497 research outputs found

    Affordable techniques for dependable microprocessor design

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    As high computing power is available at an affordable cost, we rely on microprocessor-based systems for much greater variety of applications. This dependence indicates that a processor failure could have more diverse impacts on our daily lives. Therefore, dependability is becoming an increasingly important quality measure of microprocessors.;Temporary hardware malfunctions caused by unstable environmental conditions can lead the processor to an incorrect state. This is referred to as a transient error or soft error. Studies have shown that soft errors are the major source of system failures. This dissertation characterizes the soft error behavior on microprocessors and presents new microarchitectural approaches that can realize high dependability with low overhead.;Our fault injection studies using RISC processors have demonstrated that different functional blocks of the processor have distinct susceptibilities to soft errors. The error susceptibility information must be reflected in devising fault tolerance schemes for cost-sensitive applications. Considering the common use of on-chip caches in modern processors, we investigated area-efficient protection schemes for memory arrays. The idea of caching redundant information was exploited to optimize resource utilization for increased dependability. We also developed a mechanism to verify the integrity of data transfer from lower level memories to the primary caches. The results of this study show that by exploiting bus idle cycles and the information redundancy, an almost complete check for the initial memory data transfer is possible without incurring a performance penalty.;For protecting the processor\u27s control logic, which usually remains unprotected, we propose a low-cost reliability enhancement strategy. We classified control logic signals into static and dynamic control depending on their changeability, and applied various techniques including commit-time checking, signature caching, component-level duplication, and control flow monitoring. Our schemes can achieve more than 99% coverage with a very small hardware addition. Finally, a virtual duplex architecture for superscalar processors is presented. In this system-level approach, the processor pipeline is backed up by a partially replicated pipeline. The replication-based checker minimizes the design and verification overheads. For a large-scale superscalar processor, the proposed architecture can bring 61.4% reduction in die area while sustaining the maximum performance

    Design and Validation of Network-on-Chip Architectures for the Next Generation of Multi-synchronous, Reliable, and Reconfigurable Embedded Systems

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    NETWORK-ON-CHIP (NoC) design is today at a crossroad. On one hand, the design principles to efficiently implement interconnection networks in the resource-constrained on-chip setting have stabilized. On the other hand, the requirements on embedded system design are far from stabilizing. Embedded systems are composed by assembling together heterogeneous components featuring differentiated operating speeds and ad-hoc counter measures must be adopted to bridge frequency domains. Moreover, an unmistakable trend toward enhanced reconfigurability is clearly underway due to the increasing complexity of applications. At the same time, the technology effect is manyfold since it provides unprecedented levels of system integration but it also brings new severe constraints to the forefront: power budget restrictions, overheating concerns, circuit delay and power variability, permanent fault, increased probability of transient faults. Supporting different degrees of reconfigurability and flexibility in the parallel hardware platform cannot be however achieved with the incremental evolution of current design techniques, but requires a disruptive approach and a major increase in complexity. In addition, new reliability challenges cannot be solved by using traditional fault tolerance techniques alone but the reliability approach must be also part of the overall reconfiguration methodology. In this thesis we take on the challenge of engineering a NoC architectures for the next generation systems and we provide design methods able to overcome the conventional way of implementing multi-synchronous, reliable and reconfigurable NoC. Our analysis is not only limited to research novel approaches to the specific challenges of the NoC architecture but we also co-design the solutions in a single integrated framework. Interdependencies between different NoC features are detected ahead of time and we finally avoid the engineering of highly optimized solutions to specific problems that however coexist inefficiently together in the final NoC architecture. To conclude, a silicon implementation by means of a testchip tape-out and a prototype on a FPGA board validate the feasibility and effectivenes

    Investigations into the feasibility of an on-line test methodology

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    This thesis aims to understand how information coding and the protocol that it supports can affect the characteristics of electronic circuits. More specifically, it investigates an on-line test methodology called IFIS (If it Fails It Stops) and its impact on the design, implementation and subsequent characteristics of circuits intended for application specific lC (ASIC) technology. The first study investigates the influences of information coding and protocol on the characteristics of IFIS systems. The second study investigates methods of circuit design applicable to IFIS cells and identifies the· technique possessing the characteristics most suitable for on-line testing. The third study investigates the characteristics of a 'real-life' commercial UART re-engineered using the techniques resulting from the previous two studies. The final study investigates the effects of the halting properties endowed by the protocol on failure diagnosis within IFIS systems. The outcome of this work is an identification and characterisation of the factors that influence behaviour, implementation costs and the ability to test and diagnose IFIS designs

