1,193 research outputs found
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Structured modeling for VHDL synthesis
This report will describe a proposed modeling style for the use of the VHSIC Hardware Description Language (VHDL) in design synthesis. We will describe the operations and underlying assumptions of four design models currently understood and used in practice by designers: combinational logic, functional descriptions (involving clocked components such as counters), register transfer (data path) descriptions, and behavioral (instruction set or processor) designs. We will illustrate the various uses of the VHDL description styles (structural, dataflow and behavioral) to represent characteristics of each of these design models. Emphasis is placed on how VHDL constructs should be used in order to synthesize optimal designs
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Behavioral synthesis from VHDL using structured modeling
This dissertation describes work in behavioral synthesis involving the development of a VHDL Synthesis System VSS which accepts a VHDL behavioral input specification and performs technology independent synthesis to generate a circuit netlist of generic components. The VHDL language is used for input and output descriptions. An intermediate representation which incorporates signal typing and component attributes simplifies compilation and facilitates design optimization.A Structured Modeling methodology has been developed to suggest standard VHDL modeling practices for synthesis. Structured modeling provides recommendations for the use of available VHDL description styles so that optimal designs will be synthesized.A design composed of generic components is synthesized from the input description through a process of Graph Compilation, Graph Criticism, and Design Compilation. Experiments were performed to demonstrate the effects of different modeling styles on the quality of the design produced by VSS. Several alternative VHDL models were examined for each benchmark, illustrating the improvements in design quality achieved when Structured Modeling guidelines were followed
Advanced information processing system: The Army fault tolerant architecture conceptual study. Volume 2: Army fault tolerant architecture design and analysis
Described here is the Army Fault Tolerant Architecture (AFTA) hardware architecture and components and the operating system. The architectural and operational theory of the AFTA Fault Tolerant Data Bus is discussed. The test and maintenance strategy developed for use in fielded AFTA installations is presented. An approach to be used in reducing the probability of AFTA failure due to common mode faults is described. Analytical models for AFTA performance, reliability, availability, life cycle cost, weight, power, and volume are developed. An approach is presented for using VHSIC Hardware Description Language (VHDL) to describe and design AFTA's developmental hardware. A plan is described for verifying and validating key AFTA concepts during the Dem/Val phase. Analytical models and partial mission requirements are used to generate AFTA configurations for the TF/TA/NOE and Ground Vehicle missions
Quantum Dot Cellular Automata Check Node Implementation for LDPC Decoders
The quantum dot Cellular Automata (QCA) is an emerging nanotechnology that has gained significant research interest in recent years. Extremely small feature sizes, ultralow power consumption, and high clock frequency make QCA a potentially attractive solution for implementing computing architectures at the nanoscale. To be considered as a suitable CMOS substitute, the QCA technology must be able to implement complex real-time applications with affordable complexity. Low density parity check (LDPC) decoding is one of such applications. The core of LDPC decoding lies in the check node (CN) processing element which executes actual decoding algorithm and contributes toward overall performance and complexity of the LDPC decoder. This study presents a novel QCA architecture for partial parallel, layered LDPC check node. The CN executes Normalized Min Sum decoding algorithm and is flexible to support CN degree dc up to 20. The CN is constructed using a VHDL behavioral model of QCA elementary circuits which provides a hierarchical bottom up approach to evaluate the logical behavior, area, and power dissipation of the whole design. Performance evaluations are reported for the two main implementations of QCA i.e. molecular and magneti
NEW ALGORITHM FOR BEHAVIOURAL TEST GENERATION
Significant efforts of the test design community have addressed the development of high
level test generation algorithms in the last decade. The main problem originates in the
insufficiently low gate level fault coverage of test sets generated at the behavioural or
functional levels due to oversimplifications which result from the application of highly
abstract and technology-independent fault models.
In this paper a novel behavioural level test generation algorithm is presented effectively
utilizing information on the circuit structure, which is extracted from the high level
synthesis process.
