Harnessing Simulation Acceleration to Solve the Digital Design Verification Challenge.

Today, design verification is by far the most resource and time-consuming activity of any new digital integrated circuit development. Within this area, the vast majority of the verification effort in industry relies on simulation platforms, which are implemented either in hardware or software. A "simulator" includes a model of each component of a design and has the capability of simulating its behavior under any input scenario provided by an engineer. Thus, simulators are deployed to evaluate the behavior of a design under as many input scenarios as possible and to identify and debug all incorrect functionality. Two features are critical in simulators for the validation effort to be effective: performance and checking/debugging capabilities. A wide range of simulator platforms are available today: on one end of the spectrum there are software-based simulators, providing a very rich software infrastructure for checking and debugging the design's functionality, but executing only at 1-10 simulation cycles per second (while actual chips operate at GHz speeds). At the other end of the spectrum, there are hardware-based platforms, such as accelerators, emulators and even prototype silicon chips, providing higher performances by 4 to 9 orders of magnitude, at the cost of very limited or non-existent checking/debugging capabilities. As a result, today, simulation-based validation is crippled: one can either have satisfactory performance on hardware-accelerated platforms or critical infrastructures for checking/debugging on software simulators, but not both. This dissertation brings together these two ends of the spectrum by presenting solutions that offer high-performance simulation with effective checking and debugging capabilities. Specifically, it addresses the performance challenge of software simulators by leveraging inexpensive off-the-shelf graphics processors as massively parallel execution substrates, and then exposing the parallelism inherent in the design model to that architecture. For hardware-based platforms, the dissertation provides solutions that offer enhanced checking and debugging capabilities by abstracting the relevant data to be logged during simulation so to minimize the cost of collection, transfer and processing. Altogether, the contribution of this dissertation has the potential to solve the challenge of digital design verification by enabling effective high-performance simulation-based validation.PHDComputer Science and EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttp://deepblue.lib.umich.edu/bitstream/2027.42/99781/1/dchatt_1.pd

Specification and validation of control intensive ICs in hopCP

technical reportControl intensive ICs pose a significant challenge to the users of formal methods in designing hardware. These ICs have to support a wide variety of requirements including synchronous and asynchronous operations polling and interrupt driven modes of operation multiple concurrent threads of execution non-trivial computational requirements and programmability. In this paper we illustrate the use of formal methods in the design of a control intensive IC called the "Intel 8251" Universal Synchronous / Asynchronous Receiver Transmitter (USART), using our hardware description language 'hopCP'. A feature of hopCP is that it supports communication via synchronous ports in addition to synchronous message passing Asynchronous ports are distributed shared variables writable by exactly one process We show the usefulness of this combination of communication constructs We outline algorithms to determine safe usages of asynchronous ports and also to discover other static properties of the specification We discuss a compiled code concurrent functional simulator called CFSIM, as well as the use of concurrent testers for driving CFSIM. The use of a semantically well specified and simple language and the associated analysis/simulation tools helps conquer the complexity of specifying and validating control intensive ICs

Validation and verification of the interconnection of hardware intellectual property blocks for FPGA-based packet processing systems

As networks become more versatile, the computational requirement for supporting additional functionality increases. The increasing demands of these networks can be met by Field Programmable Gate Arrays (FPGA), which are an increasingly popular technology for implementing packet processing systems. The fine-grained parallelism and density of these devices can be exploited to meet the computational requirements and implement complex systems on a single chip. However, the increasing complexity of FPGA-based systems makes them susceptible to errors and difficult to test and debug. To tackle the complexity of modern designs, system-level languages have been developed to provide abstractions suited to the domain of the target system. Unfortunately, the lack of formality in these languages can give rise to errors that are not caught until late in the design cycle. This thesis presents three techniques for verifying and validating FPGA-based packet processing systems described in a system-level description language. First, a type system is applied to the system description language to detect errors before implementation. Second, system-level transaction monitoring is used to observe high-level events on-chip following implementation. Third, the high-level information embodied in the system description language is exploited to allow the system to be automatically instrumented for on-chip monitoring. This thesis demonstrates that these techniques catch errors which are undetected by traditional verification and validation tools. The locations of faults are specified and errors are caught earlier in the design flow, which saves time by reducing synthesis iterations

