Cross-Layer Approaches for an Aging-Aware Design of Nanoscale Microprocessors

Thanks to aggressive scaling of transistor dimensions, computers have revolutionized our life. However, the increasing unreliability of devices fabricated in nanoscale technologies emerged as a major threat for the future success of computers. In particular, accelerated transistor aging is of great importance, as it reduces the lifetime of digital systems. This thesis addresses this challenge by proposing new methods to model, analyze and mitigate aging at microarchitecture-level and above

PRITEXT: Processor Reliability Improvement Through Exercise Technique

With continuous improvements in CMOS technology, transistor sizes are shrinking aggressively every year. Unfortunately, such deep submicron process technologies are severely degraded by several wearout mechanisms which lead to prolonged operational stress and failure. Negative Bias Temperature Instability (NBTI) is a prominent failure mechanism which degrades the reliability of current semiconductor devices. Improving reliability of processors is necessary for ensuring long operational lifetime which obviates the necessity of mitigating the physical wearout mechanisms. NBTI severely degrades the performance of PMOS transistors in a circuit, when negatively biased, by increasing the threshold voltage leading to critical timing failures over operational lifetime. A lack of activity among the PMOS transistors for long duration leads to a steady increase in threshold voltage Vth. Interestingly, NBTI stress can be recovered by removing the negative bias using appropriate input vectors. Exercising the dormant critical components in the Processor has been proved to reduce the NBTI stress. We use a novel methodology to generate a minimal set of deterministic input vectors which we show to be effective in reducing the NBTI wearout in a superscalar processor core. We then propose and evaluate a new technique PRITEXT, which uses these input vectors in exercise mode to effectively reduce the NBTI stress and improve the operational lifetime of superscalar processors. PRITEXT, which uses Input Vector Control, leads to a 4.5x lifetime improvement of superscalar processor on average with a maximum lifetime improvement of 12.7x

A DYNAMIC HETEROGENEOUS MULTI-CORE ARCHITECTURE

Ph.DDOCTOR OF PHILOSOPH

Exploiting Adaptive Techniques to Improve Processor Energy Efficiency

Rapid device-miniaturization keeps on inducing challenges in building energy efficient microprocessors. As the size of the transistors continuously decreasing, more uncertainties emerge in their operations. On the other hand, integrating more and more transistors on a single chip accentuates the need to lower its supply-voltage. This dissertation investigates one of the primary device uncertainties - timing error, in microprocessor performance bottleneck in NTC era. Then it proposes various innovative techniques to exploit these opportunities to maintain processor energy efficiency, in the context of emerging challenges. Evaluated with the cross-layer methodology, the proposed approaches achieve substantial improvements in processor energy efficiency, compared to other start-of-art techniques

Programmable stochastic processors

As traditional approaches for reducing power in microprocessors are being exhausted, extreme power challenges call for unconventional approaches to power reduction. Recent research has shown substantial promise for application-specific stochastic computing, i.e., computing that exploits application error tolerance to enable careful relaxation of correctness guarantees provided by hardware in order to reduce power. This dissertation explores the feasibility, challenges, and potential benefits of stochastic computing in the context of programmable general purpose processors. Specifically, the dissertation describes design-level techniques that minimize the power of a processor for a non-zero error rate or allow a processor to fail gracefully when operated over a range of non-zero error rates. It presents microarchitectural design principles that allow a processor to trade off reliability and energy more efficiently to minimize energy when exploiting error resilience. It demonstrates the benefit of using compiler optimizations that optimize a binary to enable more energy savings when operating at a non-zero error rate. It also demonstrates significant benefits for a programmable stochastic processor prototype that improves energy efficiency by carefully relaxing correctness and exposing errors in applications running on a commodity processor. This dissertation on programmable stochastic processors conclusively shows that the architecture and design of processors and applications should be approached differently in scenarios where errors are allowed to be exposed from the hardware to higher levels of the compute stack. Significant energy benefits are demonstrated for design-, architecture-, compiler-, and application-level optimizations for general purpose programmable stochastic processors

Exploiting Application Behaviors for Resilient Static Random Access Memory Arrays in the Near-Threshold Computing Regime

Near-Threshold Computing embodies an intriguing choice for mobile processors due to the promise of superior energy efficiency, extending the battery life of these devices while reducing the peak power draw. However, process, voltage, and temperature variations cause a significantly high failure rate of Level One cache cells in the near-threshold regime a stark contrast to designs in the super-threshold regime, where fault sites are rare. This thesis work shows that faulty cells in the near-threshold regime are highly clustered in certain regions of the cache. In addition, popular mobile benchmarks are studied to investigate the impact of run-time workloads on timing faults manifestation. A technique to mitigate the run-time faults is proposed. This scheme maps frequently used data to healthy cache regions by exploiting the application cache behaviors. The results show up to 78% gain in performance over two other state-of-the-art techniques

