A jittered-sampling correction technique for ADCs

In Analogue to Digital Converters (ADCs) jittered sampling raises the noise floor; this leads to a decrease in its Signal to Noise ratio (SNR) and its effective number of bits (ENOB). This research studies a technique that compensate for the effects of sampling with a jittered clock. A thorough understanding of sampling in various data converters is complied

Analysis and application of digital spectral warping in analog and mixed-signal testing

Spectral warping is a digital signal processing transform which shifts the frequencies contained within a signal along the frequency axis. The Fourier transform coefficients of a warped signal correspond to frequency-domain 'samples' of the original signal which are unevenly spaced along the frequency axis. This property allows the technique to be efficiently used for DSP-based analog and mixed-signal testing. The analysis and application of spectral warping for test signal generation, response analysis, filter design, frequency response evaluation, etc. are discussed in this paper along with examples of the software and hardware implementation

Alternative Methods for Non-Linearity Estimation in High-Resolution Analog-to-Digital Converters

The evaluation of the linearity performance of a high resolution Analog-to- Digital Converter (ADC) by the Standard Histogram method is an outstanding challenge due to the requirement of high purity of the input signal and the high number of output data that must be acquired to obtain an acceptable accuracy on the estimation. These requirements become major application drawbacks when the measures have to be performed multiple times within long test flows and for many parts, and under an industrial environment that seeks to reduce costs and lead times as is the case in the New Space sector. This thesis introduces two alternative methods that succeed in relaxing the two previous requirements for the estimation of the Integral Nonlinearity (INL) parameter in ADCs. The methods have been evaluated by estimating the Integral Non-Linearity pattern by simulation using realistic high-resolution ADC models and experimentally by applying them to real high performance ADCs. First, the challenge of applying the Standard Histogram method for the evaluation of static parameters in high resolution ADCs and how the drawbacks are accentuated in the New Space industry is analysed, being a highly expensive method for an industrial environment where cost and lead time reduction is demanded. Several alternative methods to the Standard Histogram for estimating Integral Nonlinearity in high resolution ADCs are reviewed and studied. As the number of existing works in the literature is very large and addressing all of them is a challenge in itself, only those most relevant to the development of this thesis have been included. Methods based on spectral processing to reduce the number of data acquired for the linearity test and methods based on a double histogram to be able to use generators that do not meet the the purity requirement against the ADC to be tested are further analysed. Two novel contributions are presented in this work for the estimation of the Integral Nonlinearity in ADCs, as possible alternatives to the Standard Histogram method. The first method, referred to as SSA (Simple Spectral Approach), seeks to reduce the number of output data that need to be acquired and focuses on INL estimation using an algorithm based on processing the spectrum of the output signal when a sinusoidal input stimulus is used. This type of approach requires a much smaller number of samples than the Standard Histogram method, although the estimation accuracy will depend on how smooth or abrupt the ADC nonlinearity pattern is. In general, this algorithm cannot be used to perform a calibration of the ADC nonlinearity error, but it can be applied to find out between which limits it lies and what its approximate shape is. The second method, named SDH (Simplified Double Histogram)aims to estimate the Non-Linearity of the ADC using a poor linearity generator. The approach uses two histograms constructed from the two set of output data in response to two identical input signals except for a dc offset between them. Using a simple adder model, an extended approach named ESDH (Extended Simplified Double Histogram) addresses and corrects for possible time drifts during the two data acquisitions, so that it can be successfully applied in a non-stationary test environment. According to the experimental results obtained, the proposed algorithm achieves high estimation accuracy. Both contributions have been successfully tested in high-resolution ADCs with both simulated and real laboratory experiments, the latter using a commercial ADC with 14-bit resolution and 65Msps sampling rate (AD6644 from Analog Devices).La medida de la característica de linealidad de un convertidor analógicodigital (ADC) de alta resolución mediante el método estándar del Histograma constituye un gran desafío debido los requisitos de alta pureza de la señal de entrada y del elevado número de datos de salida que deben adquirirse para obtener una precisión aceptable en la estimación. Estos requisitos encuentran importantes inconvenientes para su aplicación cuando las medidas deben realizarse dentro de largos flujos de pruebas, múltiples veces y en un gran número de piezas, y todo bajo un entorno industrial que busca reducir costes y plazos de entrega como es el caso del sector del Nuevo Espacio. Esta tesis introduce dos métodos alternativos que consiguen relajar los dos requisitos anteriores para la estimación de los parámetros de no linealidad en los ADCs. Los métodos se han evaluado estimando el patrón de No Linealidad Integral (INL) mediante simulación utilizando modelos realistas de ADC de alta resolución y experimentalmente aplicándolos en ADCs reales. Inicialmente se analiza el reto que supone la aplicación del método estándar del Histograma para la evaluación de los parámetros estáticos en ADCs de alta resolución y cómo sus inconvenientes se acentúan en la industria del Nuevo Espacio, siendo un método altamente costoso para un entorno industrial donde se exige la reducción de costes y plazos de entrega. Se estudian métodos alternativos al Histograma estándar para la estimación de la No Linealidad Integral en ADCs de alta resolución. Como el número de trabajos es muy amplio y abordarlos todos es ya en sí un desafío, se han incluido aquellos más relevantes para el desarrollo de esta tesis. Se analizan especialmente los métodos basados en el procesamiento espectral para reducir el número de datos que necesitan ser adquiridos y los métodos basados en un doble histograma para poder utilizar generadores que no cumplen el requisito de precisión frente al ADC a medir. En este trabajo se presentan dos novedosas aportaciones para la estimación de la No Linealidad Integral en ADCs, como posibles alternativas al método estándar del Histograma. El primer método, denominado SSA (Simple Spectral Approach), busca reducir el número de datos de salida que es necesario adquirir y se centra en la estimación de la INL mediante un algoritmo basado en el procesamiento del espectro de la señal de salida cuando se utiliza un estímulo de entrada sinusoidal. Este tipo de enfoque requiere un número mucho menor de muestras que el método estándar del Histograma, aunque la precisión de la estimación dependerá de lo suave o abrupto que sea el patrón de no-linealidad del ADC a medir. En general, este algoritmo no puede utilizarse para realizar una calibración del error de no linealidad del ADC, pero puede aplicarse para averiguar entre qué límites se encuentra y cuál es su forma aproximada. El segundo método, denominado SDH (Simplified Double Histogram) tiene como objetivo estimar la no linealidad del ADC utilizando un generador de baja pureza. El algoritmo utiliza dos histogramas, construidos a partir de dos conjuntos de datos de salida en respuesta a dos señales de entrada idénticas, excepto por un desplazamiento constante entre ellas. Utilizando un modelo simple de sumador, un enfoque ampliado denominado ESDH (Extended Simplified Double Histogram) aborda y corrige las posibles derivas temporales durante las dos adquisiciones de datos, de modo que puede aplicarse con éxito en un entorno de prueba no estacionario. De acuerdo con los resultados experimentales obtenidos, el algoritmo propuesto alcanza una alta precisión de estimación. Ambas contribuciones han sido probadas en ADCs de alta resolución con experimentos tanto simulados como reales en laboratorio, estos últimos utilizando un ADC comercial con una resolución de 14 bits y una tasa de muestreo de 65Msps (AD6644 de Analog Devices)

