16 research outputs found
Intelligent Circuits and Systems
ICICS-2020 is the third conference initiated by the School of Electronics and Electrical Engineering at Lovely Professional University that explored recent innovations of researchers working for the development of smart and green technologies in the fields of Energy, Electronics, Communications, Computers, and Control. ICICS provides innovators to identify new opportunities for the social and economic benefits of society. This conference bridges the gap between academics and R&D institutions, social visionaries, and experts from all strata of society to present their ongoing research activities and foster research relations between them. It provides opportunities for the exchange of new ideas, applications, and experiences in the field of smart technologies and finding global partners for future collaboration. The ICICS-2020 was conducted in two broad categories, Intelligent Circuits & Intelligent Systems and Emerging Technologies in Electrical Engineering
Multi-level simulation of nano-electronic digital circuits on GPUs
Simulation of circuits and faults is an essential part in design and test validation tasks of contemporary nano-electronic digital integrated CMOS circuits.
Shrinking technology processes with smaller feature sizes and strict performance and reliability requirements demand not only detailed validation of the functional properties of a design, but also accurate validation of non-functional aspects including the timing behavior. However, due to the rising complexity of the circuit behavior and the steady growth of the designs with respect to the transistor count, timing-accurate simulation of current designs requires a lot of computational effort which can only be handled by proper abstraction and a high degree of parallelization.
This work presents a simulation model for scalable and accurate timing simulation of digital circuits on data-parallel graphics processing unit (GPU) accelerators.
By providing compact modeling and data-structures as well as through exploiting multiple dimensions of parallelism, the simulation model enables not only fast and timing-accurate simulation at logic level, but also massively-parallel simulation with switch level accuracy.
The model facilitates extensions for fast and efficient fault simulation of small delay faults at logic level, as well as first-order parametric and parasitic faults at switch level.
With the parallelization on GPUs, detailed and scalable simulation is enabled that is applicable even to multi-million gate designs.
This way, comprehensive analyses of realistic timing-related faults in presence of process- and parameter variations are enabled for the first time.
Additional simulation efficiency is achieved by merging the presented methods in a unified simulation model, that allows to combine the unique advantages of the different levels of abstraction in a mixed-abstraction multi-level simulation flow to reach even higher speedups.
Experimental results show that the implemented parallel approach achieves unprecedented simulation throughput as well as high speedup compared to conventional timing simulators.
The underlying model scales for multi-million gate designs and gives detailed insights into the timing behavior of digital CMOS circuits, thereby enabling large-scale applications to aid even highly complex design and test validation tasks
Monitor amb control strategies to reduce the impact of process variations in digital circuits
As CMOS technology scales down, Process, Voltage, Temperature and Ageing (PVTA) variations have an increasing impact on the performance and power consumption of electronic devices. These issues may hold back the continuous improvement of these devices in the near future. There are several ways to face the variability problem: to increase the operating margins of maximum clock frequency, the implementation of lithographic friendly layout styles, and the last one and the focus of this thesis, to adapt the circuit to its actual manufacturing and environment conditions by tuning some of the adjustable parameters once the circuit has been manufactured. The main challenge of this thesis is to develop a low-area variability compensation mechanism to automatically mitigate PVTA variations in run-time, i.e. while integrated circuit is running. This implies the development of a sensor to obtain the most accurate picture of variability, and the implementation of a control block to knob some of the electrical parameters of the circuit.A mesura que la tecnologia CMOS escala, les variacions de Procés, Voltatge, Temperatura i Envelliment (PVTA) tenen un impacte creixent en el rendiment i el consum de potència dels dispositius electrònics. Aquesta problemàtica podria arribar a frenar la millora contínua d'aquests dispositius en un futur proper. Hi ha diverses maneres d'afrontar el problema de la variabilitat: relaxar el marge de la freqüència màxima d'operació, implementar dissenys físics de xips més fàcils de litografiar, i per últim i com a tema principal d'aquesta tesi, adaptar el xip a les condicions de fabricació i d'entorn mitjançant la modificació d'algun dels seus paràmetres ajustables una vegada el circuit ja ha estat fabricat. El principal repte d'aquesta tesi és desenvolupar un mecanisme de compensació de variabilitat per tal de mitigar les variacions PVTA de manera automàtica en temps d'execució, és a dir, mentre el xip està funcionant. Això implica el desenvolupament d'un sensor capaç de mesurar la variabilitat de la manera més acurada possible, i la implementació d'un bloc de control que permeti l'ajust d'alguns dels paràmetres elèctrics dels circuits
Design of asynchronous microprocessor for power proportionality
PhD ThesisMicroprocessors continue to get exponentially cheaper for end users following Moore’s
law, while the costs involved in their design keep growing, also at an exponential rate.
