61 research outputs found

    Improved Reliability of FPGA-based PUF Identification Generator Design

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    FPGA-Based PUF Designs: A Comprehensive Review and Comparative Analysis

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    Field-programmable gate arrays (FPGAs) have firmly established themselves as dynamic platforms for the implementation of physical unclonable functions (PUFs). Their intrinsic reconfigurability and profound implications for enhancing hardware security make them an invaluable asset in this realm. This groundbreaking study not only dives deep into the universe of FPGA-based PUF designs but also offers a comprehensive overview coupled with a discerning comparative analysis. PUFs are the bedrock of device authentication and key generation and the fortification of secure cryptographic protocols. Unleashing the potential of FPGA technology expands the horizons of PUF integration across diverse hardware systems. We set out to understand the fundamental ideas behind PUF and how crucially important it is to current security paradigms. Different FPGA-based PUF solutions, including static, dynamic, and hybrid systems, are closely examined. Each design paradigm is painstakingly examined to reveal its special qualities, functional nuances, and weaknesses. We closely assess a variety of performance metrics, including those related to distinctiveness, reliability, and resilience against hostile threats. We compare various FPGA-based PUF systems against one another to expose their unique advantages and disadvantages. This study provides system designers and security professionals with the crucial information they need to choose the best PUF design for their particular applications. Our paper provides a comprehensive view of the functionality, security capabilities, and prospective applications of FPGA-based PUF systems. The depth of knowledge gained from this research advances the field of hardware security, enabling security practitioners, researchers, and designers to make wise decisions when deciding on and implementing FPGA-based PUF solutions.publishedVersio

    物理複製不能関数における安全性の評価と向上に関する研究

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    In this thesis, we focus on Physically Unclonable Functions (PUFs), which are expected as one of the most promising cryptographic primitives for secure chip authentication. Generally, PUFbased authentication is achieved by two approaches: (A) using a PUF itself, which has multiple challenge (input) and response (output) pairs, or (B) using a cryptographic function, the secret key of which is generated from a PUF with a single challenge-response pair (CRP). We contribute to:(1) evaluate the security of Approach (A), and (2) improve the security of Approach (B). (1) Arbiter-based PUFs were the most feasible type of PUFs, which was used to construct Approach (A). However, Arbiter-based PUFs have a vulnerability; if an attacker knows some CRPs, she/he can predict the remaining unknown CRPs with high probability. Bistable Ring PUF (BR-PUF) was proposed as an alternative, but has not been evaluated by third parties. In this thesis, in order to construct Approach (A) securely, we evaluate the difficulty of predicting responses of a BR-PUF experimentally. As a result, the same responses are frequently generated for two challenges with small Hamming distance. Also, particular bits of challenges have a great impact on the responses. In conclusion, BR-PUFs are not suitable for achieving Approach (A)securely. In future work, we should discuss an alternative PUF suitable for secure Approach (A).(2) In order to achieve Approach (B) securely, a secret key ? generated from a PUF response?should have high entropy. We propose a novel method of extracting high entropy from PUF responses. The core idea is to effectively utilize the information on the proportion of ‘1’s including in repeatedly-measured PUF responses. We evaluate its effectiveness by fabricated test chips. As a result, the extracted entropy is about 1.72 times as large as that without the proposed method.Finally, we organize newly gained knowledge in this thesis, and discuss a new application of PUF-based technologies.電気通信大学201

    Contributions on using embedded memory circuits as physically unclonable functions considering reliability issues

