Time-efficient fault detection and diagnosis system for analog circuits

Time-efficient fault analysis and diagnosis of analog circuits are the most important prerequisites to achieve online health monitoring of electronic equipments, which are involving continuing challenges of ultra-large-scale integration, component tolerance, limited test points but multiple faults. This work reports an FPGA (field programmable gate array)-based analog fault diagnostic system by applying two-dimensional information fusion, two-port network analysis and interval math theory. The proposed system has three advantages over traditional ones. First, it possesses high processing speed and smart circuit size as the embedded algorithms execute parallel on FPGA. Second, the hardware structure has a good compatibility with other diagnostic algorithms. Third, the equipped Ethernet interface enhances its flexibility for remote monitoring and controlling. The experimental results obtained from two realistic example circuits indicate that the proposed methodology had yielded competitive performance in both diagnosis accuracy and time-effectiveness, with about 96% accuracy while within 60 ms computational time.Peer reviewedFinal Published versio

New Aspects of Fault Diagnosis of Nonlinear Analog Circuits

The paper is focused on nonlinear analog circuits, with the special attention paid to circuits comprising bipolar and MOS transistors manufactured in micrometer and submicrometer technology. The problem of fault diagnosis of this class of circuits is discussed, including locating faulty elements and evaluating their parameters. The paper deals with multiple parametric fault diagnosis using the simulation after test approach as well as detection and location of single catastrophic faults, using the simulation before test approach. The discussed methods are based on diagnostic test, leading to a system of nonlinear algebraic type equations, which are not given in explicit analytical form. An important and new aspect of the fault diagnosis is finding multiple solutions of the test equation, i.e. several sets of the parameters values that meet the test. Another new problems in this area are global fault diagnosis of technological parameters in CMOS circuits fabricated in submicrometer technology and testing the circuits  having multiple DC operating points. To solve these problems several methods have been recently developed, which employ  different concepts and mathematical tools of nonlinear analysis. In this paper they are sketched and illustrated.  All the discussed methods are based on the homotopy (continuation) idea. It is shown that various versions of homotopy and combinations  of the homotopy with some other mathematical algorithms lead to very powerful tools for fault diagnosis of nonlinear analog circuits.  To trace the homotopy path which allows finding multiple solutions, the simplicial method, the restart method, the theory of linear complementarity problem and Lemke's algorithm are employed. For illustration four numerical examples are given

Communication Subsystems for Emerging Wireless Technologies

The paper describes a multi-disciplinary design of modern communication systems. The design starts with the analysis of a system in order to define requirements on its individual components. The design exploits proper models of communication channels to adapt the systems to expected transmission conditions. Input filtering of signals both in the frequency domain and in the spatial domain is ensured by a properly designed antenna. Further signal processing (amplification and further filtering) is done by electronics circuits. Finally, signal processing techniques are applied to yield information about current properties of frequency spectrum and to distribute the transmission over free subcarrier channels

Fault modeling and parametric fault detection in analog VLSI circuits using discretization

In this article we describe new model for determination of fault in circuit and also we provide detailed analysis of tolerance of circuit, which is considered one of the important parameter while designing the circuit. We have done mathematical analysis to provide strong base for our model and also done simulation for the same. This article describes detailed analysis of parametric fault in analog VLSI circuit. The model is tested for different frequencies for compactness and its flexibility. The tolerance analysis is also done for this purpose. All the simulation are done in MATLAB software

A collection of fuzzy logic-based tools for the automated design, modelling and test of analog circuits

We have developed a collection of tools for the design, modeling, and test of analog circuits. Sharing a common fuzzy-logic based framework, the tools are part of FASY (Fuzzy-Logic-Based Analog Synthesis), an analog design package developed at the University of Seville. The first tool uses fuzzy logic for topology selection of analog cells. It follows decision rules directly entered by a human expert or automatically generated from its experience with earlier designs. Second, a performance-modeling tool provides a qualitative description of a circuit's behavior. Alternatively, it can use a learning process to accurately model circuit performance. Finally, an analog testing tool uses a fuzzy-neuron classifier to detect and classify faults in analog circuits

