17,439 research outputs found

    Connecting Software Metrics across Versions to Predict Defects

    Full text link
    Accurate software defect prediction could help software practitioners allocate test resources to defect-prone modules effectively and efficiently. In the last decades, much effort has been devoted to build accurate defect prediction models, including developing quality defect predictors and modeling techniques. However, current widely used defect predictors such as code metrics and process metrics could not well describe how software modules change over the project evolution, which we believe is important for defect prediction. In order to deal with this problem, in this paper, we propose to use the Historical Version Sequence of Metrics (HVSM) in continuous software versions as defect predictors. Furthermore, we leverage Recurrent Neural Network (RNN), a popular modeling technique, to take HVSM as the input to build software prediction models. The experimental results show that, in most cases, the proposed HVSM-based RNN model has a significantly better effort-aware ranking effectiveness than the commonly used baseline models

    Software defect prediction: do different classifiers find the same defects?

    Get PDF
    Open Access: This article is distributed under the terms of the Creative Commons Attribution 4.0 International License CC BY 4.0 (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made.During the last 10 years, hundreds of different defect prediction models have been published. The performance of the classifiers used in these models is reported to be similar with models rarely performing above the predictive performance ceiling of about 80% recall. We investigate the individual defects that four classifiers predict and analyse the level of prediction uncertainty produced by these classifiers. We perform a sensitivity analysis to compare the performance of Random Forest, Naïve Bayes, RPart and SVM classifiers when predicting defects in NASA, open source and commercial datasets. The defect predictions that each classifier makes is captured in a confusion matrix and the prediction uncertainty of each classifier is compared. Despite similar predictive performance values for these four classifiers, each detects different sets of defects. Some classifiers are more consistent in predicting defects than others. Our results confirm that a unique subset of defects can be detected by specific classifiers. However, while some classifiers are consistent in the predictions they make, other classifiers vary in their predictions. Given our results, we conclude that classifier ensembles with decision-making strategies not based on majority voting are likely to perform best in defect prediction.Peer reviewedFinal Published versio
    • …
    corecore