580 research outputs found
An Experimental Study of Reduced-Voltage Operation in Modern FPGAs for Neural Network Acceleration
We empirically evaluate an undervolting technique, i.e., underscaling the
circuit supply voltage below the nominal level, to improve the power-efficiency
of Convolutional Neural Network (CNN) accelerators mapped to Field Programmable
Gate Arrays (FPGAs). Undervolting below a safe voltage level can lead to timing
faults due to excessive circuit latency increase. We evaluate the
reliability-power trade-off for such accelerators. Specifically, we
experimentally study the reduced-voltage operation of multiple components of
real FPGAs, characterize the corresponding reliability behavior of CNN
accelerators, propose techniques to minimize the drawbacks of reduced-voltage
operation, and combine undervolting with architectural CNN optimization
techniques, i.e., quantization and pruning. We investigate the effect of
environmental temperature on the reliability-power trade-off of such
accelerators. We perform experiments on three identical samples of modern
Xilinx ZCU102 FPGA platforms with five state-of-the-art image classification
CNN benchmarks. This approach allows us to study the effects of our
undervolting technique for both software and hardware variability. We achieve
more than 3X power-efficiency (GOPs/W) gain via undervolting. 2.6X of this gain
is the result of eliminating the voltage guardband region, i.e., the safe
voltage region below the nominal level that is set by FPGA vendor to ensure
correct functionality in worst-case environmental and circuit conditions. 43%
of the power-efficiency gain is due to further undervolting below the
guardband, which comes at the cost of accuracy loss in the CNN accelerator. We
evaluate an effective frequency underscaling technique that prevents this
accuracy loss, and find that it reduces the power-efficiency gain from 43% to
25%.Comment: To appear at the DSN 2020 conferenc
Evaluating Built-in ECC of FPGA on-chip Memories for the Mitigation of Undervolting Faults
Voltage underscaling below the nominal level is an effective solution for
improving energy efficiency in digital circuits, e.g., Field Programmable Gate
Arrays (FPGAs). However, further undervolting below a safe voltage level and
without accompanying frequency scaling leads to timing related faults,
potentially undermining the energy savings. Through experimental voltage
underscaling studies on commercial FPGAs, we observed that the rate of these
faults exponentially increases for on-chip memories, or Block RAMs (BRAMs). To
mitigate these faults, we evaluated the efficiency of the built-in
Error-Correction Code (ECC) and observed that more than 90% of the faults are
correctable and further 7% are detectable (but not correctable). This
efficiency is the result of the single-bit type of these faults, which are then
effectively covered by the Single-Error Correction and Double-Error Detection
(SECDED) design of the built-in ECC. Finally, motivated by the above
experimental observations, we evaluated an FPGA-based Neural Network (NN)
accelerator under low-voltage operations, while built-in ECC is leveraged to
mitigate undervolting faults and thus, prevent NN significant accuracy loss. In
consequence, we achieve 40% of the BRAM power saving through undervolting below
the minimum safe voltage level, with a negligible NN accuracy loss, thanks to
the substantial fault coverage by the built-in ECC.Comment: 6 pages, 2 figure
On the resilience of deep learning for reduced-voltage FPGAs
Deep Neural Networks (DNNs) are inherently computation-intensive and also power-hungry. Hardware accelerators such as Field Programmable Gate Arrays (FPGAs) are a promising solution that can satisfy these requirements for both embedded and High-Performance Computing (HPC) systems. In FPGAs, as well as CPUs and GPUs, aggressive voltage scaling below the nominal level is an effective technique for power dissipation minimization. Unfortunately, bit-flip faults start to appear as the voltage is scaled down closer to the transistor threshold due to timing issues, thus creating a resilience issue.This paper experimentally evaluates the resilience of the training phase of DNNs in the presence of voltage underscaling related faults of FPGAs, especially in on-chip memories. Toward this goal, we have experimentally evaluated the resilience of LeNet-5 and also a specially designed network for CIFAR-10 dataset with different activation functions of Rectified Linear Unit (Relu) and Hyperbolic Tangent (Tanh). We have found that modern FPGAs are robust enough in extremely low-voltage levels and that low-voltage related faults can be automatically masked within the training iterations, so there is no need for costly software-or hardware-oriented fault mitigation techniques like ECC. Approximately 10% more training iterations are needed to fill the gap in the accuracy. This observation is the result of the relatively low rate of undervolting faults, i.e., <0.1%, measured on real FPGA fabrics. We have also increased the fault rate significantly for the LeNet-5 network by randomly generated fault injection campaigns and observed that the training accuracy starts to degrade. When the fault rate increases, the network with Tanh activation function outperforms the one with Relu in terms of accuracy, e.g., when the fault rate is 30% the accuracy difference is 4.92%.The research leading to these results has received funding from the European Unions Horizon 2020 Programme under the
LEGaTO Project (www.legato-project.eu), grant agreement n 780681.Peer ReviewedPostprint (author's final draft
On the Resilience of RTL NN Accelerators: Fault Characterization and Mitigation
Machine Learning (ML) is making a strong resurgence in tune with the massive
generation of unstructured data which in turn requires massive computational
resources. Due to the inherently compute- and power-intensive structure of
Neural Networks (NNs), hardware accelerators emerge as a promising solution.
However, with technology node scaling below 10nm, hardware accelerators become
more susceptible to faults, which in turn can impact the NN accuracy. In this
paper, we study the resilience aspects of Register-Transfer Level (RTL) model
of NN accelerators, in particular, fault characterization and mitigation. By
following a High-Level Synthesis (HLS) approach, first, we characterize the
vulnerability of various components of RTL NN. We observed that the severity of
faults depends on both i) application-level specifications, i.e., NN data
(inputs, weights, or intermediate), NN layers, and NN activation functions, and
ii) architectural-level specifications, i.e., data representation model and the
parallelism degree of the underlying accelerator. Second, motivated by
characterization results, we present a low-overhead fault mitigation technique
that can efficiently correct bit flips, by 47.3% better than state-of-the-art
methods.Comment: 8 pages, 6 figure
FPGAs in Industrial Control Applications
The aim of this paper is to review the state-of-the-art of Field Programmable Gate Array (FPGA) technologies and their contribution to industrial control applications. Authors start by addressing various research fields which can exploit the advantages of FPGAs. The features of these devices are then presented, followed by their corresponding design tools. To illustrate the benefits of using FPGAs in the case of complex control applications, a sensorless motor controller has been treated. This controller is based on the Extended Kalman Filter. Its development has been made according to a dedicated design methodology, which is also discussed. The use of FPGAs to implement artificial intelligence-based industrial controllers is then briefly reviewed. The final section presents two short case studies of Neural Network control systems designs targeting FPGAs
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