4 research outputs found
Statistical Classification Based Modelling and Estimation of Analog Circuits Failure Probability
At nanoscales, variations in transistor parameters cause variations and unpredictability in the circuit output, and may ultimately cause a violation of the desired specifications, leading to circuit failure. The parametric variations in transistors occur due to limitations in the manufacturing process and are commonly known as process variations. Circuit simulation is a Computer-Aided Design (CAD) technique for verifying the behavior of analog circuits but exhibits incompleteness under the effects of process variations. Hence, statistical circuit simulation is showing increasing importance for circuit design to address this incompleteness problem. However, existing statistical circuit simulation approaches either fail to analyze the rare failure events accurately and efficiently or are impractical to use. Moreover, none of the existing approaches is able to successfully analyze analog circuits in the presence of multiple performance specifications in timely and accurate manner. Therefore, we propose a new statistical circuit simulation based methodology for modelling and estimation of failure probability of analog circuits in the presence of multiple performance metrics. Our methodology is based on an iterative way of estimating failure probability, employing a statistical classifier to reduce the number of simulations while still maintaining high estimation accuracy. Furthermore, a more practical classifier model is proposed for analog circuit failure probability estimation.
Our methodology estimates an accurate failure probability even when the failures resulting from each performance metric occur simultaneously. The proposed methodology can deliver many orders of speedup compared to traditional Monte Carlo methods. Moreover, experimental results show that the methodology generates accurate results for problems with multiple specifications, while other approaches fail totally
An EScheduler-based data dependence analysis and task scheduling for parallel circuit simulation
The sparse matrix solver has become the bottleneck in a Simulation Program with Integrated Circuit Emphasis circuit
simulator. It is difficult to parallelize the sparse matrix solver
because of the high data dependence during the numerical LU
factorization. In this brief, a parallel LU factorization algorithm
is developed on shared-memory computers with multicore central processing units, based on KLU algorithms. An Elimination Scheduler (EScheduler) is proposed to represent the data dependence during the LU factorization. Based on the EScheduler, the parallel tasks are scheduled in two modes to achieve a high level of concurrence, i.e., cluster mode and pipeline mode. The experimental results on 26 circuit matrices reveal that the developed algorithm can achieve speedup of 1.18–4.55× (on geometric average), as compared with KLU, with 1–8 threads. The result analysis indicates that for different data dependence, different parallel strategies should be dynamically selected to obtain optimal performance.Accepted versio