Reining in the Functional Verification of Complex Processor Designs with Automation, Prioritization, and Approximation

Our quest for faster and efficient computing devices has led us to processor designs with enormous complexity. As a result, functional verification, which is the process of ascertaining the correctness of a processor design, takes up a lion's share of the time and cost spent on making processors. Unfortunately, functional verification is only a best-effort process that cannot completely guarantee the correctness of a design, often resulting in defective products that may have devastating consequences.Functional verification, as practiced today, is unable to cope with the complexity of current and future processor designs. In this dissertation, we identify extensive automation as the essential step towards scalable functional verification of complex processor designs. Moreover, recognizing that a complete guarantee of design correctness is impossible, we argue for systematic prioritization and prudent approximation to realize fast and far-reaching functional verification solutions. We partition the functional verification effort into three major activities: planning and test generation, test execution and bug detection, and bug diagnosis. Employing a perspective we refer to as the automation, prioritization, and approximation (APA) approach, we develop solutions that tackle challenges across these three major activities. In pursuit of efficient planning and test generation for modern systems-on-chips, we develop an automated process for identifying high-priority design aspects for verification. In addition, we enable the creation of compact test programs, which, in our experiments, were up to 11 times smaller than what would otherwise be available at the beginning of the verification effort. To tackle challenges in test execution and bug detection, we develop a group of solutions that enable the deployment of automatic and robust mechanisms for catching design flaws during high-speed functional verification. By trading accuracy for speed, these solutions allow us to unleash functional verification platforms that are over three orders of magnitude faster than traditional platforms, unearthing design flaws that are otherwise impossible to reach. Finally, we address challenges in bug diagnosis through a solution that fully automates the process of pinpointing flawed design components after detecting an error. Our solution, which identifies flawed design units with over 70% accuracy, eliminates weeks of diagnosis effort for every detected error.PHDComputer Science & EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/137057/1/birukw_1.pd

