Designs for increasing reliability while reducing energy and increasing lifetime

In the last decades, the computing technology experienced tremendous developments. For instance, transistors' feature size shrank to half at every two years as consistently from the first time Moore stated his law. Consequently, number of transistors and core count per chip doubles at each generation. Similarly, petascale systems that have the capability of processing more than one billion calculation per second have been developed. As a matter of fact, exascale systems are predicted to be available at year 2020. However, these developments in computer systems face a reliability wall. For instance, transistor feature sizes are getting so small that it becomes easier for high-energy particles to temporarily flip the state of a memory cell from 1-to-0 or 0-to-1. Also, even if we assume that fault-rate per transistor stays constant with scaling, the increase in total transistor and core count per chip will significantly increase the number of faults for future desktop and exascale systems. Moreover, circuit ageing is exacerbated due to increased manufacturing variability and thermal stresses, therefore, lifetime of processor structures are becoming shorter. On the other side, due to the limited power budget of the computer systems such that mobile devices, it is attractive to scale down the voltage. However, when the voltage level scales to beyond the safe margin especially to the ultra-low level, the error rate increases drastically. Nevertheless, new memory technologies such as NAND flashes present only limited amount of nominal lifetime, and when they exceed this lifetime, they can not guarantee storing of the data correctly leading to data retention problems. Due to these issues, reliability became a first-class design constraint for contemporary computing in addition to power and performance. Moreover, reliability even plays increasingly important role when computer systems process sensitive and life-critical information such as health records, financial information, power regulation, transportation, etc. In this thesis, we present several different reliability designs for detecting and correcting errors occurring in processor pipelines, L1 caches and non-volatile NAND flash memories due to various reasons. We design reliability solutions in order to serve three main purposes. Our first goal is to improve the reliability of computer systems by detecting and correcting random and non-predictable errors such as bit flips or ageing errors. Second, we aim to reduce the energy consumption of the computer systems by allowing them to operate reliably at ultra-low voltage level. Third, we target to increase the lifetime of new memory technologies by implementing efficient and low-cost reliability schemes

An Analysis of Storage Virtualization

Investigating technologies and writing expansive documentation on their capabilities is like hitting a moving target. Technology is evolving, growing, and expanding what it can do each and every day. This makes it very difficult when trying to snap a line and investigate competing technologies. Storage virtualization is one of those moving targets. Large corporations develop software and hardware solutions that try to one up the competition by releasing firmware and patch updates to include their latest developments. Some of their latest innovations include differing RAID levels, virtualized storage, data compression, data deduplication, file deduplication, thin provisioning, new file system types, tiered storage, solid state disk, and software updates to coincide these technologies with their applicable hardware. Even data center environmental considerations like reusable energies, data center environmental characteristics, and geographic locations are being used by companies both small and large to reduce operating costs and limit environmental impacts. Companies are even moving to an entire cloud based setup to limit their environmental impact as it could be cost prohibited to maintain your own corporate infrastructure. The trifecta of integrating smart storage architectures to include storage virtualization technologies, reducing footprint to promote energy savings, and migrating to cloud based services will ensure a long-term sustainable storage subsystem

Study of Various Motherboards

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Design of a fault tolerant airborne digital computer. Volume 1: Architecture

This volume is concerned with the architecture of a fault tolerant digital computer for an advanced commercial aircraft. All of the computations of the aircraft, including those presently carried out by analogue techniques, are to be carried out in this digital computer. Among the important qualities of the computer are the following: (1) The capacity is to be matched to the aircraft environment. (2) The reliability is to be selectively matched to the criticality and deadline requirements of each of the computations. (3) The system is to be readily expandable. contractible, and (4) The design is to appropriate to post 1975 technology. Three candidate architectures are discussed and assessed in terms of the above qualities. Of the three candidates, a newly conceived architecture, Software Implemented Fault Tolerance (SIFT), provides the best match to the above qualities. In addition SIFT is particularly simple and believable. The other candidates, Bus Checker System (BUCS), also newly conceived in this project, and the Hopkins multiprocessor are potentially more efficient than SIFT in the use of redundancy, but otherwise are not as attractive

The 1991 3rd NASA Symposium on VLSI Design

Papers from the symposium are presented from the following sessions: (1) featured presentations 1; (2) very large scale integration (VLSI) circuit design; (3) VLSI architecture 1; (4) featured presentations 2; (5) neural networks; (6) VLSI architectures 2; (7) featured presentations 3; (8) verification 1; (9) analog design; (10) verification 2; (11) design innovations 1; (12) asynchronous design; and (13) design innovations 2

