A built-in self-test technique for high speed analog-to-digital converters

Fundação para a Ciência e a Tecnologia (FCT) - PhD grant (SFRH/BD/62568/2009

Millimeter wave experiment for ATS-F

A detailed description of spaceborne equipment is provided. The equipment consists of two transmitters radiating signals at 20 and 30 GHz from either U.S. coverage horn antennas or a narrow beam parabolic antenna. Three modes of operation are provided: a continuous wave mode, a multitone mode in which nine spectral lines having 180 MHz separation and spaced symmetrically about each carrier, and a communications mode in which communications signals from the main spacecraft transponder are modulated on the two carriers. Detailed performance attained in the flight/prototype model of the equipment is presented both under laboratory conditions and under environmental extremes. Provisions made for ensuring reliability in space operation are described. Also described the bench test equipment developed for use with the experiment, and a summary of the new technology is included

Built-in self test of high speed analog-to-digital converters

Signals found in nature need to be converted to the digital domain through analog-to-digital converters (ADCs) to be processed by digital means [1]. For applications in communication and measurement [2], [3], high conversion rates are required. With advances of the complementary metal oxide semiconductor (CMOS) technology, the conversion rates of CMOS ADCs are now well beyond the gigasamples per second (GS/s) range, but only moderate resolutions are required [4]. These ADCs need to be tested after fabrication and, if possible, during field operation. The test costs are a very significant fraction of their production cost [5]. This is mainly due to lengthy use of very expensive automated test equipment (ATE) to apply specific test stimuli to the devices under test (DUT) and to collect and analyze their responses.publishe

Testing a CMOS operational amplifier circuit using a combination of oscillation and IDDQ test methods

This work presents a case study, which attempts to improve the fault diagnosis and testability of the oscillation testing methodology applied to a typical two-stage CMOS operational amplifier. The proposed test method takes the advantage of good fault coverage through the use of a simple oscillation based test technique, which needs no test signal generation and combines it with quiescent supply current (IDDQ) testing to provide a fault confirmation. A built in current sensor (BICS), which introduces insignificant performance degradation of the circuit-under-test (CUT), has been utilized to monitor the power supply quiescent current changes in the CUT. The testability has also been enhanced in the testing procedure using a simple fault-injection technique. The approach is attractive for its simplicity, robustness and capability of built-in-self test (BIST) implementation. It can also be generalized to the oscillation based test structures of other CMOS analog and mixed-signal integrated circuits. The practical results and simulations confirm the functionality of the proposed test method

On-chip evaluation of oscillation-based-test output signals for switched-capacitor circuits

This work presents a simple and low-cost method for on-chip evaluation of test signals coming from the application of the Oscillation-Based-Test (OBT) technique. This method extracts the main test signal features (amplitude, frequency and DC level) in the digital domain requiring just a very simple and robust circuitry. Experimental results obtained from an integrated chip demonstrate the feasibility of the approac

Development and design of three monitoring instruments for spacecraft charging

A set of instruments which provide early detection of potentially dangerous geomagnetic substorm conditions and monitor the spacecraft response are discussed. The set consists of a sensor that measures the characteristic energy of collected electrons or ions from + 100 to - 20,000 V, a logarithmic current density sensor that measures local electron flux and a transient events counter that counts the spurious pulses from electrostatic discharges that couple into the spacecraft wiring harness. Design details and performance characteristics of the three instruments are given. Size, weight, and power requirements are minimized

Analog Block Evaluation with BIST Instruments

The demands for quality and for the ability to compete in the market make it necessary not only to facilitate the testing of analog circuits but also to make them more efficient. With the increase in systems complexity and level of integration, the process of testing analog circuits has become difficult and expensive. This dissertation, proposed by Synopsys Portugal, aims to perform a study on analog Built-In Self-Test (BIST) and implement a simple analog BIST system that is capable of testing a voltage regulator and an oscillator on specifics parameters. In the regulator, the parameters to test are: Over and Under Voltage, Settling Time and Voltage Ripple. In the oscillator the parameters to test are: Frequency Drift, Settling Time and Duty-Cycle Distortion. This methodology allows for self-test operations and, thus, reduces complexity and cost associated with performing analog circuit tests. It makes it possible to test the circuits periodically throughout its lifetime and also monitors some analog parameters in real-time

A Low Total Harmonic Distortion Sinusoidal Oscillator Based on Digital Harmonic Cancellation Technique

Sinusoidal oscillator is intensively used in many applications, such as built-in-self-testing and ADC characterization. An innovative medical application for skin cancer detection employed a technology named bio-impedance spectroscopy, which also requires highly linear sinusoidal-wave as the reference clock. Moreover, the generated sinusoidal signals should be tunable within the frequency range from 10kHz to 10MHz, and quadrature outputs are demanded for coherent demodulation within the system. A design methodology of sinusoidal oscillator named digital-harmonic-cancellation (DHC) technique is presented. DHC technique is realized by summing up a set of square-wave signals with different phase shifts and different summing coefficient to cancel unwanted harmonics. With a general survey of literature, some sinusoidal oscillators based on DHC technique are reviewed and categorized. Also, the mathematical algorithm behind the technique is explained, and non-ideality effect is analyzed based on mathematical calculation. The prototype is fabricated in OnSemi 0.5um CMOS technology. The experimental results of this work show that it can achieve HD2 is -59.74dB and HD3 is -60dB at 0.9MHz, and the frequency is tunable over 0.1MHz to 0.9MHz. The chip consumes area of 0.76mm2, and power consumption at 0.9MHz is 2.98mW. Another design in IBM 0.18um technology is still in the phase of design. The preliminary simulation results show that the 0.18um design can realize total harmonic distortion of -72dB at 10MHz with the power consumption of 0.4mW. The new design is very competitive with state-of-art, which will be finished with layout, submitted for fabrication and measured later