Golden Reference-Free Hardware Trojan Localization using Graph Convolutional Network

The globalization of the Integrated Circuit (IC) supply chain has moved most of the design, fabrication, and testing process from a single trusted entity to various untrusted third-party entities worldwide. The risk of using untrusted third-Party Intellectual Property (3PIP) is the possibility for adversaries to insert malicious modifications known as Hardware Trojans (HTs). These HTs can compromise the integrity, deteriorate the performance, deny the service, and alter the functionality of the design. While numerous HT detection methods have been proposed in the literature, the crucial task of HT localization is overlooked. Moreover, a few existing HT localization methods have several weaknesses: reliance on a golden reference, inability to generalize for all types of HT, lack of scalability, low localization resolution, and manual feature engineering/property definition. To overcome their shortcomings, we propose a novel, golden reference-free HT localization method at the pre-silicon stage by leveraging Graph Convolutional Network (GCN). In this work, we convert the circuit design to its intrinsic data structure, graph and extract the node attributes. Afterward, the graph convolution performs automatic feature extraction for nodes to classify the nodes as Trojan or benign. Our automated approach does not burden the designer with manual code review. It locates the Trojan signals with 99.6% accuracy, 93.1% F1-score, and a false-positive rate below 0.009%.Comment: IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 202

An On-chip PVT Resilient Short Time Measurement Technique

As the CMOS technology nodes continue to shrink, the challenges of developing manufacturing tests for integrated circuits become more difficult to address. To detect parametric faults of new generation of integrated circuits such as 3D ICs, on-chip short-time intervals have to be accurately measured. The accuracy of an on-chip time measurement module is heavily affected by Process, supply Voltage, and Temperature (PVT) variations. This work presents a new on-chip time measurement scheme where the undesired effects of PVT variations are attenuated significantly. To overcome the effects of PVT variations on short-time measurement, phase locking methodology is utilized to implement a robust Vernier delay line. A prototype Time-to-Digital Converter (TDC) has been fabricated using TSMC 0.180 µm CMOS technology and experimental measurements have been carried out to verify the performance parameters of the TDC. The measurement results indicate that the proposed solution reduces the effects of PVT variations by more than tenfold compared to a conventional on-chip TDC. A coarse-fine time interval measurement scheme which is resilient to the PVT variations is also proposed. In this approach, two Delay Locked Loops (DLLs) are utilized to minimize the effects of PVT on the measured time intervals. The proposed scheme has been implemented using CMOS 65nm technology. Simulation results using Advanced Design System (ADS) indicate that the measurement resolution varies by less than 0.1ps with ±15% variations of the supply voltage. The proposed method also presents a robust performance against process and temperature variations. The measurement accuracy changes by a maximum of 0.05ps from slow to fast corners. The implemented TDC presents a robust performance against temperature variations too and its measurement accuracy varies a few femto-seconds from -40 ºC to +100 ºC. The principle of robust short-time measurement was used in practice to design and implement a state-of-the-art Coordinate Measuring Machine (CMM) for an industry partner to measure geometrical features of transmission parts with micrometer resolution. The solution developed for the industry partner has resulted in a patent and a product in the market. The on-chip short-time measurement technology has also been utilized to develop a solution to detect Hardware Trojans