Low-cost and efficient fault detection and diagnosis schemes for modern cores

Continuous improvements in transistor scaling together with microarchitectural advances have made possible the widespread adoption of high-performance processors across all market segments. However, the growing reliability threats induced by technology scaling and by the complexity of designs are challenging the production of cheap yet robust systems. Soft error trends are haunting, especially for combinational logic, and parity and ECC codes are therefore becoming insufficient as combinational logic turns into the dominant source of soft errors. Furthermore, experts are warning about the need to also address intermittent and permanent faults during processor runtime, as increasing temperatures and device variations will accelerate inherent aging phenomena. These challenges specially threaten the commodity segments, which impose requirements that existing fault tolerance mechanisms cannot offer. Current techniques based on redundant execution were devised in a time when high penalties were assumed for the sake of high reliability levels. Novel light-weight techniques are therefore needed to enable fault protection in the mass market segments. The complexity of designs is making post-silicon validation extremely expensive. Validation costs exceed design costs, and the number of discovered bugs is growing, both during validation and once products hit the market. Fault localization and diagnosis are the biggest bottlenecks, magnified by huge detection latencies, limited internal observability, and costly server farms to generate test outputs. This thesis explores two directions to address some of the critical challenges introduced by unreliable technologies and by the limitations of current validation approaches. We first explore mechanisms for comprehensively detecting multiple sources of failures in modern processors during their lifetime (including transient, intermittent, permanent and also design bugs). Our solutions embrace a paradigm where fault tolerance is built based on exploiting high-level microarchitectural invariants that are reusable across designs, rather than relying on re-execution or ad-hoc block-level protection. To do so, we decompose the basic functionalities of processors into high-level tasks and propose three novel runtime verification solutions that combined enable global error detection: a computation/register dataflow checker, a memory dataflow checker, and a control flow checker. The techniques use the concept of end-to-end signatures and allow designers to adjust the fault coverage to their needs, by trading-off area, power and performance. Our fault injection studies reveal that our methods provide high coverage levels while causing significantly lower performance, power and area costs than existing techniques. Then, this thesis extends the applicability of the proposed error detection schemes to the validation phases. We present a fault localization and diagnosis solution for the memory dataflow by combining our error detection mechanism, a new low-cost logging mechanism and a diagnosis program. Selected internal activity is continuously traced and kept in a memory-resident log whose capacity can be expanded to suite validation needs. The solution can catch undiscovered bugs, reducing the dependence on simulation farms that compute golden outputs. Upon error detection, the diagnosis algorithm analyzes the log to automatically locate the bug, and also to determine its root cause. Our evaluations show that very high localization coverage and diagnosis accuracy can be obtained at very low performance and area costs. The net result is a simplification of current debugging practices, which are extremely manual, time consuming and cumbersome. Altogether, the integrated solutions proposed in this thesis capacitate the industry to deliver more reliable and correct processors as technology evolves into more complex designs and more vulnerable transistors.El continuo escalado de los transistores junto con los avances microarquitectónicos han posibilitado la presencia de potentes procesadores en todos los segmentos de mercado. Sin embargo, varios problemas de fiabilidad están desafiando la producción de sistemas robustos. Las predicciones de "soft errors" son inquietantes, especialmente para la lógica combinacional: soluciones como ECC o paridad se están volviendo insuficientes a medida que dicha lógica se convierte en la fuente predominante de soft errors. Además, los expertos están alertando acerca de la necesidad de detectar otras fuentes de fallos (causantes de errores permanentes e intermitentes) durante el tiempo de vida de los procesadores. Los segmentos "commodity" son los más vulnerables, ya que imponen unos requisitos que las técnicas actuales de fiabilidad no ofrecen. Estas soluciones (generalmente basadas en re-ejecución) fueron ideadas en un tiempo en el que con tal de alcanzar altos nivel de fiabilidad se asumían grandes costes. Son por tanto necesarias nuevas técnicas que permitan la protección contra fallos en los segmentos más populares. La complejidad de los diseños está encareciendo la validación "post-silicon". Su coste excede el de diseño, y el número de errores descubiertos está aumentando durante la validación y ya en manos de los clientes. La localización y el diagnóstico de errores son los mayores problemas, empeorados por las altas latencias en la manifestación de errores, por la poca observabilidad interna y por el coste de generar las señales esperadas. Esta tesis explora dos direcciones para tratar algunos de los retos causados por la creciente vulnerabilidad hardware y por las limitaciones de los enfoques de validación. Primero exploramos mecanismos para detectar múltiples fuentes de fallos durante el tiempo de vida de los procesadores (errores transitorios, intermitentes, permanentes y de diseño). Nuestras soluciones son de un paradigma donde la fiabilidad se construye explotando invariantes microarquitectónicos genéricos, en lugar de basarse en re-ejecución o en protección ad-hoc. Para ello descomponemos las funcionalidades básicas de un procesador y proponemos tres soluciones de `runtime verification' que combinadas permiten una detección de errores a nivel global. Estas tres soluciones son: un verificador de flujo de datos de registro y de computación, un verificador de flujo de datos de memoria y un verificador de flujo de control. Nuestras técnicas usan el concepto de firmas y permiten a los diseñadores ajustar los niveles de protección a sus necesidades, mediante compensaciones en área, consumo energético y rendimiento. Nuestros estudios de inyección de errores revelan que los métodos propuestos obtienen altos niveles de protección, a la vez que causan menos costes que las soluciones existentes. A continuación, esta tesis explora la aplicabilidad de estos esquemas a las fases de validación. Proponemos una solución de localización y diagnóstico de errores para el flujo de datos de memoria que combina nuestro mecanismo de detección de errores, junto con un mecanismo de logging de bajo coste y un programa de diagnóstico. Cierta actividad interna es continuamente registrada en una zona de memoria cuya capacidad puede ser expandida para satisfacer las necesidades de validación. La solución permite descubrir bugs, reduciendo la necesidad de calcular los resultados esperados. Al detectar un error, el algoritmo de diagnóstico analiza el registro para automáticamente localizar el bug y determinar su causa. Nuestros estudios muestran un alto grado de localización y de precisión de diagnóstico a un coste muy bajo de rendimiento y área. El resultado es una simplificación de las prácticas actuales de depuración, que son enormemente manuales, incómodas y largas. En conjunto, las soluciones de esta tesis capacitan a la industria a producir procesadores más fiables, a medida que la tecnología evoluciona hacia diseños más complejos y más vulnerables