Error Detection and Diagnosis for System-on-Chip in Space Applications

Tesis por compendio de publicacionesLos componentes electrónicos comerciales, comúnmente llamados componentes Commercial-Off-The-Shelf (COTS) están presentes en multitud de dispositivos habituales en nuestro día a día. Particularmente, el uso de microprocesadores y sistemas en chip (SoC) altamente integrados ha favorecido la aparición de dispositivos electrónicos cada vez más inteligentes que sostienen el estilo de vida y el avance de la sociedad moderna. Su uso se ha generalizado incluso en aquellos sistemas que se consideran críticos para la seguridad, como vehículos, aviones, armamento, dispositivos médicos, implantes o centrales eléctricas. En cualquiera de ellos, un fallo podría tener graves consecuencias humanas o económicas. Sin embargo, todos los sistemas electrónicos conviven constantemente con factores internos y externos que pueden provocar fallos en su funcionamiento. La capacidad de un sistema para funcionar correctamente en presencia de fallos se denomina tolerancia a fallos, y es un requisito en el diseño y operación de sistemas críticos. Los vehículos espaciales como satélites o naves espaciales también hacen uso de microprocesadores para operar de forma autónoma o semi autónoma durante su vida útil, con la dificultad añadida de que no pueden ser reparados en órbita, por lo que se consideran sistemas críticos. Además, las duras condiciones existentes en el espacio, y en particular los efectos de la radiación, suponen un gran desafío para el correcto funcionamiento de los dispositivos electrónicos. Concretamente, los fallos transitorios provocados por radiación (conocidos como soft errors) tienen el potencial de ser una de las mayores amenazas para la fiabilidad de un sistema en el espacio. Las misiones espaciales de gran envergadura, típicamente financiadas públicamente como en el caso de la NASA o la Agencia Espacial Europea (ESA), han tenido históricamente como requisito evitar el riesgo a toda costa por encima de cualquier restricción de coste o plazo. Por ello, la selección de componentes resistentes a la radiación (rad-hard) específicamente diseñados para su uso en el espacio ha sido la metodología imperante en el paradigma que hoy podemos denominar industria espacial tradicional, u Old Space. Sin embargo, los componentes rad-hard tienen habitualmente un coste mucho más alto y unas prestaciones mucho menores que otros componentes COTS equivalentes. De hecho, los componentes COTS ya han sido utilizados satisfactoriamente en misiones de la NASA o la ESA cuando las prestaciones requeridas por la misión no podían ser cubiertas por ningún componente rad-hard existente. En los últimos años, el acceso al espacio se está facilitando debido en gran parte a la entrada de empresas privadas en la industria espacial. Estas empresas no siempre buscan evitar el riesgo a toda costa, sino que deben perseguir una rentabilidad económica, por lo que hacen un balance entre riesgo, coste y plazo mediante gestión del riesgo en un paradigma denominado Nuevo Espacio o New Space. Estas empresas a menudo están interesadas en entregar servicios basados en el espacio con las máximas prestaciones y el mayor beneficio posibles, para lo cual los componentes rad-hard son menos atractivos debido a su mayor coste y menores prestaciones que los componentes COTS existentes. Sin embargo, los componentes COTS no han sido específicamente diseñados para su uso en el espacio y típicamente no incluyen técnicas específicas para evitar que los efectos de la radiación afecten su funcionamiento. Los componentes COTS se comercializan tal cual son, y habitualmente no es posible modificarlos para mejorar su resistencia a la radiación. Además, los elevados niveles de integración de los sistemas en chip (SoC) complejos de altas prestaciones dificultan su observación y la aplicación de técnicas de tolerancia a fallos. Este problema es especialmente relevante en el caso de los microprocesadores. Por tanto, existe un gran interés en el desarrollo de técnicas que permitan conocer y mejorar el comportamiento de los microprocesadores COTS bajo radiación sin modificar su arquitectura y sin interferir en su funcionamiento para facilitar su uso en el espacio y con ello maximizar las prestaciones de las misiones espaciales presentes y futuras. En esta Tesis se han desarrollado técnicas novedosas para detectar, diagnosticar y mitigar los errores producidos por radiación en microprocesadores y sistemas en chip (SoC) comerciales, utilizando la interfaz de traza como punto de observación. La interfaz de traza es un recurso habitual en los microprocesadores modernos, principalmente enfocado a soportar las tareas de desarrollo y depuración del software durante la fase de diseño. Sin embargo, una vez el desarrollo ha concluido, la interfaz de traza típicamente no se utiliza durante la fase operativa del sistema, por lo que puede ser reutilizada sin coste. La interfaz de traza constituye un punto de conexión viable para observar el comportamiento de un microprocesador de forma no intrusiva y sin interferir en su funcionamiento. Como resultado de esta Tesis se ha desarrollado un módulo IP capaz de recabar y decodificar la información de traza de un microprocesador COTS moderno de altas prestaciones. El IP es altamente configurable y personalizable para adaptarse a diferentes aplicaciones y tipos de procesadores. Ha sido diseñado y validado utilizando el dispositivo Zynq-7000 de Xilinx como plataforma de desarrollo, que constituye un dispositivo COTS de interés en la industria espacial. Este dispositivo incluye un procesador ARM Cortex-A9 de doble núcleo, que es representativo del conjunto de microprocesadores hard-core modernos de altas prestaciones. El IP resultante es compatible con la tecnología ARM CoreSight, que proporciona acceso a información de traza en los microprocesadores ARM. El IP incorpora técnicas para detectar errores en el flujo de ejecución y en los datos de la aplicación ejecutada utilizando la información de traza, en tiempo real y con muy baja latencia. El IP se ha validado en campañas de inyección de fallos y también en radiación con protones y neutrones en instalaciones especializadas. También se ha combinado con otras técnicas de tolerancia a fallos para construir técnicas híbridas de mitigación de errores. Los resultados experimentales obtenidos demuestran su alta capacidad de detección y potencialidad en el diagnóstico de errores producidos por radiación. El resultado