1,094 research outputs found

    Voltage Balancing of Series Connected SiC MOSFETs with Adaptive-impedance Self-powered Gate Drivers

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    Series-Connection of Medium Voltage SIC Mosefets with Self-Powered Design

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    An Integrated IGBT Active Gate Driver with Fast Feed-Forward Variable Current

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    The Insulated-Gate Bipolar Transistor (IGBT) is a hybrid of bipolar and MOSFET transistors. As a consequence, IGBTs can handle higher current typical of bipolar transistors with the ease of control typical of MOSFETs. These characteristics make IGBTs desirable for high power Switch Mode Power Supplies (SMPS). In high power systems such as these, devices must be very reliable, as device failures may result in safety hazards such as fires in addition to the failure of the system. Conventional Gate Driver (CGD) circuits typically design for reliability in these systems by including a resistor between the gate driver and gate of the IGBT. This slows the switching waveforms, reducing stress on the IGBT while sacrificing efficiency. This solution is suboptimal, however, and as such Active Gate Drivers (AGD) have been designed to control voltage and current slopes through the IGBT by modulating the gate signal. AGD circuits found on the market today consist of a combination of an CGD with external components to implement the variable current necessary for protection. This requires a large amount of area on a Printed Circuit Board (PCB), and thus can be costly. Therefore, it can be desirable to integrate the AGD functionality into an on-chip system. In this thesis, an AGD is designed, fabricated and analyzed to show that IGBT gate voltage can be controlled in a manner capable of reducing overvoltage, as well as slowed when desired using an on-chip system. The current provided by this gate driver is controlled by feedback signals indicating the switching state of the device, as well as input bits that determine total output current

    Induction heating converter's design, control and modeling applied to continuous wire heating

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    Induction heating is a heating method for electrically conductive materials that takes advantage of the heat generated by the Eddy currents originated by means of a varying magnetic field. Since Michael Faraday discovered electromagnetic induction in 1831, this phenomena has been widely studied in many applications like transformers, motors or generators' design. At the turn of the 20th century, induction started to be studied as a heating method, leading to the construction of the first industrial induction melting equipment by the Electric Furnace Company in 1927. At first, the varying magnetic fields were obtained with spark-gap generators, vacuum-tube generators and low frequency motor-generator sets. With the emergence of reliable semiconductors in the late 1960's, motor-generators were replaced by solid-state converters for low frequency applications. With regard to the characterization of the inductor-workpiece system, the first models used to understand the load's behavior were based on analytical methods. These methods were useful to analyze the overall behavior of the load, but they were not accurate enough for a precise analysis and were limited to simple geometries. With the emergence of computers, numerical methods experienced a tremendous growth in the 1990's and started to be applied in the induction heating field. Nowadays, the development of commercial softwares that allow this type of analysis have started to make the use of numerical methods popular among research centers and enterprises. This type of softwares allow a great variety of complex analysis with high precision, consequently diminishing the trial and error process. The research realized in last decades, the increase in the utilization of numerical modeling and the appearance and improvement of semiconductor devices, with their corresponding cost reduction, have caused the spread of induction heating in many fields. Induction heating equipments can be found in many applications, since domestic cookers to high-power aluminum melting furnaces or automotive sealing equipments, and are becoming more and more popular thanks to their easy control, quick heating and the energy savings obtained. The present thesis focuses on the application of induction heating to wire heating. The wire heating is a continuous heating method in which the wire is continuously feeding the heating inductor. This heating method allows high production rates with reduced space requirements and is usually found in medium to high power industrial processes working 24 hours per day. The first chapters of this study introduce the induction heating phenomena, its modeling and the converters and tanks used. Afterwards, a multichannel converter for high-power and high-frequency applications is designed and implemented with the aim of providing modularity to the converter and reduce the designing time, the production cost and its maintenance. Moreover, this type of structure provides reliability to the system and enables low repairing times, which is an extremely interesting feature for 24 hours processes. Additionally, a software phase-locked loop for induction heating applications is designed and implemented to prove its flexibility and reliability. This type of control allows the use of the same hardware for different applications, which is attractive for the case of industrial applications. This phase-locked loop is afterwards used to design and implement a load-adaptative control that varies the references to have soft-switching according to load's variation, improving converter's performance. Finally, the modeling of a continuous induction wire hardening system is realized, solving the difficulty of considering the mutual influence between the thermal, electromagnetic and electric parameters. In this thesis, a continuous process is modeled and tested using numerical methods and considering converter's operation and influence in the process.Postprint (published version

    Simulation of speed tracking for brushless DC motor using fuzzy logic controller

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    Brushless DC motors are normally used in an automotive application, robotics, medical, industrial automation equipment and machine tools due to its advantages. The advantages are long life operation, easy to construct, noiseless operation and has a better speed performance. This project presents a simulation model for BLDC motor using MATLAB/Simulink. Usually, the speed control is achieved by using PI controller. Then, the dynamic response of the BLDC motor such as speed, torque as well as current and voltage are observed and been analyzed using the MATLAB model. It is quite hard and difficult to tune the conventional PI controller parameters. Therefore, a suitable speed controller is been developed by using MATLAB Fuzzy Logic tool box. The objectives of this project are to minimize the maximum overshoot (%OS), settling time (Ts) and also peak time (Tp). Besides, the purpose is to improve the speed performance of the motor drive system. In order to verify the effectiveness of the controller, both control algorithms (Fuzzy logic control and PID) are compared. The simulation results show that the FLC controller has better performance which has reduced and minimized the percentage of maximum overshoot, settling time, peak time and rise time compared with the used of conventional PI controller