The reason is the ever increasing complexity of processors, which modern EDA tools
struggle to keep up with. This makes further scaling for performance subject to a high
risk in the reliability of the system. To keep this risk low, yet improve the performance,
CPU designers try to optimise various parts of the processor. Instruction Set Architecture
(ISA) is a significant part of the whole processor design flow, whose optimal design
for a particular combination of available hardware resources and software requirements
is crucial for building processors with high performance and efficient energy utilisation.
This is a challenging task involving a lot of heuristics and high-level design decisions.
Another issue impacting CPU reliability is continuous scaling for power consumption. For
the last decades CPU designers have been mainly focused on improving performance, but
“keeping energy and power consumption in mind”. The consequence of this was a development
of energy-efficient systems, where energy was considered as a resource whose
consumption should be optimised. As CMOS technology was progressing, with feature
size decreasing and power delivered to circuit components becoming less stable, the
energy resource turned from an optimisation criterion into a constraint, sometimes a critical
one. At this point power proportionality becomes one of the most important aspects
in system design. Developing methods and techniques which will address the problem
of designing a power-proportional microprocessor, capable to adapt to varying operating
conditions (such as low or even unstable voltage levels) and application requirements in
the runtime, is one of today’s grand challenges. In this thesis this challenge is addressed
by proposing a new design flow for the development of an ISA for microprocessors, which
can be altered to suit a particular hardware platform or a specific operating mode. This
flow uses an expressive and powerful formalism for the specification of processor instruction
sets called the Conditional Partial Order Graph (CPOG). The CPOG model captures
large sets of behavioural scenarios for a microarchitectural level in a computationally
efficient form amenable to formal transformations for synthesis, verification and automated
derivation of asynchronous hardware for the CPU microcontrol. The feasibility of
the methodology, novel design flow and a number of optimisation techniques was proven
in a full size asynchronous Intel 8051 microprocessor and its demonstrator silicon. The
chip showed the ability to work in a wide range of operating voltage and environmental
conditions. Depending on application requirements and power budget our ASIC supports
several operating modes: one optimised for energy consumption and the other one for
performance. This was achieved by extending a traditional datapath structure with an
auxiliary control layer for adaptable and fault tolerant operation. These and other optimisations
resulted in a reconfigurable and adaptable implementation, which was proven
by measurements, analysis and evaluation of the chip.EPSR
Design and Validation of Network-on-Chip Architectures for the Next Generation of Multi-synchronous, Reliable, and Reconfigurable Embedded Systems
NETWORK-ON-CHIP (NoC) design is today at a crossroad. On one hand, the
design principles to efficiently implement interconnection networks in the
resource-constrained on-chip setting have stabilized. On the other hand,
the requirements on embedded system design are far from stabilizing. Embedded
systems are composed by assembling together heterogeneous components featuring
differentiated operating speeds and ad-hoc counter measures must be adopted
to bridge frequency domains. Moreover, an unmistakable trend toward enhanced
reconfigurability is clearly underway due to the increasing complexity of applications.
At the same time, the technology effect is manyfold since it provides unprecedented
levels of system integration but it also brings new severe constraints
to the forefront: power budget restrictions, overheating concerns, circuit delay and
power variability, permanent fault, increased probability of transient faults.
Supporting different degrees of reconfigurability and flexibility in the parallel
hardware platform cannot be however achieved with the incremental evolution of
current design techniques, but requires a disruptive approach and a major increase
in complexity. In addition, new reliability challenges cannot be solved by using
traditional fault tolerance techniques alone but the reliability approach must be
also part of the overall reconfiguration methodology.
In this thesis we take on the challenge of engineering a NoC architectures for
the next generation systems and we provide design methods able to overcome the
conventional way of implementing multi-synchronous, reliable and reconfigurable
NoC. Our analysis is not only limited to research novel approaches to the specific
challenges of the NoC architecture but we also co-design the solutions in a single
integrated framework. Interdependencies between different NoC features are
detected ahead of time and we finally avoid the engineering of highly optimized solutions
to specific problems that however coexist inefficiently together in the final
NoC architecture. To conclude, a silicon implementation by means of a testchip
tape-out and a prototype on a FPGA board validate the feasibility and effectivenes
2009-2010 UNM Catalog
Course catalog for the years 2009-2010.https://digitalrepository.unm.edu/course_catalogs/1099/thumbnail.jp
2007-2008 UNM CATALOG
Course catalog for the years 2007-2008.https://digitalrepository.unm.edu/course_catalogs/1022/thumbnail.jp
2006-2007 UNM CATALOG
Course catalog for the years 2006-2007.https://digitalrepository.unm.edu/course_catalogs/1011/thumbnail.jp
Fault and Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices
This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a fault and defect tolerant (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required hardware redundancy is approximately 15 times that of a non-fault tolerant design. While larger than current FT designs, this architecture allows the use of devices much more likely to fail than silicon CMOS. As part of model development, an improved model is derived for NAND Multiplexing. The model is the first accurate model for small and medium amounts of redundancy. Previous models are extended to account for dependence between the inputs and produce more accurate results