de esta Tesis, desarrollada en el marco de un Doctorado Industrial entre la Universidad Carlos III de Madrid (UC3M) y la empresa Arquimea, se ha transferido satisfactoriamente al entorno empresarial en forma de un proyecto financiado por la Agencia Espacial Europea para continuar su desarrollo y posterior explotación.Commercial electronic components, also known as Commercial-Off-The-Shelf (COTS), are present in a wide variety of devices commonly used in our daily life. Particularly, the use of microprocessors and highly integrated System-on-Chip (SoC) devices has fostered the advent of increasingly intelligent electronic devices which sustain the lifestyles and the progress of modern society. Microprocessors are present even in safety-critical systems, such as vehicles, planes, weapons, medical devices, implants, or power plants. In any of these cases, a fault could involve severe human or economic consequences. However, every electronic system deals continuously with internal and external factors that could provoke faults in its operation. The capacity of a system to operate correctly in presence of faults is known as fault-tolerance, and it becomes a requirement in the design and operation of critical systems. Space vehicles such as satellites or spacecraft also incorporate microprocessors to operate autonomously or semi-autonomously during their service life, with the additional difficulty that they cannot be repaired once in-orbit, so they are considered critical systems. In addition, the harsh conditions in space, and specifically radiation effects, involve a big challenge for the correct operation of electronic devices. In particular, radiation-induced soft errors have the potential to become one of the major risks for the reliability of systems in space. Large space missions, typically publicly funded as in the case of NASA or European Space Agency (ESA), have followed historically the requirement to avoid the risk at any expense, regardless of any cost or schedule restriction. Because of that, the selection of radiation-resistant components (known as rad-hard) specifically designed to be used in space has been the dominant methodology in the paradigm of traditional space industry, also known as “Old Space”. However, rad-hard components have commonly a much higher associated cost and much lower performance that other equivalent COTS devices. In fact, COTS components have already been used successfully by NASA and ESA in missions that requested such high performance that could not be satisfied by any available rad-hard component. In the recent years, the access to space is being facilitated in part due to the irruption of private companies in the space industry. Such companies do not always seek to avoid the risk at any cost, but they must pursue profitability, so they perform a trade-off between risk, cost, and schedule through risk management in a paradigm known as “New Space”. Private companies are often interested in deliver space-based services with the maximum performance and maximum benefit as possible. With such objective, rad-hard components are less attractive than COTS due to their higher cost and lower performance. However, COTS components have not been specifically designed to be used in space and typically they do not include specific techniques to avoid or mitigate the radiation effects in their operation. COTS components are commercialized “as is”, so it is not possible to modify them to improve their susceptibility to radiation effects. Moreover, the high levels of integration of complex, high-performance SoC devices hinder their observability and the application of fault-tolerance techniques. This problem is especially relevant in the case of microprocessors. Thus, there is a growing interest in the development of techniques allowing to understand and improve the behavior of COTS microprocessors under radiation without modifying their architecture and without interfering with their operation. Such techniques may facilitate the use of COTS components in space and maximize the performance of present and future space missions. In this Thesis, novel techniques have been developed to detect, diagnose, and mitigate radiation-induced errors in COTS microprocessors and SoCs using the trace interface as an observation point. The trace interface is a resource commonly found in modern microprocessors, mainly intended to support software development and debugging activities during the design phase. However, it is commonly left unused during the operational phase of the system, so it can be reused with no cost. The trace interface constitutes a feasible connection point to observe microprocessor behavior in a non-intrusive manner and without disturbing processor operation. As a result of this Thesis, an IP module has been developed capable to gather and decode the trace information of a modern, high-end, COTS microprocessor. The IP is highly configurable and customizable to support different applications and processor types. The IP has been designed and validated using the Xilinx Zynq-7000 device as a development platform, which is an interesting COTS device for the space industry. This device features a dual-core ARM Cortex-A9 processor, which is a good representative of modern, high-end, hard-core microprocessors. The resulting IP is compatible with the ARM CoreSight technology, which enables access to trace information in ARM microprocessors. The IP is able to detect errors in the execution flow of the microprocessor and in the application data using trace information, in real time and with very low latency. The IP has been validated in fault injection campaigns and also under proton and neutron irradiation campaigns in specialized facilities. It has also been combined with other fault-tolerance techniques to build hybrid error mitigation approaches. Experimental results demonstrate its high detection capabilities and high potential for the diagnosis of radiation-induced errors. The result of this Thesis, developed in the framework of an Industrial Ph.D. between the University Carlos III of Madrid (UC3M) and the company Arquimea, has been successfully transferred to the company business as a project sponsored by European Space Agency to continue its development and subsequent commercialization.Programa de Doctorado en Ingeniería Eléctrica, Electrónica y Automática por la Universidad Carlos III de MadridPresidenta: María Luisa López Vallejo.- Secretario: Enrique San Millán Heredia.- Vocal: Luigi Di Lill

