626 research outputs found

    Null Convention Logic applications of asynchronous design in nanotechnology and cryptographic security

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    This dissertation presents two Null Convention Logic (NCL) applications of asynchronous logic circuit design in nanotechnology and cryptographic security. The first application is the Asynchronous Nanowire Reconfigurable Crossbar Architecture (ANRCA); the second one is an asynchronous S-Box design for cryptographic system against Side-Channel Attacks (SCA). The following are the contributions of the first application: 1) Proposed a diode- and resistor-based ANRCA (DR-ANRCA). Three configurable logic block (CLB) structures were designed to efficiently reconfigure a given DR-PGMB as one of the 27 arbitrary NCL threshold gates. A hierarchical architecture was also proposed to implement the higher level logic that requires a large number of DR-PGMBs, such as multiple-bit NCL registers. 2) Proposed a memristor look-up-table based ANRCA (MLUT-ANRCA). An equivalent circuit simulation model has been presented in VHDL and simulated in Quartus II. Meanwhile, the comparison between these two ANRCAs have been analyzed numerically. 3) Presented the defect-tolerance and repair strategies for both DR-ANRCA and MLUT-ANRCA. The following are the contributions of the second application: 1) Designed an NCL based S-Box for Advanced Encryption Standard (AES). Functional verification has been done using Modelsim and Field-Programmable Gate Array (FPGA). 2) Implemented two different power analysis attacks on both NCL S-Box and conventional synchronous S-Box. 3) Developed a novel approach based on stochastic logics to enhance the resistance against DPA and CPA attacks. The functionality of the proposed design has been verified using an 8-bit AES S-box design. The effects of decision weight, bitstream length, and input repetition times on error rates have been also studied. Experimental results shows that the proposed approach enhances the resistance to against the CPA attack by successfully protecting the hidden key --Abstract, page iii

    D2.1 - Report on Selected TRNG and PUF Principles

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    This report represents the final version of Deliverable 2.1 of the HECTOR work package WP2. It is a result of discussions and work on Task 2.1 of all HECTOR partners involved in WP2. The aim of the Deliverable 2.1 is to select principles of random number generators (RNGs) and physical unclonable functions (PUFs) that fulfill strict technology, design and security criteria. For example, the selected RNGs must be suitable for implementation in logic devices according to the German AIS20/31 standard. Correspondingly, the selected PUFs must be suitable for applying similar security approach. A standard PUF evaluation approach does not exist, yet, but it should be proposed in the framework of the project. Selected RNGs and PUFs should be then thoroughly evaluated from the point of view of security and the most suitable principles should be implemented in logic devices, such as Field Programmable Logic Arrays (FPGAs) and Application Specific Integrated Circuits (ASICs) during the next phases of the project

    Research on performance enhancement for electromagnetic analysis and power analysis in cryptographic LSI

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    制度:新 ; 報告番号:甲3785号 ; 学位の種類:博士(工学) ; 授与年月日:2012/11/19 ; 早大学位記番号:新6161Waseda Universit

    On the Entropy of Oscillator-Based True Random Number Generators under Ionizing Radiation

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    The effects of ionizing radiation on field-programmable gate arrays (FPGAs) have been investigated in depth during the last decades. The impact of these effects is typically evaluated on implementations which have a deterministic behavior. In this article, two well-known true-random number generators (TRNGs) based on sampling jittery signals have been exposed to a Co-60 radiation source as in the standard tests for space conditions. The effects of the accumulated dose on these TRNGs, an in particular, its repercussion over their randomness quality (e.g., entropy or linear complexity), have been evaluated by using two National Institute of Standards and Technology (NIST) statistical test suites. The obtained results clearly show how the degradation of the statistical properties of these TRNGs increases with the accumulated dose. It is also notable that the deterioration of the TRNG (non-deterministic component) appears before that the degradation of the deterministic elements in the FPGA, which compromises the integrated circuit lifetime.Ministerio de Economía y Competitividad (ESP-2015-68245-C4-1-P)Ministerio de Economía y Competitividad (ESP-2015-68245-C4-4-P)Ministerio de Economía y Empresa (TIN2016-79095-C2-2-R)CAM (S2013/ICE-3095
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