30,293 research outputs found
On Timing Model Extraction and Hierarchical Statistical Timing Analysis
In this paper, we investigate the challenges to apply Statistical Static
Timing Analysis (SSTA) in hierarchical design flow, where modules supplied by
IP vendors are used to hide design details for IP protection and to reduce the
complexity of design and verification. For the three basic circuit types,
combinational, flip-flop-based and latch-controlled, we propose methods to
extract timing models which contain interfacing as well as compressed internal
constraints. Using these compact timing models the runtime of full-chip timing
analysis can be reduced, while circuit details from IP vendors are not exposed.
We also propose a method to reconstruct the correlation between modules during
full-chip timing analysis. This correlation can not be incorporated into timing
models because it depends on the layout of the corresponding modules in the
chip. In addition, we investigate how to apply the extracted timing models with
the reconstructed correlation to evaluate the performance of the complete
design. Experiments demonstrate that using the extracted timing models and
reconstructed correlation full-chip timing analysis can be several times faster
than applying the flattened circuit directly, while the accuracy of statistical
timing analysis is still well maintained
Ring oscillator clocks and margins
How much margin do we have to add to the delay lines of a bundled-data circuit? This paper is an attempt to give a methodical answer to this question, taking into account all sources of variability and the existing EDA machinery for timing analysis and sign-off. The paper is based on the study of the margins of a ring oscillator that substitutes a PLL as clock generator. A timing model is proposed that shows that a 12% margin for delay lines can be sufficient to cover variability in a 65nm technology. In a typical scenario, performance and energy improvements between 15% and 35% can be obtained by using a ring oscillator instead of a PLL. The paper concludes that a synchronous circuit with a ring oscillator clock shows similar benefits in performance and energy as those of bundled-data asynchronous circuits.Peer ReviewedPostprint (author's final draft
Yield-driven power-delay-optimal CMOS full-adder design complying with automotive product specifications of PVT variations and NBTI degradations
We present the detailed results of the application of mathematical optimization algorithms to transistor sizing in a full-adder cell design, to obtain the maximum expected fabrication yield. The approach takes into account all the fabrication process parameter variations specified in an industrial PDK, in addition to operating condition range and NBTI aging. The final design solutions present transistor sizing, which depart from intuitive transistor sizing criteria and show dramatic yield improvements, which have been verified by Monte Carlo SPICE analysis
Calculation of Generalized Polynomial-Chaos Basis Functions and Gauss Quadrature Rules in Hierarchical Uncertainty Quantification
Stochastic spectral methods are efficient techniques for uncertainty
quantification. Recently they have shown excellent performance in the
statistical analysis of integrated circuits. In stochastic spectral methods,
one needs to determine a set of orthonormal polynomials and a proper numerical
quadrature rule. The former are used as the basis functions in a generalized
polynomial chaos expansion. The latter is used to compute the integrals
involved in stochastic spectral methods. Obtaining such information requires
knowing the density function of the random input {\it a-priori}. However,
individual system components are often described by surrogate models rather
than density functions. In order to apply stochastic spectral methods in
hierarchical uncertainty quantification, we first propose to construct
physically consistent closed-form density functions by two monotone
interpolation schemes. Then, by exploiting the special forms of the obtained
density functions, we determine the generalized polynomial-chaos basis
functions and the Gauss quadrature rules that are required by a stochastic
spectral simulator. The effectiveness of our proposed algorithm is verified by
both synthetic and practical circuit examples.Comment: Published by IEEE Trans CAD in May 201
Product assurance technology for custom LSI/VLSI electronics
The technology for obtaining custom integrated circuits from CMOS-bulk silicon foundries using a universal set of layout rules is presented. The technical efforts were guided by the requirement to develop a 3 micron CMOS test chip for the Combined Release and Radiation Effects Satellite (CRRES). This chip contains both analog and digital circuits. The development employed all the elements required to obtain custom circuits from silicon foundries, including circuit design, foundry interfacing, circuit test, and circuit qualification
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