A PCI Express board designed to interface with the electronic phase-2 upgrades of the ATLAS detectors at CERN

Nei prossimi 10 anni è in previsione un aggiornamento radicale dell'acceleratore LHC al CERN finalizzato al raggiungimento di più alti valori di luminosità istantanea (oltre \begin{math}5 \times 10^{34}cm^{-2}s^{-1}\end{math}) ed integrata (oltre un fattore 10 rispetto a quella attuale). Conseguentemente, anche i rilevatori degli esperimenti che lavorano al CERN, così come i loro sistemi di acquisizione dati, dovranno essere aggiornati per poter gestire un flusso notevolmente maggiore rispetto a quello utilizzato finora. Questa tesi tratta in particolare di una nuova scheda elettronica di lettura, progettata e testata nel laboratorio di elettronica del Dipartimento di Fisica ed Astronomia dell'Università di Bologna e nel laboratorio di elettronica della Sezione INFN (Istituto Nazionale di Fisica Nucleare) di Bologna. Le motivazioni che hanno indotto lo sviluppo della scheda prototipale sono molteplici. Un primo obiettivo da perseguire è stato quello di aggiornare la versione attuale delle schede elettroniche di acquisizione dati usate oggi nel Pixel Detector dell'esperimento ATLAS, visto che sono anch'esse sotto la responsabilità della sezione INFN di Bologna. Secondariamente, la scheda (nominata Pixel-ROD) è orientata a gestire le esigenze elettroniche che seguiranno l'upgrade di LHC durante la fase 2. La complessità del progetto e l'inerzia intrinseca di una vasta collaborazione come quella di ATLAS, hanno poi indotto lo sviluppo di questo progetto elettronico in largo anticipo rispetto al vero upgrade di fase 2 di LHC, previsto per il 2024. In questo modo saranno anche più facilmente eseguibili eventuali aggiornamenti tecnologici in corso d'opera, senza dover riprogettare da zero un sistema di acquisizione dati completo