A Survey on Integrated Circuit Trojans

Traditionally, computer security has been associated with the software security, or the information-data security. Surprisingly, the hardware on which the software executes or the information stored-processed-transmitted has been assumed to be a trusted base of security. The main building blocks of any electronic device are Integrated circuits (ICs) which form the fabric of a computer system. Lately, the use of ICs has expanded from handheld calculators and personal computers (PCs) to smartphones, servers, and Internet-of-Things (IoT) devices. However, this significant growth in the IC market created intense competition among IC vendors, leading to new trends in IC manufacturing. System-on-chip (SoC) design based on intellectual property (IP), a globally spread supply chain of production and distribution of ICs are the foremost of these trends. The emerging trends have resulted in many security and trust weaknesses and vulnerabilities, in computer systems. This includes Hardware Trojans attacks, side-channel attacks, Reverse-engineering, IP piracy, IC counterfeiting, micro probing, physical tampering, and acquisition of private or valuable assets by debugging and testing. IC security and trust vulnerabilities may cause loss of private information, modified/altered functions, which may cause a great economical hazard and big damage to society. Thus, it is crucial to examine the security and trust threats existing in the IC lifecycle and build defense mechanisms against IC Trojan threats. In this article, we examine the IC supply chain and define the possible IC Trojan threats for the parties involved. Then we survey the latest progress of research in the area of countermeasures against the IC Trojan attacks and discuss the challenges and expectations in this area. Keywords: IC supply chain, IC security, IP privacy, hardware trojans, IC trojans DOI: 10.7176/CEIS/12-2-01 Publication date: April 30th 202

Emerging Security Threats in Modern Digital Computing Systems: A Power Management Perspective

Design of computing systems — from pocket-sized smart phones to massive cloud based data-centers — have one common daunting challenge : minimizing the power consumption. In this effort, power management sector is undergoing a rapid and profound transformation to promote clean and energy proportional computing. At the hardware end of system design, there is proliferation of specialized, feature rich and complex power management hardware components. Similarly, in the software design layer complex power management suites are growing rapidly. Concurrent to this development, there has been an upsurge in the integration of third-party components to counter the pressures of shorter time-to-market. These trends collectively raise serious concerns about trust and security of power management solutions. In recent times, problems such as overheating, performance degradation and poor battery life, have dogged the mobile devices market, including the infamous recall of Samsung Note 7. Power outage in the data-center of a major airline left innumerable passengers stranded, with thousands of canceled flights costing over 100 million dollars. This research examines whether such events of unintentional reliability failure, can be replicated using targeted attacks by exploiting the security loopholes in the complex power management infrastructure of a computing system. At its core, this research answers an imminent research question: How can system designers ensure secure and reliable operation of third-party power management units? Specifically, this work investigates possible attack vectors, and novel non-invasive detection and defense mechanisms to safeguard system against malicious power attacks. By a joint exploration of the threat model and techniques to seamlessly detect and protect against power attacks, this project can have a lasting impact, by enabling the design of secure and cost-effective next generation hardware platforms

Investigating and Leveraging EM and Backscattering Side Channels for Hardware Security

This dissertation is focused on investigating and leveraging side-channel leakage for hardware security. To help designers address and take advantage of electromagnetic (EM) side channels, two methods for locating the physical sources of EM side channels have been developed. Both methods are used to investigate how the EM side-channel sources change with frequency and program activity. The second half of this dissertation introduces two methods that use side channels for component authentication. The same properties that make side channels such a threat, also make them useful for authenticating electronic components. The first method uses EM side channels for identifying integrated circuits (ICs) installed on a device. Focusing on components already integrated onto a device lets designers authenticate devices assembled by third parties. The second method uses the recently defined backscattering side channel for detecting recycled ICs. Unlike other types of side channels, backscattering is directly affected by the IC aging. Since the backscattering side channel is nondestructive and requires no additional circuitry on the IC, it is low cost. The effect of aging on the side channel is then investigated through simulation and experimentation.Ph.D

