Product assurance technology for custom LSI/VLSI electronics

The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification

Concepts for on-board satellite image registration. Volume 3: Impact of VLSI/VHSIC on satellite on-board signal processing

Anticipated major advances in integrated circuit technology in the near future are described as well as their impact on satellite onboard signal processing systems. Dramatic improvements in chip density, speed, power consumption, and system reliability are expected from very large scale integration. Improvements are expected from very large scale integration enable more intelligence to be placed on remote sensing platforms in space, meeting the goals of NASA's information adaptive system concept, a major component of the NASA End-to-End Data System program. A forecast of VLSI technological advances is presented, including a description of the Defense Department's very high speed integrated circuit program, a seven-year research and development effort

Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics

Advanced measurement methods using microelectronic test chips are described. These chips are intended to be used in acquiring the data needed to qualify Application Specific Integrated Circuits (ASIC's) for space use. Efforts were focused on developing the technology for obtaining custom IC's from CMOS/bulk silicon foundries. A series of test chips were developed: a parametric test strip, a fault chip, a set of reliability chips, and the CRRES (Combined Release and Radiation Effects Satellite) chip, a test circuit for monitoring space radiation effects. The technical accomplishments of the effort include: (1) development of a fault chip that contains a set of test structures used to evaluate the density of various process-induced defects; (2) development of new test structures and testing techniques for measuring gate-oxide capacitance, gate-overlap capacitance, and propagation delay; (3) development of a set of reliability chips that are used to evaluate failure mechanisms in CMOS/bulk: interconnect and contact electromigration and time-dependent dielectric breakdown; (4) development of MOSFET parameter extraction procedures for evaluating subthreshold characteristics; (5) evaluation of test chips and test strips on the second CRRES wafer run; (6) two dedicated fabrication runs for the CRRES chip flight parts; and (7) publication of two papers: one on the split-cross bridge resistor and another on asymmetrical SRAM (static random access memory) cells for single-event upset analysis

A study of universal modulation techniques applied to satellite data collection

A universal modulation and frequency control system for use with data collection platform (DCP) transmitters is examined. The final design discussed can, under software/firmwave control, generate all of the specific digital data modulation formats currently used in the NASA satellite data collection service and can simultaneously synthesize the proper RF carrier frequencies employed. A novel technique for DCP time and frequency control is presented. The emissions of NBS radio station WWV/WWVH are received, detected, and finally decoded in microcomputer software to generate a highly accurate time base for the platform; with the assistance of external hardware, the microcomputer also directs the recalibration of all DCP oscillators to achieve very high frequency accuracies and low drift rates versus temperature, supply voltage, and time. The final programmable DCP design also employs direct microcomputer control of data reduction, formatting, transmitter switching, and system power management

Techniques of Energy-Efficient VLSI Chip Design for High-Performance Computing

How to implement quality computing with the limited power budget is the key factor to move very large scale integration (VLSI) chip design forward. This work introduces various techniques of low power VLSI design used for state of art computing. From the viewpoint of power supply, conventional in-chip voltage regulators based on analog blocks bring the large overhead of both power and area to computational chips. Motivated by this, a digital based switchable pin method to dynamically regulate power at low circuit cost has been proposed to make computing to be executed with a stable voltage supply. For one of the widely used and time consuming arithmetic units, multiplier, its operation in logarithmic domain shows an advantageous performance compared to that in binary domain considering computation latency, power and area. However, the introduced conversion error reduces the reliability of the following computation (e.g. multiplication and division.). In this work, a fast calibration method suppressing the conversion error and its VLSI implementation are proposed. The proposed logarithmic converter can be supplied by dc power to achieve fast conversion and clocked power to reduce the power dissipated during conversion. Going out of traditional computation methods and widely used static logic, neuron-like cell is also studied in this work. Using multiple input floating gate (MIFG) metal-oxide semiconductor field-effect transistor (MOSFET) based logic, a 32-bit, 16-operation arithmetic logic unit (ALU) with zipped decoding and a feedback loop is designed. The proposed ALU can reduce the switching power and has a strong driven-in capability due to coupling capacitors compared to static logic based ALU. Besides, recent neural computations bring serious challenges to digital VLSI implementation due to overload matrix multiplications and non-linear functions. An analog VLSI design which is compatible to external digital environment is proposed for the network of long short-term memory (LSTM). The entire analog based network computes much faster and has higher energy efficiency than the digital one

FPGA ARCHITECTURE AND VERIFICATION OF BUILT IN SELF-TEST (BIST) FOR 32-BIT ADDER/SUBTRACTER USING DE0-NANO FPGA AND ANALOG DISCOVERY 2 HARDWARE