Experimental results show that the gate level fault coverage of the test sets generated
by the new algorithm is similar to those assured by the gate level test generation
algorithms
Power Minimisation Techniques for Testing Low Power VLSI Circuits (PhD Dissertation)
Testing low power very large scale integrated (VLSI) circuits has recently become an area of concern due to yield and reliability problems. This dissertation focuses on minimising power dissipation during test application at logic level and register-transfer level (RTL) of abstraction of the VLSI design flow. The first part of this dissertation addresses power minimisation techniques in scan sequential circuits at the logic level of abstraction. A new best primary input change (BPIC) technique based on a novel test application strategy has been proposed. The technique increases the correlation between successive states during shifting in test vectors and shifting out test responses by changing the primary inputs such that the smallest number of transitions is achieved. The new technique is test set dependent and it is applicable to small to medium sized full and partial scan sequential circuits. Since the proposed test application strategy depends only on controlling primary input change time, power is minimised with no penalty in test area, performance, test efficiency, test application time or volume of test data. Furthermore, it is shown that partial scan does not provide only the commonly known benefits such as less test area overhead and test application time, but also less power dissipation during test application when compared to full scan. To achieve power savings in large scan sequential circuits a new test set independent multiple scan chain-based technique which employs a new design for test (DFT) architecture and a novel test application strategy, is presented. The technique has been validated using benchmark examples, and it has been shown that power is minimised with low computational time, low overhead in test area and volume of test data, and with no penalty in test application time, test efficiency, or performance. The second part of this dissertation addresses power minimisation techniques for testing low power VLSI circuits using built-in self-test (BIST) at RTL. First, it is important to overcome the shortcomings associated with traditional BIST methodologies. It is shown how a new BIST methodology for RTL data paths using a novel concept called test compatibility classes (TCC) overcomes high test application time, BIST area overhead, performance degradation, volume of test data, fault-escape probability, and complexity of the testable design space exploration. Second, power minimisation in BIST RTL data paths is achieved by analysing the effect of test synthesis and test scheduling on power dissipation during test application and by employing new power conscious test synthesis and test scheduling algorithms. Third, the new BIST methodology has been validated using benchmark examples. Further, it is shown that when the proposed power conscious test synthesis and test scheduling is combined with novel test compatibility classes simultaneous reduction in test application time and power dissipation is achieved with low overhead in computational time
Enhancement of fault injection techniques based on the modification of VHDL code
Deep submicrometer devices are expected to be increasingly sensitive to physical faults. For this reason, fault-tolerance mechanisms are more and more required in VLSI circuits. So, validating their dependability is a prior concern in the design process. Fault injection techniques based on the use of hardware description languages offer important advantages with regard to other techniques. First, as this type of techniques can be applied during the design phase of the system, they permit reducing the time-to-market. Second, they present high controllability and reachability. Among the different techniques, those based on the use of saboteurs and mutants are especially attractive due to their high fault modeling capability. However, implementing automatically these techniques in a fault injection tool is difficult. Especially complex are the insertion of saboteurs and the generation of mutants. In this paper, we present new proposals to implement saboteurs and mutants for models in VHDL which are easy-to-automate, and whose philosophy can be generalized to other hardware description languages.Baraza Calvo, JC.; Gracia-Morán, J.; Blanc Clavero, S.; Gil Tomás, DA.; Gil Vicente, PJ. (2008). Enhancement of fault injection techniques based on the modification of VHDL code. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 16(6):693-706. doi:10.1109/TVLSI.2008.2000254S69370616
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EXTEND-L : an input language for extensible register transfer compilation
This report discusses the model and input language for EXTEND, a synthesis system that permits extensible register transfer synthesis. EXTEND-L fills the need for a language that bridges the gap between existing behavioral input descriptions, which are too abstract, and structural schematics, which cannot capture the high-level behavior. The report first discusses previous work in behavioral synthesis and summarizes the deficiencies of these behavioral specifications. The report then describes the proposed langauge in detail, and concludes with a few examples that show its utility
High level behavioural modelling of boundary scan architecture.
This project involves the development of a software tool
which enables the integration of the IEEE 1149.1/JTAG
Boundary Scan Test Architecture automatically into an ASIC
(Application Specific Integrated Circuit) design. The tool requires the original design (the ASIC) to be described in VHDL-IEEE 1076 Hardware Description Language. The tool consists of the two major elements: i) A parsing and insertion algorithm developed and implemented in 'C';
ii) A high level model of the Boundary Scan Test
Architecture implemented in 'VHDL'. The parsing and insertion algorithm is developed to deal with identifying the design Input/Output (I/O) terminals, their types and the order they appear in the ASIC design. It then attaches suitable Boundary Scan Cells to each I/O, except power and ground and inserts the high level models of the full Boundary Scan Architecture into the ASIC without altering the design core structure
Plug & Test at System Level via Testable TLM Primitives
With the evolution of Electronic System Level (ESL) design methodologies, we are experiencing an extensive use of Transaction-Level Modeling (TLM). TLM is a high-level approach to modeling digital systems where details of the communication among modules are separated from the those of the implementation of functional units. This paper represents a first step toward the automatic insertion of testing capabilities at the transaction level by definition of testable TLM primitives. The use of testable TLM primitives should help designers to easily get testable transaction level descriptions implementing what we call a "Plug & Test" design methodology. The proposed approach is intended to work both with hardware and software implementations. In particular, in this paper we will focus on the design of a testable FIFO communication channel to show how designers are given the freedom of trading-off complexity, testability levels, and cos
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