An effective AMS Top-Down Methodology Applied to the Design of a Mixed-SignalUWB System-on-Chip

The design of Ultra Wideband (UWB) mixed-signal SoC for localization applications in wireless personal area networks is currently investigated by several researchers. The complexity of the design claims for effective top-down methodologies. We propose a layered approach based on VHDL-AMS for the first design stages and on an intelligent use of a circuit-level simulator for the transistor-level phase. We apply the latter just to one block at a time and wrap it within the system-level VHDL-AMS description. This method allows to capture the impact of circuit-level design choices and non-idealities on system performance. To demonstrate the effectiveness of the methodology we show how the refinement of the design affects specific UWB system parameters such as bit-error rate and localization estimations

A design for testability study on a high performance automatic gain control circuit.

A comprehensive testability study on a commercial automatic gain control circuit is presented which aims to identify design for testability (DfT) modifications to both reduce production test cost and improve test quality. A fault simulation strategy based on layout extracted faults has been used to support the study. The paper proposes a number of DfT modifications at the layout, schematic and system levels together with testability. Guidelines that may well have generic applicability. Proposals for using the modifications to achieve partial self test are made and estimates of achieved fault coverage and quality levels presente