Techniques for Improving Security and Trustworthiness of Integrated Circuits

The integrated circuit (IC) development process is becoming increasingly vulnerable to malicious activities because untrusted parties could be involved in this IC development flow. There are four typical problems that impact the security and trustworthiness of ICs used in military, financial, transportation, or other critical systems: (i) Malicious inclusions and alterations, known as hardware Trojans, can be inserted into a design by modifying the design during GDSII development and fabrication. Hardware Trojans in ICs may cause malfunctions, lower the reliability of ICs, leak confidential information to adversaries or even destroy the system under specifically designed conditions. (ii) The number of circuit-related counterfeiting incidents reported by component manufacturers has increased significantly over the past few years with recycled ICs contributing the largest percentage of the total reported counterfeiting incidents. Since these recycled ICs have been used in the field before, the performance and reliability of such ICs has been degraded by aging effects and harsh recycling process. (iii) Reverse engineering (RE) is process of extracting a circuit’s gate-level netlist, and/or inferring its functionality. The RE causes threats to the design because attackers can steal and pirate a design (IP piracy), identify the device technology, or facilitate other hardware attacks. (iv) Traditional tools for uniquely identifying devices are vulnerable to non-invasive or invasive physical attacks. Securing the ID/key is of utmost importance since leakage of even a single device ID/key could be exploited by an adversary to hack other devices or produce pirated devices. In this work, we have developed a series of design and test methodologies to deal with these four challenging issues and thus enhance the security, trustworthiness and reliability of ICs. The techniques proposed in this thesis include: a path delay fingerprinting technique for detection of hardware Trojans, recycled ICs, and other types counterfeit ICs including remarked, overproduced, and cloned ICs with their unique identifiers; a Built-In Self-Authentication (BISA) technique to prevent hardware Trojan insertions by untrusted fabrication facilities; an efficient and secure split manufacturing via Obfuscated Built-In Self-Authentication (OBISA) technique to prevent reverse engineering by untrusted fabrication facilities; and a novel bit selection approach for obtaining the most reliable bits for SRAM-based physical unclonable function (PUF) across environmental conditions and silicon aging effects

Understanding multidimensional verification: Where functional meets non-functional

Abstract Advancements in electronic systems' design have a notable impact on design verification technologies. The recent paradigms of Internet-of-Things (IoT) and Cyber-Physical Systems (CPS) assume devices immersed in physical environments, significantly constrained in resources and expected to provide levels of security, privacy, reliability, performance and low-power features. In recent years, numerous extra-functional aspects of electronic systems were brought to the front and imply verification of hardware design models in multidimensional space along with the functional concerns of the target system. However, different from the software domain such a holistic approach remains underdeveloped. The contributions of this paper are a taxonomy for multidimensional hardware verification aspects, a state-of-the-art survey of related research works and trends enabling the multidimensional verification concept. Further, an initial approach to perform multidimensional verification based on machine learning techniques is evaluated. The importance and challenge of performing multidimensional verification is illustrated by an example case study

An Empirical Study on Android-related Vulnerabilities

Mobile devices are used more and more in everyday life. They are our cameras, wallets, and keys. Basically, they embed most of our private information in our pocket. For this and other reasons, mobile devices, and in particular the software that runs on them, are considered first-class citizens in the software-vulnerabilities landscape. Several studies investigated the software-vulnerabilities phenomenon in the context of mobile apps and, more in general, mobile devices. Most of these studies focused on vulnerabilities that could affect mobile apps, while just few investigated vulnerabilities affecting the underlying platform on which mobile apps run: the Operating System (OS). Also, these studies have been run on a very limited set of vulnerabilities. In this paper we present the largest study at date investigating Android-related vulnerabilities, with a specific focus on the ones affecting the Android OS. In particular, we (i) define a detailed taxonomy of the types of Android-related vulnerability; (ii) investigate the layers and subsystems from the Android OS affected by vulnerabilities; and (iii) study the survivability of vulnerabilities (i.e., the number of days between the vulnerability introduction and its fixing). Our findings could help OS and apps developers in focusing their verification & validation activities, and researchers in building vulnerability detection tools tailored for the mobile world

Fingerprint Recognition in Biometric Security -A State of the Art

Today, because of the vulnerability of standard authentication system, law-breaking has accumulated within the past few years. Identity authentication that relies on biometric feature like face, iris, voice, hand pure mathematics, handwriting, retina, fingerprints will considerably decrease the fraud. so that they square measure being replaced by identity verification mechanisms. Among bioscience, fingerprint systems are one amongst most generally researched and used. it\'s fashionable due to their easy accessibility. during this paper we tend to discuss the elaborated study of various gift implementation define strategies together with their comparative measures and result analysis thus as realize a brand new constructive technique for fingerprint recognition