Noise shaping Asynchronous SAR ADC based time to digital converter

Time-to-digital converters (TDCs) are key elements for the digitization of timing information in modern mixed-signal circuits such as digital PLLs, DLLs, ADCs, and on-chip jitter-monitoring circuits. Especially, high-resolution TDCs are increasingly employed in on-chip timing tests, such as jitter and clock skew measurements, as advanced fabrication technologies allow fine on-chip time resolutions. Its main purpose is to quantize the time interval of a pulse signal or the time interval between the rising edges of two clock signals. Similarly to ADCs, the performance of TDCs are also primarily characterized by Resolution, Sampling Rate, FOM, SNDR, Dynamic Range and DNL/INL. This work proposes and demonstrates 2nd order noise shaping Asynchronous SAR ADC based TDC architecture with highest resolution of 0.25 ps among current state of art designs with respect to post-layout simulation results. This circuit is a combination of low power/High Resolution 2nd Order Noise Shaped Asynchronous SAR ADC backend with simple Time to Amplitude converter (TAC) front-end and is implemented in 40nm CMOS technology. Additionally, special emphasis is given on the discussion on various current state of art TDC architectures.Electrical and Computer Engineerin

A mixed-signal integrated circuit for FM-DCSK modulation

This paper presents a mixed-signal application-specific integrated circuit (ASIC) for a frequency-modulated differential chaos shift keying (FM-DCSK) communication system. The chip is conceived to serve as an experimental platform for the evaluation of the FM-DCSK modulation scheme, and includes several programming features toward this goal. The operation of the ASIC is herein illustrated for a data rate of 500 kb/s and a transmission bandwidth in the range of 17 MHz. Using signals acquired from the test platform, bit error rate (BER) estimations of the overall FM-DCSK communication link have been obtained assuming wireless transmission at the 2.4-GHz ISM band. Under all tested propagation conditions, including multipath effects, the system obtains a BER = 10-3 for Eb/No lower than 28 dB.Ministerio de Ciencia y Tecnología TIC2003-0235

Low power 9-bit 500 kS/s 2-stage cyclic ADC using OTA variable bias current

This paper presents a 9-bit, 2-stage cyclic analog to digital converter (ADC) with a variable bias current control circuitry to reduce its power dissipation. Each stage outputs a three-bit digital word and the circuit requires four subcycles to perform a whole conversion. Since the accuracy required is higher in the first stage and first subcycle and decreases in subsequent cycles, the bias current of each operational transconductance amplifier is regulated depending on the subcycle of the conversion process. The resolution and sampling frequency of the converter make it suitable to be integrated with 8-bit CMOS imagers with column-parallel ADC architectures. The ADC has been designed using a 1.2 V 110 nm CMOS technology and the circuit consumes 27.9 µW at a sampling rate of 500 kS/s. At this sampling rate and at a 32 kHz input frequency, the circuit achieves 56 dB of SNDR and 9 bit ENOB. The Figure of Merit is 109 fJ/step.This work has been partially funded by Spanish Ministerio de Ciencia e Innovación (MCI), Agencia Estatal de Investigación (AEI) and European Region Development Fund (ERDF/FEDER) under grant RTI2018-097088-B-C3

Design of the 12-bit Delta-Sigma Modulator using SC Technique for Vibration Sensor Output Processing

The work deals with the design of the 12-bit Delta-Sigma modulator using switched capacitors (SC) technique. The modulator serves to vibration sensor output processing. The first part describes the Delta-Sigma modulator parameters definition. Results of the proposed topology ideal model were presented as well. Next, the Delta-Sigma modulator circuitry on the transistor level was done. The ONSemiconductor I2T100 0.7 um CMOS technology was used for design. Then, the Delta-Sigma modulator nonidealities were simulated and implemented into the MATLAB ideal model of the modulator. The model of real Delta-Sigma modulator was derived. Consequently, modulator coefficients were optimized. Finally, the corner analysis of the Delta-Sigma modulator with the optimized coefficients was simulated. The value of SNDR = 82.2 dB (ENOB = 13.4 bits) was achieved

Fundamental Blocks for a 0.18um Cyclic Analog-to-Digital Converter

The goal of this project was to design a fully differential Cyclic Analog-to-Digital Converter, and test the functionality of its major blocks. The converter is an integrated circuit designed for the CMOS 0.18 micron fabrication process. It is self-calibrating and performs 1 million samples per second. Design techniques used include switched capacitor networks, differential amplifier, replica biasing, and calibration in the off-chip digital domain. The project is sponsored by the New England Center for Analog and Mixed Signal Design (NECAMSID)