Design of a Five Stage Pipeline CPU with Interruption System

A central processing unit (CPU), also referred to as a central processor unit, is the hardware within a computer that carries out the instructions of a computer program by performing the basic arithmetical, logical, and input/output operations of the system. The term has been in use in the computer industry at least since the early 1960s.The form, design, and implementation of CPUs have changed over the course of their history, but their fundamental operation remains much the same. A computer can have more than one CPU; this is called multiprocessing. All modern CPUs are microprocessors, meaning contained on a single chip. Some integrated circuits (ICs) can contain multiple CPUs on a single chip; those ICs are called multi-core processors. An IC containing a CPU can also contain peripheral devices, and other components of a computer system; this is called a system on a chip (SoC).Two typical components of a CPU are the arithmetic logic unit (ALU), which performs arithmetic and logical operations, and the control unit (CU), which extracts instructions from memory and decodes and executes them, calling on the ALU when necessary. Not all computational systems rely on a central processing unit. An array processor or vector processor has multiple parallel computing elements, with no one unit considered the "center". In the distributed computing model, problems are solved by a distributed interconnected set of processors

Reining in the Functional Verification of Complex Processor Designs with Automation, Prioritization, and Approximation

Our quest for faster and efficient computing devices has led us to processor designs with enormous complexity. As a result, functional verification, which is the process of ascertaining the correctness of a processor design, takes up a lion's share of the time and cost spent on making processors. Unfortunately, functional verification is only a best-effort process that cannot completely guarantee the correctness of a design, often resulting in defective products that may have devastating consequences.Functional verification, as practiced today, is unable to cope with the complexity of current and future processor designs. In this dissertation, we identify extensive automation as the essential step towards scalable functional verification of complex processor designs. Moreover, recognizing that a complete guarantee of design correctness is impossible, we argue for systematic prioritization and prudent approximation to realize fast and far-reaching functional verification solutions. We partition the functional verification effort into three major activities: planning and test generation, test execution and bug detection, and bug diagnosis. Employing a perspective we refer to as the automation, prioritization, and approximation (APA) approach, we develop solutions that tackle challenges across these three major activities. In pursuit of efficient planning and test generation for modern systems-on-chips, we develop an automated process for identifying high-priority design aspects for verification. In addition, we enable the creation of compact test programs, which, in our experiments, were up to 11 times smaller than what would otherwise be available at the beginning of the verification effort. To tackle challenges in test execution and bug detection, we develop a group of solutions that enable the deployment of automatic and robust mechanisms for catching design flaws during high-speed functional verification. By trading accuracy for speed, these solutions allow us to unleash functional verification platforms that are over three orders of magnitude faster than traditional platforms, unearthing design flaws that are otherwise impossible to reach. Finally, we address challenges in bug diagnosis through a solution that fully automates the process of pinpointing flawed design components after detecting an error. Our solution, which identifies flawed design units with over 70% accuracy, eliminates weeks of diagnosis effort for every detected error.PHDComputer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/137057/1/birukw_1.pd