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    [eng] Moving towards Internet-of-Things (IoT) era, hardware security becomes a crucial research topic, because of the growing demand of electronic products that are remotely connected through networks. Novel hardware security primitives based on manufacturing process variability are proposed to enhance the security of the IoT systems. As a trusted root that provides physical randomness, a physically unclonable function is an essential base for hardware security. SRAM devices are becoming one of the most promising alternatives for the implementation of embedded physical unclonable functions as the start-up value of each bit-cell depends largely on the variability related with the manufacturing process. Not all bit-cells experience the same degree of variability, so it is possible that some cells randomly modify their logical starting value, while others will start-up always at the same value. However, physically unclonable function applications, such as identification and key generation, require more constant logical starting value to assure high reliability in PUF response. For this reason, some kind of post-processing is needed to correct the errors in the PUF response. Unfortunately, those cells that have more constant logic output are difficult to be detected in advance. This work characterizes by simulation the start-up value reproducibility proposing several metrics suitable for reliability estimation during design phases. The aim is to be able to predict by simulation the percentage of cells that will be suitable to be used as PUF generators. We evaluate the metrics results and analyze the start-up values reproducibility considering different external perturbation sources like several power supply ramp up times, previous internal values in the bit-cell, and different temperature scenarios. The characterization metrics can be exploited to estimate the number of suitable SRAM cells for use in PUF implementations that can be expected from a specific SRAM design.[cat] En l’era de la Internet de les coses (IoT), garantir la seguretat del hardware ha esdevingut un tema de recerca crucial, en especial a causa de la creixent demanda de productes electrònics que es connecten remotament a través de xarxes. Per millorar la seguretat dels sistemes IoT, s’han proposat noves solucions hardware basades en la variabilitat dels processos de fabricació. Les funcions físicament inclonables (PUF) constitueixen una font fiable d’aleatorietat física i són una base essencial per a la seguretat hardware. Les memòries SRAM s’estan convertint en una de les alternatives més prometedores per a la implementació de funcions físicament inclonables encastades. Això és així ja que el valor d’encesa de cada una de les cel·les que formen els bits de la memòria depèn en gran mesura de la variabilitat pròpia del procés de fabricació. No tots els bits tenen el mateix grau de variabilitat, així que algunes cel·les canvien el seu estat lògic d’encesa de forma aleatòria entre enceses, mentre que d’altres sempre assoleixen el mateix valor en totes les enceses. No obstant això, les funcions físicament inclonables, que s’utilitzen per generar claus d’identificació, requereixen un valor lògic d’encesa constant per tal d’assegurar una resposta fiable del PUF. Per aquest motiu, normalment es necessita algun tipus de postprocessament per corregir els possibles errors presents en la resposta del PUF. Malauradament, les cel·les que presenten una resposta més constant són difícils de detectar a priori. Aquest treball caracteritza per simulació la reproductibilitat del valor d’encesa de cel·les SRAM, i proposa diverses mètriques per estimar la fiabilitat de les cel·les durant les fases de disseny de la memòria. L'objectiu és ser capaç de predir per simulació el percentatge de cel·les que seran adequades per ser utilitzades com PUF. S’avaluen els resultats de diverses mètriques i s’analitza la reproductibilitat dels valors d’encesa de les cel·les considerant diverses fonts de pertorbacions externes, com diferents rampes de tensió per a l’encesa, els valors interns emmagatzemats prèviament en les cel·les, i diferents temperatures. Es proposa utilitzar aquestes mètriques per estimar el nombre de cel·les SRAM adients per ser implementades com a PUF en un disseny d‘SRAM específic.[spa] En la era de la Internet de las cosas (IoT), garantizar la seguridad del hardware se ha convertido en un tema de investigación crucial, en especial a causa de la creciente demanda de productos electrónicos que se conectan remotamente a través de redes. Para mejorar la seguridad de los sistemas IoT, se han propuesto nuevas soluciones hardware basadas en la variabilidad de los procesos de fabricación. Las funciones físicamente inclonables (PUF) constituyen una fuente fiable de aleatoriedad física y son una base esencial para la seguridad hardware. Las memorias SRAM se están convirtiendo en una de las alternativas más prometedoras para la implementación de funciones físicamente inclonables empotradas. Esto es así, puesto que el valor de encendido de cada una de las celdas que forman los bits de la memoria depende en gran medida de la variabilidad propia del proceso de fabricación. No todos los bits tienen el mismo grado de variabilidad. Así pues, algunas celdas cambian su estado lógico de encendido de forma aleatoria entre encendidos, mientras que otras siempre adquieren el mismo valor en todos los encendidos. Sin embargo, las funciones físicamente inclonables, que se utilizan para generar claves de identificación, requieren un valor lógico de encendido constante para asegurar una respuesta fiable del PUF. Por este motivo, normalmente se necesita algún tipo de posprocesado para corregir los posibles errores presentes en la respuesta del PUF. Desafortunadamente, las celdas que presentan una respuesta más constante son difíciles de detectar a priori. Este trabajo caracteriza por simulación la reproductibilidad del valor de encendido de celdas SRAM, y propone varias métricas para estimar la fiabilidad de las celdas durante las fases de diseño de la memoria. El objetivo es ser capaz de predecir por simulación el porcentaje de celdas que serán adecuadas para ser utilizadas como PUF. Se evalúan los resultados de varias métricas y se analiza la reproductibilidad de los valores de encendido de las celdas considerando varias fuentes de perturbaciones externas, como diferentes rampas de tensión para el encendido, los valores internos almacenados previamente en las celdas, y diferentes temperaturas. Se propone utilizar estas métricas para estimar el número de celdas SRAM adecuadas para ser implementadas como PUF en un diseño de SRAM específico

