An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests

Nowadays many Integrated Systems embed auxiliary on-chip instruments whose function is to perform test, debug, calibration, configuration, etc. The growing complexity and the increasing number of these instruments have led to new solutions for their access and control, such as the IEEE 1687 standard. The standard introduces an infrastructure composed of scan chains incorporating configurable elements for accessing the instruments in a flexible manner. Such an infrastructure is known as Reconfigurable Scan Network or RSN. Since permanent faults affecting the circuitry can cause malfunction, i.e., inappropriate behaviour, detecting them is of utmost importance. This paper addresses the issue of generating effective sequences for testing the reconfigurable elements within RSNs using evolutionary computation. Test configurations are extracted with automatic test pattern generation (ATPG) and used to guide the evolution. Postprocessing techniques are proposed to improve the evolutionary fittest solution. Results on a standard set of benchmark networks show up to 27% reduced test time with respect to test generation based on RSN exploratio

Survey of timing/synchronization of operating wideband digital communications networks

In order to benefit from experience gained from the synchronization of operational wideband digital networks, a survey was made of three such systems: Data Transmission Company, Western Union Telegraph Company, and the Computer Communications Group of the Trans-Canada Telephone System. The focus of the survey was on deployment and operational experience from a practical (as opposed to theoretical) viewpoint. The objective was to provide a report on the results of deployment how the systems performed, and wherein the performance differed from that predicted or intended in the design. It also attempted to determine how the various system designers would use the benefit of hindsight if they could design those same systems today

A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks

The broad need to efficiently access all the instrumentation embedded within a semiconductor device called for a standardization, and the reconfigurable scan networks proposed in IEEE 1687 have been demonstrated effective in handling complex infrastructures. At the same time, different techniques have been proposed to test the new circuitry required; however, most of the automatic approaches are either too computationally demanding to be applied in complex cases, or too approximate to yield high-quality tests. This paper models the state of a reconfigurable scan network with a finite state automaton, using the length of the active path as the output alphabet and the configurations as input symbols. Permanent faults are represented as incorrect transitions, and a greedy algorithm is used to generate a functional test sequence able to detect all these multiple state-transition faults. The automaton’s state set and the input alphabet are small subsets of the possible ones, and are carefully chosen. Experimental results on ITC’16 benchmarks demonstrate that the proposed approach is broadly applicable; the test sequences are more efficient than the ones previously generated by search heuristics

New techniques for functional testing of microprocessor based systems

Electronic devices may be affected by failures, for example due to physical defects. These defects may be introduced during the manufacturing process, as well as during the normal operating life of the device due to aging. How to detect all these defects is not a trivial task, especially in complex systems such as processor cores. Nevertheless, safety-critical applications do not tolerate failures, this is the reason why testing such devices is needed so to guarantee a correct behavior at any time. Moreover, testing is a key parameter for assessing the quality of a manufactured product. Consolidated testing techniques are based on special Design for Testability (DfT) features added in the original design to facilitate test effectiveness. Design, integration, and usage of the available DfT for testing purposes are fully supported by commercial EDA tools, hence approaches based on DfT are the standard solutions adopted by silicon vendors for testing their devices. Tests exploiting the available DfT such as scan-chains manipulate the internal state of the system, differently to the normal functional mode, passing through unreachable configurations. Alternative solutions that do not violate such functional mode are defined as functional tests. In microprocessor based systems, functional testing techniques include software-based self-test (SBST), i.e., a piece of software (referred to as test program) which is uploaded in the system available memory and executed, with the purpose of exciting a specific part of the system and observing the effects of possible defects affecting it. SBST has been widely-studies by the research community for years, but its adoption by the industry is quite recent. My research activities have been mainly focused on the industrial perspective of SBST. The problem of providing an effective development flow and guidelines for integrating SBST in the available operating systems have been tackled and results have been provided on microprocessor based systems for the automotive domain. Remarkably, new algorithms have been also introduced with respect to state-of-the-art approaches, which can be systematically implemented to enrich SBST suites of test programs for modern microprocessor based systems. The proposed development flow and algorithms are being currently employed in real electronic control units for automotive products. Moreover, a special hardware infrastructure purposely embedded in modern devices for interconnecting the numerous on-board instruments has been interest of my research as well. This solution is known as reconfigurable scan networks (RSNs) and its practical adoption is growing fast as new standards have been created. Test and diagnosis methodologies have been proposed targeting specific RSN features, aimed at checking whether the reconfigurability of such networks has not been corrupted by defects and, in this case, at identifying the defective elements of the network. The contribution of my work in this field has also been included in the first suite of public-domain benchmark networks

Cryptography for Ultra-Low Power Devices

Ubiquitous computing describes the notion that computing devices will be everywhere: clothing, walls and floors of buildings, cars, forests, deserts, etc. Ubiquitous computing is becoming a reality: RFIDs are currently being introduced into the supply chain. Wireless distributed sensor networks (WSN) are already being used to monitor wildlife and to track military targets. Many more applications are being envisioned. For most of these applications some level of security is of utmost importance. Common to WSN and RFIDs are their severely limited power resources, which classify them as ultra-low power devices. Early sensor nodes used simple 8-bit microprocessors to implement basic communication, sensing and computing services. Security was an afterthought. The main power consumer is the RF-transceiver, or radio for short. In the past years specialized hardware for low-data rate and low-power radios has been developed. The new bottleneck are security services which employ computationally intensive cryptographic operations. Customized hardware implementations hold the promise of enabling security for severely power constrained devices. Most research groups are concerned with developing secure wireless communication protocols, others with designing efficient software implementations of cryptographic algorithms. There has not been a comprehensive study on hardware implementations of cryptographic algorithms tailored for ultra-low power applications. The goal of this dissertation is to develop a suite of cryptographic functions for authentication, encryption and integrity that is specifically fashioned to the needs of ultra-low power devices. This dissertation gives an introduction to the specific problems that security engineers face when they try to solve the seemingly contradictory challenge of providing lightweight cryptographic services that can perform on ultra-low power devices and shows an overview of our current work and its future direction

The IPS fidelity scale as a guideline to implement Supported Employment

info:eu-repo/semantics/publishe