Runtime Monitoring for Dependable Hardware Design

Mit dem Voranschreiten der Technologieskalierung und der Globalisierung der Produktion von integrierten Schaltkreisen eröffnen sich eine Fülle von Schwachstellen bezüglich der Verlässlichkeit von Computerhardware. Jeder Mikrochip wird aufgrund von Produktionsschwankungen mit einem einzigartigen Charakter geboren, welcher sich durch seine Arbeitsbedingungen, Belastung und Umgebung in individueller Weise entwickelt. Daher sind deterministische Modelle, welche zur Entwurfszeit die Verlässlichkeit prognostizieren, nicht mehr ausreichend um Integrierte Schaltkreise mit Nanometertechnologie sinnvoll abbilden zu können. Der Bedarf einer Laufzeitanalyse des Zustandes steigt und mit ihm die notwendigen Maßnahmen zum Erhalt der Zuverlässigkeit. Transistoren sind anfällig für auslastungsbedingte Alterung, die die Laufzeit der Schaltung erhöht und mit ihr die Möglichkeit einer Fehlberechnung. Hinzu kommen spezielle Abläufe die das schnelle Altern des Chips befördern und somit seine zuverlässige Lebenszeit reduzieren. Zusätzlich können strahlungsbedingte Laufzeitfehler (Soft-Errors) des Chips abnormales Verhalten kritischer Systeme verursachen. Sowohl das Ausbreiten als auch das Maskieren dieser Fehler wiederum sind abhängig von der Arbeitslast des Systems. Fabrizierten Chips können ebenfalls vorsätzlich während der Produktion boshafte Schaltungen, sogenannte Hardwaretrojaner, hinzugefügt werden. Dies kompromittiert die Sicherheit des Chips. Da diese Art der Manipulation vor ihrer Aktivierung kaum zu erfassen ist, ist der Nachweis von Trojanern auf einem Chip direkt nach der Produktion extrem schwierig. Die Komplexität dieser Verlässlichkeitsprobleme machen ein einfaches Modellieren der Zuverlässigkeit und Gegenmaßnahmen ineffizient. Sie entsteht aufgrund verschiedener Quellen, eingeschlossen der Entwicklungsparameter (Technologie, Gerät, Schaltung und Architektur), der Herstellungsparameter, der Laufzeitauslastung und der Arbeitsumgebung. Dies motiviert das Erforschen von maschinellem Lernen und Laufzeitmethoden, welche potentiell mit dieser Komplexität arbeiten können. In dieser Arbeit stellen wir Lösungen vor, die in der Lage sind, eine verlässliche Ausführung von Computerhardware mit unterschiedlichem Laufzeitverhalten und Arbeitsbedingungen zu gewährleisten. Wir entwickelten Techniken des maschinellen Lernens um verschiedene Zuverlässigkeitseffekte zu modellieren, zu überwachen und auszugleichen. Verschiedene Lernmethoden werden genutzt, um günstige Überwachungspunkte zur Kontrolle der Arbeitsbelastung zu finden. Diese werden zusammen mit Zuverlässigkeitsmetriken, aufbauend auf Ausfallsicherheit und generellen Sicherheitsattributen, zum Erstellen von Vorhersagemodellen genutzt. Des Weiteren präsentieren wir eine kosten-optimierte Hardwaremonitorschaltung, welche die Überwachungspunkte zur Laufzeit auswertet. Im Gegensatz zum aktuellen Stand der Technik, welcher mikroarchitektonische Überwachungspunkte ausnutzt, evaluieren wir das Potential von Arbeitsbelastungscharakteristiken auf der Logikebene der zugrundeliegenden Hardware. Wir identifizieren verbesserte Features auf Logikebene um feingranulare Laufzeitüberwachung zu ermöglichen. Diese Logikanalyse wiederum hat verschiedene Stellschrauben um auf höhere Genauigkeit und niedrigeren Overhead zu optimieren. Wir untersuchten die Philosophie, Überwachungspunkte auf Logikebene mit Hilfe von Lernmethoden zu identifizieren und günstigen Monitore zu implementieren um eine adaptive Vorbeugung gegen statisches Altern, dynamisches Altern und strahlungsinduzierte Soft-Errors zu schaffen und zusätzlich die Aktivierung von Hardwaretrojanern zu erkennen. Diesbezüglich haben wir ein Vorhersagemodell entworfen, welches den Arbeitslasteinfluss auf alterungsbedingte Verschlechterungen des Chips mitverfolgt und dazu genutzt werden kann, dynamisch zur Laufzeit vorbeugende Techniken, wie Task-Mitigation, Spannungs- und Frequenzskalierung zu benutzen. Dieses Vorhersagemodell wurde in Software implementiert, welche verschiedene Arbeitslasten aufgrund ihrer Alterungswirkung einordnet. Um die Widerstandsfähigkeit gegenüber beschleunigter Alterung sicherzustellen, stellen wir eine Überwachungshardware vor, welche einen Teil der kritischen Flip-Flops beaufsichtigt, nach beschleunigter Alterung Ausschau hält und davor warnt, wenn ein zeitkritischer Pfad unter starker Alterungsbelastung steht. Wir geben die Implementierung einer Technik zum Reduzieren der durch das Ausführen spezifischer Subroutinen auftretenden Belastung von zeitkritischen Pfaden. Zusätzlich schlagen wir eine Technik zur Abschätzung von online Soft-Error-Schwachstellen von Speicherarrays und Logikkernen vor, welche auf der Überwachung einer kleinen Gruppe Flip-Flops des Entwurfs basiert. Des Weiteren haben wir eine Methode basierend auf Anomalieerkennung entwickelt, um Arbeitslastsignaturen von Hardwaretrojanern während deren Aktivierung zur Laufzeit zu erkennen und somit eine letzte Verteidigungslinie zu bilden. Basierend auf diesen Experimenten demonstriert diese Arbeit das Potential von fortgeschrittener Feature-Extraktion auf Logikebene und lernbasierter Vorhersage basierend auf Laufzeitdaten zur Verbesserung der Zuverlässigkeit von Harwareentwürfen

Toward Reliable, Secure, and Energy-Efficient Multi-Core System Design

Computer hardware researchers have perennially focussed on improving the performance of computers while stipulating the energy consumption under a strict budget. While several innovations over the years have led to high performance and energy efficient computers, more challenges have also emerged as a fallout. For example, smaller transistor devices in modern multi-core systems are afflicted with several reliability and security concerns, which were inconceivable even a decade ago. Tackling these bottlenecks happens to negatively impact the power and performance of the computers. This dissertation explores novel techniques to gracefully solve some of the pressing challenges of the modern computer design. Specifically, the proposed techniques improve the reliability of on-chip communication fabric under a high power supply noise, increase the energy-efficiency of low-power graphics processing units, and demonstrate an unprecedented security loophole of the low-power computing paradigm through rigorous hardware-based experiments