MICROCANTILEVER-BASED FORCE SENSING, CONTROL AND IMAGING

This dissertation presents a distributed-parameters base modeling framework for microcantilever (MC)-based force sensing and control with applications to nanomanipulation and imaging. Due to the widespread applications of MCs in nanoscale force sensing or atomic force microscopy with nano-Newton to pico-Newton force measurement requirements, precise modeling of the involved MCs is essential. Along this line, a distributed-parameters modeling framework is proposed which is followed by a modified robust controller with perturbation estimation to target the problem of delay in nanoscale imaging and manipulation. It is shown that the proposed nonlinear model-based controller can stabilize such nanomanipulation process in a very short time compared to available conventional methods. Such modeling and control development could pave the pathway towards MC-based manipulation and positioning. The first application of the MC-based (a piezoresistive MC) force sensors in this dissertation includes MC-based mass sensing with applications to biological species detection. MC-based sensing has recently attracted extensive interest in many chemical and biological applications due to its sensitivity, extreme applicability and low cost. By measuring the stiffness of MCs experimentally, the effect of adsorption of target molecules can be quantified. To measure MC\u27s stiffness, an in-house nanoscale force sensing setup is designed and fabricated which utilizes a piezoresistive MC to measure the force acting on the MC\u27s tip with nano-Newton resolution. In the second application, the proposed MC-based force sensor is utilized to achieve a fast-scan laser-free Atomic Force Microscopy (AFM). Tracking control of piezoelectric actuators in various applications including scanning probe microscopes is limited by sudden step discontinuities within time-varying continuous trajectories. For this, a switching control strategy is proposed for effective tracking of such discontinuous trajectories. A new spiral path planning is also proposed here which improves scanning rate of the AFM. Implementation of the proposed modeling and controller in a laser-free AFM setup yields high quality image of surfaces with stepped topographies at frequencies up to 30 Hz. As the last application of the MC-based force sensors, a nanomanipulator named here MM3A® is utilized for nanomanipulation purposes. The area of control and manipulation at the nanoscale has recently received widespread attention in different technologies such as fabricating electronic chipsets, testing and assembly of MEMS and NEMS, micro-injection and manipulation of chromosomes and genes. To overcome the lack of position sensor on this particular manipulator, a fused vision force feedback robust controller is proposed. The effects of utilization of the image and force feedbacks are individually discussed and analyzed for use in the developed fused vision force feedback control framework in order to achieve ultra precise positioning and optimal performance

Haptic feedback in teleoperation in Micro-and Nano-Worlds.

International audienceRobotic systems have been developed to handle very small objects, but their use remains complex and necessitates long-duration training. Simulators, such as molecular simulators, can provide access to large amounts of raw data, but only highly trained users can interpret the results of such systems. Haptic feedback in teleoperation, which provides force-feedback to an operator, appears to be a promising solution for interaction with such systems, as it allows intuitiveness and flexibility. However several issues arise while implementing teleoperation schemes at the micro-nanoscale, owing to complex force-fields that must be transmitted to users, and scaling differences between the haptic device and the manipulated objects. Major advances in such technology have been made in recent years. This chapter reviews the main systems in this area and highlights how some fundamental issues in teleoperation for micro- and nano-scale applications have been addressed. The chapter considers three types of teleoperation, including: (1) direct (manipulation of real objects); (2) virtual (use of simulators); and (3) augmented (combining real robotic systems and simulators). Remaining issues that must be addressed for further advances in teleoperation for micro-nanoworlds are also discussed, including: (1) comprehension of phenomena that dictate very small object (< 500 micrometers) behavior; and (2) design of intuitive 3-D manipulation systems. Design guidelines to realize an intuitive haptic feedback teleoperation system at the micro-nanoscale level are proposed

AFM-Based Mechanical Nanomanipulation

Advances in several research areas increase the need for more sophisticated fabrication techniques and better performing materials. Tackling this problem from a bottom-up perspective is currently an active field of research. The bottom-up fabrication procedure offers sub-nanometer accurate manipulation. At this time, candidates to achieve nanomanipulation include chemical (self-assembly), biotechnology methods (DNA-based), or using controllable physical forces (e.g. electrokinetic forces, mechanical forces). In this thesis, new methods and techniques for mechanical nanomanipulation using probe force interaction are developed. The considered probes are commonly used in Atomic Force Microscopes (AFMs) for high resolution imaging. AFM-based mechanical nanomanipulation will enable arranging nanoscale entities such as nanotubes and molecules in a precise and controlled manner to assemble and produce novel devices and systems at the nanoscale. The novelty of this research stems from the development of new modeling of the physics and mechanics of the tip interaction with nanoscale entities, coupled with the development of new smart cantilevers with multiple degrees of freedom. The gained knowledge from the conducted simulations and analysis is expected to enable true precision and repeatability of nanomanipulation tasks which is not feasible with existing methods and technologies

