manufacturing systems (FMSs). The contributions of this work are multifold. First, it demonstrates a new application of PNs for simulation by evaluating the performance of pull and push diagrams in manufacturing systems. Second, it introduces a class of PNs, Augmented-timed Petri nets (ATPNs) in order to increase the power of PNs to simulate and control flexible systems with breakdowns. Third, it proposes a new class of PNs called Realtime Petri nets (RTPNs) for discrete event control of FMS s. The detailed comparison between RTPNs and traditional discrete event methods such as ladder logic diagrams is presented to answer the basic question \u27Why is a PN better tool than ladder logic diagram?\u27 and to justify the PN method. Also, a conversion procedure that automatically generates PN models from a given class of logic control specifications is presented. Finally, a methodology that uses PNs for the development of object-oriented control software is proposed. The present work extends the PN state-of-the-art in two ways. First, it offers a wide scope for engineers and managers who are responsible for the design and the implementation of modem manufacturing systems to evaluate Petri nets for applications in their work. Second, it further develops Petri net-based methods for discrete event control of manufacturing systems

Application of hypergraphs in decomposition of discrete systems

seria: Lecture Notes in Control and Computer Science ; vol. 23

Industrial Applications: New Solutions for the New Era

This book reprints articles from the Special Issue "Industrial Applications: New Solutions for the New Age" published online in the open-access journal Machines (ISSN 2075-1702). This book consists of twelve published articles. This special edition belongs to the "Mechatronic and Intelligent Machines" section

Advances in Robotics, Automation and Control

The book presents an excellent overview of the recent developments in the different areas of Robotics, Automation and Control. Through its 24 chapters, this book presents topics related to control and robot design; it also introduces new mathematical tools and techniques devoted to improve the system modeling and control. An important point is the use of rational agents and heuristic techniques to cope with the computational complexity required for controlling complex systems. Through this book, we also find navigation and vision algorithms, automatic handwritten comprehension and speech recognition systems that will be included in the next generation of productive systems developed by man

Energy-Efficient and Reliable Computing in Dark Silicon Era

Dark silicon denotes the phenomenon that, due to thermal and power constraints, the fraction of transistors that can operate at full frequency is decreasing in each technology generation. Moore’s law and Dennard scaling had been backed and coupled appropriately for five decades to bring commensurate exponential performance via single core and later muti-core design. However, recalculating Dennard scaling for recent small technology sizes shows that current ongoing multi-core growth is demanding exponential thermal design power to achieve linear performance increase. This process hits a power wall where raises the amount of dark or dim silicon on future multi/many-core chips more and more. Furthermore, from another perspective, by increasing the number of transistors on the area of a single chip and susceptibility to internal defects alongside aging phenomena, which also is exacerbated by high chip thermal density, monitoring and managing the chip reliability before and after its activation is becoming a necessity. The proposed approaches and experimental investigations in this thesis focus on two main tracks: 1) power awareness and 2) reliability awareness in dark silicon era, where later these two tracks will combine together. In the first track, the main goal is to increase the level of returns in terms of main important features in chip design, such as performance and throughput, while maximum power limit is honored. In fact, we show that by managing the power while having dark silicon, all the traditional benefits that could be achieved by proceeding in Moore’s law can be also achieved in the dark silicon era, however, with a lower amount. Via the track of reliability awareness in dark silicon era, we show that dark silicon can be considered as an opportunity to be exploited for different instances of benefits, namely life-time increase and online testing. We discuss how dark silicon can be exploited to guarantee the system lifetime to be above a certain target value and, furthermore, how dark silicon can be exploited to apply low cost non-intrusive online testing on the cores. After the demonstration of power and reliability awareness while having dark silicon, two approaches will be discussed as the case study where the power and reliability awareness are combined together. The first approach demonstrates how chip reliability can be used as a supplementary metric for power-reliability management. While the second approach provides a trade-off between workload performance and system reliability by simultaneously honoring the given power budget and target reliability

The development of factory templates for the integrated virtual factory framework

Páginas numeradas: I-XVI, 17-123Tese de mestrado integrado. Engenharia Electrotécnica e de Computadores (Major Automação). Faculdade de Engenharia. Universidade do Porto. 201