    CROSS-LAYER DESIGN, OPTIMIZATION AND PROTOTYPING OF NoCs FOR THE NEXT GENERATION OF HOMOGENEOUS MANY-CORE SYSTEMS

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    This thesis provides a whole set of design methods to enable and manage the runtime heterogeneity of features-rich industry-ready Tile-Based Networkon- Chips at different abstraction layers (Architecture Design, Network Assembling, Testing of NoC, Runtime Operation). The key idea is to maintain the functionalities of the original layers, and to improve the performance of architectures by allowing, joint optimization and layer coordinations. In general purpose systems, we address the microarchitectural challenges by codesigning and co-optimizing feature-rich architectures. In application-specific NoCs, we emphasize the event notification, so that the platform is continuously under control. At the network assembly level, this thesis proposes a Hold Time Robustness technique, to tackle the hold time issue in synchronous NoCs. At the network architectural level, the choice of a suitable synchronization paradigm requires a boost of synthesis flow as well as the coexistence with the DVFS. On one hand this implies the coexistence of mesochronous synchronizers in the network with dual-clock FIFOs at network boundaries. On the other hand, dual-clock FIFOs may be placed across inter-switch links hence removing the need for mesochronous synchronizers. This thesis will study the implications of the above approaches both on the design flow and on the performance and power quality metrics of the network. Once the manycore system is composed together, the issue of testing it arises. This thesis takes on this challenge and engineers various testing infrastructures. At the upper abstraction layer, the thesis addresses the issue of managing the fully operational system and proposes a congestion management technique named HACS. Moreover, some of the ideas of this thesis will undergo an FPGA prototyping. Finally, we provide some features for emerging technology by characterizing the power consumption of Optical NoC Interfaces

    A CONTROLLER AREA NETWORK LAYER FOR RECONFIGURABLE EMBEDDED SYSTEMS

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    Dependable and Fault-tolerant computing is actively being pursued as a research area since the 1980s in various fields involving development of safety-critical applications. The ability of the system to provide reliable functional service as per its design is a key paradigm in dependable computing. For providing reliable service in fault-tolerant systems, dynamic reconfiguration has to be supported to enable recovery from errors (induced by faults) or graceful degradation in case of service failures. Reconfigurable Distributed applications provided a platform to develop fault-tolerant systems and these reconfigurable architectures requires an embedded network that is inherently fault-tolerant and capable of handling movement of tasks between nodes/processors within the system during dynamic reconfiguration. The embedded network should provide mechanisms for deterministic message transfer under faulty environments and support fault detection/isolation mechanisms within the network framework. This thesis describes the design, implementation and validation of an embedded networking layer using Controller Area Network (CAN) to support reconfigurable embedded systems

    Enabling Full-Stack Quantum Computing with Changeable Error-Corrected Qubits

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    Executing quantum applications with quantum error correction (QEC) faces the gate non-universality problem imposed by the Eastin-Knill theorem. As one resource-time-efficient solution, code switching changes the encoding of logical qubits to implement universal logical gates. Unfortunately, it is still unclear how to perform full-stack fault-tolerant quantum computing (FTQC) based on the changeable logical qubit. Specifically, three critical problems remain unsolved: a) how to implement the dynamic logical qubit on hardware; b) how to determine the appropriate timing for logical qubit varying; c) how to improve the overall system performance for programs of different features. To overcome those design problems, We propose CECQ, to explore the large design space for FTQC based on changeable logical qubits. Experiments on various quantum programs demonstrate the effectiveness of CECQ

    New Techniques for On-line Testing and Fault Mitigation in GPUs

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    Reliability-aware circuit design to mitigate impact of device defects and variability in emerging memristor-based applications

