Smart cmos image sensor for 3d measurement

3D measurements are concerned with extracting visual information from the geometry of visible surfaces and interpreting the 3D coordinate data thus obtained, to detect or track the position or reconstruct the profile of an object, often in real time. These systems necessitate image sensors with high accuracy of position estimation and high frame rate of data processing for handling large volumes of data. A standard imager cannot address the requirements of fast image acquisition and processing, which are the two figures of merit for 3D measurements. Hence, dedicated VLSI imager architectures are indispensable for designing these high performance sensors. CMOS imaging technology provides potential to integrate image processing algorithms on the focal plane of the device, resulting in smart image sensors, capable of achieving better processing features in handling massive image data. The objective of this thesis is to present a new architecture of smart CMOS image sensor for real time 3D measurement using the sheet-beam projection methods based on active triangulation. Proposing the vision sensor as an ensemble of linear sensor arrays, all working in parallel and processing the entire image in slices, the complexity of the image-processing task shifts from O (N 2 ) to O (N). Inherent also in the design is the high level of parallelism to achieve massive parallel processing at high frame rate, required in 3D computation problems. This work demonstrates a prototype of the smart linear sensor incorporating full testability features to test and debug both at device and system levels. The salient features of this work are the asynchronous position to pulse stream conversion, multiple images binarization, high parallelism and modular architecture resulting in frame rate and sub-pixel resolution suitable for real time 3D measurements

CMOS digital pixel sensor array with time domain analogue to digital conversion

This thesis presents a digital pixel sensor array, which is the first stage of an ongoing project to produce a CMOS image sensor with on-chip image processing. The analogue to digital conversion is performed at the pixel level, with the result stored in pixel memory. This architecture allows fast, reliable access to the image data and simplifies the integration of the image array and the processing logic. Each pixel contains a photodiode sensor, a comparator, memory and addressing logic. The photodiode sensor operates in integrating mode, where the photodiode junction capacitance is first charged to an initial voltage, and then discharged by the photodiode leakage current, which is comprised mainly of optically generated carriers. The analogue to digital conversion is performed by measuring the time taken for the photodiode cathode voltage to fall from its initial voltage, to the comparator reference voltage. This triggers the 8-bit pixel memory, which stores a data value representative of the time. The trigger signal also resets the photodiode, which conserves the charge stored in the junction capacitance, and also prevents blooming. An on-chip control circuit generates the digital data that is distributed globally to the array. The control circuit compensates for the inverse relationship between the integration time and the photocurrent by adjusting the data clock timing. The period of the data clock is increased at the same rate as the integration time, resulting in a linear relationship between the digital data and the photocurrent. The design is realised as a 64 x 64 pixel array, manufactured in O.35µm 3.3 V CMOS technology. Each pixel occupies an area of 45µm x 45µm with a 12.3% fill factor, and the entire pixel array and control circuit measures 3.7mm x 3.9mm. Experimental results confirm the operation of the digital pixel, and the linearising control circuit. The digital pixel has a dynamic range of 85dB, and can be adapted to different lighting conditions by varying a single clock frequency. The data captured by the array can be randomly accessed, and is read from the array nondestructivcly

Low power cmos potentiometric circuit design for label-free DNA detection

DNA detector is one of the main way to use in order to detect diseases, preventing crime and so on. The DNA detecting process is limited due to the bulky and expensive existing DNA detector machine. As the demand of the small, portable and inexpensive biosensor for point-of-care testing aid and medical diagnostic, the research and development of biosensor are increasing exponentially every year. The aim of this work is to develop an on-chip Complementary Metal Oxide Semiconductor (CMOS) biosensor circuit based on the charge-modulated field effect transistor (CMFET) for a label-free deoxyribonucleic acid (DNA) detection. This project focusing on low voltage and low power design potentiometric DNA detection circuit. Overall of detection circuit consists of two main circuits which are self-cascode source drain follower and two-stage differential amplifier. The proposed detection circuit is designed and simulates using 0.13 µm Silterra CMOS fabrication with 1.2 V supply. The power consumption of the improved source-drain follower circuit is 1.36 µW and with gain of 0.998 dB. The two-stage differential amplifier achives a voltage gain of 56.02 dB and high common mode rejection ration (CMRR) of 90 dB

Iddq testing of a CMOS 10-bit charge scaling digital-to-analog converter

This work presents an effective built-in current sensor (BICS), which has a very small impact on the performance of the circuit under test (CUT). The proposed BICS works in two-modes the normal mode and the test mode. In the normal mode the BICS is isolated from the CUT due to which there is no performance degradation of the CUT. In the testing mode, our BICS detects the abnormal current caused by permanent manufacturing defects. Further more our BICS can also distinguish the type of defect induced (Gate-source short, source-drain short and drain-gate short). Our BICS requires neither an external voltage source nor current source. Hence the BICS requires less area and is more efficient than the conventional current sensors. The circuit under test is a 10-bit digital to analog converter using charge-scaling architecture