39 research outputs found
Recommended from our members
Testability considerations for implementing an embedded memory subsystem
textThere are a number of testability considerations for VLSI design,
but test coverage, test time, accuracy of test patterns and
correctness of design information for DFD (Design for debug) are
the most important ones in design with embedded memories. The goal
of DFT (Design-for-Test) is to achieve zero defects. When it comes
to the memory subsystem in SOCs (system on chips), many flavors of
memory BIST (built-in self test) are able to get high test
coverage in a memory, but often, no proper attention is given to
the memory interface logic (shadow logic). Functional testing and
BIST are the most prevalent tests for this logic, but functional
testing is impractical for complicated SOC designs. As a result,
industry has widely used at-speed scan testing to detect delay
induced defects. Compared with functional testing, scan-based
testing for delay faults reduces overall pattern generation
complexity and cost by enhancing both controllability and
observability of flip-flops. However, without proper modeling of
memory, Xs are generated from memories. Also, when the design has
chip compression logic, the number of ATPG patterns is increased
significantly due to Xs from memories. In this dissertation, a
register based testing method and X prevention logic are presented
to tackle these problems.
An important design stage for scan based testing with memory
subsystems is the step to create a gate level model and verify
with this model. The flow needs to provide a robust ATPG netlist
model. Most industry standard CAD tools used to analyze fault
coverage and generate test vectors require gate level models.
However, custom embedded memories are typically designed using a
transistor-level flow, there is a need for an abstraction step to
generate the gate models, which must be equivalent to the actual
design (transistor level). The contribution of the research is a
framework to verify that the gate level representation of custom
designs is equivalent to the transistor-level design.
Compared to basic stuck-at fault testing, the number of patterns
for at-speed testing is much larger than for basic stuck-at fault
testing. So reducing test and data volume are important. In this
desertion, a new scan reordering method is introduced to reduce
test data with an optimal routing solution. With in depth
understanding of embedded memories and flows developed during the
study of custom memory DFT, a custom embedded memory Bit Mapping
method using a symbolic simulator is presented in the last chapter
to achieve high yield for memories.Electrical and Computer Engineerin
New Techniques for On-line Testing and Fault Mitigation in GPUs
L'abstract è presente nell'allegato / the abstract is in the attachmen
Concurrent Online Testing for Many Core Systems-on-Chips
Shrinking transistor sizes have introduced new challenges and opportunities for system-on-chip (SoC) design and reliability. Smaller transistors are more susceptible to early lifetime failure and electronic wear-out, greatly reducing their reliable lifetimes. However, smaller transistors will also allow SoC to contain hundreds of processing cores and other infrastructure components with the potential for increased reliability through massive structural redundancy. Concurrent online testing (COLT) can provide sufficient reliability and availability to systems with this redundancy. COLT manages the process of testing a subset of processing cores while the rest of the system remains operational. This can be considered a temporary, graceful degradation of system performance that increases reliability while maintaining availability.
In this dissertation, techniques to assist COLT are proposed and analyzed. The techniques described in this dissertation focus on two major aspects of COLT feasibility: recovery time and test delivery costs. To reduce the time between failure and recovery, and thereby increase system availability, an anomaly-based test triggering unit (ATTU) is proposed to initiate COLT when anomalous network behavior is detected. Previous COLT techniques have relied on initiating tests periodically. However, determining the testing period is based on a device's mean time between failures (MTBF), and calculating MTBF is exceedingly difficult and imprecise.
To address the test delivery costs associated with COLT, a distributed test vector storage (DTVS) technique is proposed to eliminate the dependency of test delivery costs on core location. Previous COLT techniques have relied on a single location to store test vectors, and it has been demonstrated that centralized storage of tests scales poorly as the number of cores per SoC grows. Assuming that the SoC organizes its processing cores with a regular topology, DTVS uses an interleaving technique to optimally distribute the test vectors across the entire chip. DTVS is analyzed both empirically and analytically, and a testing protocol using DTVS is described.
COLT is only feasible if the applications running concurrently are largely unaffected. The effect of COLT on application execution time is also measured in this dissertation, and an application-aware COLT protocol is proposed and analyzed. Application interference is greatly reduced through this technique