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    In the last decades, semiconductor industry has fostered a fast downscale in technology, propelling the large scale integration of CMOS-based systems. The benefits in miniaturization are numerous, highlighting faster switching frequency, lower voltage supply and higher device density. However, this aggressive scaling trend it has not been without challenges, such as leakage currents, yield reduction or the increase in the overall system power dissipation. New materials, changes in the device structures and new architectures are key to keep the miniaturization trend. It is foreseen that 2D integration will eventually come to an insurmountable physical and economic limit, in which new strategic directions are required, such as the development of new device structures, 3D architectures or heterogeneous systems that takes advantage of the best of different technologies, both the ones already consolidated as well as emergent ones that provide performance and efficiency improvements in applications. In this context, memristor arises as one of several candidates in the race to find suitable emergent devices. Memristor, a blend of the words memory and resistor, is a passive device postulated by Leon Chua in 1971. In contrast with the other fundamental passive elements, memristors have the distinctive feature of modifying their resistance according to the charge that passes through these devices, and remaining unaltered when charge no longer flows. Although when it appeared no physical device implementation was acknowledged, HP Labs claimed in 2008 the manufacture of the first real memristor. This milestone triggered an unexpectedly high research activity about memristors, both in searching new materials and structures as well as in potential applications. Nowadays, memristors are not only appreciated in memory systems by their nonvolatile storage properties, but in many other fields, such as digital computing, signal processing circuits, or non-conventional applications like neuromorphic computing or chaotic circuits. In spite of their promising features, memristors show a primarily downside: they show significant device variation and limited lifetime due degradation compared with other alternatives. This Thesis explores the challenges that memristor variation and malfunction imposes in potential applications. The main goal is to propose circuits and strategies that either avoid reliability problems or take advantage of them. Throughout a collection of scenarios in which reliability issues are present, their impact is studied by means of simulations. This thesis is contextualized and their objectives are exposed in Chapter 1. In Chapter 2 the memristor is introduced, at both conceptual and experimental levels, and different compact levels are presented to be later used in simulations. Chapter 3 deepens in the phenomena that causes the lack of reliability in memristors, and models that include these defects in simulations are provided. The rest of the Thesis covers different applications. Therefore, Chapter 4 exhibits nonvolatile memory systems, and specifically an online test method for faulty cells. Digital computing is presented in Chapter 5, where a solution for the yield reduction in logic operations due to memristors variability is proposed. Lastly, Chapter 6 reviews applications in the analog domain, and it focuses in the exploitation of results observed in faulty memristor-based interconnect mediums for chaotic systems synchronization purposes. Finally, the Thesis concludes in Chapter 7 along with perspectives about future work.Este trabajo desarrolla un novedoso dispositivo condensador basado en el uso de la nanotecnología. El dispositivo parte del concepto existente de metal-aislador-metal (MIM), pero en lugar de una capa aislante continua, se utilizan nanopartículas dieléctricas. Las nanopartículas son principalmente de óxido de silicio (sílice) y poliestireno (PS) y los valores de diámetro son 255nm y 295nm respectivamente. Las nanopartículas contribuyen a una alta relación superficie/volumen y están fácilmente disponibles a bajo costo. La tecnología de depósito desarrollada en este trabajo se basa en la técnica de electrospray, que es una tecnología de fabricación ascendente (bottom-up) que permite el procesamiento por lotes y logra un buen compromiso entre una gran superficie y un bajo tiempo de depósito. Con el objetivo de aumentar la superficie de depósito, la configuración de electrospray ha sido ajustada para permitir áreas de depósito de 1cm2 a 25cm2. El dispositivo fabricado, los llamados condensadores de metal aislante de nanopartículas (NP-MIM) ofrecen valores de capacidad más altos que un condensador convencional similar con una capa aislante continua. En el caso de los NP-MIM de sílice, se alcanza un factor de hasta 1000 de mejora de la capacidad, mientras que los NP-MIM de poliestireno exhibe una ganancia de capacidad en el rango de 11. Además, los NP-MIM de sílice muestran comportamientos capacitivos en específicos rangos de frecuencias que depende de la humedad y el grosor de la capa de nanopartículas, mientras que los NP-MIM de poliestireno siempre mantienen su comportamiento capacitivo. Los dispositivos fabricados se han caracterizado mediante medidas de microscopía electrónica de barrido (SEM) complementadas con perforaciones de haz de iones focalizados (FIB) para caracterizar la topografía de los NP-MIMs. Los dispositivos también se han caracterizado por medidas de espectroscopia de impedancia, a diferentes temperaturas y humedades. El origen de la capacitancia aumentada está asociado en parte a la humedad en las interfaces de las nanopartículas. Se ha desarrollado un modelo de un circuito basado en elementos distribuidos para ajustar y predecir el comportamiento eléctrico de los NP-MIMs. En resumen, esta tesis muestra el diseño, fabricación, caracterización y modelización de un nuevo y prometedor condensador nanopartículas metal-aislante-metal que puede abrir el camino al desarrollo de una nueva tecnología de supercondensadores MIM
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