Specification and validation of control intensive ICs in hopCP

technical reportControl intensive ICs pose a significant challenge to the users of formal methods in designing hardware. These ICs have to support a wide variety of requirements including synchronous and asynchronous operations polling and interrupt driven modes of operation multiple concurrent threads of execution non-trivial computational requirements and programmability. In this paper we illustrate the use of formal methods in the design of a control intensive IC called the "Intel 8251" Universal Synchronous / Asynchronous Receiver Transmitter (USART), using our hardware description language 'hopCP'. A feature of hopCP is that it supports communication via synchronous ports in addition to synchronous message passing Asynchronous ports are distributed shared variables writable by exactly one process We show the usefulness of this combination of communication constructs We outline algorithms to determine safe usages of asynchronous ports and also to discover other static properties of the specification We discuss a compiled code concurrent functional simulator called CFSIM, as well as the use of concurrent testers for driving CFSIM. The use of a semantically well specified and simple language and the associated analysis/simulation tools helps conquer the complexity of specifying and validating control intensive ICs

Analyse de testabilité au niveau transfert de registres

Synthèse automatique et analyse de testabilité -- Les définitions de base -- Analyse de testabilité à haut niveau d'abstraction -- Analyse de testabilité et d'insertion de points de test au niveau transfert de registres -- Testability analysis and test-point insertion in RTL VHDL specifications for scan-based bist -- Implantation de l'algorithme et résultats expérimentaux

Analysis and Optimization for Pipelined Asynchronous Systems

Most microelectronic chips used today--in systems ranging from cell phones to desktop computers to supercomputers--operate in basically the same way: they synchronize the operation of their millions of internal components using a clock that is distributed globally. This global clocking is becoming a critical design challenge in the quest for building chips that offer increasingly greater functionality, higher speed, and better energy efficiency. As an alternative, asynchronous or clockless design obviates the need for global synchronization; instead, components operate concurrently and synchronize locally only when necessary. This dissertation focuses on one class of asynchronous circuits: application specific stream processing systems (i.e. those that take in a stream of data items and produce a stream of processed results.) High-speed stream processors are a natural match for many high-end applications, including 3D graphics rendering, image and video processing, digital filters and DSPs, cryptography, and networking processors. This dissertation aims to make the design, analysis, optimization, and testing of circuits in the chosen domain both fast and efficient. Although much of the groundwork has already been laid by years of past work, my work identifies and addresses four critical missing pieces: i) fast performance analysis for estimating the throughput of a fine-grained pipelined system; ii) automated and versatile design space exploration; iii) a full suite of circuit level modules that connect together to implement a wide variety of system behaviors; and iv) testing and design for testability techniques that identify and target the types of errors found only in high-speed pipelined asynchronous systems. I demonstrate these techniques on a number of examples, ranging from simple applications that allow for easy comparison to hand-designed alternatives to more complex systems, such as a JPEG encoder. I also demonstrate these techniques through the design and test of a fully asynchronous GCD demonstration chip

Interconnect yield analysis and fault tolerance for field programmable gate arrays

Imperial Users onl

Generating Circuit Tests by Exploiting Designed Behavior

This thesis describes two programs for generating tests for digital circuits that exploit several kinds of expert knowledge not used by previous approaches. First, many test generation problems can be solved efficiently using operation relations, a novel representation of circuit behavior that connects internal component operations with directly executable circuit operations. Operation relations can be computed efficiently by searching traces of simulated circuit behavior. Second, experts write test programs rather than test vectors because programs are more readable and compact. Test programs can be constructed automatically by merging program fragments using expert-supplied goal-refinement rules and domain-independent planning techniques

Specification and validation of control-intensive integrated circuits in hopCP

technical reportControl intensive ICs pose a significant challenge to the users of formal methods in designing hardware. These ICs have to support a wide variety of requirements including synchronous and asynchronous operations, polling and interrupt-driven modes of operation, multiple concurrent threads of execution, complex computations, and programmability. In this paper, we illustrate the use of formal methods in the design of a control intensive IC called the "Intel 8251" Universal Synchronous/Asynchronous Receiver/Transmitter (USART), using our formal hardware description language 'hopCP'. A feature of hopCP is that it supports communication via asynchronous ports (distributed shared variables writable by exactly one process), in addition to synchronous message passing. We show the usefulness of this combination of communication constructs. We outline static analysis algorithms to determine safe usages of asynchronous ports, and also to discover other static properties of the specification. We discuss a compiled-code concurrent functional simulator called CFSIM, as well as the use of concurrent testers for driving CFSIM. The use of a seraantically well specified and simple language, and the associated analysis/simulation tools helps conquer the complexity of specifying and validating control intensive ICs

Block-level test scheduling under power dissipation constraints

As dcvicc technologies such as VLSI and Multichip Module (MCM) become mature, and larger and denser memory ICs arc implemented for high-performancc digital systems, power dissipation becomes a critical factor and can no longer be ignored cither in normal operation of the system or under test conditions. One of the major considerations in test scheduling is the fact that heat dissipated during test application is significantly higher than during normal operation (sometimes 100 - 200% higher). Therefore, this is one of the recent major considerations in test scheduling. Test scheduling is strongly related to test concurrency. Test concurrency is a design property which strongly impacts testability and power dissipation. To satisfy high fault coverage goals with reduced test application time under certain power dissipation constraints, the testing of all components on the system should be performed m parallel to the greatest extent possible. Some theoretical analysis of this problem has been carried out, but only at IC level. The problem was basically described as a compatible test clustering, where the compatibility among tests was given by test resource and power dissipation conflicts at the same time. From an implementation point of view this problem was identified as an Non-Polynomial (NP) complete problem In this thesis, an efficient scheme for overlaying the block-tcsts, called the extended tree growing technique, is proposed together with classical scheduling algorithms to search for power-constrained blocktest scheduling (PTS) profiles m a polynomial time Classical algorithms like listbased scheduling and distribution-graph based scheduling arc employed to tackle at high level the PTS problem. This approach exploits test parallelism under power constraints. This is achieved by overlaying the block-tcst intervals of compatible subcircuits to test as many of them as possible concurrently so that the maximum accumulated power dissipation is balanced and does not exceed the given limit. The test scheduling discipline assumed here is the partitioned testing with run to completion. A constant additive model is employed for power dissipation analysis and estimation throughout the algorithm

Investigations into the feasibility of an on-line test methodology

This thesis aims to understand how information coding and the protocol that it supports can affect the characteristics of electronic circuits. More specifically, it investigates an on-line test methodology called IFIS (If it Fails It Stops) and its impact on the design, implementation and subsequent characteristics of circuits intended for application specific lC (ASIC) technology. The first study investigates the influences of information coding and protocol on the characteristics of IFIS systems. The second study investigates methods of circuit design applicable to IFIS cells and identifies the· technique possessing the characteristics most suitable for on-line testing. The third study investigates the characteristics of a 'real-life' commercial UART re-engineered using the techniques resulting from the previous two studies. The final study investigates the effects of the halting properties endowed by the protocol on failure diagnosis within IFIS systems. The outcome of this work is an identification and characterisation of the factors that influence behaviour, implementation costs and the ability to test and diagnose IFIS designs