Low-cost and efficient fault detection and diagnosis schemes for modern cores

Continuous improvements in transistor scaling together with microarchitectural advances have made possible the widespread adoption of high-performance processors across all market segments. However, the growing reliability threats induced by technology scaling and by the complexity of designs are challenging the production of cheap yet robust systems. Soft error trends are haunting, especially for combinational logic, and parity and ECC codes are therefore becoming insufficient as combinational logic turns into the dominant source of soft errors. Furthermore, experts are warning about the need to also address intermittent and permanent faults during processor runtime, as increasing temperatures and device variations will accelerate inherent aging phenomena. These challenges specially threaten the commodity segments, which impose requirements that existing fault tolerance mechanisms cannot offer. Current techniques based on redundant execution were devised in a time when high penalties were assumed for the sake of high reliability levels. Novel light-weight techniques are therefore needed to enable fault protection in the mass market segments. The complexity of designs is making post-silicon validation extremely expensive. Validation costs exceed design costs, and the number of discovered bugs is growing, both during validation and once products hit the market. Fault localization and diagnosis are the biggest bottlenecks, magnified by huge detection latencies, limited internal observability, and costly server farms to generate test outputs. This thesis explores two directions to address some of the critical challenges introduced by unreliable technologies and by the limitations of current validation approaches. We first explore mechanisms for comprehensively detecting multiple sources of failures in modern processors during their lifetime (including transient, intermittent, permanent and also design bugs). Our solutions embrace a paradigm where fault tolerance is built based on exploiting high-level microarchitectural invariants that are reusable across designs, rather than relying on re-execution or ad-hoc block-level protection. To do so, we decompose the basic functionalities of processors into high-level tasks and propose three novel runtime verification solutions that combined enable global error detection: a computation/register dataflow checker, a memory dataflow checker, and a control flow checker. The techniques use the concept of end-to-end signatures and allow designers to adjust the fault coverage to their needs, by trading-off area, power and performance. Our fault injection studies reveal that our methods provide high coverage levels while causing significantly lower performance, power and area costs than existing techniques. Then, this thesis extends the applicability of the proposed error detection schemes to the validation phases. We present a fault localization and diagnosis solution for the memory dataflow by combining our error detection mechanism, a new low-cost logging mechanism and a diagnosis program. Selected internal activity is continuously traced and kept in a memory-resident log whose capacity can be expanded to suite validation needs. The solution can catch undiscovered bugs, reducing the dependence on simulation farms that compute golden outputs. Upon error detection, the diagnosis algorithm analyzes the log to automatically locate the bug, and also to determine its root cause. Our evaluations show that very high localization coverage and diagnosis accuracy can be obtained at very low performance and area costs. The net result is a simplification of current debugging practices, which are extremely manual, time consuming and cumbersome. Altogether, the integrated solutions proposed in this thesis capacitate the industry to deliver more reliable and correct processors as technology evolves into more complex designs and more vulnerable transistors.El continuo escalado de los transistores junto con los avances microarquitectónicos han posibilitado la presencia de potentes procesadores en todos los segmentos de mercado. Sin embargo, varios problemas de fiabilidad están desafiando la producción de sistemas robustos. Las predicciones de "soft errors" son inquietantes, especialmente para la lógica combinacional: soluciones como ECC o paridad se están volviendo insuficientes a medida que dicha lógica se convierte en la fuente predominante de soft errors. Además, los expertos están alertando acerca de la necesidad de detectar otras fuentes de fallos (causantes de errores permanentes e intermitentes) durante el tiempo de vida de los procesadores. Los segmentos "commodity" son los más vulnerables, ya que imponen unos requisitos que las técnicas actuales de fiabilidad no ofrecen. Estas soluciones (generalmente basadas en re-ejecución) fueron ideadas en un tiempo en el que con tal de alcanzar altos nivel de fiabilidad se asumían grandes costes. Son por tanto necesarias nuevas técnicas que permitan la protección contra fallos en los segmentos más populares. La complejidad de los diseños está encareciendo la validación "post-silicon". Su coste excede el de diseño, y el número de errores descubiertos está aumentando durante la validación y ya en manos de los clientes. La localización y el diagnóstico de errores son los mayores problemas, empeorados por las altas latencias en la manifestación de errores, por la poca observabilidad interna y por el coste de generar las señales esperadas. Esta tesis explora dos direcciones para tratar algunos de los retos causados por la creciente vulnerabilidad hardware y por las limitaciones de los enfoques de validación. Primero exploramos mecanismos para detectar múltiples fuentes de fallos durante el tiempo de vida de los procesadores (errores transitorios, intermitentes, permanentes y de diseño). Nuestras soluciones son de un paradigma donde la fiabilidad se construye explotando invariantes microarquitectónicos genéricos, en lugar de basarse en re-ejecución o en protección ad-hoc. Para ello descomponemos las funcionalidades básicas de un procesador y proponemos tres soluciones de `runtime verification' que combinadas permiten una detección de errores a nivel global. Estas tres soluciones son: un verificador de flujo de datos de registro y de computación, un verificador de flujo de datos de memoria y un verificador de flujo de control. Nuestras técnicas usan el concepto de firmas y permiten a los diseñadores ajustar los niveles de protección a sus necesidades, mediante compensaciones en área, consumo energético y rendimiento. Nuestros estudios de inyección de errores revelan que los métodos propuestos obtienen altos niveles de protección, a la vez que causan menos costes que las soluciones existentes. A continuación, esta tesis explora la aplicabilidad de estos esquemas a las fases de validación. Proponemos una solución de localización y diagnóstico de errores para el flujo de datos de memoria que combina nuestro mecanismo de detección de errores, junto con un mecanismo de logging de bajo coste y un programa de diagnóstico. Cierta actividad interna es continuamente registrada en una zona de memoria cuya capacidad puede ser expandida para satisfacer las necesidades de validación. La solución permite descubrir bugs, reduciendo la necesidad de calcular los resultados esperados. Al detectar un error, el algoritmo de diagnóstico analiza el registro para automáticamente localizar el bug y determinar su causa. Nuestros estudios muestran un alto grado de localización y de precisión de diagnóstico a un coste muy bajo de rendimiento y área. El resultado es una simplificación de las prácticas actuales de depuración, que son enormemente manuales, incómodas y largas. En conjunto, las soluciones de esta tesis capacitan a la industria a producir procesadores más fiables, a medida que la tecnología evoluciona hacia diseños más complejos y más vulnerables