Architecting heterogeneous memory systems with 3D die-stacked memory

The main objective of this research is to efficiently enable 3D die-stacked memory and heterogeneous memory systems. 3D die-stacking is an emerging technology that allows for large amounts of in-package high-bandwidth memory storage. Die-stacked memory has the potential to provide extraordinary performance and energy benefits for computing environments, from data-intensive to mobile computing. However, incorporating die-stacked memory into computing environments requires innovations across the system stack from hardware and software. This dissertation presents several architectural innovations to practically deploy die-stacked memory into a variety of computing systems. First, this dissertation proposes using die-stacked DRAM as a hardware-managed cache in a practical and efficient way. The proposed DRAM cache architecture employs two novel techniques: hit-miss speculation and self-balancing dispatch. The proposed techniques virtually eliminate the hardware overhead of maintaining a multi-megabytes SRAM structure, when scaling to gigabytes of stacked DRAM caches, and improve overall memory bandwidth utilization. Second, this dissertation proposes a DRAM cache organization that provides a high level of reliability for die-stacked DRAM caches in a cost-effective manner. The proposed DRAM cache uses error-correcting code (ECCs), strong checksums (CRCs), and dirty data duplication to detect and correct a wide range of stacked DRAM failures—from traditional bit errors to large-scale row, column, bank, and channel failures—within the constraints of commodity, non-ECC DRAM stacks. With only a modest performance degradation compared to a DRAM cache with no ECC support, the proposed organization can correct all single-bit failures, and 99.9993% of all row, column, and bank failures. Third, this dissertation proposes architectural mechanisms to use large, fast, on-chip memory structures as part of memory (PoM) seamlessly through the hardware. The proposed design achieves the performance benefit of on-chip memory caches without sacrificing a large fraction of total memory capacity to serve as a cache. To achieve this, PoM implements the ability to dynamically remap regions of memory based on their access patterns and expected performance benefits. Lastly, this dissertation explores a new usage model for die-stacked DRAM involving a hybrid of caching and virtual memory support. In the common case where system’s physical memory is not over-committed, die-stacked DRAM operates as a cache to provide performance and energy benefits to the system. However, when the workload’s active memory demands exceed the capacity of the physical memory, the proposed scheme dynamically converts the stacked DRAM cache into a fast swap device to avoid the otherwise grievous performance penalty of swapping to disk.Ph.D

The language parallel Pascal and other aspects of the massively parallel processor

A high level language for the Massively Parallel Processor (MPP) was designed. This language, called Parallel Pascal, is described in detail. A description of the language design, a description of the intermediate language, Parallel P-Code, and details for the MPP implementation are included. Formal descriptions of Parallel Pascal and Parallel P-Code are given. A compiler was developed which converts programs in Parallel Pascal into the intermediate Parallel P-Code language. The code generator to complete the compiler for the MPP is being developed independently. A Parallel Pascal to Pascal translator was also developed. The architecture design for a VLSI version of the MPP was completed with a description of fault tolerant interconnection networks. The memory arrangement aspects of the MPP are discussed and a survey of other high level languages is given