On-line health monitoring of passive electronic components using digitally controlled power converter

This thesis presents System Identification based On-Line Health Monitoring to analyse the dynamic behaviour of the Switch-Mode Power Converter (SMPC), detect, and diagnose anomalies in passive electronic components. The anomaly detection in this research is determined by examining the change in passive component values due to degradation. Degradation, which is a long-term process, however, is characterised by inserting different component values in the power converter. The novel health-monitoring capability enables accurate detection of passive electronic components despite component variations and uncertainties and is valid for different topologies of the switch-mode power converter. The need for a novel on-line health-monitoring capability is driven by the need to improve unscheduled in-service, logistics, and engineering costs, including the requirement of Integrated Vehicle Health Management (IVHM) for electronic systems and components. The detection and diagnosis of degradations and failures within power converters is of great importance for aircraft electronic manufacturers, such as Thales, where component failures result in equipment downtime and large maintenance costs. The fact that existing techniques, including built-in-self test, use of dedicated sensors, physics-of-failure, and data-driven based health-monitoring, have yet to deliver extensive application in IVHM, provides the motivation for this research ... [cont.]

Hybrid receiver study

The results are presented of a 4 month study to design a hybrid analog/digital receiver for outer planet mission probe communication links. The scope of this study includes functional design of the receiver; comparisons between analog and digital processing; hardware tradeoffs for key components including frequency generators, A/D converters, and digital processors; development and simulation of the processing algorithms for acquisition, tracking, and demodulation; and detailed design of the receiver in order to determine its size, weight, power, reliability, and radiation hardness. In addition, an evaluation was made of the receiver's capabilities to perform accurate measurement of signal strength and frequency for radio science missions

Specific Heat of Liquid Helium in Zero Gravity very near the Lambda Point

We report the details and revised analysis of an experiment to measure the specific heat of helium with subnanokelvin temperature resolution near the lambda point. The measurements were made at the vapor pressure spanning the region from 22 mK below the superfluid transition to 4 uK above. The experiment was performed in earth orbit to reduce the rounding of the transition caused by gravitationally induced pressure gradients on earth. Specific heat measurements were made deep in the asymptotic region to within 2 nK of the transition. No evidence of rounding was found to this resolution. The optimum value of the critical exponent describing the specific heat singularity was found to be a = -0.0127+ - 0.0003. This is bracketed by two recent estimates based on renormalization group techniques, but is slightly outside the range of the error of the most recent result. The ratio of the coefficients of the leading order singularity on the two sides of the transition is A+/A- =1.053+ - 0.002, which agrees well with a recent estimate. By combining the specific heat and superfluid density exponents a test of the Josephson scaling relation can be made. Excellent agreement is found based on high precision measurements of the superfluid density made elsewhere. These results represent the most precise tests of theoretical predictions for critical phenomena to date.Comment: 27 Pages, 20 Figure