A Review of Haptic Feedback Teleoperation Systems for Micromanipulation and Microassembly

International audienceThis paper presents a review of the major haptic feedback teleoperation systems for micromanipulation. During the last decade, the handling of micrometer-sized objects has become a critical issue. Fields of application from material science to electronics demonstrate an urgent need for intuitive and flexible manipulation systems able to deal with small-scale industrial projects and assembly tasks. Two main approaches have been considered: fully automated tasks and manual operation. The first one require fully pre determined tasks, while the later necessitates highly trained operators. To overcome these issues the use of haptic feedback teleoperation where the user manipulates the tool through a joystick whilst feeling a force feedback, appears to be a promising solution as it allows high intuitiveness and flexibility. Major advances have been achieved during this last decade, starting with systems that enable the operator to feel the substrate topology, to the current state-of-the-art where 3D haptic feedback is provided to aid manipulation tasks. This paper details the major achievements and the solutions that have been developed to propose 3D haptic feedback for tools that often lack 3D force measurements. The use of virtual reality to enhance the immersion is also addressed. The strategies developed provide haptic feedback teleoperation systems with a high degree of assistance and for a wide range of micromanipulation tools. Based on this expertise on haptic for micromanipulation and virtual reality assistance it is now possible to propose microassembly systems for objects as small as 1 to 10 micrometers. This is a mature field and will benefit small-scale industrial projects where precision and flexibility in microassembly are required

New Manufacturing Environments with Micro- and Nanorobotics

UIDB/04647/2020 UIDP/04647/2020The convergence of nano-, bio-, information, and cognitive sciences and technologies (NBIC) is advancing continuously in many societal spheres. This also applies to the manufacturing sector, where technological transformations in robotics push the boundaries of human–machine interaction (HMI). Here, current technological advances in micro- and nanomanufacturing are accompanied by new socio-economic concepts for different sectors of the process industry. Although these developments are still ongoing, the blurring of the boundaries of HMI in processes at the micro- and nano- level can already be observed. According to the authors, these new socio-technical HMIs may lead to the development of new work environments, which can also have an impact on work organization. While there is still little empirical evidence, the following contribution focuses on the question whether the “manufacturing (or working) life” using enhancement practices pushes the boundaries of HMI and how these effects enable new modes of working in manufacturing. Issues of standardization, acceleration of processes, and order-oriented production become essential for technological innovation in this field. However, these trends tend to lead to a “manufacturing life” in work environments rather than to new modes of work in industry.publishersversionepub_ahead_of_prin

Scanning electron microscope image signal-to-noise ratio monitoring for micro-nanomanipulation.

International audienceAs an imaging system, scanning electron microscope (SEM) performs an important role in autonomous micro-nanomanipulation applications. When it comes to the sub micrometer range and at high scanning speeds, the images produced by the SEM are noisy and need to be evaluated or corrected beforehand. In this article, the quality of images produced by a tungsten gun SEM has been evaluated by quantifying the level of image signal-to-noise ratio (SNR). In order to determine the SNR, an efficient and online monitoring method is developed based on the nonlinear filtering using a single image. Using this method, the quality of images produced by a tungsten gun SEM is monitored at different experimental conditions. The derived results demonstrate the developed method's efficiency in SNR quantification and illustrate the imaging quality evolution in SEM

Sensitivity Analysis of Coulomb and HK Friction Models in 2D AFM-Based Nano-Manipulation: Sobol Method

Abstract: Nanotechnolog

Improvement in the Imaging Performance of Atomic Force Microscopy: A Survey

Nanotechnology is the branch of science which deals with the manipulation of matters at an extremely high resolution down to the atomic level. In recent years, atomic force microscopy (AFM) has proven to be extremely versatile as an investigative tool in this field. The imaging performance of AFMs is hindered by: 1) the complex behavior of piezo materials, such as vibrations due to the lightly damped low-frequency resonant modes, inherent hysteresis, and creep nonlinearities; 2) the cross-coupling effect caused by the piezoelectric tube scanner (PTS); 3) the limited bandwidth of the probe; 4) the limitations of the conventional raster scanning method using a triangular reference signal; 5) the limited bandwidth of the proportional-integral controllers used in AFMs; 6) the offset, noise, and limited sensitivity of position sensors and photodetectors; and 7) the limited sampling rate of the AFM's measurement unit. Due to these limitations, an AFM has a high spatial but low temporal resolution, i.e., its imaging is slow, e.g., an image frame of a living cell takes up to 120 s, which means that rapid biological processes that occur in seconds cannot be studied using commercially available AFMs. There is a need to perform fast scans using an AFM with nanoscale accuracy. This paper presents a survey of the literature, presents an overview of a few emerging innovative solutions in AFM imaging, and proposes future research directions.This work was supported in part by the Australian Research Council (ARC) under Grant FL11010002 and Grant DP160101121 and the UNSW Canberra under a Rector's Visiting Fellowshi