Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations

Analysis of Radiation-induced Cross Domain Errors in TMR Architectures on SRAM-based FPGAs

SRAM-Based FPGAs represent a low-cost alternative to ASIC device thanks to their high performance and design flexibility. In particular, for aerospace and avionics application fields, SRAM-based FPGAs are increasingly adopted for their configurability features making them a viable solution for long-time applications. However, these fields are characterized by a radiation environment that makes the technology extremely sensitive to radiation-induced Single Event Upsets (SEUs) in the SRAM-based FPGA’s configuration memory. Configuration scrubbing and Triple Modular Redundancy (TMR) have been widely adopted in order to cope with SEU effects. However, modern FPGA devices are characterized by a heterogeneous routing resource distribution and a complex configuration memory mapping causing an increasing sensitivity to Cross Domain Errors affecting the TMR structure. In this paper we developed a new methodology to calculate the reliability of TMR architecture considering the intrinsic characteristics of the new generation of SRAM-based FPGAs. The method includes the analysis of the configuration bit sharing phenomena and of the routing long lines. We experimentally evaluate the method of various benchmark circuits evaluating the Mean Upset To Failure (MUTF). Finally, we used the results of the developed method to implement an improved design achieving 29x improvement of the MUTF

New Design Techniques for Dynamic Reconfigurable Architectures

L'abstract è presente nell'allegato / the abstract is in the attachmen

Low-Level Placement and Routing Changes to Increase SRAM FPGA Reliability

Mitigation techniques, such as TMR, are used to reduce the negative effects of radiation on FPGAs deployed in space environments. While these techniques increase the robustness of the device, there is still room for improvement in the range of 100 to 1,000x. These improvements can be realized through the low-level implementation of the placement and routing on the device. This work has implemented a wide variety of techniques to realize these gains, achieving an overall improvement of 45,653x through fault-injection testing and an improvement of 368x in radiation testing

SRAM-Based FPGA Systems for Safety-Critical Applications: A Survey on Design Standards and Proposed Methodologies

As the ASIC design cost becomes affordable only for very large-scale productions, the FPGA technology is currently becoming the leading technology for those applications that require a small-scale production. FPGAs can be considered as a technology crossing between hardware and software. Only a small-number of standards for the design of safety-critical systems give guidelines and recommendations that take the peculiarities of the FPGA technology into consideration. The main contribution of this paper is an overview of the existing design standards that regulate the design and verification of FPGA-based systems in safety-critical application fields. Moreover, the paper proposes a survey of significant published research proposals and existing industrial guidelines about the topic, and collects and reports about some lessons learned from industrial and research projects involving the use of FPGA devices

Dynamic Partial Reconfiguration for Dependable Systems

Moore’s law has served as goal and motivation for consumer electronics manufacturers in the last decades. The results in terms of processing power increase in the consumer electronics devices have been mainly achieved due to cost reduction and technology shrinking. However, reducing physical geometries mainly affects the electronic devices’ dependability, making them more sensitive to soft-errors like Single Event Transient (SET) of Single Event Upset (SEU) and hard (permanent) faults, e.g. due to aging effects. Accordingly, safety critical systems often rely on the adoption of old technology nodes, even if they introduce longer design time w.r.t. consumer electronics. In fact, functional safety requirements are increasingly pushing industry in developing innovative methodologies to design high-dependable systems with the required diagnostic coverage. On the other hand commercial off-the-shelf (COTS) devices adoption began to be considered for safety-related systems due to real-time requirements, the need for the implementation of computationally hungry algorithms and lower design costs. In this field FPGA market share is constantly increased, thanks to their flexibility and low non-recurrent engineering costs, making them suitable for a set of safety critical applications with low production volumes. The works presented in this thesis tries to face new dependability issues in modern reconfigurable systems, exploiting their special features to take proper counteractions with low impacton performances, namely Dynamic Partial Reconfiguration

Improving SRAM FPGA Radiation Reliability Through Low-Level TMR Implementation

Mitigation techniques, such as TMR with repair, are used to reduce the negative effects of radiation on FPGAs deployed in space environments. While these techniques increase the robustness of the device, there is still room for improvement in the range of 100 to 1,000x. These improvements can be realized through the low-level implementation of the placement and routing on the device. This work has implemented a wide variety of techniques to realize these gains, achieving an overall improvement of 57,443x through fault-injection testing and an improvement of 350x in radiation testing

Digital design techniques for dependable High-Performance Computing

L'abstract è presente nell'allegato / the abstract is in the attachmen

Voter Insertion Techniques for Fault Tolerant FPGA Design

Triple Modular Redundancy (TMR) is a common reliability technique for FPGA designs used in radiation environments. TMR consists of triplicating a design and inserting voters to mask errors using redundancy. This paper will investigate the automatic placement of voters in TMR designs. In particular, it will introduce three algorithms for determining where to insert synchronization voters and compare the area and timing impact of these algorithms on FPGA designs. It will be shown that the placement of synchronization voters in a triplicated design can have an important impact on the area and timing characteristics of the resulting design. The algorithms presented in this paper give results that increase the critical path length of a design when adding TMR voters by as little as 3% to as much as 50%