The integrated circuit (IC) is an integral part of everyday modern technology, and its application is very attractive to hardware and software design engineers because of its versatility, integration, power consumption, cost, and board area reduction. IC is available in various types such as Field Programming Gate Array (FPGA), Application Specific Integrated Circuit (ASIC), System on Chip (SoC) architecture, Digital Signal Processing (DSP), microcontrollers (μC), and many more. With technology demand focused on faster, low power consumption, efficient IC application, design engineers are facing tremendous challenges in developing and testing integrated circuits that guaranty functionality, high fault coverage, and reliability as the transistor technology is shrinking to the point where manufacturing defects of ICs are affecting yield which associates with the increased cost of the part. The competitive IC market is pressuring manufactures of ICs to develop and market IC in a relatively quick turnaround which in return requires design and verification engineers to develop an integrated self-test structure that would ensure fault-free and the quality product is delivered on the market. 70-80% of IC design is spent on verification and testing to ensure high quality and reliability for the enduser. To test complex and sophisticated IC designs, the verification engineers must produce laborious and costly test fixtures which affect the cost of the part on the competitive market. To avoid increasing the part cost due to yield and test time to the end-user and to keep up with the competitive market many IC design engineers are deviating from complex external test fixture approach and are focusing on integrating Built-in Self-Test (BIST) or Design for Test (DFT) techniques onto IC’s which would reduce time to market but still guarantee high coverage for the product. Understanding the BIST, the architecture, as well as the application of IC, must be understood before developing IC. The architecture of FPGA is elaborated in this paper followed by several BIST techniques and applications of those BIST relative to FPGA, SoC, analog to digital (ADC), or digital to analog converters (DAC) that are integrated on IC. Paper is concluded with verification of BIST for the 32-bit adder/subtracter designed in Quartus II software using the Analog Discovery 2 module as stimulus and DE0-NANO FPGA board for verification

ANALYSIS OF MOS CURRENT MODE LOGIC (MCML) AND IMPLEMENTATION OF MCML STANDARD CELL LIBRARY FOR LOW-NOISE DIGITAL CIRCUIT DESIGN

MOS current mode logic (MCML) offers low noise digital circuits that reduce noise that can cripple analog components in mixed-signal integrated circuits, when compared to CMOS digital circuits. An MCML standard cell library was developed for the Cadence Virtuoso Integrated Circuit (IC) design software that gives IC designers the ability to design complex, low noise digital circuits for use in mixed-signal and noise sensitive systems at a high level of abstraction, allowing them to get superior products to market faster than competitors. The MCML standard cell library developed and presented here allows for fast development of mixed signal circuits by providing quiet digital building block gates that reduce the simultaneous switching noise (SSN) by an order of magnitude over conventional CMOS based designs [3]. This thesis project developed the following digital gates in MCML as a standard cell library for general-purpose low noise and very low noise applications: inverter, buffer, NAND, AND, NOR, OR, XOR, NXOR, 2:1 MUX, CMOS to MCML, MCML to CMOS, and double edge triggered flip-flop (DETFF)

Microprocessor controlled novel 4-quadrant DC-DC converter

The thesis describes a novel 4-quadrant DC-DC converter, supplied by a 28V DC voltage source, with an output voltage which may be continuously varied between +180V and -180V DC. A prototype 1.2kW DC-DC converter was designed and built, with emphasis given to the optimization of both the converter size and efficiency. This was achieved by means of a computer-based simulation study, which determined the optimal switching frequency and the size of the inductors and capacitors while maintaining a high unit efficiency. Mos-Gated Bimos switches, which feature the advantages of both mosfets and bipolar transistors, were developed to achieve high switching speed during high power operation. A digital-controlled DC servo system based on a 16-bit Intel 8086 microprocessor was designed, to provide both motor speed and position control. Speed and position detection circuits and the structure and the interfacing arrangement of the microprocessor system were designed and constructed. Several control algorithms were developed, including PID Control Algorithm and Current-Limit Control Algorithm. Based on open loop transfer function of the system, derived through mathematical modelling using the State-Space Averaging Method, the constants for the control algorithms were obtained to meet the dynamic performance specified for the system. Computer simulation was carried out to assist with the design of the converter and the control system. It is expected that drives into which the novel converter is incorporated will find many applications in situations where accurate positional control is required, particularly in battery-operated DC-servo system, such as satellite system, robots and some military vehicles

NASA SERC 1990 Symposium on VLSI Design

This document contains papers presented at the first annual NASA Symposium on VLSI Design. NASA's involvement in this event demonstrates a need for research and development in high performance computing. High performance computing addresses problems faced by the scientific and industrial communities. High performance computing is needed in: (1) real-time manipulation of large data sets; (2) advanced systems control of spacecraft; (3) digital data transmission, error correction, and image compression; and (4) expert system control of spacecraft. Clearly, a valuable technology in meeting these needs is Very Large Scale Integration (VLSI). This conference addresses the following issues in VLSI design: (1) system architectures; (2) electronics; (3) algorithms; and (4) CAD tools