10 research outputs found

    ATPG for Reversible Circuits Using Simulation, Boolean Satisfiability, and Pseudo Boolean Optimization

    Full text link
    Abstract—Research in the domain of reversible circuits found significant interest in the last years – not least because of the promising applications e.g. in quantum computation and low-power design. First physical realizations are already available, motivating the development of efficient testing methods for this kind of circuits. In this paper, complementary approaches for automatic test pattern generation for reversible circuits are introduced and evaluated. Besides a simulation-based technique, methods based on Boolean satisfiability and pseudo-Boolean optimization are thereby applied. Experiments on large reversible circuits show the suitability of the proposed approaches with re-spect to different application scenarios and test goals, respectively. I

    Quantum Algorithm for Variant Maximum Satisfiability

    Get PDF
    In this paper, we proposed a novel quantum algorithm for the maximum satisfiability problem. Satisfiability (SAT) is to find the set of assignment values of input variables for the given Boolean function that evaluates this function as TRUE or prove that such satisfying values do not exist. For a POS SAT problem, we proposed a novel quantum algorithm for the maximum satisfiability (MAX-SAT), which returns the maximum number of OR terms that are satisfied for the SAT-unsatisfiable function, providing us with information on how far the given Boolean function is from the SAT satisfaction. We used Grover’s algorithm with a new block called quantum counter in the oracle circuit. The proposed circuit can be adapted for various forms of satisfiability expressions and several satisfiability-like problems. Using the quantum counter and mirrors for SAT terms reduces the need for ancilla qubits and realizes a large Toffoli gate that is then not needed. Our circuit reduces the number of ancilla qubits for the terms T of the Boolean function from T of ancilla qubits to ≈⌈log2⁡T⌉+1. We analyzed and compared the quantum cost of the traditional oracle design with our design which gives a low quantum cost

    Scalable diversified antirandom test pattern generation with improved fault coverage for black-box circuit testing

    Get PDF
    Pseudorandom testing is incapable of utilizing the success rate of preceding test patterns while generating subsequent test patterns. Many redundant test patterns have been generated that increase the test length without any significant increase in the fault coverage. An extension to pseudorandom testing is Antirandom that induces divergent patterns by maximizing the Total Hamming Distance (THD) and Total Cartesian Distance (TCD) of every subsequent test pattern. However, the Antirandom test sequence generation algorithm is prone to unsystematic selection when more than one patterns possess maximum THD and TCD. As a result, diversity among test sequences is compromised, lowering the fault coverage. Therefore, this thesis analyses the effect of Hamming distance in vertical as well as horizontal dimension to enhance diversity among test patterns. First contribution of this thesis is the proposal of a Diverse Antirandom (DAR) test pattern generation algorithm. DAR employs Horizontal Total Hamming Distance (HTHD) along with THD and TCD for diversity enhancement among test patterns as maximum distance test pattern generation. The HTHD and TCD are used as distance metrics that increase computational complexity in divergent test sequence generation. Therefore, the second contribution of this thesis is the proposal of tree traversal search method to maximize diversity among test patterns. The proposed method uses bits mutation of a temporary test pattern following a path leading towards maximization of TCD. Results of fault simulations on benchmark circuits have shown that DAR significantly improves the fault coverage up to 18.3% as compared to Antirandom. Moreover, the computational complexity of Antirandom is reduced from exponential O(2n) to linear O(n). Next, the DARalgorithm is modified to ease hardware implementation for on-chip test generation. Therefore, the third contribution of this thesis is the design of a hardware-oriented DAR (HODA) test pattern generator architecture as an alternative to linear feedback shift register (LFSR) that consists of large number of memory elements. Parallel concatenation of the HODA architecture is designed to reduce the number of memory elements by implementing bit slicing architecture. It has been proven through simulation that the proposed architecture has increased fault coverage up to 66% and a reduction of 46.59% gate count compared to the LFSR. Consequently, this thesis presents uniform and scalable test pattern generator architecture for built-in self-test (BIST) applications and solution to maximum distance test pattern generation for high fault coverage in black-box environment

    Automatic Algorithm Selection for Pseudo-Boolean Optimization with Given Computational Time Limits

    Full text link
    Machine learning (ML) techniques have been proposed to automatically select the best solver from a portfolio of solvers, based on predicted performance. These techniques have been applied to various problems, such as Boolean Satisfiability, Traveling Salesperson, Graph Coloring, and others. These methods, known as meta-solvers, take an instance of a problem and a portfolio of solvers as input. They then predict the best-performing solver and execute it to deliver a solution. Typically, the quality of the solution improves with a longer computational time. This has led to the development of anytime selectors, which consider both the instance and a user-prescribed computational time limit. Anytime meta-solvers predict the best-performing solver within the specified time limit. Constructing an anytime meta-solver is considerably more challenging than building a meta-solver without the "anytime" feature. In this study, we focus on the task of designing anytime meta-solvers for the NP-hard optimization problem of Pseudo-Boolean Optimization (PBO), which generalizes Satisfiability and Maximum Satisfiability problems. The effectiveness of our approach is demonstrated via extensive empirical study in which our anytime meta-solver improves dramatically on the performance of Mixed Integer Programming solver Gurobi, which is the best-performing single solver in the portfolio. For example, out of all instances and time limits for which Gurobi failed to find feasible solutions, our meta-solver identified feasible solutions for 47% of these