System Identification, Diagnosis, and Built-In Self-Test of High Switching Frequency DC-DC Converters

abstract: Complex electronic systems include multiple power domains and drastically varying dynamic power consumption patterns, requiring the use of multiple power conversion and regulation units. High frequency switching converters have been gaining prominence in the DC-DC converter market due to smaller solution size (higher power density) and higher efficiency. As the filter components become smaller in value and size, they are unfortunately also subject to higher process variations and worse degradation profiles jeopardizing stable operation of the power supply. This dissertation presents techniques to track changes in the dynamic loop characteristics of the DC-DC converters without disturbing the normal mode of operation. A digital pseudo-noise (PN) based stimulus is used to excite the DC-DC system at various circuit nodes to calculate the corresponding closed-loop impulse response. The test signal energy is spread over a wide bandwidth and the signal analysis is achieved by correlating the PN input sequence with the disturbed output generated, thereby accumulating the desired behavior over time. A mixed-signal cross-correlation circuit is used to derive on-chip impulse responses, with smaller memory and lower computational requirement in comparison to a digital correlator approach. Model reference based parametric and non-parametric techniques are discussed to analyze the impulse response results in both time and frequency domain. The proposed techniques can extract open-loop phase margin and closed-loop unity-gain frequency within 5.2% and 4.1% error, respectively, for the load current range of 30-200mA. Converter parameters such as natural frequency (ω_n ), quality factor (Q), and center frequency (ω_c ) can be estimated within 3.6%, 4.7%, and 3.8% error respectively, over load inductance of 4.7-10.3µH, and filter capacitance of 200-400nF. A 5-MHz switching frequency, 5-8.125V input voltage range, voltage-mode controlled DC-DC buck converter is designed for the proposed built-in self-test (BIST) analysis. The converter output voltage range is 3.3-5V and the supported maximum load current is 450mA. The peak efficiency of the converter is 87.93%. The proposed converter is fabricated on a 0.6µm 6-layer-metal Silicon-On-Insulator (SOI) technology with a die area of 9mm^2 . The area impact due to the system identification blocks including related I/O structures is 3.8% and they consume 530µA quiescent current during operation.Dissertation/ThesisDoctoral Dissertation Electrical Engineering 201

Breadboard linear array scan imager using LSI solid-state technology

The performance of large scale integration photodiode arrays in a linear array scan (pushbroom) breadboard was evaluated for application to multispectral remote sensing of the earth's resources. The technical approach, implementation, and test results of the program are described. Several self scanned linear array visible photodetector focal plane arrays were fabricated and evaluated in an optical bench configuration. A 1728-detector array operating in four bands (0.5 - 1.1 micrometer) was evaluated for noise, spectral response, dynamic range, crosstalk, MTF, noise equivalent irradiance, linearity, and image quality. Other results include image artifact data, temporal characteristics, radiometric accuracy, calibration experience, chip alignment, and array fabrication experience. Special studies and experimentation were included in long array fabrication and real-time image processing for low-cost ground stations, including the use of computer image processing. High quality images were produced and all objectives of the program were attained

A 1Gsample/s 6-bit flash A/D converter with a combined chopping and averaging technique for reduced distortion in 0.18(mu)m CMOS

Hard disk drive applications require a high Spurious Free Dynamic Range (SFDR), 6-bit Analog-to-Digital Converter (ADC) at conversion rates of 1GHz and beyond. This work proposes a robust, fault-tolerant scheme to achieve high SFDR in an av- eraging flash A/D converter using comparator chopping. Chopping of comparators in a flash A/D converter was never previously implemented due to lack of feasibility in implementing multiple, uncorrelated, high speed random number generators. This work proposes a novel array of uncorrelated truly binary random number generators working at 1GHz to chop all comparators. Chopping randomizes the residual offset left after averaging, further pushing the dynamic range of the converter. This enables higher accuracy and lower bit-error rate for high speed disk-drive read channels. Power consumption and area are reduced because of the relaxed design requirements for the same linearity. The technique has been verified in Matlab simulations for a 6-bit 1Gsamples/s flash ADC under case of process gradients with non-zero mean offsets as high as 60mV and potentially serious spot offset errors as high as 1V for a 2V peak to peak input signal. The proposed technique exhibits an improvement of over 15dB compared to pure averaging flash converters for all cases. The circuit-level simulation results, for a 1V peak to peak input signal, demon- strate superior performance. The reported ADC was fabricated in TSMC 0.18 ??mCMOS process. It occupies 8.79mm2 and consumes about 400mW from 1.8V power supply at 1GHz. The targeted SFDR performance for the fabricated chip is at least 45dB for a 256MHz input sine wave, sampled at 1GHz, about 10dB improvement on the 6-bit flash ADCs in the literature