38,914 research outputs found
Subset Feature Learning for Fine-Grained Category Classification
Fine-grained categorisation has been a challenging problem due to small
inter-class variation, large intra-class variation and low number of training
images. We propose a learning system which first clusters visually similar
classes and then learns deep convolutional neural network features specific to
each subset. Experiments on the popular fine-grained Caltech-UCSD bird dataset
show that the proposed method outperforms recent fine-grained categorisation
methods under the most difficult setting: no bounding boxes are presented at
test time. It achieves a mean accuracy of 77.5%, compared to the previous best
performance of 73.2%. We also show that progressive transfer learning allows us
to first learn domain-generic features (for bird classification) which can then
be adapted to specific set of bird classes, yielding improvements in accuracy
A Survey on Metric Learning for Feature Vectors and Structured Data
The need for appropriate ways to measure the distance or similarity between
data is ubiquitous in machine learning, pattern recognition and data mining,
but handcrafting such good metrics for specific problems is generally
difficult. This has led to the emergence of metric learning, which aims at
automatically learning a metric from data and has attracted a lot of interest
in machine learning and related fields for the past ten years. This survey
paper proposes a systematic review of the metric learning literature,
highlighting the pros and cons of each approach. We pay particular attention to
Mahalanobis distance metric learning, a well-studied and successful framework,
but additionally present a wide range of methods that have recently emerged as
powerful alternatives, including nonlinear metric learning, similarity learning
and local metric learning. Recent trends and extensions, such as
semi-supervised metric learning, metric learning for histogram data and the
derivation of generalization guarantees, are also covered. Finally, this survey
addresses metric learning for structured data, in particular edit distance
learning, and attempts to give an overview of the remaining challenges in
metric learning for the years to come.Comment: Technical report, 59 pages. Changes in v2: fixed typos and improved
presentation. Changes in v3: fixed typos. Changes in v4: fixed typos and new
method
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