What is the Path to Fast Fault Simulation?

Motivated by the recent advances in fast fault simulation techniques for large combinational circuits, a panel discussion has been organized for the 1988 International Test Conference. This paper is a collective account of the position statements offered by the panelists

A Self Learning based Diagnosis of Faulty Configurable Logic Blocks (CLBs) in Field Programmable Gate Arrays (FPGA) Using Reconfiguration

In many areas of digital systems Field programmable gate arrays (FPGAs) are most important for designing. The main usesof FPGAs are, these are programmable, and faults can be easily diagnosed, once faulty locations are identified. The locationand identification of faults in FPGA has not yet been explored much. A methodology for the testing and diagnosis of faultsin FPGAs is presented based on automatic circuit reconfiguration. The proposed method imposes no hardware overhead.This method can also be used in fault-tolerant systems, in which a good functional circuit can be still mapped to a FPGAwith faulty elements, as long as the fault sites are known. The logic synthesis software assigns the Configurable Logic Block(CLB) resources without system designer intervention. It is very advantageous for the designer to understand certain CLBdetails, including the varying capabilities of the look-up tables (LUTs), the physical direction of the carry propagation, thenumber and distribution of the available flip-flops. FPGA consists of 25 Configurable Logic Blocks (CLB). Each CLB isassigned with an application. The inputs for CLB are applied from a file. There is also a fault file in which error CLBs arepresent. If there is error CLBs, those CLBs are replaced by the spare CLBs. Finally, the errors CLBs are corrected withproper inputs and modified bits are displayed. So efficiency is not reduced and configurability is done without replacing thefaulty components. This FPGA can tolerate not only single faults but also for multiple faults. The power analysis resultsprovided for fault free, stuck-at-1, stuck-at-0 faults in digital circuits validate the point that faulty circuits dissipates moreand hence draw more power.Key words: Configurable Logic Block (CLB), Power Dissipation, Fault Tolerance, Fault Diagnosis, Faults, Full adder (FA)

An efficient logic fault diagnosis framework based on effect-cause approach

Fault diagnosis plays an important role in improving the circuit design process and the manufacturing yield. With the increasing number of gates in modern circuits, determining the source of failure in a defective circuit is becoming more and more challenging. In this research, we present an efficient effect-cause diagnosis framework for combinational VLSI circuits. The framework consists of three stages to obtain an accurate and reasonably precise diagnosis. First, an improved critical path tracing algorithm is proposed to identify an initial suspect list by backtracing from faulty primary outputs toward primary inputs. Compared to the traditional critical path tracing approach, our algorithm is faster and exact. Second, a novel probabilistic ranking model is applied to rank the suspects so that the most suspicious one will be ranked at or near the top. Several fast filtering methods are used to prune unrelated suspects. Finally, to refine the diagnosis, fault simulation is performed on the top suspect nets using several common fault models. The difference between the observed faulty behavior and the simulated behavior is used to rank each suspect. Experimental results on ISCAS85 benchmark circuits show that this diagnosis approach is efficient both in terms of memory space and CPU time and the diagnosis results are accurate and reasonably precise

LSI/VLSI design for testability analysis and general approach

The incorporation of testability characteristics into large scale digital design is not only necessary for, but also pertinent to effective device testing and enhancement of device reliability. There are at least three major DFT techniques, namely, the self checking, the LSSD, and the partitioning techniques, each of which can be incorporated into a logic design to achieve a specific set of testability and reliability requirements. Detailed analysis of the design theory, implementation, fault coverage, hardware requirements, application limitations, etc., of each of these techniques are also presented

Report on the formal specification and partial verification of the VIPER microprocessor

The formal specification and partial verification of the VIPER microprocessor is reviewed. The VIPER microprocessor was designed by RSRE, Malvern, England, for safety critical computing applications (e.g., aircraft, reactor control, medical instruments, armaments). The VIPER was carefully specified and partially verified in an attempt to provide a microprocessor with completely predictable operating characteristics. The specification of VIPER is divided into several levels of abstraction, from a gate-level description up to an instruction execution model. Although the consistency between certain levels was demonstrated with mechanically-assisted mathematical proof, the formal verification of VIPER was never completed

Techniques for the realization of ultra- reliable spaceborne computer Final report

Bibliography and new techniques for use of error correction and redundancy to improve reliability of spaceborne computer