3,993 research outputs found

    Statistical Monitoring Procedures for High-Purity Manufacturing Processes

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    Statistical Monitoring Procedures for High-Purity Manufacturing Processes

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    Contributions in statistical process control for high quality products

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    Ph.DDOCTOR OF PHILOSOPH

    Negative Binomial charts for monitoring high-quality processes

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    Good control charts for high quality processes are often based on the number of successes between failures. Geometric charts are simplest in this respect, but slow in recognizing moderately increased failure rates p. Improvement can be achieved by waiting until r > 1 failures have occurred, i.e. by using negative binomial charts.In this paper we analyze such charts in some detail. On the basis of a fair comparison, we demonstrate how the optimal r is related to the degree of increase of p. As in practice p will usually be unknown, we also analyze the estimated version of the charts. In particular, simple corrections are derived to control the non-negligible effects of this estimation step

    Modeling and designing control chart for monitoring time-between events data

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    Ph.DDOCTOR OF PHILOSOPH

    ECONOMIC DESIGN OF VSI GCCC CHARTS FOR CORRELATED SAMPLES

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    A study of properties and applications of control charts for high yield processes

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    Ph.DDOCTOR OF PHILOSOPH

    Poisson Distributed Individuals Control Charts with Optimal Limits

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    The conventional method used in attribute control charts is the Shewhart three sigma limits. The implicit assumption of the Normal distribution in this approach is not appropriate for skewed distributions such as Poisson, Geometric and Negative Binomial. Normal approximations perform poorly in the tail area of the these distributions. In this research, a type of attribute control chart is introduced to monitor the processes that provide count data. The economic objective of this chart is to minimize the cost of its errors which is determined by the designer. This objective is a linear function of type I and II errors. The proposed control chart can be applied to Poisson, Geometric and Negative Binomial as the underlying distribution of count data. Control limits in this chart is calculated optimally since it is based on the probability distribution of the data and can detect a directional shift in the process rate. Some numerical results for the optimal design of the proposed control chart are provided. The expected cost of the control chart is compared to that of a one sided c chart. The effects of changing the available parameters on the cost, errors and the optimal limits of the proposed control chart are shown graphically

    A study of modelling and monitoring time-between-events with control charts

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    Ph.DDOCTOR OF PHILOSOPH
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