Development of Trigger and Control Systems for CMS

During the year of 2007, the Large Hadron Collider (LHC) and its four main detectors will begin operation with a view to answering the most pressing questions in particle physics. However before one can analyse the data produced to find the rare phenomena being looked for, both the detector and readout electronics must be thoroughly tested to ensure that the system will operate in a consistent way. The Compact Muon Solenoid (CMS) is one of the two general-purpose detectors at CERN. The tracking component of the design produces more data than any previous detector used in particle physics, with approximately ten million detector channels. The data from the detector is processed by the tracker Front End Driver (FED). The large data volume necessitated the development of a buffering and throttling system to prevent buffer overflow both on and off the detector. A critical component of this system is the APV emulator (APVe), which vetoes trigger decisions based on buffer status in the tracker. The commissioning of these components, along with a large part of the Timing, Trigger and Control (TTC) system is discussed, including the various modifications that were made to improve the robustness of the full system. Another key piece of the CMS electronics is the calorimeter trigger system, responsible for identifying âinteresting' physical events in a background of well-understood phenomena using calorimetric information. Calorimeter information is processed to identify various trigger objects by the Global Calorimeter Trigger (GCT). The first component of this system is the Source card, which has been developed to transfer data from the Regional Calorimeter Trigger (RCT) to the Leaf card, the processing engine of the GCT. The use of modern programmable logic with high speed optical links is discussed, emphasising its use for data concentration and the benefit it confers to the processing algorithms. Looking forward to Super-LHC, a possible addition to the CMS Level-1 trigger system is discussed, incorporating information from a new pixel detector with an alternative stacked geometry that allows the possibility of on-detector data rate reduction by means of a transverse momentum cut. A toy Monte Carlo was developed to study detector performance. Issues with high-speed reconstruction and the complications of on-detector data rate reduction are also discussed

Analysis of H/W & S/W techniques for data reduction in high speed digital image processing

With the widespread utilization of charge-coupled-devices, there is much interest in methods to efficiently process images. The processing, manipulation, and storage of photographic quality digital images place significant demands on today\u27s computers. Even with today\u27s high performance bus structure and real-time operating systems, manipulating full resolution image data may quickly overwhelm computer hardware and software. In response to this, data reduction techniques have been developed to aid in resolving this problem. Two common data reduction techniques include data sub-sampling and data averaging. Data sub-sampling approach is simplistic in nature and perhaps easiest to implement in both hardware and/or software. This approach involves sub-sampling the full resolution image data to a lower resolution. Selection of sub-sampled element of the full resolution image is random in nature. This random selection makes sub-sampling an effective technique for flat image fields but degrades or softens the image for edges information quality/content. Data averaging approach is more difficult and complex to implement in both hardware and software than the sub-sampling approach. The data averaging approach involves a two dimensional averaging function to sub-sample the full resolution image data to a lower resolution. Averaging area parameters may be chosen to average X consecutive pixels, and Y consecutive lines. Although more complex, data averaging more effectively retains edge information. This thesis investigates the two-dimensional, pixel data-averaging method for data reduction. It supports the use of a pixel-averaging algorithm in conjunction with, or independent from compression techniques which may be employed elsewhere within the same system. Hardware and software implementations are presented to solve this system problem. The hardware architecture design is based on a pixel averaging application specific integrated circuit. Software routines written in C programming language are presented to perform this data-averaging task. Performance comparisons are made between the hardware and software implementations for image resolutions up to 2048 by 3072 pixels, and under several averaging conditions. This thesis also provides a survey of various types of charge-coupled devices sensors, focusing on their abilities and limitations for data averaging. It presents several applications where this type of data reduction would be advantageous