Hardware-Assisted Dependable Systems

Unpredictable hardware faults and software bugs lead to application crashes, incorrect computations, unavailability of internet services, data losses, malfunctioning components, and consequently financial losses or even death of people. In particular, faults in microprocessors (CPUs) and memory corruption bugs are among the major unresolved issues of today. CPU faults may result in benign crashes and, more problematically, in silent data corruptions that can lead to catastrophic consequences, silently propagating from component to component and finally shutting down the whole system. Similarly, memory corruption bugs (memory-safety vulnerabilities) may result in a benign application crash but may also be exploited by a malicious hacker to gain control over the system or leak confidential data. Both these classes of errors are notoriously hard to detect and tolerate. Usual mitigation strategy is to apply ad-hoc local patches: checksums to protect specific computations against hardware faults and bug fixes to protect programs against known vulnerabilities. This strategy is unsatisfactory since it is prone to errors, requires significant manual effort, and protects only against anticipated faults. On the other extreme, Byzantine Fault Tolerance solutions defend against all kinds of hardware and software errors, but are inadequately expensive in terms of resources and performance overhead. In this thesis, we examine and propose five techniques to protect against hardware CPU faults and software memory-corruption bugs. All these techniques are hardware-assisted: they use recent advancements in CPU designs and modern CPU extensions. Three of these techniques target hardware CPU faults and rely on specific CPU features: ∆-encoding efficiently utilizes instruction-level parallelism of modern CPUs, Elzar re-purposes Intel AVX extensions, and HAFT builds on Intel TSX instructions. The rest two target software bugs: SGXBounds detects vulnerabilities inside Intel SGX enclaves, and “MPX Explained” analyzes the recent Intel MPX extension to protect against buffer overflow bugs. Our techniques achieve three goals: transparency, practicality, and efficiency. All our systems are implemented as compiler passes which transparently harden unmodified applications against hardware faults and software bugs. They are practical since they rely on commodity CPUs and require no specialized hardware or operating system support. Finally, they are efficient because they use hardware assistance in the form of CPU extensions to lower performance overhead

Co-designing reliability and performance for datacenter memory

Memory is one of the key components that affects reliability and performance of datacenter servers. Memory in today’s servers is organized and shared in several ways to provide the most performant and efficient access to data. For example, cache hierarchy in multi-core chips to reduce access latency, non-uniform memory access (NUMA) in multi-socket servers to improve scalability, disaggregation to increase memory capacity. In all these organizations, hardware coherence protocols are used to maintain memory consistency of this shared memory and implicitly move data to the requesting cores. This thesis aims to provide fault-tolerance against newer models of failure in the organization of memory in datacenter servers. While designing for improved reliability, this thesis explores solutions that can also enhance performance of applications. The solutions build over modern coherence protocols to achieve these properties. First, we observe that DRAM memory system failure rates have increased, demanding stronger forms of memory reliability. To combat this, the thesis proposes Dvé, a hardware driven replication mechanism where data blocks are replicated across two different memory controllers in a cache-coherent NUMA system. Data blocks are accompanied by a code with strong error detection capabilities so that when an error is detected, correction is performed using the replica. Dvé’s organization offers two independent points of access to data which enables: (a) strong error correction that can recover from a range of faults affecting any of the components in the memory and (b) higher performance by providing another nearer point of memory access. Dvé’s coherent replication keeps the replicas in sync for reliability and also provides coherent access to read replicas during fault-free operation for improved performance. Dvé can flexibly provide these benefits on-demand at runtime. Next, we observe that the coherence protocol itself requires to be hardened against failures. Memory in datacenter servers is being disaggregated from the compute servers into dedicated memory servers, driven by standards like CXL. CXL specifies the coherence protocol semantics for compute servers to access and cache data from a shared region in the disaggregated memory. However, the CXL specification lacks the requisite level of fault-tolerance necessary to operate at an inter-server scale within the datacenter. Compute servers can fail or be unresponsive in the datacenter and therefore, it is important that the coherence protocol remain available in the presence of such failures. The thesis proposes Āpta, a CXL-based, shared disaggregated memory system for keeping the cached data consistent without compromising availability in the face of compute server failures. Āpta architects a high-performance fault-tolerant object-granular memory server that significantly improves performance for stateless function-as-a-service (FaaS) datacenter applications