    Testable Design for Positive Control Flipping Faults in Reversible Circuits

    Get PDF
    Fast computational power is a major concern in every computing system. The advancement of the fabrication process in the present semiconductor technologies provides to accommodate millions of gates per chip and is also capable of reducing the size of the chips. Concurrently, the complex circuit design always leads to high power dissipation and increases the fault rates. Due to these difficulties, researchers explore the reversible logic circuit as an alternative way to implement the low-power circuit design. It is also widely applied in recent technology trends like quantum computing. Analyzing the correct functional behavior of these circuits is an essential requirement in the testing of the circuit. This paper presents a testable design for the k-CNOT based circuit capable of diagnosing the Positive Control Flipping Faults (PCFFs) in reversible circuits. The proposed work shows that generating a single test vector that applies to the constructed design circuit is sufficient for covering the PCFFs in the reversible circuit. Further, the parity-bit operations are augmented to the constructed testable circuit that produces the parity-test pattern to extract the faulty gate location of PCFFs. Various reversible benchmark circuits are used for evaluating the experimental results to establish the correctness of the proposed fault diagnosis technique. Also a comparative analysis is performed with the existing work

    Exploiting Don\u27t Cares to Enhance Functional Tests

    Get PDF
    In simulation based design verification, deterministic or pseudo-random tests are used to check functional correctness of a design. In this paper we present a technique generating tests by specifying the don’t care inputs in the functional specifications so as to improve their coverage of both design errors and manufacturing faults. The don’t cares are chosen to maximize sensitization of signals in the circuit. The tests generated in this way require only a fraction of pseudo-exhaustive test patterns to achieve a high multiplicity of fault coverage

    New techniques for functional testing of microprocessor based systems

    Get PDF
    Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

    Machine learning support for logic diagnosis

    Get PDF

    Polarity Control at Runtime:from Circuit Concept to Device Fabrication

    Get PDF
    Semiconductor device research for digital circuit design is currently facing increasing challenges to enhance miniaturization and performance. A huge economic push and the interest in novel applications are stimulating the development of new pathways to overcome physical limitations affecting conventional CMOS technology. Here, we propose a novel Schottky barrier device concept based on electrostatic polarity control. Specifically, this device can behave as p- or n-type by simply changing an electric input bias. This device combines More-than-Moore and Beyond CMOS elements to create an efficient technology with a viable path to Very Large Scale Integration (VLSI). This thesis proposes a device/circuit/architecture co-optimization methodology, where aspects of device technology to logic circuit and system design are considered. At device level, a full CMOS compatible fabrication process is presented. In particular, devices are demonstrated using vertically stacked, top-down fabricated silicon nanowires with gate-all-around electrode geometry. Source and drain contacts are implemented using nickel silicide to provide quasi-symmetric conduction of either electrons or holes, depending on the mode of operation. Electrical measurements confirm excellent performance, showing Ion/Ioff > 10^7 and subthreshold slopes approaching the thermal limit, SS ~ 60mV/dec (~ 63mV/dec) for n(p)-type operation in the same physical device. Moreover, the shown devices behave as p-type for a polarization bias (polarity gate voltage, Vpg) of 0V, and n-type for a Vpg = 1V, confirming their compatibility with multi-level static logic circuit design. At logic gate level, two- and four-transistor logic gates are fabricated and tested. In particular, the first fully functional, two-transistor XOR logic gate is demonstrated through electrical characterization, confirming that polarity control can enable more compact logic gate design with respect to conventional CMOS. Furthermore, we show for the first time fabricated four- transistors logic gates that can be reconfigured as NAND or XOR only depending on their external connectivity. In this case, logic gates with full swing output range are experimentally demonstrated. Finally, single device and mixed-mode TCAD simulation results show that lower Vth and more optimized polarization ranges can be expected in scaled devices implementing strain or high-k technologies. At circuit and system level, a full semi-custom logic circuit design tool flow was defined and configured. Using this flow, novel logic libraries based on standard cells or regular gate fabrics were compared with standard CMOS. In this respect, results were shown in comparison to CMOS, including a 40% normalized area-delay product reduction for the analyzed standard cell libraries, and improvements of over 2× in terms of normalized delay for regular Controlled Polarity (CP)-based cells in the context of Structured ASICs. These results, in turn, confirm the interest in further developing and optimizing CP devices, as promising candidates for future digital circuit technology
    corecore