A MLMVN WITH ARBITRARY COMPLEX-VALUED INPUTS AND A HYBRID TESTABILITY APPROACH FOR THE EXTRACTION OF LUMPED MODELS USING FRA

A procedure for the identification of lumped models of distributed parameter electromagnetic systems is presented in this paper. A Frequency Response Analysis (FRA) of the device to be modeled is performed, executing repeated measurements or intensive simulations. The method can be used to extract the values of the components. The fundamental brick of this architecture is a multi-valued neuron (MVN), used in a multilayer neural network (MLMVN); the neuron is modified in order to use arbitrary complex-valued inputs, which represent the frequency response of the device. It is shown that this modification requires just a slight change in the MLMVN learning algorithm. The method is tested over three completely different examples to clearly explain its generality

Methods for testing of analog circuits

Práce se zabývá metodami pro testování lineárních analogových obvodů v kmitočtové oblasti. Cílem je navrhnout efektivní metody pro automatické generování testovacího plánu. Snížením počtu měření a výpočetní náročnosti lze výrazně snížit náklady za testování. Práce se zabývá multifrekveční parametrickou poruchovou analýzou, která byla plně implementována do programu Matlab. Vhodnou volbou testovacích kmitočtů lze potlačit chyby měření a chyby způsobené výrobními tolerancemi obvodových prvků. Navržené metody pro optimální volbu kmitočtů byly statisticky ověřeny metodou MonteCarlo. Pro zvýšení přesnosti a snížení výpočetní náročnosti poruchové analýzy byly vyvinuty postupy založené na metodě nejmenších čtverců a přibližné symbolické analýze.The thesis deals with methods for testing of linear analog circuits in the frequency domain. The goal is to develop new efficient methods for automatic test plan generation. To reduce test costs a minimum number of measurements as well as less computational demands are the fundamental aims. The thesis is focused on the multi-frequency parametric fault diagnosis which was fully implemented in the Matlab program. The fundamental problem consists in selection of test frequencies which can reduce the influences of measurement errors and errors caused by tolerances of well-working components. The proposed methods for test frequency selection were statistically verified by the MonteCarlo method. To improve the accuracy and reduce the computational complexity of fault diagnosis, the methods based on least-square techniques and approximate symbolic analysis were presented.

Modern Diagnostics Techniques for Electrical Machines, Power Electronics, and Drives

© 2015 IEEE. Personal use of this material is permitted. Permissíon from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertisíng or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.[EN] For the last ten years, at least three different special sections dealing with diagnostics in power electrical engineering have been published in the IEEE transactions on industrial electronics [1]-[5]. All of them had their specificities, but the last ones, starting in 2011, were more connected to relevant events organized on the topic. In fact, these events have been clearly the only international forums fully dedicated to diagnostics techniques in power electrical engineering. For this particular issue, it has been decided to separate the different submissions into six parts: state of the art; general methods; induction machines (IMs); synchronous machines (SMs); . electrical drives; power components and power converters. The second section includes only one state-of-the-art paper, which is dedicated to actual techniques implemented in both industry and research laboratories. The third section includes three papers on diagnostic techniques not specifically aimed at a particular type of machine. The fourth section includes three papers devoted to diagnostics of rotor faults, two dedicated to stator insulation issues, and four papers dealing with mechanical faults diagnosis in IMs. The fifth section includes papers focusing on different types of SMs. The first two papers deal with wound-rotor SMs, the following three papers are dedicated to permanent-magnet radial flux machines, and the last one deals with permanent-magnet axial flux machines. Regarding the types of faults analyzed, there are three papers devoted to the diagnosis of interturn short circuits in the stator windings, i.e., one dedicated to the detection and location of field-winding-to-ground faults and a paper devoted to the diagnosis of static eccentricities. In the sixth section, two papers investigate issues related to faults in drive sensors, and one is devoted to fault detections in the coupling inductors. The last section includes two papers devoted to diagnosis of faults and losses analysis in switching components of power converters.Capolino, G.; Antonino-Daviu, J.; Riera-Guasp, M. (2015). Modern Diagnostics Techniques for Electrical Machines, Power Electronics, and Drives. IEEE Transactions on Industrial Electronics. 62(3):1738-1745. doi:10.1109/TIE.2015.2391186S1738174562