    A Simple Closed-Loop Active Gate Voltage Driver for Controlling diC/dt and dvCE/dt in IGBTs

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    The increase of the switching speed in power semiconductors leads to converters with better efficiency and high power density. On the other hand, fast switching generates some consequences like overshoots and higher switching transient, which provoke electromagnetic interference (EMI). This paper proposes a new closed-loop gate driver to improve switching trajectory in insulated gate bipolar transistors (IGBTs) at the hard switching condition. The proposed closed-loop gate driver is based on an active gate voltage control method, which deals with emitter voltage (VEe) for controlling diC/dt and gets feedback from the output voltage (vCE) in order to control dvCE/dt. The sampled voltage signals modify the profile of the applied gate voltage (vgg). As a result, the desired gate driver (GD) improves the switching transients with minimum switching loss. The operation principle and implementation of the controller in the GD are thoroughly described. It can be observed that the new GD controls both dvCE/dt and diC/dt accurately independent of the variable parameters. The new control method is verified by experimental results. As a current issue, the known trade-off between switching losses and EMI is improved by this simple and effective control method.Postprint (published version

    Prognostics and health management of power electronics

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    Prognostics and health management (PHM) is a major tool enabling systems to evaluate their reliability in real-time operation. Despite ground-breaking advances in most engineering and scientific disciplines during the past decades, reliability engineering has not seen significant breakthroughs or noticeable advances. Therefore, self-awareness of the embedded system is also often required in the sense that the system should be able to assess its own health state and failure records, and those of its main components, and take action appropriately. This thesis presents a radically new prognostics approach to reliable system design that will revolutionise complex power electronic systems with robust prognostics capability enhanced Insulated Gate Bipolar Transistors (IGBT) in applications where reliability is significantly challenging and critical. The IGBT is considered as one of the components that is mainly damaged in converters and experiences a number of failure mechanisms, such as bond wire lift off, die attached solder crack, loose gate control voltage, etc. The resulting effects mentioned are complex. For instance, solder crack growth results in increasing the IGBT’s thermal junction which becomes a source of heat turns to wire bond lift off. As a result, the indication of this failure can be seen often in increasing on-state resistance relating to the voltage drop between on-state collector-emitter. On the other hand, hot carrier injection is increased due to electrical stress. Additionally, IGBTs are components that mainly work under high stress, temperature and power consumptions due to the higher range of load that these devices need to switch. This accelerates the degradation mechanism in the power switches in discrete fashion till reaches failure state which fail after several hundred cycles. To this end, exploiting failure mechanism knowledge of IGBTs and identifying failure parameter indication are background information of developing failure model and prognostics algorithm to calculate remaining useful life (RUL) along with ±10% confidence bounds. A number of various prognostics models have been developed for forecasting time to failure of IGBTs and the performance of the presented estimation models has been evaluated based on two different evaluation metrics. The results show significant improvement in health monitoring capability for power switches.Furthermore, the reliability of the power switch was calculated and conducted to fully describe health state of the converter and reconfigure the control parameter using adaptive algorithm under degradation and load mission limitation. As a result, the life expectancy of devices has been increased. These all allow condition-monitoring facilities to minimise stress levels and predict future failure which greatly reduces the likelihood of power switch failures in the first place

    Assessing the effectiveness of different test approaches for power devices in a PCB

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    Power electronic systems employing Printed Circuit Boards (PCBs) are broadly used in many applications, including some safety-critical ones. Several standards (e.g., ISO26262 for the automotive sector and DO-178 for avionics) mandate the adoption of effective test procedures for all electronic systems. However, the metrics to be used to compute the effectiveness of the adopted test procedures are not so clearly defined for power devices and systems. In the last years, some commercial fault simulation tools (e.g., DefectSim by Mentor Graphics and TestMAX by Synopsys) for analog circuits have been introduced, together with some new fault models. With these new tools, systematic analog fault simulation finally became practically feasible. The aim of this paper is twofold: first, we propose a method to extend the usage of the new analog fault models to power devices, thus allowing to compute a Fault Coverage figure for a given test. Secondly, we adopt the method on a case study, for which we quantitatively evaluate the effectiveness of some test procedures commonly used at the PCB level for the detection of faults inside power devices. A typical Power Supply Unit (PSU) used in industrial products, including power transistors and power diodes, is considered. The analysis of the gathered results shows that using the new method we can identify the main points of strength / weakness of the different test solutions in a quantitative and deterministic manner, and pinpoint the faults escaping to each one

    Resistive Solid State Protective Device

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    Abstract: This thesis describes and explains different fault to characterize fault specifically for DC distribution systems and DC Microgrids fed by synchronous generators. This will result in a testbed for static and intermittent line-to-line faults, and in future work, various types of ground faults. Automaton allows for repeated testing at various voltage levels and precise control over intermittent fault generation. The fault generator is implemented with an IGBT H-bridge topology. Its physical implementation and benefits are described. Experimental results are shown for static line-to-line fault. This testbed will be used to help develop closed-form expressions. Once fault currents are characterized and closed-form expressions are made, adequate protection systems can be designed. finally, this paper will include the simulation and experimental results of line-to-line fault characterization with a DC smoothing capacitor, and intermittent faults of various times
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