    Emerging physical unclonable functions with nanotechnology

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    Physical unclonable functions (PUFs) are increasingly used for authentication and identification applications as well as the cryptographic key generation. An important feature of a PUF is the reliance on minute random variations in the fabricated hardware to derive a trusted random key. Currently, most PUF designs focus on exploiting process variations intrinsic to the CMOS technology. In recent years, progress in emerging nanoelectronic devices has demonstrated an increase in variation as a consequence of scaling down to the nanoregion. To date, emerging PUFs with nanotechnology have not been fully established, but they are expected to emerge. Initial research in this area aims to provide security primitives for emerging integrated circuits with nanotechnology. In this paper, we review emerging nanotechnology-based PUFs

    D2.1 - Report on Selected TRNG and PUF Principles

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    This report represents the final version of Deliverable 2.1 of the HECTOR work package WP2. It is a result of discussions and work on Task 2.1 of all HECTOR partners involved in WP2. The aim of the Deliverable 2.1 is to select principles of random number generators (RNGs) and physical unclonable functions (PUFs) that fulfill strict technology, design and security criteria. For example, the selected RNGs must be suitable for implementation in logic devices according to the German AIS20/31 standard. Correspondingly, the selected PUFs must be suitable for applying similar security approach. A standard PUF evaluation approach does not exist, yet, but it should be proposed in the framework of the project. Selected RNGs and PUFs should be then thoroughly evaluated from the point of view of security and the most suitable principles should be implemented in logic devices, such as Field Programmable Logic Arrays (FPGAs) and Application Specific Integrated Circuits (ASICs) during the next phases of the project

    A hardware-embedded, delay-based PUF engine designed for use in cryptographic and authentication applications

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    Cryptographic and authentication applications in application-specific integrated circuits (ASICs) and field-programmable gate arrays (FPGAs), as well as codes for the activation of on-chip features, require the use of embedded secret information. The generation of secret bitstrings using physical unclonable functions, or PUFs, provides several distinct advantages over conventional methods, including the elimination of costly non-volatile memory, and the potential to increase the random bits available to applications. In this dissertation, a Hardware-Embedded Delay PUF (HELP) is proposed that is designed to leverage path delay variations that occur in the core logic macros of a chip to create random bitstrings. A thorough discussion is provided of the operational details of an embedded path timing structure called REBEL that is used by HELP to provide the timing functionality upon which HELP relies for the entropy source for the cryptographic quality of the bitstrings. Further details of the FPGA-based implementation used to prove the viability of the HELP PUF concept are included, along with a discussion of the evolution of the techniques employed in realizing the final PUF engine design. The bitstrings produced by a set of 30 FPGA boards are evaluated with regard to several statistical quality metrics including uniqueness, randomness, and stability. The stability characteristics of the bitstrings are evaluated by subjecting the FPGAs to commercial-grade temperature and power supply voltage variations. In particular, this work evaluates the reproducibility of the bitstrings generated at 0C, 25C, and 70C, and 10% of the rated supply voltage. A pair of error avoidance schemes are proposed and presented that provide significant improvements to the HELP PUF\u27s resiliency against bit-flip errors in the bitstrings
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